X-Ray Spectrometry最新文献

{"title":"Analysis of lichen and moss samples by the EDXRF method","authors":"P. Zuzaan, Z. Batsuren, O. Enkhtuya, E. Sosorburam, Bolortuya Damdinsuren","doi":"10.1002/xrs.3442","DOIUrl":"https://doi.org/10.1002/xrs.3442","url":null,"abstract":"This research presents the contents of K, Ca, Ti, Mn, Fe, Ni, Cu, Zn, Rb, Sr, and Pb in lichen and moss samples used as biomonitors of air pollution collected in Ulaanbaatar city. X‐ray fluorescence (XRF) methods were used, employing for excitation a Pd X‐ray tube with a molybdenum secondary target. Matrix effects were corrected by the use of normalization for the coherent and incoherent scattered peak, in this way the determination is more efficient. For quality control of the results, comparisons were made with results from other certified laboratories. No significant differences were found between the different techniques. The elemental distribution patterns obtained for each metal were associated with different pollution sources, thus contributing to the assessment of air pollution in Ulaanbaatar.","PeriodicalId":23867,"journal":{"name":"X-Ray Spectrometry","volume":null,"pages":null},"PeriodicalIF":1.2,"publicationDate":"2024-07-04","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"141548227","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":4,"RegionCategory":"物理与天体物理","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

{"title":"Biomonitoring of urban industrial pollution using total reflection X‐ray fluorescence","authors":"M. Schmeling, M. Gende, A. Tovar","doi":"10.1002/xrs.3439","DOIUrl":"https://doi.org/10.1002/xrs.3439","url":null,"abstract":"Environmental pollution as a result of industrial activity is widespread in many urban areas including Chicago. In an effort to evaluate the heavy metal fraction originating from industrial activities, plant samples of <jats:italic>Daucus Carota</jats:italic> or wild carrot were collected at or adjacent to six sites located in two of Chicago's designated industrial corridors. Plants, especially herbaceous species, have been deemed suitable as environmental pollution monitors as they are able to provide information about the heavy metal fraction accessible to biota. The leaves of <jats:italic>Daucus Carota</jats:italic> were acid digested and analyzed with total reflection X‐ray fluorescence spectrometry TXRF. The results showed elevated heavy metal mass fractions for at least one collection site which is close to an operational railyard. Other studies investigating heavy metals in proximity to railroad operations found elevated mass fractions for several elements, but specifically manganese as well. This suggests that abrasion from shunting and breaking releases certain pollutants into the local environment. The data were compared with studies executed in Rome, Italy, and Pakistan, which used <jats:italic>Daucus Carota</jats:italic> to evaluate heavy metal pollution. It was found that the heavy metal mass fractions obtained for Chicago were higher for some elements indicating an increased pollutant burden for these elements. The same samples were also analyzed by graphite furnace atomic absorption spectrometry GFAAS for the elements copper and lead and the data compared. Those two elements were chosen as they were present at each location and GFAAS has proven to be highly sensitive for them. It was found that the two methods provided comparable results for copper, whereas for lead, TXRF overestimated the mass fractions most likely due to limitations of the spectra evaluation software. The analysis of a certified reference material ‘BCR 679 white cabbage’ showed that most data obtained by TXRF were in good agreement with the certified values, with the exception of lead, which was not certified. However, since GFAAS has high sensitivity toward lead and is considered reference method for that element by regulatory agencies, a comparison between GFAAS and TXRF data for lead in the same sample can serve as good indicator for TXRF performance.","PeriodicalId":23867,"journal":{"name":"X-Ray Spectrometry","volume":null,"pages":null},"PeriodicalIF":1.2,"publicationDate":"2024-06-25","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"141508116","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":4,"RegionCategory":"物理与天体物理","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

