Peter R. Wilson, Y. Kiliç, M. Ieee, J. Ross, Mark Zwolinski, Andrew D. Brown
{"title":"Behavioural modelling of operational amplifier faults using analogue hardware description languages","authors":"Peter R. Wilson, Y. Kiliç, M. Ieee, J. Ross, Mark Zwolinski, Andrew D. Brown","doi":"10.1109/BMAS.2001.962506","DOIUrl":"https://doi.org/10.1109/BMAS.2001.962506","url":null,"abstract":"The use of behavioural modelling for operational amplifiers has been well known for many years and previous work has included modelling of specific fault conditions using a macro-model. In this paper, the models are implemented in a more abstract form using analogue hardware description languages (HDL), including MAST, taking advantage of the ability to control the behaviour of the model using high-level fault condition states. The implementation method allows a range of fault conditions to be integrated without switching to a completely new model. The various transistor faults are categorised, and used to characterise the behaviour of the HDL models. Simulations compare the accuracy and speed of the transistor and behavioural level models under a set of representative fault conditions.","PeriodicalId":262433,"journal":{"name":"Proceedings of the Fifth IEEE International Workshop on Behavioral Modeling and Simulation. BMAS 2001 (Cat No.01TH8601)","volume":"1 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2001-10-10","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"129952439","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Wei-Jean Liu, O. Chen, L. Dai, P. Weng, Kaung-Hsin Huang, F. Jih
{"title":"A CMOS photodiode model","authors":"Wei-Jean Liu, O. Chen, L. Dai, P. Weng, Kaung-Hsin Huang, F. Jih","doi":"10.1109/BMAS.2001.962505","DOIUrl":"https://doi.org/10.1109/BMAS.2001.962505","url":null,"abstract":"This paper utilizes the concepts of equilibrium equations and minority carrier continuity to build and derive a CMOS photodiode model. By using the TSMC 1P3M 0.5 /spl mu/m CMOS technology, photodiodes with two different types of N/sub well/-P/sub Epitaxial/-P/sub substrate/ and N/sub diffusion/-P/sub well/-P/sub Epitaxial/-P/sub su/ /sub bstrate/ were fabricated. Measurements were done to test the photoresponse from 400 nm to 1000 nm. To simulate the photoresponses of N/sub well/-P/sub Epitaxial/-P/sub substrate/ and N/sub diffusion/-P/sub well/-P/sub Epitaxial/-P/sub su/ /sub bstrate/ photodiodes using the proposed model, if an inadequate value of the surface recombination velocity which is affected by the surface defects in the manufacture process is utilized, the proposed model would yield a little larger error in estimating the photoresponse in a shorter wavelength. To overcome this problem, the curve mapping scheme is applied to find the adequate boundary condition of the surface recombination velocity with the least mean squared error thus allowing the proposed model to achieve a good performance. The concept of the model proposed herein could be utilized in designing any CMOS photodiode for simulating its photo-electronic characteristics in various industrial applications.","PeriodicalId":262433,"journal":{"name":"Proceedings of the Fifth IEEE International Workshop on Behavioral Modeling and Simulation. BMAS 2001 (Cat No.01TH8601)","volume":"89 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2001-10-10","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"124591211","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"Behavioural modeling of microwave oscillating amplifiers","authors":"E. Calandra, R. Ruggirello","doi":"10.1109/BMAS.2001.962491","DOIUrl":"https://doi.org/10.1109/BMAS.2001.962491","url":null,"abstract":"The problem of deriving, from experimental data, a behavioral nonlinear model capable of predicting the dynamical response of microwave oscillating amplifiers (either continuous-wave or pulsed) is addressed. Experimental results are reported, showing that a good simulation accuracy can be combined with an excellent computational efficiency by resorting to a black-box modeling approach in the stroboscopic time domain, in which the oscillating amplifier is described by an algebraic-differential set of fundamental frequency phasor equations that can be considered as a \"three-port\" extended Van der Pol (3P-E-VdP) model of the embedded synchronized oscillator. An additional advantage of the proposed behavioral approach over standard, detailed, equivalent circuit modeling techniques is the small number of unknown model parameters that have to be identified and the fact that their values can be rather straightforwardly extracted from experimental data obtained from conventional microwave measuring apparatus.","PeriodicalId":262433,"journal":{"name":"Proceedings of the Fifth IEEE International Workshop on Behavioral Modeling and Simulation. BMAS 2001 (Cat No.01TH8601)","volume":"7 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2001-10-10","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"134034097","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"An extensible compact model description language and compiler","authors":"R.V.H. Booth","doi":"10.1109/BMAS.2001.962495","DOIUrl":"https://doi.org/10.1109/BMAS.2001.962495","url":null,"abstract":"We describe the compact model compiler approach to developing and supporting compact device models. A single model specification and model compiler tool support circuit simulation, parameter extraction and documentation. We present three examples of the model compiler approach: a compact transistor model, a bandgap reference circuit and a flip-flop.","PeriodicalId":262433,"journal":{"name":"Proceedings of the Fifth IEEE International Workshop on Behavioral Modeling and Simulation. BMAS 2001 (Cat No.01TH8601)","volume":"40 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2001-10-10","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"115213946","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"Requirements for object-oriented systems modeling with STEAMS","authors":"G. D. Peterson, P. Wilsey","doi":"10.1109/BMAS.2001.962496","DOIUrl":"https://doi.org/10.1109/BMAS.2001.962496","url":null,"abstract":"Designers face the challenge of specifying and implementing complicated mixed-technology systems. In order to better address mixed-signal designs, the VHDL-AMS and Verilog-AMS languages have been developed. These languages provide powerful