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2005 IEEE Instrumentationand Measurement Technology Conference Proceedings最新文献

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Spectral Signature Calculations for Remote Sensing 遥感光谱特征计算
2005 IEEE Instrumentationand Measurement Technology Conference Proceedings Pub Date : 2005-05-16 DOI: 10.1109/IMTC.2005.1604538
M. Yeary, T. Yu, S. Nematifar, A. Shapiro
{"title":"Spectral Signature Calculations for Remote Sensing","authors":"M. Yeary, T. Yu, S. Nematifar, A. Shapiro","doi":"10.1109/IMTC.2005.1604538","DOIUrl":"https://doi.org/10.1109/IMTC.2005.1604538","url":null,"abstract":"Remote sensing radar has shown to be an important tool to observe severe and hazardous weather and to provide operational forecasters prompt information of such rapidly evolving phenomena. Although the history of tornado measurements is long, there have been only a few successes in obtaining spectral signatures. This is largely because neither the technology to process spectra nor the technology to record voluminous amounts of time series data were available, except for a few customized systems. However, present day radar technology and computer resources are now advanced enough to study tornado spectral signature in a systematic manner. The research WSR-88D (weather surveillance radar) locally operated by the National Severe Storm Laboratory (NSSL) in Norman has the unique capability of collecting massive volumes of Level I time series data over many hours which provides a rich environment for evaluating our new post-processing algorithms. In this work, an approach of identifying tornado vortices in Doppler spectra is proposed and investigated through the use of neural networks","PeriodicalId":244878,"journal":{"name":"2005 IEEE Instrumentationand Measurement Technology Conference Proceedings","volume":"32 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2005-05-16","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"114579562","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 4
A New Flame Monitor with Triple Photovoltaic Cells 一种新型三层光伏电池火焰监测仪
2005 IEEE Instrumentationand Measurement Technology Conference Proceedings Pub Date : 2005-05-16 DOI: 10.1109/IMTC.2005.1604577
Lijun Xu, Yong Yan
{"title":"A New Flame Monitor with Triple Photovoltaic Cells","authors":"Lijun Xu, Yong Yan","doi":"10.1109/IMTC.2005.1604577","DOIUrl":"https://doi.org/10.1109/IMTC.2005.1604577","url":null,"abstract":"Presented in this paper is a new flame monitor that uses three photovoltaic cells covering UV, visible and IR spectral bands respectively. A gain adjustable amplifier is incorporated into the monitor so that it is applicable to coal, oil or gas fired flames. Self-checking of the monitor is implemented through cross-correlation of the signals from the three cells and hence no additional self-checking hardware is required. Both flickering frequency and brightness of the flame are determined to monitor flame stability and to detect flame presence as well as sighting tube blockage. Unlike conventional single cell flame detectors, the new multi-cell device can still be in operation before being repaired after a cell-failure alarm has gone off. Experiments carried out on an industrial scale combustion test facility demonstrate the advantages of the new flame monitor over conventional flame detectors","PeriodicalId":244878,"journal":{"name":"2005 IEEE Instrumentationand Measurement Technology Conference Proceedings","volume":"48 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2005-05-16","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"114745601","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 4
Analysis of the Lift-off Effect of Phase Spectra for Eddy Current Sensors 涡流传感器相位谱的升离效应分析
2005 IEEE Instrumentationand Measurement Technology Conference Proceedings Pub Date : 2005-05-16 DOI: 10.1109/IMTC.2005.1604477
W. Yin, R. Binns, S. Dickinson, C. Davis, A. Peyton
{"title":"Analysis of the Lift-off Effect of Phase Spectra for Eddy Current Sensors","authors":"W. Yin, R. Binns, S. Dickinson, C. Davis, A. Peyton","doi":"10.1109/IMTC.2005.1604477","DOIUrl":"https://doi.org/10.1109/IMTC.2005.1604477","url":null,"abstract":"This paper presents an analytical model which describes the inductance change when a double air-cored coil sensor is placed next to a conducting plate. Analysis of the analytical model reveals that the phase signature of such sensor is virtually lift-off independent. This finding is verified by numerical evaluations. This paper also finds that the phase signature of a ferrite U-cored sensor can be approximated by that of a double air-cored sensor of similar size, and therefore possesses similar lift-off independent property. Measurements made with a sample U-cored sensor next to plates of non-magnetic and magnetic materials verified the theoretical results","PeriodicalId":244878,"journal":{"name":"2005 IEEE Instrumentationand Measurement Technology Conference Proceedings","volume":"44 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2005-05-16","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"115491544","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 24
Analysis of Crosstalk Effects on Mixed-Signal CMOS ICs with Different Mounting Technologies 不同安装工艺下混合信号CMOS串扰效应分析
2005 IEEE Instrumentationand Measurement Technology Conference Proceedings Pub Date : 2005-05-16 DOI: 10.1109/IMTC.2005.1604518
V. Ferragina, N. Ghittori, G. Torelli, G. Boselli, G. Trucco, V. Liberali
