1991 Annual Report. Conference on Electrical Insulation and Dielectric Phenomena,最新文献

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The Influence Of Ionic And Non-ionic Additives On The Electric Potential Distribution In Dielectric Liquids 离子和非离子添加剂对介电液体电势分布的影响
1991 Annual Report. Conference on Electrical Insulation and Dielectric Phenomena, Pub Date : 1991-10-20 DOI: 10.1109/CEIDP.1991.763336
R. E. Barker, D. B. Holt, F. Junghans
{"title":"The Influence Of Ionic And Non-ionic Additives On The Electric Potential Distribution In Dielectric Liquids","authors":"R. E. Barker, D. B. Holt, F. Junghans","doi":"10.1109/CEIDP.1991.763336","DOIUrl":"https://doi.org/10.1109/CEIDP.1991.763336","url":null,"abstract":"Modifications of the electrostatic probe techniques of Forster [1,2] and of Bloor and Morant [ 3 ] have been used to study the influence of additives, including extended chain ions such as sodium dodecyl sulfate ( S D S ) and dissolved polymers, on the distribution of electric potential C#J(X) across low conductivity liquids between parallel electrodes. The systems studied include toluene with dissolved polystyrene and n-octanol with dissolved SDS. It is thought that these s stems reflect some of the conditions relevant to transrormer fluids and also may be of significance in biophysical considerations [ 4 ] . The distribution of space charge p(x) is estimated by the application of Poisson's equation to the measured potential function @(x). From such data implications can be made about the effects of molecular interactions.","PeriodicalId":277387,"journal":{"name":"1991 Annual Report. Conference on Electrical Insulation and Dielectric Phenomena,","volume":"212 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1991-10-20","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"116998050","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Capacitance Voltage Characteristics Of Stearic Acid Insulating Films In Mis Devices 硬脂酸绝缘膜在Mis器件中的电容电压特性
1991 Annual Report. Conference on Electrical Insulation and Dielectric Phenomena, Pub Date : 1991-10-20 DOI: 10.1109/CEIDP.1991.763967
S. Alam
{"title":"Capacitance Voltage Characteristics Of Stearic Acid Insulating Films In Mis Devices","authors":"S. Alam","doi":"10.1109/CEIDP.1991.763967","DOIUrl":"https://doi.org/10.1109/CEIDP.1991.763967","url":null,"abstract":"Fatty acid films may provide a good substitute as dielectric medium for MIS (metal-insulator-semionductor) technology. This paper discusses capacitance vs voltage (C-V) characteristics of metal/stearic acid/semiconductor devices formed on p-type silicon with thin native silicon dioxide (Si/sub 2/) layers. Variable frequency C-V plots display anomalous frequency dispersion in the negative bias voltage region and a reduction of the dispersion in the positive bias region. This can be attributed to the formation of interface states at the SiO/sub 2//stearic acid insulator boundary. C-V characteristics of MIS samples which have been subjected to thermal stress are also discussed. In these studies we have observed both a voltage and capacitance shift with respect to the unstressed specimens. The observed voltage shift is presumably due to the presence of mobile space charges moving to the SiO/sub 2//stearic acid boundary. The shift in capacitance in the stressed samples may have been caused by annealing of stearic acid films when they undergo thermal stress.","PeriodicalId":277387,"journal":{"name":"1991 Annual Report. Conference on Electrical Insulation and Dielectric Phenomena,","volume":"331 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1991-10-20","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"116442610","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
The Influence Of Ions On The Dc Conductivity And Thermally Stimulated Discharge Current (TSDC) Spectra Of Water Treed Additive Free Low Density Polyethylene 离子对无添加剂低密度聚乙烯直流电导率和热激放电电流(TSDC)谱的影响
1991 Annual Report. Conference on Electrical Insulation and Dielectric Phenomena, Pub Date : 1991-10-20 DOI: 10.1109/CEIDP.1991.763375
R. Fouracre, Li Huimim, B. Crichton, V. Banks