capabilities to model and simulate behaviors in both the continuous and discrete time domains. Contemporaneously, the control systems community developed the object-oriented Modelica language to support the specification and continuous time modeling of complex control systems. The STEAMS (SUAVE and Tennessee Extensions for Analog and Mixed-Signal Systems) effort strives to provide an object-oriented systems specification and modeling language that supports both discrete and continuous time behaviors. STEAMS enables the modeling of interacting continuous and discrete time components coupled with the modeling productivity benefits associated with object-oriented techniques. This paper presents the requirements and rationale for the STEAMS language development effort, including modeling deficiencies facing the VHDL-AMS user community.","PeriodicalId":262433,"journal":{"name":"Proceedings of the Fifth IEEE International Workshop on Behavioral Modeling and Simulation. BMAS 2001 (Cat No.01TH8601)","volume":"7 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2001-10-10","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"116970968","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"The virtual disk drive-mixed-domain support for disk electronics over the complete life-cycle","authors":"G. Pelz","doi":"10.1109/BMAS.2001.962499","DOIUrl":"https://doi.org/10.1109/BMAS.2001.962499","url":null,"abstract":"This paper is about high-level, mixed-domain modeling to support a product through its complete lifecycle, from concept phase over circuit design and testing to application engineering in field. This is illustrated through an example, which is the electronics for a disk drive system comprising digital and analog/power electronics, mechanics and the respective firmware.","PeriodicalId":262433,"journal":{"name":"Proceedings of the Fifth IEEE International Workshop on Behavioral Modeling and Simulation. BMAS 2001 (Cat No.01TH8601)","volume":"28 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2001-10-10","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"125855596","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
N. Milet-Lewis, G. Monnerie, A. Fakhfakh, D. Geoffroy, Y. Hervé, Herve Levi, J. Charlot
{"title":"A VHDL-AMS library of RF blocks models","authors":"N. Milet-Lewis, G. Monnerie, A. Fakhfakh, D. Geoffroy, Y. Hervé, Herve Levi, J. Charlot","doi":"10.1109/BMAS.2001.962490","DOIUrl":"https://doi.org/10.1109/BMAS.2001.962490","url":null,"abstract":"This paper presents a behavioral model library of analogue and mixed circuits used in the radio-frequency domain. The models are described in VHDL-AMS and are carefully documented and validated, in order to be easily used by designers or model developers. These models allow one to explore systems architecture easily and rapidly.","PeriodicalId":262433,"journal":{"name":"Proceedings of the Fifth IEEE International Workshop on Behavioral Modeling and Simulation. BMAS 2001 (Cat No.01TH8601)","volume":"5 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2001-10-10","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"132287392","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"Pole-zero localization: a behavioral modeling approach","authors":"C. S. Gathercole, H. Mantooth","doi":"10.1109/BMAS.2001.962498","DOIUrl":"https://doi.org/10.1109/BMAS.2001.962498","url":null,"abstract":"A behavioral modeling procedure has been developed that enables the movement of poles and zeros to be modeled with changes in operating conditions. A major component of this procedure, known as the root localization algorithm, identifies when such an approach is applicable, resulting in models that more accurately reflect the distinctive behavior of the circuit.","PeriodicalId":262433,"journal":{"name":"Proceedings of the Fifth IEEE International Workshop on Behavioral Modeling and Simulation. BMAS 2001 (Cat No.01TH8601)","volume":"9 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2001-10-10","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"127780584","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"Fast evaluation of digital switching noise for synthesis of mixed-signal applications","authors":"A. Doboli, R. Vemuri","doi":"10.1109/BMAS.2001.962494","DOIUrl":"https://doi.org/10.1109/BMAS.2001.962494","url":null,"abstract":"This paper presents a novel symbolic analysis method for transient analysis of digital switching noise (DSN). The method relies on symbolic techniques to express the voltage variations at the power pins of analog blocks depending on the DSN at the switching digital blocks. The paper discusses the modeling of DSN propagation including the representation of the substrate coupling, contacts to the power supplies and power buses. Experiments support the correctness of the method and showed significant speed-ups of simulation time as related to SPICE simulation.","PeriodicalId":262433,"journal":{"name":"Proceedings of the Fifth IEEE International Workshop on Behavioral Modeling and Simulation. BMAS 2001 (Cat No.01TH8601)","volume":"316 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2001-10-10","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"126248436","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"Multi domain behavioral models of smart-power ICs for design integration in automotive applications","authors":"D. Metzner, J. Schafer, Chihao Xu","doi":"10.1109/BMAS.2001.962502","DOIUrl":"https://doi.org/10.1109/BMAS.2001.962502","url":null,"abstract":"A modeling methodology for behavioral models of smart-power IC is presented. These components typically consist of a few hundred to thousand transistors, which can be separated into digital (logic) and analog (electro-thermal) model equations. The preferred simulation tool in the automotive industry is presently SABER (MAST/sup (R)/ language). The resulting models enable system level simulations of the mechatronic application in a few minutes CPU time, compared to hours with a transistor level simulation of the IC alone.","PeriodicalId":262433,"journal":{"name":"Proceedings of the Fifth IEEE International Workshop on Behavioral Modeling and Simulation. BMAS 2001 (Cat No.01TH8601)","volume":"40 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2001-10-10","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"123275668","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}