{"title":"Depth‐resolved historical painting study with minimal microsampling, illustrated with a newly discovered Botticelli workshop painting","authors":"José Tapia, M. Eveno, É. Laval, I. Reiche","doi":"10.1002/xrs.3430","DOIUrl":"https://doi.org/10.1002/xrs.3430","url":null,"abstract":"A painting from the Botticelli workshop has been studied after its recent discovery, with an innovative and noninvasive approach combining two‐ dimensional scanning macro‐x‐ray fluorescence imaging (MA‐XRF) and a laboratory‐based depth‐resolved site‐selective confocal micro‐x‐ray fluorescence (CXRF) device. These analyses were supported by measurements on cross‐sections taken from the artwork using scanning electron microscopy coupled with an energy‐dispersive x‐ray system. The aims of this study are to confirm the painting's attribution and authentication, find characteristic markers and features, understand the artist's technique, materials used, and palette, and all of it while reducing sampling. The analyzing approach used combines imaging and site‐selective techniques while avoiding, reducing and replacing sampling without compromising the results. Chemical maps of the painting were obtained by MA‐XRF and enabled the identification of zones, colors, and chemical elements of interest alongside with a first assumption on the pigments used. Depth profiles were then performed in precise areas and colors using CXRF, allowing to evidence overlaying paint layers and obtain a more complete 3D vision of the painting. Contrasting the findings using this new methodology with the traditionally employed analysis process involving microsampling allowed us to determine the accuracy and veracity of our conclusions.","PeriodicalId":23867,"journal":{"name":"X-Ray Spectrometry","volume":null,"pages":null},"PeriodicalIF":1.2,"publicationDate":"2024-05-15","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"140974969","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":4,"RegionCategory":"物理与天体物理","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

{"title":"Investigation of the X‐ray fluorescence technique in the characterization of Ni coatings applied to historical heritage studies","authors":"Paula Silveira, Hugo Marcelo Veit, Johnny Dias, Tiago Falcade","doi":"10.1002/xrs.3429","DOIUrl":"https://doi.org/10.1002/xrs.3429","url":null,"abstract":"Historical heritage pieces allow a better comprehension of the characteristics of different civilizations over time. The characterization of such pieces is of paramount importance for their preservation. Energy‐dispersive X‐ray fluorescence (EDXRF) is recommended for this application, mostly because it is non‐destructive and the equipment is portable. However, one of its limitations is the difficulty in separating the signal from the substrate and the coating of multilayered samples, as it does not provide depth resolution. This project investigates the application of EDXRF in the characterization of metallic coatings, in the context of historical heritage. The elemental concentration of electrodeposited Ni coatings onto carbon steel substrates was obtained from EDXRF analyses. The relationship between the layer thickness and the variation of the Kα/Kβ intensity ratio of nickel peaks was exploited and the thicknesses of the coatings were estimated through EDXRF measurements. For comparison, particle‐induced x‐ray emission spectroscopy and scanning electron microscopy of the cross‐section were employed, providing a depth profile of the coatings. The estimated thicknesses from EDXRF analysis were comparable to those observed in the microscopy images for thinner films (up to 8 μm). On the other hand, for thicker films, the thicknesses were underestimated, due to the technique's depth limit and matrix effects, as secondary absorption. Despite these limitations, EDXRF remains valuable for evaluating cultural heritage pieces, often providing sufficient information to address authenticity concerns or to guide restoration processes. A case study was also performed to apply the methodology discussed on historical metallic pieces.","PeriodicalId":23867,"journal":{"name":"X-Ray Spectrometry","volume":null,"pages":null},"PeriodicalIF":1.2,"publicationDate":"2024-05-04","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"140841815","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":4,"RegionCategory":"物理与天体物理","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