{"title":"Analysis of Crosstalk Effects on Mixed-Signal CMOS ICs with Different Mounting Technologies","authors":"V. Ferragina, N. Ghittori, G. Torelli, G. Boselli, G. Trucco, V. Liberali","doi":"10.1109/IMTC.2005.1604518","DOIUrl":"https://doi.org/10.1109/IMTC.2005.1604518","url":null,"abstract":"This paper presents an approach for analysis of crosstalk effects due to current pulses drawn from voltage supplies in mixed analog-digital CMOS integrated circuits. A test chip has been integrated and mounted in different ways, in order to compare measurements on chips mounted in package and mounted on board. The chip has been extensively simulated, using a realistic model of on-chip and off-chip parasitics, to study what happens on the analog section when digital switching noise is injected. Simulations results indicate that disturbances due to switching currents in digital blocks propagate through interconnection parasitics, and affect analog voltages, degrading circuit performance. Therefore, reduction of interconnection parasitics is essential in mixed-signal high-frequency circuits, such as radio-frequency front-ends. Measurements confirm simulation results","PeriodicalId":244878,"journal":{"name":"2005 IEEE Instrumentationand Measurement Technology Conference Proceedings","volume":"29 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2005-05-16","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"123092652","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 2
A Microcontroller-Based System for the Monitoring of a Fuel Cell Stack 基于微控制器的燃料电池堆监控系统
2005 IEEE Instrumentationand Measurement Technology Conference Proceedings Pub Date : 2005-05-16 DOI: 10.1109/IMTC.2005.1604354
G. Bucci, E. Fiorucci, F. Ciancetta, F. Vegliò
{"title":"A Microcontroller-Based System for the Monitoring of a Fuel Cell Stack","authors":"G. Bucci, E. Fiorucci, F. Ciancetta, F. Vegliò","doi":"10.1109/IMTC.2005.1604354","DOIUrl":"https://doi.org/10.1109/IMTC.2005.1604354","url":null,"abstract":"This paper describes the development of a monitoring and managing system for a PEM fuel-cell (FC) stack. This is a stand-alone unit that embodies two microcontrollers, hardware and sensing circuits, an LCD and a numeric pad. The proposed system acquires the most important gas parameters: mass flow rate, pressure and temperature. The output current and voltage are also acquired. The system design complies with the requirements of a portable FC based application. Additionally, results obtained during the experimental test are presented","PeriodicalId":244878,"journal":{"name":"2005 IEEE Instrumentationand Measurement Technology Conference Proceedings","volume":"24 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2005-05-16","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"123475852","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 5
Combating Reverberation in Speaker Verification 在扬声器验证中对抗混响
2005 IEEE Instrumentationand Measurement Technology Conference Proceedings Pub Date : 2005-05-16 DOI: 10.1109/IMTC.2005.1604205
J. Gammal, R. Goubran
{"title":"Combating Reverberation in Speaker Verification","authors":"J. Gammal, R. Goubran","doi":"10.1109/IMTC.2005.1604205","DOIUrl":"https://doi.org/10.1109/IMTC.2005.1604205","url":null,"abstract":"This paper investigates reverberation in speaker verification. Reverberant test speech degrades the performance of speaker verification algorithms. The effect of training with speech originating from reverberant environments that are different from that of the test speech is investigated. It was found that with the room impulse responses used, that training with speech that is less reverberant than the test speech always improved performance. A method was proposed to determine given a set of reverberant training speech segments corrupted with different transfer functions, which transfer function corrupted the speech. A classification rate of 96.5% was achieved","PeriodicalId":244878,"journal":{"name":"2005 IEEE Instrumentationand Measurement Technology Conference Proceedings","volume":"22 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2005-05-16","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"123591594","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 28
ARMAsel as a Language for Random Data ARMAsel作为一种随机数据语言
2005 IEEE Instrumentationand Measurement Technology Conference Proceedings Pub Date : 2005-05-16 DOI: 10.1109/IMTC.2005.1604408
P. Broersen
{"title":"ARMAsel as a Language for Random Data","authors":"P. Broersen","doi":"10.1109/IMTC.2005.1604408","DOIUrl":"https://doi.org/10.1109/IMTC.2005.1604408","url":null,"abstract":"Two different high order time series models represent a parametric spectral estimate that is exactly equal to the non-parametric periodogram. Hence, the raw material for parametric and for non-parametric spectral and autocorrelation analysis is the same. In non-parametric estimation, the periodogram is smoothed with a window to diminish or remove insignificant details. That gives a distortion to the details of all modified non-parametric estimates, defined by the shape and by the width of the window. In contrast, parametric time series models can eliminate higher order details without distorting the remaining lower order details. First, many candidate models are estimated, with different type and order. From those candidates, a single time series model is selected automatically, without user interaction. The selection of model order and model type with the ARMAsel algorithm lets the data speak and decide. Interesting alternative models are suggested by the estimated accuracies of all other candidates, in what can be called the language of the data","PeriodicalId":244878,"journal":{"name":"2005 IEEE Instrumentationand Measurement Technology Conference Proceedings","volume":"40 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2005-05-16","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"122726637","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 1
