2012 Second International Conference on Intelligent System Design and Engineering Application最新文献

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Algorithm for XML Data Consistency XML数据一致性算法
Meijuan Wang, Zhenghong Qiao, Yaqing Shi, Xiaoyu Lei
{"title":"Algorithm for XML Data Consistency","authors":"Meijuan Wang, Zhenghong Qiao, Yaqing Shi, Xiaoyu Lei","doi":"10.1109/ISDEA.2012.458","DOIUrl":"https://doi.org/10.1109/ISDEA.2012.458","url":null,"abstract":"As XML become the main stream data formats on Internet, achievements were made on XML normalization, however the majortities are limited in level structure. In this paper, we use the new definition of XML key for different kinds of data redundancy, consider from the inner relationship between XML elements and attributes, make direct normative processing on XML data, give the algorithm based on Key which can keep the consistency of XML data.","PeriodicalId":267532,"journal":{"name":"2012 Second International Conference on Intelligent System Design and Engineering Application","volume":"12 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2012-01-06","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"125926693","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Machine Design and Discussion of Curriculum Reform 机器设计与课程改革探讨
Jiang Zhi, D. Qin
{"title":"Machine Design and Discussion of Curriculum Reform","authors":"Jiang Zhi, D. Qin","doi":"10.1109/ISDEA.2012.722","DOIUrl":"https://doi.org/10.1109/ISDEA.2012.722","url":null,"abstract":"Mechanical design engineering colleges based course is highly practical in a comprehensive technology foundation courses, Professional courses for students plays a role as a bridge linking its professional coverage of about 80% of engineering class. In order to stimulate and develop students interest in learning, change boring as interesting, the content of the abstract simplicity to enhance students analyze and solve problems, to ensure the quality of teaching, the teaching methods were reformed.","PeriodicalId":267532,"journal":{"name":"2012 Second International Conference on Intelligent System Design and Engineering Application","volume":"43 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2012-01-06","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"126138594","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
A MPPT Control Method of PV System Based on Fuzzy Logic and Particle Swarm Optimization 基于模糊逻辑和粒子群优化的光伏系统最大功率控制方法
Yufeng Hu, Jun Liu, Bin Liu
{"title":"A MPPT Control Method of PV System Based on Fuzzy Logic and Particle Swarm Optimization","authors":"Yufeng Hu, Jun Liu, Bin Liu","doi":"10.1109/ISDEA.2012.404","DOIUrl":"https://doi.org/10.1109/ISDEA.2012.404","url":null,"abstract":"In the view of the fact that if crystalline silicon cell's photovoltaic system used for power output can not be controlled, it is hard to grantee the maximum power output, which will cause energy dissipation and high cost. Regarding the PV inverter system as a platform, while the controlling of crystalline silicon as a research object, the paper presents the MPPT control algorithm based on fuzzy logic and particle swarm optimization, which arrives at the maximum power tracking.","PeriodicalId":267532,"journal":{"name":"2012 Second International Conference on Intelligent System Design and Engineering Application","volume":"164 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2012-01-06","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"124262932","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 8
A Note on Synchronization of a Fractional Order Coullet Chaotic System 分数阶小波混沌系统的同步问题
Wen Tan, F. Jiang, Jianxun Liu, Min Chen
{"title":"A Note on Synchronization of a Fractional Order Coullet Chaotic System","authors":"Wen Tan, F. Jiang, Jianxun Liu, Min Chen","doi":"10.1109/ISDEA.2012.544","DOIUrl":"https://doi.org/10.1109/ISDEA.2012.544","url":null,"abstract":"In this paper, chaos synchronization problem of the fractional order Coullet system in a master-slave pattern is investigated by using the nonlinear feedback control method. Suitable synchronization conditions are analyzed based on the Lyapunov stability theory. And the synchronization of commensurate order Coullet chaotic system of the base order 0.98 is implemented by virtue of the method. Numerical simulations are provided to verify the performance of the proposed controller.","PeriodicalId":267532,"journal":{"name":"2012 Second International Conference on Intelligent System Design and Engineering Application","volume":"32 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2012-01-06","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"121555140","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Experimental Study of Producing 5N High Purity Aluminum by Segregation Method 偏析法制备5N高纯铝的实验研究
Li Liu, Shengxiang Deng, Y. Lai
{"title":"Experimental Study of Producing 5N High Purity Aluminum by Segregation Method","authors":"Li Liu, Shengxiang Deng, Y. Lai","doi":"10.1109/ISDEA.2012.736","DOIUrl":"https://doi.org/10.1109/ISDEA.2012.736","url":null,"abstract":"This paper makes an industrial experimental study of the influence of crystal growth characteristics, crystal growth striations and rotating magnetic field on the growth characteristics of ingot cellular crystal in the production process of high purity aluminum by vertical high purity aluminum directional solidification equipment and hereby optimizes productive and technical parameters, thereby successfully producing 5N large-diameter high purity aluminum ingots whose purity is greater than 99.999%.","PeriodicalId":267532,"journal":{"name":"2012 Second International Conference on Intelligent System Design and Engineering Application","volume":"42 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2012-01-06","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"130473981","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Learning Rate of Least Square Regressions with Some Kind of Mercer Kernel 一类Mercer核最小二乘回归的学习率
