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Proceedings of IEEE East-West Design & Test Symposium (EWDTS 2014)最新文献

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Efficient calculation of cyclic convolution by means of fast Fourier transform in a finite field 有限域内快速傅里叶变换循环卷积的有效计算
Proceedings of IEEE East-West Design & Test Symposium (EWDTS 2014) Pub Date : 2014-09-01 DOI: 10.1109/EWDTS.2014.7027043
V. Amerbaev, R. Solovyev, A. Stempkovskiy, D. Telpukhov
{"title":"Efficient calculation of cyclic convolution by means of fast Fourier transform in a finite field","authors":"V. Amerbaev, R. Solovyev, A. Stempkovskiy, D. Telpukhov","doi":"10.1109/EWDTS.2014.7027043","DOIUrl":"https://doi.org/10.1109/EWDTS.2014.7027043","url":null,"abstract":"Over a finite field a transformation similar to discrete Fourier transform can be defined that can be efficiently implemented using fast algorithms. One of the main applications of such transformation is calculation of convolutions of long sequences of integers by means of integer arithmetic. In this paper a method of implementation of two vectors convolution using modular arithmetic with Proth-type modulo is considered. A device performing cyclic convolution using modular arithmetic was created. A comparison with binary analogues was carried out.","PeriodicalId":272780,"journal":{"name":"Proceedings of IEEE East-West Design & Test Symposium (EWDTS 2014)","volume":"217 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2014-09-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"116062716","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 6
The modeling of electromagnetic fields intensity in urban development condition 城市发展条件下的电磁场强度建模
Proceedings of IEEE East-West Design & Test Symposium (EWDTS 2014) Pub Date : 2014-09-01 DOI: 10.1109/EWDTS.2014.7027049
M. Anishin, G. F. Zargano, V. Zemlyakov, A. A. Hondu
{"title":"The modeling of electromagnetic fields intensity in urban development condition","authors":"M. Anishin, G. F. Zargano, V. Zemlyakov, A. A. Hondu","doi":"10.1109/EWDTS.2014.7027049","DOIUrl":"https://doi.org/10.1109/EWDTS.2014.7027049","url":null,"abstract":"This article is devoted to the questions of irradiation of citizens by electromagnetic fields. The algorithm of intensity calculation of electromagnetic radiation is described. The results of calculation sanitary protection zones and restriction zones for Rostov-on-Don are given.","PeriodicalId":272780,"journal":{"name":"Proceedings of IEEE East-West Design & Test Symposium (EWDTS 2014)","volume":"192 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2014-09-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"116521941","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Profiling of MES software requirements for the pharmaceutical enterprise 制药企业MES软件需求分析
Proceedings of IEEE East-West Design & Test Symposium (EWDTS 2014) Pub Date : 2014-09-01 DOI: 10.1109/EWDTS.2014.7027090
A. Fedoseeva, V. Kharchenko
{"title":"Profiling of MES software requirements for the pharmaceutical enterprise","authors":"A. Fedoseeva, V. Kharchenko","doi":"10.1109/EWDTS.2014.7027090","DOIUrl":"https://doi.org/10.1109/EWDTS.2014.7027090","url":null,"abstract":"Approach to safety assessment for manufacturing execution systems (MESs) of pharmaceutical enterprise based on the Safety Case methodology is proposed. Normative profile for MES software based on requirements of international standards, guidelines and technical reports of the pharmaceutical enterprise (PE) and general requirements to critical software is developed. The facet-hierarchical structure of requirements to the PE MES software is suggested.","PeriodicalId":272780,"journal":{"name":"Proceedings of IEEE East-West Design & Test Symposium (EWDTS 2014)","volume":"38 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2014-09-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"123187593","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 1
Method of free C++ code migration between SoC level tests and standalone IP-Core UVM environments 在SoC级测试和独立IP-Core UVM环境之间的免费c++代码迁移方法
Proceedings of IEEE East-West Design & Test Symposium (EWDTS 2014) Pub Date : 2014-09-01 DOI: 10.1109/EWDTS.2014.7027042
F. Putrya
{"title":"Method of free C++ code migration between SoC level tests and standalone IP-Core UVM environments","authors":"F. Putrya","doi":"10.1109/EWDTS.2014.7027042","DOIUrl":"https://doi.org/10.1109/EWDTS.2014.7027042","url":null,"abstract":"Common way for IP-Core standalone verification assumes UVM based environments and tests development. At the same time, IP-core integration verification at the SoC level and hardware-software co-verification as a whole, requires development of the code running on the embedded CPU (usually written on C/C++). When C/C++ tests and software are developed it is desirable to reuse IP-Core standalone level verification code, presented in the form of UVM sequences library. However, porting of UVM sequences to C++ is difficult because of differences in the organization of UVM and C++ programs. Moreover, SoC-level tests development often requires a lot of time for debugging and simulation. This paper proposes method of free verification code migration between the standalone IP-Core and the system level SoC environments, which increases code reuse efficiency and accelerates SoC level tests debugging.","PeriodicalId":272780,"journal":{"name":"Proceedings of IEEE East-West Design & Test Symposium (EWDTS 2014)","volume":"21 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2014-09-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"126369004","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 3