{"title":"The Influence Of Ions On The Dc Conductivity And Thermally Stimulated Discharge Current (TSDC) Spectra Of Water Treed Additive Free Low Density Polyethylene","authors":"R. Fouracre, Li Huimim, B. Crichton, V. Banks","doi":"10.1109/CEIDP.1991.763375","DOIUrl":"https://doi.org/10.1109/CEIDP.1991.763375","url":null,"abstract":"The role of ions in the treeing process appears crucial to the understanding of water treeing [l] and has been extensively studied. widely found [1,2]. An increased ionic concentration has been found both in the visibly treed region and also just in front of the tree 131. The presence of ions and possible morphological changes in the treed material imply that the electrical properties of the stressed material may also have some ion-specific behaviour.","PeriodicalId":277387,"journal":{"name":"1991 Annual Report. Conference on Electrical Insulation and Dielectric Phenomena,","volume":"365 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1991-10-20","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"116558253","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 3
Diagnosis expert system for the life time of transformers by using fuzzy Clustering 基于模糊聚类的变压器寿命诊断专家系统
1991 Annual Report. Conference on Electrical Insulation and Dielectric Phenomena, Pub Date : 1991-10-20 DOI: 10.1109/CEIDP.1991.763966
I. Terayama, Y. Kenmochi, J. Kobayashi, N. Iijima, H. Mitsui, M. Sone
{"title":"Diagnosis expert system for the life time of transformers by using fuzzy Clustering","authors":"I. Terayama, Y. Kenmochi, J. Kobayashi, N. Iijima, H. Mitsui, M. Sone","doi":"10.1109/CEIDP.1991.763966","DOIUrl":"https://doi.org/10.1109/CEIDP.1991.763966","url":null,"abstract":"1.Introduction In general, it is known that a life time of dry type transformer is reduced remarkably by partial discharges. The quality of insulation is kept constant as possible in the factory, but sometimes it is scattered by some reasons. The reliability of the products is much influenced by scatters of the quality. Therefore, it is very important to predict the life time of the products. So far it was done by measuring a withstand voltage. However, the withstand voltage test means a destruction of the products, so it is necessary to predict the life time by using undestructive tests. As an undestructive test, the magnitude of the partial discharge will be adaptable to an expert system for life time prediction. General expert systems were based on some threshold value, which did not have an objective meaning. So it is necessary to evaluate more objectively. By using an expert system with fuzzy clustering, it can be done to make a judgment taking the interactions of each data into considerat ion. Even if a characteristic of life time is not clear, this type of expert systems can establish an optimum expert with learning, and can watch not only the products but also the relationship between conditions of manufacturing machines and life. However, fuzzy clustering has a flaw that if data numbers increases, handling time becomes extremely long. So, it can not to do real time diagnosis of the products in manufacturing line. Therefore, we apply a high speed algorism using DSP (Digital Signal Processor) with high calculating speed to our expert system. In this paper, we suggest a diagnosis expert system for the life time of transformers by using fuzzy clustering and describe a method of prediction of life time in the manufacturing line.","PeriodicalId":277387,"journal":{"name":"1991 Annual Report. Conference on Electrical Insulation and Dielectric Phenomena,","volume":"1 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1991-10-20","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"129520835","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 1
A preliminary study of the relationship between matrix morphology and water treeing in medium voltage polymeric insulated cable 中压聚合物绝缘电缆基质形态与水树关系的初步研究
1991 Annual Report. Conference on Electrical Insulation and Dielectric Phenomena, Pub Date : 1991-10-20 DOI: 10.1109/CEIDP.1991.763382
S. Moody, V. Banks, A. Vaughan