{"title":"High‐resolution x‐ray emission spectrometry in the lithium K range with a reflection zone plate spectrometer","authors":"Khalil Hassebi, Nicolas Rividi, Michel Fialin, Anne Verlaguet, Gaston Godard, Jürgen Probst, Heike Löchel, Thomas Krist, Christoph Braig, Christian Seifert, Rabah Benbalagh, Régis Vacheresse, Vita Ilakovac, Karine Le Guen, Philippe Jonnard","doi":"10.1002/xrs.3427","DOIUrl":"https://doi.org/10.1002/xrs.3427","url":null,"abstract":"Implementing a newly developed spectrometer for the soft x‐ray range of (35–130) eV based on reflection zone plates was successfully accomplished on an electron probe microanalyzer. In this context, we present the first spectra acquired using this setup, including those of elements such as Be (Kα), C (Kα), Mg (L<jats:sub>2,3</jats:sub>), Al (L<jats:sub>2,3</jats:sub>), and Si (L<jats:sub>2,3</jats:sub>). We have also conducted an analysis of several lithium compounds and measured the emission of Li Kα from metallic Li, LiF, and LiNbO<jats:sub>3</jats:sub>. Some of the results were compared with density functional theory calculations. The spectrum obtained for the lithium‐bearing mineral amblygonite Li<jats:sub>0.75</jats:sub>Na<jats:sub>0.25</jats:sub>Al(PO<jats:sub>4</jats:sub>)F<jats:sub>0.75</jats:sub>(OH)<jats:sub>0.25</jats:sub> is chosen to discuss some of the challenges faced.","PeriodicalId":23867,"journal":{"name":"X-Ray Spectrometry","volume":null,"pages":null},"PeriodicalIF":1.2,"publicationDate":"2024-04-18","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"140629450","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":4,"RegionCategory":"物理与天体物理","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

{"title":"Investigation of rare‐metal granites, pegmatites, and metasomatites minerals of Mongolia by scanning electron microscopy and x‐ray electron probe microanalysis methods","authors":"Olga Yu. Belozerova, Victor S. Antipin, Larisa V. Kushch, D. Odgerel","doi":"10.1002/xrs.3428","DOIUrl":"https://doi.org/10.1002/xrs.3428","url":null,"abstract":"The multicomponent technique of x‐ray electron probe microanalysis for rock‐forming and minor minerals of granites, pegmatites, and metasomatites was developed using the scanning electron microscopy (SEM) and x‐ray electron probe microanalysis (EPMA) methods. The conditions for excitation and recording of elements analytical lines were chosen taking into account the properties of the investigated material. The distortion of analytical signal due to the effect of mutual overlapping of determined elements analytical lines was corrected using overlap coefficients, previously determined on the samples that did not contain the determined element. An assessment of metrological characteristics of EPMA technique showed, that it satisfies the requirements for the second category of quality of quantitative determinations and the second category of analyses adopted in the International Program for Professional Testing of Geoanalytical Laboratories (GeoPT). This developed technique was used for studying rare‐metal granites, pegmatites, and metasomatites of Central Mongolia (multiphase Baga Gazriin massif).","PeriodicalId":23867,"journal":{"name":"X-Ray Spectrometry","volume":null,"pages":null},"PeriodicalIF":1.2,"publicationDate":"2024-04-17","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"140614883","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":4,"RegionCategory":"物理与天体物理","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

{"title":"Escape peaks of Ge detector in X‐ray fluorescence (XRF)","authors":"Yasuto Isozumi, Jun Kawai, Takeshi Mukoyama, Fumitaka Nishiyama, Takashi Yamada","doi":"10.1002/xrs.3426","DOIUrl":"https://doi.org/10.1002/xrs.3426","url":null,"abstract":"","PeriodicalId":23867,"journal":{"name":"X-Ray Spectrometry","volume":null,"pages":null},"PeriodicalIF":1.2,"publicationDate":"2024-04-04","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"140572745","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":4,"RegionCategory":"物理与天体物理","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