A New Generation Method of DSB-SC Signal for Radiated Immunity/Susceptibility Test Using Rotating-EM Fields and Its Basic Characteristics 旋转电磁场辐射免疫敏度试验DSB-SC信号生成新方法及其基本特性
2005 IEEE Instrumentationand Measurement Technology Conference Proceedings Pub Date : 2005-05-16 DOI: 10.1109/IMTC.2005.1604199
K. Murano, M. Tayarani, F. Xiao, Y. Kami
{"title":"A New Generation Method of DSB-SC Signal for Radiated Immunity/Susceptibility Test Using Rotating-EM Fields and Its Basic Characteristics","authors":"K. Murano, M. Tayarani, F. Xiao, Y. Kami","doi":"10.1109/IMTC.2005.1604199","DOIUrl":"https://doi.org/10.1109/IMTC.2005.1604199","url":null,"abstract":"A new generation technique of the double-side-band suppressed-carrier signals for radiated, radio frequency, immunity/susceptibility test using electromagnetic field of rotating polarization and its basic characteristics are studied. The signal can be easily generated with only one signal generator by using the technique. In this paper, the basic characteristics of the signals generated by using the technique proposed here are clarified, and the uniformity of the field generated in an anechoic chamber by using the signals is evaluated. In addition, a susceptibility test is conducted by using the new system to which the proposed technique is applied. From these results, the effectiveness of our proposed system is confirmed","PeriodicalId":244878,"journal":{"name":"2005 IEEE Instrumentationand Measurement Technology Conference Proceedings","volume":"64 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2005-05-16","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"122899044","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Compact System for Photometric Characterization of Automotive Headlamps 汽车前照灯光度表征的紧凑型系统
2005 IEEE Instrumentationand Measurement Technology Conference Proceedings Pub Date : 2005-05-16 DOI: 10.1109/IMTC.2005.1604453
M. Cattoen, S. Royo, M. J. Arranz, J. Arasa, H. Seat
{"title":"Compact System for Photometric Characterization of Automotive Headlamps","authors":"M. Cattoen, S. Royo, M. J. Arranz, J. Arasa, H. Seat","doi":"10.1109/IMTC.2005.1604453","DOIUrl":"https://doi.org/10.1109/IMTC.2005.1604453","url":null,"abstract":"We present a system allowing the determination of the distribution of light at any given distance (e.g. 25m) from a light source, by measuring the intensity and direction of the illumination distribution at a closer distance (e.g. near 20 cm). The measurement principle is based on the acquisition of images taken by a CCD matrix-sensor through an optical system focused at infinity. A sequence of images is obtained by moving the camera at different positions in front of the source. The process involves the accumulation of shifted images and corrections for optics (geometrical distortion and vignetting) and electronic shutter (exposure time). We describe the developed experimental set-up and the calibration procedures needed to obtain absolute photometric values. We present results obtained for automotive headlamps: computed relative illumination distribution is very similar to that obtained using a reference given by a measurement tool using a lightmeter. Absolute calibration of the system is performed from the set of measured points","PeriodicalId":244878,"journal":{"name":"2005 IEEE Instrumentationand Measurement Technology Conference Proceedings","volume":"133 5 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2005-05-16","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"124254936","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 7
Dependence of a Thermoresistive Sensor-Based Constant Temperature Measurement Instrument Response on DC Amplifier Input Offset Voltage 基于热阻传感器的恒温测量仪响应与直流放大器输入偏置电压的关系
2005 IEEE Instrumentationand Measurement Technology Conference Proceedings Pub Date : 2005-05-16 DOI: 10.1109/IMTC.2005.1604414
G. Araújo, R. Freire, J.F. da Silva, S. Catunda, G. Fontgalland
{"title":"Dependence of a Thermoresistive Sensor-Based Constant Temperature Measurement Instrument Response on DC Amplifier Input Offset Voltage","authors":"G. Araújo, R. Freire, J.F. da Silva, S. Catunda, G. Fontgalland","doi":"10.1109/IMTC.2005.1604414","DOIUrl":"https://doi.org/10.1109/IMTC.2005.1604414","url":null,"abstract":"In this paper is analyzed the dependence of the temporal response of a thermoresistive sensor-based, feedback constant temperature circuit on the input offset voltage of the operational amplifier employed in the circuit. Experimental results of the performance evaluation of a proposed feedback automatic input offset control circuit are presented","PeriodicalId":244878,"journal":{"name":"2005 IEEE Instrumentationand Measurement Technology Conference Proceedings","volume":"7 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2005-05-16","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"129268440","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 3
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