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1991 Annual Report. Conference on Electrical Insulation and Dielectric Phenomena,最新文献

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Dielectric Properties Of Isopropyl Biphenyl And Propylene Carbonate Mixtures 异丙基联苯和碳酸丙烯酯混合物的介电性能
1991 Annual Report. Conference on Electrical Insulation and Dielectric Phenomena, Pub Date : 1991-10-20 DOI: 10.1109/CEIDP.1991.763945
T. Jow, P. Cygan
{"title":"Dielectric Properties Of Isopropyl Biphenyl And Propylene Carbonate Mixtures","authors":"T. Jow, P. Cygan","doi":"10.1109/CEIDP.1991.763945","DOIUrl":"https://doi.org/10.1109/CEIDP.1991.763945","url":null,"abstract":"Isopropyl biphenyl (IPB) with 80% aromaticity contains two phenyls and aliphatic groups of three carbons. It is characterized with a low dielectric constant (e ’ ) value of 2.66 [l] and a low dissipation factor (DF) value of at 1 kJ3z. On the other hand, propylene carbonate (PC) is a polar liquid with a high E ’ value of 65 and a DF value at 0.5 at 10 kHz. The structures of IPB and PC are shown as follows.","PeriodicalId":277387,"journal":{"name":"1991 Annual Report. Conference on Electrical Insulation and Dielectric Phenomena,","volume":"1 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1991-10-20","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"126097905","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Effects of preannealing on positively electron-beam charged SiO/sub 2/ electrets 预退火对带正电的SiO/sub /驻极体的影响
1991 Annual Report. Conference on Electrical Insulation and Dielectric Phenomena, Pub Date : 1991-10-20 DOI: 10.1109/CEIDP.1991.763349
P. Gunther
{"title":"Effects of preannealing on positively electron-beam charged SiO/sub 2/ electrets","authors":"P. Gunther","doi":"10.1109/CEIDP.1991.763349","DOIUrl":"https://doi.org/10.1109/CEIDP.1991.763349","url":null,"abstract":"Thermally wet grown SiO/sub 2/ layers were positively electron-beam charged by using the secondary electron emission effect. The mean spatial depth of the charges was determined by measuring the surface potential at the SiO/sub 2/-air interface as well as at the Si-SiO/sub 2/ interface independently. The first measurement was carried out with an electrostatic voltmeter, whereas the latter measurement is based on detecting a voltage shift in the capacitance-voltage characteristic of a Metal Oxide Semiconductor-structure. This structure is formed by putting a mercury probe at the top of the SiO/sub 2/-silicon sample. It was found that preannealing the samples at temperatures up to 250/spl deg/C for less than two hours before charging, changes the mean charge depth significantly, although the charging parameters remained constant. Additionally the mean charge depth clearly exceds the maximum penetration depth of the incoming primary electrons during charging. A model to explain both phenomenas will be presented.","PeriodicalId":277387,"journal":{"name":"1991 Annual Report. Conference on Electrical Insulation and Dielectric Phenomena,","volume":"1 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1991-10-20","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"129949855","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 1
A New Measurement Technique Of Partial Discharge Phase Angle Distribution 局部放电相角分布测量新技术
1991 Annual Report. Conference on Electrical Insulation and Dielectric Phenomena, Pub Date : 1991-10-20 DOI: 10.1109/CEIDP.1991.763958
D. Kang, W. Y. Lee, Y.J. Kim
{"title":"A New Measurement Technique Of Partial Discharge Phase Angle Distribution","authors":"D. Kang, W. Y. Lee, Y.J. Kim","doi":"10.1109/CEIDP.1991.763958","DOIUrl":"https://doi.org/10.1109/CEIDP.1991.763958","url":null,"abstract":"Several experiments have been aiming at finding usefl diagnostic parameters from partial discharge spectra 1 applying new measurement techniques. The work described was designed to measure a new partii discharge parameter named Dynamic Stagnation Voltage ( 11, whic may be a useful diagnostic concept in predicting remaining lii and assessing insulation health, by frequency spectrum analyzf and multichannel analyzer.","PeriodicalId":277387,"journal":{"name":"1991 Annual Report. Conference on Electrical Insulation and Dielectric Phenomena,","volume":"25 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1991-10-20","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"115434278","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Analysis of degradation products on epoxy surfaces subjected to pulse and glow type discharges 脉冲和辉光放电作用下环氧树脂表面降解产物的分析
1991 Annual Report. Conference on Electrical Insulation and Dielectric Phenomena, Pub Date : 1991-10-20 DOI: 10.1109/CEIDP.1991.763364
C. Hudon, R. Bartnikas, M. Wertheimer