{"title":"News Article","authors":"Kenji Sakurai","doi":"10.1002/xrs.3424","DOIUrl":"https://doi.org/10.1002/xrs.3424","url":null,"abstract":"<p><b>Deciphering Burnt and Carbonized Scroll Books with Deep Learning-Assisted X-ray Imaging (February 5, 2024)</b>.</p>\u0000<p>There is a program called the Vesuvius Challenge in which investors are funding the deciphering of what was written in the extremely fragile scrolls that were carbonized when Mount Vesuvius erupted in 79 A.D., some 2000 years ago (https://scrollprize.org/). Pompeii is famous for the eruption of Mount Vesuvius, which was buried by volcanic ejecta, etc. Not only Pompeii, but also towns near Mount Vesuvius were buried in the same way. The city of Herculaneum is one of them. The scrolls discovered in Herculaneum in the 1750s are one of the most important research subjects. Looking back in history, one would immediately think of using non-destructive methods of analysis such as X-rays, but in the days before the discovery of X-rays, this was obviously not possible. The method of dismantling the scrolls was unavoidable, and it seems that actual dismantling was done. Afterwards, they were probably restored by hand, but it is still difficult to read the text on them. In 2015, other ancient scrolls, though not from the Vesuvius eruption, were successfully read by X-ray imaging without touching them at all. A commercially available micro X-ray CT device was used (for details, see the paper, William Brent Seales, Clifford Seth Parker, Michael Segal, Emanuel Tov, Pnina Shor, and Yosef Porath, “From damage to discovery via virtual unwrapping: reading the scroll from En-Gedi”, Science Advances, 2, e1601247 (2016). https://doi.org/10.1126/sciadv.1601247). Using X-ray imaging, it is possible to read the inside of a scroll-like book without touching it to open it and reveal its contents. The Vesuvius Challenge program appears to have been inspired by this 2015 success story. Furthermore, while X-ray CT simply images three-dimensional electron density contrasts, deep learning techniques can be used to read text from them (for details, see the paper, Yannis Assael, Thea Sommerschield, Brendan Shillingford, Mahyar Bordbar, John Pavlopoulos, Marita Chatzipanagiotou, Ion Androutsopoulos, Jonathan Prag and Nando de Freitas, “Restoring and attributing ancient texts using deep neural networks”, Nature 603, 280–283 (2022). https://doi.org/10.1038/s41586-022-04448). Recently, the Vesuvius Challenge experiment was conducted using the imaging beamline of the Diamond Light Source synchrotron radiation facility in the UK to collect a large number of 3D CT images of carbonized scrolls. Deep learning was used to decipher the text.</p>\u0000<p>Eventually, the first success was achieved, although only a small part of the text was deciphered. What was written on the scroll turned out to be a philosophical statement about sensation and pleasure. It was announced that three 21-year-old graduate students from Egypt, Switzerland, and the U.S. were awarded $700,000 for their success in using X-rays to decipher what was written in such extremely fragile ancient burnt sc","PeriodicalId":23867,"journal":{"name":"X-Ray Spectrometry","volume":null,"pages":null},"PeriodicalIF":1.2,"publicationDate":"2024-04-04","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"140572755","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":4,"RegionCategory":"物理与天体物理","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