{"title":"A preliminary study of the relationship between matrix morphology and water treeing in medium voltage polymeric insulated cable","authors":"S. Moody, V. Banks, A. Vaughan","doi":"10.1109/CEIDP.1991.763382","DOIUrl":"https://doi.org/10.1109/CEIDP.1991.763382","url":null,"abstract":"Electrical stress in the presence of water, ionic contaminants and oxidation products may cause water tree growth in medium voltage polymeric insulated cables. The water trees may either be in the form of vented trees which grow from the semi-conducting screen interfaces o r bowtie trees which grow from defects in the bulk of the insulation. This water tree growth may cause a decrease in the electric strength of the cable, thereby increasing the probability of failure. A large number of studies have, therefore, been carried out into examining the phenomenon of water treeing jn medium voltage cables[l-3].","PeriodicalId":277387,"journal":{"name":"1991 Annual Report. Conference on Electrical Insulation and Dielectric Phenomena,","volume":"80 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1991-10-20","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"128265619","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 5
Final Breakdown Mechanism Of Water Treeing 水树的最终分解机制
1991 Annual Report. Conference on Electrical Insulation and Dielectric Phenomena, Pub Date : 1991-10-20 DOI: 10.1109/CEIDP.1991.763374
S. Bamji, A. Bulinski, R. Densley
{"title":"Final Breakdown Mechanism Of Water Treeing","authors":"S. Bamji, A. Bulinski, R. Densley","doi":"10.1109/CEIDP.1991.763374","DOIUrl":"https://doi.org/10.1109/CEIDP.1991.763374","url":null,"abstract":"","PeriodicalId":277387,"journal":{"name":"1991 Annual Report. Conference on Electrical Insulation and Dielectric Phenomena,","volume":"38 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1991-10-20","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"121289596","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 14
Evidence for SF/sub 4/ and SF/sub 2/ formation in SF/sub 6/ corona discharges SF/sub 6/电晕放电中SF/sub 4/和SF/sub 2/形成的证据
1991 Annual Report. Conference on Electrical Insulation and Dielectric Phenomena, Pub Date : 1991-10-20 DOI: 10.1109/CEIDP.1991.763950
I. Sauers
{"title":"Evidence for SF/sub 4/ and SF/sub 2/ formation in SF/sub 6/ corona discharges","authors":"I. Sauers","doi":"10.1109/CEIDP.1991.763950","DOIUrl":"https://doi.org/10.1109/CEIDP.1991.763950","url":null,"abstract":"","PeriodicalId":277387,"journal":{"name":"1991 Annual Report. Conference on Electrical Insulation and Dielectric Phenomena,","volume":"23 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1991-10-20","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"121396199","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
The Operation Of Moisture Equilibrium In Determining Electrification In Oil/cellulose Structures 水分平衡在测定油/纤维素结构中起电作用的作用
1991 Annual Report. Conference on Electrical Insulation and Dielectric Phenomena, Pub Date : 1991-10-20 DOI: 10.1109/CEIDP.1991.763344
J. Nelson, M. Brubaker, S. Lindgren
{"title":"The Operation Of Moisture Equilibrium In Determining Electrification In Oil/cellulose Structures","authors":"J. Nelson, M. Brubaker, S. Lindgren","doi":"10.1109/CEIDP.1991.763344","DOIUrl":"https://doi.org/10.1109/CEIDP.1991.763344","url":null,"abstract":"Several of the transformer failures which have been attributable to static electrification have occurred within a few hours of energization in the absence of known system overvoltages. This suggests that perhaps thermal processes having a long time constant have been involved with the accumulation of static charge, since the electrification process is known to be a function of temperature [I]. Since temperature affects most of the factors involved, the predominant variable by which temperature influences charge accumulation (mobility, viscosity, conductivity, etc.) is not always evident.","PeriodicalId":277387,"journal":{"name":"1991 Annual Report. Conference on Electrical Insulation and Dielectric Phenomena,","volume":"22 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1991-10-20","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"126241520","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 4