{"title":"Analysis of degradation products on epoxy surfaces subjected to pulse and glow type discharges","authors":"C. Hudon, R. Bartnikas, M. Wertheimer","doi":"10.1109/CEIDP.1991.763364","DOIUrl":"https://doi.org/10.1109/CEIDP.1991.763364","url":null,"abstract":"The degradation of epoxy specimens, exposed to pulse type and pulseless glow discharges, was investigated. Epoxy coverered, plane- parallel electrodes were employed; the mean discharge magnitude of the pulse type discharges was measured as a function of exposure time. The glow discharge light intensity was monitored as a function of time using a photomultiplier tube (PMT). Preliminary results indicate erratically changing magnitude of both the pulse type discharge and the photoemission prior to the disappearance of the pulses, at which point the PMT output is observed to assume a relatively constant value. The latter result infers a quasi constant glow discharge intensity for long exposure times. The change in the discharge behavior is ascribed to the chemical reactions occurring in the vapor phase and on the epoxy specimen surface. The surface deposition products are analyzed using ESCA, Debye-Scherrer X-ray diffraction and Ion Chromatography measurement techniques.","PeriodicalId":277387,"journal":{"name":"1991 Annual Report. Conference on Electrical Insulation and Dielectric Phenomena,","volume":"10 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1991-10-20","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"114867777","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 26
Performance Characteristics Of Polymer Insulating Materials Under Different Conditions 高分子绝缘材料在不同条件下的性能特性
1991 Annual Report. Conference on Electrical Insulation and Dielectric Phenomena, Pub Date : 1991-10-20 DOI: 10.1109/CEIDP.1991.763367
M. Rizk, A. Soliman, L. Nasrat, N. L. Doss
{"title":"Performance Characteristics Of Polymer Insulating Materials Under Different Conditions","authors":"M. Rizk, A. Soliman, L. Nasrat, N. L. Doss","doi":"10.1109/CEIDP.1991.763367","DOIUrl":"https://doi.org/10.1109/CEIDP.1991.763367","url":null,"abstract":"","PeriodicalId":277387,"journal":{"name":"1991 Annual Report. Conference on Electrical Insulation and Dielectric Phenomena,","volume":"72 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1991-10-20","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"115066696","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Experimental Determination Of The Development And Evolution Of The Spatial Distribution Of Charge Injected In Polyethylene By A Voltage-biased Needle 偏压针注入聚乙烯中电荷空间分布发展演变的实验测定
1991 Annual Report. Conference on Electrical Insulation and Dielectric Phenomena, Pub Date : 1991-10-20 DOI: 10.1109/CEIDP.1991.763345
A. De Reggi, S. Mahdavi, J. Lewiner, C. Alquié
{"title":"Experimental Determination Of The Development And Evolution Of The Spatial Distribution Of Charge Injected In Polyethylene By A Voltage-biased Needle","authors":"A. De Reggi, S. Mahdavi, J. Lewiner, C. Alquié","doi":"10.1109/CEIDP.1991.763345","DOIUrl":"https://doi.org/10.1109/CEIDP.1991.763345","url":null,"abstract":"We have used the pressure-wave-propagation method [l] on a microscale to measure the spatial distribution of charge in polyethylene between the point of an imbedded, voltage-biased needle electrode and a grounded, planar, counter electrode on one surface. The pulsed laser beam that produces the pressure pulses was focused on a small diameter aperture as a means of maintaining energy while reducing the diameter of the laser-induced pressure wave front. The capacitance that is modulated by the pressure wave and contributes to the response, thus is confined to that small volume swept-out by the pressure wave within which the injected charge is expected to reside. Reducing unwanted capacitance modulations from regions outside this volume is the dynamic equivalent of electrostatically guarding the needle point when measuring injection currents from the point [2]. In the present work and in [2], the charge injected from the point is rendered observable. Guarding is of limited usefulness when studying injection near breakdown because, if the guard is grounded, the distance from the needle point to the guard cannot be made much smaller than the distance between the point and the ground plane, while, if the guard is at the needle potential, it too may be a source of injected charge.","PeriodicalId":277387,"journal":{"name":"1991 Annual Report. Conference on Electrical Insulation and Dielectric Phenomena,","volume":"7 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1991-10-20","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"121485766","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
The mechanism of schottky-barrier formation in poly-p-phenylene 聚苯中肖特基势垒形成的机理
1991 Annual Report. Conference on Electrical Insulation and Dielectric Phenomena, Pub Date : 1991-10-20 DOI: 10.1109/CEIDP.1991.763355
M. Campos
{"title":"The mechanism of schottky-barrier formation in poly-p-phenylene","authors":"M. Campos","doi":"10.1109/CEIDP.1991.763355","DOIUrl":"https://doi.org/10.1109/CEIDP.1991.763355","url":null,"abstract":"The temperature dependence of the capacitance and current-voltage characteristics of Al/PPP junction device has been measured in order to investigate the junction properties. The barrier height and the effective Richardson constant of the junction have been determined to be 0.48 eV and 1.2x1/sup -4/Acm/sup -2/K/sup -1/ by Richardson plots. Analysis of the metal-polymer interface by x-ray photoemission spectroscopy (XPS) technique shows that an aluminum oxide complex is formed at the interface which would be the origin of the contact effects. The small effective Richardson constant has been due to existence of that composite layer, acting as a tunneling one.","PeriodicalId":277387,"journal":{"name":"1991 Annual Report. Conference on Electrical Insulation and Dielectric Phenomena,","volume":"10 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1991-10-20","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"125361589","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 1
