{"title":"A New Approach to Nonlinear Modelling and Simulation of MESFETs and MODFETs","authors":"Hardy Sldzlk, I. Wolff","doi":"10.1109/EUMA.1990.336139","DOIUrl":"https://doi.org/10.1109/EUMA.1990.336139","url":null,"abstract":"A new method for the derivation of a FET-equivalent-circuit for large- and small-signal applications is presented. The model consists of nine bias-dependent intrinsic elements additionally eight linear extrinsic elements. All circuit-elements are determined from measured DC- and scattering-parameters with an analytical method at any bias-condition. The nonlinear behaviour of the intrinsic elements are expressed using two-dimensional spline-functions. The large-signal simulation considers all nonlinear intrinsic elements including the Schottky-diodes and the gate-drain avalanche breakdown.","PeriodicalId":248044,"journal":{"name":"1990 20th European Microwave Conference","volume":"34 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1990-10-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"121899585","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"Harmonic Describing Function: Application to Microwave Oscillator's Design","authors":"J. Gismero, Jorge Perez","doi":"10.1109/EUMA.1990.336231","DOIUrl":"https://doi.org/10.1109/EUMA.1990.336231","url":null,"abstract":"A classic description of negative-resistance devices through the first harmonic approach (Describing Function, DF) yields to results that can be insufficiently accurate or even inexact since the harmonic content in the control signals cannot be avoided a priori by the designer, so the basic condition for the application of DF is not fulfilled. In this paper, the use of a new approach, the \"Harmonic Describing Function\" (HDF), is proposed to study the nonlinear device behaviour without restrictions in the harmonic content of signals involved in the analysis. HDF, evaluated by means of harmonic balance technique, describes the nonlinear device together with the linear network in which it is integrated, so the harmonic content of signals appears as a result of the analysis.","PeriodicalId":248044,"journal":{"name":"1990 20th European Microwave Conference","volume":"1 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1990-10-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"129639485","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"Optimization of Power Added Efficiency and Third Order Intermodulation in Solid State Power Amplifiers, using Data Processing Software Coupled to Single Tone Active Source and Load-Pull System. Extension to Class F Operation","authors":"P. Bouysse, J. Nebus, J. Villotte, M. Aubourg","doi":"10.1109/EUMA.1990.336234","DOIUrl":"https://doi.org/10.1109/EUMA.1990.336234","url":null,"abstract":"A fully calibrated and automatized single-tone test set-up, using both active source and load-pull techniques allows to built an accurate data-file, characterizing any non-linear two-port device. Appropriate data processing routines provide optimized operating conditions of the device under test in terms of added power, efficiency and third order intermodulation. Therefore such a measurement system reveals to be a precious laboratory tool to aid optimized power-circuit design.","PeriodicalId":248044,"journal":{"name":"1990 20th European Microwave Conference","volume":"17 2 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1990-10-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"129651895","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
N. Boulanger, C. Rumelhard, B. Carnez, L. Boulanger, C. Sentubery
{"title":"On Wafer Automatic Three Ports Measurement System for MMIC Circuits and Dual Gate FETs","authors":"N. Boulanger, C. Rumelhard, B. Carnez, L. Boulanger, C. Sentubery","doi":"10.1109/EUMA.1990.336047","DOIUrl":"https://doi.org/10.1109/EUMA.1990.336047","url":null,"abstract":"Recent advances in monolithic design point out the need for accurate and repeatible \"S\" parameters measurements of three ports RF circuits such as dual gate FETs. This paper presents an automatic on wafer three ports system for frequencies up to 26.5 GHz consisting of a two ports Network Analyser and wafer probes, that is used to provide RF measurements of three ports devices and to extract the model of dual gate FETs. On wafer calibration method including the open short load and transmission technique with on GaAs standards is used, probe techniques for making the best possible on wafer measurements and a range of measurement applications are examined.","PeriodicalId":248044,"journal":{"name":"1990 20th European Microwave Conference","volume":"1 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1990-10-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"130378093","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"Mergence of Microwave and Optical Technologies in Communications","authors":"A. Kuchar","doi":"10.1109/EUMA.1990.336167","DOIUrl":"https://doi.org/10.1109/EUMA.1990.336167","url":null,"abstract":"In this paper, we examine the trend to symbiosis and convergence of microwave, optoelectronic and lightwave technologies in communication and other closely related systems, such as radars. We outline the bandwidth limitations of optical fibre links employing semiconductor optical sources and detectors and review the properties of optoelectronic devices relevant to high-speed communication. We consider transmission of digital as well as analogue signals. We give examples of microwave/optical communication systems and discuss the possibilities of creating new network architectures based on synergy of microwave and optical technologies.","PeriodicalId":248044,"journal":{"name":"1990 20th European Microwave Conference","volume":"37 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1990-10-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"121219206","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
I. Vendik, G. L. Osipyan, V. Pchelkin, A. Shchepak