Bao-huai Sheng, Liqin Duan, Peixin Ye
{"title":"Learning Rate of Least Square Regressions with Some Kind of Mercer Kernel","authors":"Bao-huai Sheng, Liqin Duan, Peixin Ye","doi":"10.1109/ISDEA.2012.633","DOIUrl":"https://doi.org/10.1109/ISDEA.2012.633","url":null,"abstract":"We consider the error estimate of least square regression with data dependent hypothesis and coefficient regularization algorithms based on general kernel. When the kernel belongs to some kind of Mercer kernel, under a mild regularity condition on the regression function, we derive a dimensional-free learning rate m-1/6.","PeriodicalId":267532,"journal":{"name":"2012 Second International Conference on Intelligent System Design and Engineering Application","volume":"36 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2012-01-06","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"115025897","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Energy-Saving Emulsion Pump Automatic Control System 节能乳化液泵自动控制系统
C. Ting, Li Hong
{"title":"Energy-Saving Emulsion Pump Automatic Control System","authors":"C. Ting, Li Hong","doi":"10.1109/ISDEA.2012.668","DOIUrl":"https://doi.org/10.1109/ISDEA.2012.668","url":null,"abstract":"The energy loss problem of the emulsion pump has been garnered attention. Numerous surveys suggest that the old emulsion pump systems do a bad jobs in the energy -saving. In this paper, a automatic control system is proposed based on SCM(Single Chip Micyoco), using the sensors feed backing the real-time state of the emulsion pump and then the control system doing the proper adjustment. This control system has been using in a few coal mines, and the practice indicates that the automatic control system can reduce the idle work by the emulsion pump and reduce the energy loss.","PeriodicalId":267532,"journal":{"name":"2012 Second International Conference on Intelligent System Design and Engineering Application","volume":"24 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2012-01-06","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"132712775","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 3
Novel Failure Isolation Techniques for Circuits Sensitive to Microprobe 微探针敏感电路的新型故障隔离技术
Diwei Fan, Miao Wu, J. Yu, Winter Wang, Chunlei Wu, Jinglong Li, Li Tian
{"title":"Novel Failure Isolation Techniques for Circuits Sensitive to Microprobe","authors":"Diwei Fan, Miao Wu, J. Yu, Winter Wang, Chunlei Wu, Jinglong Li, Li Tian","doi":"10.1109/ISDEA.2012.399","DOIUrl":"https://doi.org/10.1109/ISDEA.2012.399","url":null,"abstract":"Voltage measurement of test pad directly by microprobe is typical technique in circuit isolation stage of failure analysis. But in some special circuits which are sensitive to microprobe, the voltage of some test pads will change when microprobe needle touches the test pads. Hence it is necessary to develop new measurement skills to confirm test pad status instead of measuring voltage directly. This paper introduces several novel measurement methods to solve this issue and demonstrates these skills with real cases.","PeriodicalId":267532,"journal":{"name":"2012 Second International Conference on Intelligent System Design and Engineering Application","volume":"9 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2012-01-06","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"131097295","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 3
Cover System in Dynamic Environment 动态环境下的覆盖系统
Jun Lai, Wei Tang, Feng Jiang
{"title":"Cover System in Dynamic Environment","authors":"Jun Lai, Wei Tang, Feng Jiang","doi":"10.1109/ISDEA.2012.391","DOIUrl":"https://doi.org/10.1109/ISDEA.2012.391","url":null,"abstract":"This paper proposes a cover system including two methods for finding cover, named static annotation and the dynamic checking algorithm. Finally, the system is tested in the UDK environment. As results, it can be concluded that the approach to established can be successfully applied in dynamic environment.","PeriodicalId":267532,"journal":{"name":"2012 Second International Conference on Intelligent System Design and Engineering Application","volume":"3 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2012-01-06","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"129458971","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 2
ATPG of Digital Electronic Systems BIST Based on D-PL Chaotic Model 基于D-PL混沌模型的数字电子系统BIST的ATPG
Min Zhu, Yu Chen, Chunling Yang, Dong-yang Zhao
{"title":"ATPG of Digital Electronic Systems BIST Based on D-PL Chaotic Model","authors":"Min Zhu, Yu Chen, Chunling Yang, Dong-yang Zhao","doi":"10.1109/ISDEA.2012.514","DOIUrl":"https://doi.org/10.1109/ISDEA.2012.514","url":null,"abstract":"A D-PL ( Digital-PL) chaotic model was proposed to construct ATPG (Automatic Test Pattern Generation) of BIST (Built in Self Test) in this paper. The D-PL chaotic model is improvement of the traditional continuous PL chaotic model. The coefficient of power of 2 was used for traditional PL chaos discrete processing. This approach is conducive to the realization of hardware. Shift registers and accumulator adopted to implement iteration avoiding the direct use of the multiplier. This method can effectively reduce the circuits area After parameters optimization, the D-PL chaotic model ATPG was applied for testing digital circuits. Experiment results show that the proposed D-PL chaotic model ATPG has good randomness and ergodicity. The test pattern of D-PL Model has no correlation. It can effectively improve the digital circuits fault detection rate in BIST.","PeriodicalId":267532,"journal":{"name":"2012 Second International Conference on Intelligent System Design and Engineering Application","volume":"1 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2012-01-06","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"129830108","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 2
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