Charge Injection Into Dielectric Oil From The Anode Or Cathode Under Ramped Voltage Application 斜坡电压作用下阳极或阴极向介电油的电荷注入
1991 Annual Report. Conference on Electrical Insulation and Dielectric Phenomena, Pub Date : 1991-10-20 DOI: 10.1109/CEIDP.1991.763946
D.H. Ren, A. Watson
{"title":"Charge Injection Into Dielectric Oil From The Anode Or Cathode Under Ramped Voltage Application","authors":"D.H. Ren, A. Watson","doi":"10.1109/CEIDP.1991.763946","DOIUrl":"https://doi.org/10.1109/CEIDP.1991.763946","url":null,"abstract":"From an e a r l i e r study in s i l i c o n e o i l , the average cur ren t response t o r i s i n g and f a l l i n g vol tage appears on a log-log s c a l e with two l i n e a r port ions which a r e sharply divided a t high f i e l d [l]. Both of these two port ions obey the equation I a VS, i n which Su and Si a r e re fer red t o as the upper s lope and lower slope. Figure 1 gives a typical p l o t o f the average cur ren t a s a function of the t r i a n g u l a r applied voltage i n log-log sca le . According t o a theory o f charge t ranspor t in d i e l e c t r i c l iqu id [Z] , i t i s proposed t h a t under slow t r i a n g u l a r voltage waveform appl ica t ion t h e process may occur by in jec t ion of e lec t rons from the cathode in t h e highest f i e l d region. The lower s lope represents the cur ren t c h a r a c t e r i s t i c in the lower (intermediate) f i e l d region. The lower s lope i n the intermediate f i e l d s t rength regime has not so f a r been invest igated c lose ly . I t has been hypothesized t h a t the lower s lope o r i g i n a t e s in some pos i t ive ion i n j e c t i o n process very much as e lec t rons are in jec ted from t h e cathode a t the highest f i e l d s t rengths . Indeed, s i l i c o n e o i l i s a homocharge 1 iquid according t o the c l a s s i f i c a t i o n of Guizonnier [3] and as such wil l have e lec t ron i n j e c t i o n under the control of the cathode material sur face while pos i t ive ion production i s determined by the anode. In addi t ion t o any such process, pos i t ive ions can appear and remain in the l iqu id from other mechanisms.","PeriodicalId":277387,"journal":{"name":"1991 Annual Report. Conference on Electrical Insulation and Dielectric Phenomena,","volume":"17 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1991-10-20","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"132559055","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Streak Camera Observations of Partial Discharg Polyethylene under Fast Impulse Voltage Stress 快速脉冲电压应力下局部放电聚乙烯的条纹相机观察
1991 Annual Report. Conference on Electrical Insulation and Dielectric Phenomena, Pub Date : 1991-10-20 DOI: 10.1109/CEIDP.1991.763381
J. Parpal
{"title":"Streak Camera Observations of Partial Discharg Polyethylene under Fast Impulse Voltage Stress","authors":"J. Parpal","doi":"10.1109/CEIDP.1991.763381","DOIUrl":"https://doi.org/10.1109/CEIDP.1991.763381","url":null,"abstract":"Samples of polyethylene with electrical trees at the tip of a needle radius/9 mm gap) molded into the material were subjected to voltage impulses of between 50 and 85 kV (20 ns/2 /spl mu/s). The light emitted from the partial discharges was recorded with a streak camera. Light was emitted for less than 20 ns for a positive impulse of 70 kV. The recorded light was located in the region of the electrical tree and the \"length\" of the recorded light increased with the growth of the tree. There was degradation of the emitting region after many impulses, except in one branch. The rate of growth of the electrical tree leading to final breakdown depends also on the mechanical stress applied sample.","PeriodicalId":277387,"journal":{"name":"1991 Annual Report. Conference on Electrical Insulation and Dielectric Phenomena,","volume":"42 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1991-10-20","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"133071450","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
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