{"title":"Low-Dimensional Conductors in Microwave Electronics","authors":"I. Vendik, G. L. Osipyan, V. Pchelkin, A. Shchepak","doi":"10.1109/EUMA.1990.336064","DOIUrl":"https://doi.org/10.1109/EUMA.1990.336064","url":null,"abstract":"Low dimensional conductors (LDC) showing a strong anisotropy of crystal structure and electron properties are characterized by the Peierls metal-insulator transition accompanied by charge density wave (CDW) formation. The CDW contribution to conductivity of such conductors results in unusual electric properties: frequency and electric field dependent conductivity, current oscillations, etc. These properties ensure possible practical applications of LDC's in microwave electronics: sensitive bolometers as well as expanded dynamic range mixers and electrically and optically controlled switches. The bulk nonlinear properties of these materials are used, which leads to simple designs, eliminating the need for submicron technique. LDC's exhibit nonconventional electric properties which enables their possible applications in microwave electronics to be discussed. They have an anisotropic crystal structure accompanied by a strong anisotropy of electric properties. Quasi-one-dimensional conductors CID) are characterized by the presence of well conducting stacks of molecules which are weaakly bounded to each other and similar to a system of metallic filaments inserted into a dielectric matrix. In quassi-two-dimensional conductors (92D0) t he highi conductivity exists in a crystallographic plane.","PeriodicalId":248044,"journal":{"name":"1990 20th European Microwave Conference","volume":"61 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1990-10-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"116479026","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"Improvements of Spectral Domain Analysis Techniques for Arbitrary Planar Circuits","authors":"T. Becks, I. Wolff","doi":"10.1109/EUMA.1990.336198","DOIUrl":"https://doi.org/10.1109/EUMA.1990.336198","url":null,"abstract":"Spectral domain analysis techniques using roof-top functions as expansion functions for the surface current density have proofed to lead to a flexible tool for the calculation of arbitrarily shaped planar microwave structures. Several improvements of this method e.g. the introduction of new integration paths and analytic integration of a separated part of the dyadic function which reduce the computation time and which for the first time introduce losses (without using perturbation techniques) into the spectral domain analysis will be described. Furthermore the influence of surface waves and radiation is considered so that the transmission properties of planar microwave components can be described more realistically.","PeriodicalId":248044,"journal":{"name":"1990 20th European Microwave Conference","volume":"85 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1990-10-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"124140932","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"Dielectric Dual Ring Resonator for Millimeter Through Optical Wave Integrated Circuit","authors":"K. Matsumura, N. Ohki","doi":"10.1109/EUMA.1990.336218","DOIUrl":"https://doi.org/10.1109/EUMA.1990.336218","url":null,"abstract":"Frequency responses of an open type resonator constructed by coupled two dielectric rings which have different diameters (the diameters are relatively large compare to handling wavelength) are investigated theoretically and experimentally. It is found that the resonance frequency spacing of the resonator system is given by the Least Common Multiple (L.C.M.) of the resonance frequency spacing of each dielectric ring resonator. The quality factor (Q value) of this resonator system remains higher value. This dual ring resonator will be widely used for frequency discriminators in the millimeter through optical wave integrated circuits.","PeriodicalId":248044,"journal":{"name":"1990 20th European Microwave Conference","volume":"20 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1990-10-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"127612859","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"X-Band Homodyne Network Analyzer using a Broadband Computer-Controlled SSB-Modulator","authors":"B. Schonrock, R. Knochel","doi":"10.1109/EUMA.1990.336274","DOIUrl":"https://doi.org/10.1109/EUMA.1990.336274","url":null,"abstract":"A homodyne network analyzer (NWA) is presented that applies a novel SSB-modulator for modulating the test path. The unwanted or image sideband is suppressed more then 40 dB over the 8-12 GHz frequency range using a microcomputer to adjust the modulator to its optimal operating points. Measurements have been made with various test objects, confirming the applicability of the measurement procedure. Very fast measurement speed is possible.","PeriodicalId":248044,"journal":{"name":"1990 20th European Microwave Conference","volume":"17 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1990-10-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"126460636","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"A Pll Simulator for Education in a Radiocommiunication and Microwaves Laboratory","authors":"Jorge Perez, P. Dorta, G. González","doi":"10.1109/EUMA.1990.336308","DOIUrl":"https://doi.org/10.1109/EUMA.1990.336308","url":null,"abstract":"In this paper a new phase-locked loop simulator used to teach this topic in our laboratory will be described. It is a very good tool for real PLO and frequency synthesizers design. This simulator runs on XT and AT compatible PC's having a very high interactive and graphic capability. This working tool has been designed so that the student can visualize the most important characteristics of a microwave PLL subsytem and improve his own design.","PeriodicalId":248044,"journal":{"name":"1990 20th European Microwave Conference","volume":"112 3 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1990-10-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"121625592","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}