A new technique for layout based functional testing of modules in Digital Microfluidic Biochips 基于布局的数字微流控生物芯片模块功能测试新技术
Proceedings of IEEE East-West Design & Test Symposium (EWDTS 2014) Pub Date : 2014-09-01 DOI: 10.1109/EWDTS.2014.7027097
P. Roy, Samadrita Bhattacharya, H. Rahaman, P. Dasgupta
{"title":"A new technique for layout based functional testing of modules in Digital Microfluidic Biochips","authors":"P. Roy, Samadrita Bhattacharya, H. Rahaman, P. Dasgupta","doi":"10.1109/EWDTS.2014.7027097","DOIUrl":"https://doi.org/10.1109/EWDTS.2014.7027097","url":null,"abstract":"Microfluidic based biochips as a composite microsystem offers an alternative platform for conventional laboratory procedures. In recent years a new generation of such lab on chip devices namely Digital Microfluidic Biochip is emerged as a suitable application for concurrent and scalable integration of multiple bioassay protocols. Dependability and accuracy are major issues for safety critical applications of DMFBs specifically in the areas of clinical diagnostics and other biochemical applications. Functional testing is targeted towards assessment of reliability of basic microfluidic operations namely merging, mixing, splitting and incubation. In this paper we proposed a layout specific functional testing method that detects faults in a prespecified group of cells already placed within a 2D array for execution of a given bioassay protocol. The objective is to minimize the test completion time, optimize test resources and customize the test for prespecified cluster of cells to be utilized as modules dedicated for microfluidic operations. The simulation is carried out on testbenches of Benchmark suite III and the results are found to be encouraging.","PeriodicalId":272780,"journal":{"name":"Proceedings of IEEE East-West Design & Test Symposium (EWDTS 2014)","volume":"1 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2014-09-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"129511338","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
The precision voltage references for the radiation-hardened bi-FET technological process 辐射硬化双场效应管工艺过程的精密电压参考
Proceedings of IEEE East-West Design & Test Symposium (EWDTS 2014) Pub Date : 2014-09-01 DOI: 10.1109/EWDTS.2014.7027079
E. I. Starchenko, N. Prokopenko, V. Yugai
{"title":"The precision voltage references for the radiation-hardened bi-FET technological process","authors":"E. I. Starchenko, N. Prokopenko, V. Yugai","doi":"10.1109/EWDTS.2014.7027079","DOIUrl":"https://doi.org/10.1109/EWDTS.2014.7027079","url":null,"abstract":"The possibility of the construction of the voltage references (VR) is considered, the output voltage of which, unlike the majority of the well-known circuitry solutions, can be relatively liberally controlled and be either higher or lower than the band gap of the silicon. For these purposes the differential stage (DS) is used where the voltage power supply with negative temperature drift is connected to one of its inputs. As a result the current with negative temperature drift is formed in one arm of DR and the current with positive temperature drift is formed in another arm. When summing the currents we manage to obtain the temperature stable voltage from 0,2 V up to 3-4V at the temperature drift not worse than 10 ppm/K. Furthermore, the use of p-n-junction FETs with p-type channel in DS renders possible to achieve high radiation hardness at total dose up to 1 Mrad and neutron flux up to 1013 - 1014 n/cm2.","PeriodicalId":272780,"journal":{"name":"Proceedings of IEEE East-West Design & Test Symposium (EWDTS 2014)","volume":"26 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2014-09-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"129989245","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 1
Combinational circuits checking on the base of sum codes with one weighted data bit 基于一加权数据位和码的组合电路校验
Proceedings of IEEE East-West Design & Test Symposium (EWDTS 2014) Pub Date : 2014-09-01 DOI: 10.1109/EWDTS.2014.7027064
V. Sapozhnikov, V. Sapozhnikov, D. Efanov, D. Nikitin