High frequency dielectric response data insulating liquids from measurements sub-zero temperatures 高频介电响应数据使液体不受零度以下温度测量的影响
1991 Annual Report. Conference on Electrical Insulation and Dielectric Phenomena, Pub Date : 1991-10-20 DOI: 10.1109/CEIDP.1991.763828
B. Nettelblad, A. Jaksts
{"title":"High frequency dielectric response data insulating liquids from measurements sub-zero temperatures","authors":"B. Nettelblad, A. Jaksts","doi":"10.1109/CEIDP.1991.763828","DOIUrl":"https://doi.org/10.1109/CEIDP.1991.763828","url":null,"abstract":"A survey of the dielectric behaviour of some insulating liquids has been performed. The results show that these liquids display a conduction mechanism at moder elevated temperatures. At low temperatures, the Iiquids display a loss maximum, that is shifted downwards in frequency as the temperature is lowered. The temperature, at which the loss maximum frequency is 1 kHz, differs among the liquids, but is in the range -70 to -50 /spl deg/C. The amplitude of the loss maximum, also differs among the liquids, especially between aged and unaged naphthenic mineral oil.","PeriodicalId":277387,"journal":{"name":"1991 Annual Report. Conference on Electrical Insulation and Dielectric Phenomena,","volume":"68 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1991-10-20","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"123827386","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Poly-P-Xylene film for high temperature high voltage dielectric applications 高温高压介质用聚对二甲苯薄膜
1991 Annual Report. Conference on Electrical Insulation and Dielectric Phenomena, Pub Date : 1991-10-20 DOI: 10.1109/CEIDP.1991.763365
J. Suthar, J. Laghari, W. Khechan
{"title":"Poly-P-Xylene film for high temperature high voltage dielectric applications","authors":"J. Suthar, J. Laghari, W. Khechan","doi":"10.1109/CEIDP.1991.763365","DOIUrl":"https://doi.org/10.1109/CEIDP.1991.763365","url":null,"abstract":"Poly-P-Xylene (PPX), a high melting point polymer previously used as a dielectric in microelectronic circuits, was electrically characterized as a function of frequency, temperature and voltage to explore its possible use for high voltage high temperature space power applications. Properties that were measured included dielectric constant and dielectric loss both at frequencies up to 100 kHz, at several temperatures up to 200/spl deg/ C, and at electric fields up to 40 volt//spl mu/m. The ac and dc breakdown strength of the film were determined at temperatures up to 250/spl deg/ C. The results obtained displayed very little change in the dielectric constant, dielectric loss and breakdown voltages with an increase in temperature. At temperatures above 250/spl deg/ C, however, visual inspection of the tested samples revealed that the film became brittle and lost some of its physical integrity. The usefulness of PPX as a high temperature high voltage dielectric is demonstrated in this paper.","PeriodicalId":277387,"journal":{"name":"1991 Annual Report. Conference on Electrical Insulation and Dielectric Phenomena,","volume":"42 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1991-10-20","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"129571934","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 3
Watersensitive Conductivity and charge Relaxation In Polyimide 聚酰亚胺的水敏电导率和电荷弛豫
1991 Annual Report. Conference on Electrical Insulation and Dielectric Phenomena, Pub Date : 1991-10-20 DOI: 10.1109/CEIDP.1991.763340
H. Kliem, F. Znidarsic
{"title":"Watersensitive Conductivity and charge Relaxation In Polyimide","authors":"H. Kliem, F. Znidarsic","doi":"10.1109/CEIDP.1991.763340","DOIUrl":"https://doi.org/10.1109/CEIDP.1991.763340","url":null,"abstract":"In microelectronics industry polyimides (PI) have found an inc applicability within the last ten years. They are used as insulati layers between wiring networks in multilevel circuitry for pack; substrates in resistive heating elements or as passivants. Althoi known that the PI insulation properties are weakened by humid a few detailed studies of the conduction and discharge propertie different relative humidities can be found in literature 111. It is of this paper to report on experimental results on this subject discuss physical models for an explanation.","PeriodicalId":277387,"journal":{"name":"1991 Annual Report. Conference on Electrical Insulation and Dielectric Phenomena,","volume":"36 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1991-10-20","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"125920840","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 3
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