{"title":"Combinational circuits checking on the base of sum codes with one weighted data bit","authors":"V. Sapozhnikov, V. Sapozhnikov, D. Efanov, D. Nikitin","doi":"10.1109/EWDTS.2014.7027064","DOIUrl":"https://doi.org/10.1109/EWDTS.2014.7027064","url":null,"abstract":"In this article the characteristics of on-bit and one weighted bit sum codes for distortions detection in concurrent error detection systems (CED systems) are described. Conditions under which the weight-based sum code will have all key characteristics of classic Berger code are established. Established features of weight-based sum codes in practice allow to choose the best coding option while organizing the on-line testing system.","PeriodicalId":272780,"journal":{"name":"Proceedings of IEEE East-West Design & Test Symposium (EWDTS 2014)","volume":"46 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2014-09-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"134578976","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 12
The levels of target resources development in computer systems 计算机系统中目标资源开发的水平
Proceedings of IEEE East-West Design & Test Symposium (EWDTS 2014) Pub Date : 2014-09-01 DOI: 10.1109/EWDTS.2014.7027104
J. Drozd, A. Drozd, D. Maevsky, L. Shapa
{"title":"The levels of target resources development in computer systems","authors":"J. Drozd, A. Drozd, D. Maevsky, L. Shapa","doi":"10.1109/EWDTS.2014.7027104","DOIUrl":"https://doi.org/10.1109/EWDTS.2014.7027104","url":null,"abstract":"The paper considers the resource development levels characterizing the improvement of computer systems and their components. It stresses that the traditional contradictions in the parameters of resources are eliminated with the level increase. The development levels of computer system hardware and software in the processes of both design universalization and specialization and green technology development are estimated.","PeriodicalId":272780,"journal":{"name":"Proceedings of IEEE East-West Design & Test Symposium (EWDTS 2014)","volume":"58 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2014-09-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"114994094","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 23
Multichannel Fast Affine Projection algorithm with Gradient Adaptive Step-Size and fast computation of adaptive filter output signal 基于梯度自适应步长的多通道快速仿射投影算法及自适应滤波输出信号的快速计算
Proceedings of IEEE East-West Design & Test Symposium (EWDTS 2014) Pub Date : 2014-09-01 DOI: 10.1109/EWDTS.2014.7027094
V. Djigan
{"title":"Multichannel Fast Affine Projection algorithm with Gradient Adaptive Step-Size and fast computation of adaptive filter output signal","authors":"V. Djigan","doi":"10.1109/EWDTS.2014.7027094","DOIUrl":"https://doi.org/10.1109/EWDTS.2014.7027094","url":null,"abstract":"The paper presents a computational procedure of a multichannel Fast Affine Projection algorithm. The procedure also includes Sliding Window linear prediction, Gradient Adaptive Step-Size and fast computation of adaptive filter output signal. An example of the algorithm application in a combined Feed-Forward and Feed Backward Active Noise Control system, which can be viewed as a two-channel adaptive filter, and simulation results are discussed.","PeriodicalId":272780,"journal":{"name":"Proceedings of IEEE East-West Design & Test Symposium (EWDTS 2014)","volume":"129 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2014-09-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"114521340","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 2
Mobile health applications to support diabetic patient and doctor 移动健康应用程序支持糖尿病患者和医生
Proceedings of IEEE East-West Design & Test Symposium (EWDTS 2014) Pub Date : 2014-09-01 DOI: 10.1109/EWDTS.2014.7027105
A. Petrenko
{"title":"Mobile health applications to support diabetic patient and doctor","authors":"A. Petrenko","doi":"10.1109/EWDTS.2014.7027105","DOIUrl":"https://doi.org/10.1109/EWDTS.2014.7027105","url":null,"abstract":"The Repository of services (web-applications with a unified interface) is proposed for patient care (care services), for planning and carrying out of treatment (treatment services) and to ensure the functioning the entire system (management services). Treatment of diabetes becomes personalized and customized because it is possible to build and adjust their treatment plan and workflow by selecting the necessary services for the individual patient, for the doctor and for application management which to be executed on cloud resources. It provides the secure, safe and committed healthcare to diabetes sufferers at any point of the country by creating facilities for everybody to check glucose meter (GM) and other vital parameters (say, blood pressure-BP) data at home and to make these data to be evaluable for his doctor in the form of the updating Electronic Health Records (EHR).","PeriodicalId":272780,"journal":{"name":"Proceedings of IEEE East-West Design & Test Symposium (EWDTS 2014)","volume":"91 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2014-09-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"126177649","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 3
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