{"title":"Calendar Article","authors":"Kenji Sakurai","doi":"10.1002/xrs.3425","DOIUrl":"https://doi.org/10.1002/xrs.3425","url":null,"abstract":"<p>\u0000</p><div>\u0000<div tabindex=\"0\">\u0000<table>\u0000<thead>\u0000<tr>\u0000<th>2024</th>\u0000<td></td>\u0000</tr>\u0000</thead>\u0000<tbody>\u0000<tr>\u0000<td style=\"background-color:#F2F2F2\"><b>April 15–19</b></td>\u0000<td style=\"background-color:#F2F2F2\"><p><b>ICDD X-ray Fluorescence Clinic</b></p>\u0000<p>ICDD Headquarters, Newtown Square, PA, USA</p>\u0000<p>https://www.icdd.com/xrf/</p>\u0000</td>\u0000</tr>\u0000<tr>\u0000<td style=\"background-color:#F2F2F2\"><b>April 22–26</b></td>\u0000<td style=\"background-color:#F2F2F2\"><p><b>Materials Research Society 2024 Spring Meeting</b></p>\u0000<p>Seattle, Washington, USA</p>\u0000<p>https://www.mrs.org/meetings-events/spring-meetings-exhibits</p>\u0000</td>\u0000</tr>\u0000<tr>\u0000<td style=\"background-color:#F2F2F2\"><b>April 22–26</b></td>\u0000<td style=\"background-color:#F2F2F2\"><p><b>2024 International Congress on Emerging Fields and Exploratory Research in Optics and Photonics (OPIC2024)</b></p>\u0000<p>PACIFICO Yokohama, Japan</p>\u0000<p>https://opicon.jp/</p>\u0000</td>\u0000</tr>\u0000<tr>\u0000<td style=\"background-color:#F2F2F2\"><b>April 23–26</b></td>\u0000<td style=\"background-color:#F2F2F2\"><p><b>International Conference on X-ray Optics and Applications (XOPT2024)</b></p>\u0000<p>PACIFICO Yokohama, Japan</p>\u0000<p>https://xopt.opicon.jp/</p>\u0000</td>\u0000</tr>\u0000<tr>\u0000<td style=\"background-color:#F2F2F2\"><b>May 18–24</b></td>\u0000<td style=\"background-color:#F2F2F2\"><p><b>15^th International Particle Accelerator Conference (IPAC 2024)</b></p>\u0000<p>Nashville, Tennessee, USA</p>\u0000<p>https://ipac24.org/</p>\u0000</td>\u0000</tr>\u0000<tr>\u0000<td style=\"background-color:#F2F2F2\"><b>May 27–31</b></td>\u0000<td style=\"background-color:#F2F2F2\"><p><b>ALTECH 2024 - Analytical techniques for accurate nanoscale characterization of advanced materials</b></p>\u0000<p>Strasbourg, France</p>\u0000<p>https://www.european-mrs.com/altech-2024-analytical-techniques-accurate-nanoscale-characterization-advanced-materials-emrs</p>\u0000</td>\u0000</tr>\u0000<tr>\u0000<td style=\"background-color:#F2F2F2\"><b>June 2–4</b></td>\u0000<td style=\"background-color:#F2F2F2\"><p><b>Lehigh Microscopy School</b></p>\u0000<p>Lehigh University, Bethlehem, PA USA</p>\u0000<p>https://ifmd.lehigh.edu/lehigh-microscopy-school</p>\u0000</td>\u0000</tr>\u0000<tr>\u0000<td style=\"background-color:#F2F2F2\"><b>June 3–7</b></td>\u0000<td style=\"background-color:#F2F2F2\"><p><b>ICDD X-ray Diffraction Clinics - Session I - Fundamentals of X-ray Powder Diffraction</b></p>\u0000<p>ICDD Headquarters, Newtown Square, PA, USA</p>\u0000<p>http://www.icdd.com/xrd/</p>\u0000</td>\u0000</tr>\u0000<tr>\u0000<td style=\"background-color:#F2F2F2\"><b>June 9–12</b></td>\u0000<td style=\"background-color:#F2F2F2\"><p><b>XVIII</b>^<b>th</b> <b>International Conference on Electron Microscopy (EM 2024)</b></p>\u0000<p>Zakopane, Poland</p>\u0000<p>https://em2024.pl/</p>\u0000</td>\u0000</tr>\u0000<tr>\u0000<td style=\"background-color:#F2F2F2\"><b>June 10–13</b></td>\u0000<td style=\"background-color:#F2F2F2\"><p><b>9^th International Workshop on Numerical Modelling of High Temperature Superconductors (HTS 2024)</b></p>\u0000<p>Parkhotel Bad Zurzach, Switzerland</p>\u0000<p>https://indico.psi.ch/event/14456/overview</p>\u0000</td>\u0000</tr>\u0000<tr>\u0000<td style=\"background-color:#F2F2F2\">","PeriodicalId":23867,"journal":{"name":"X-Ray Spectrometry","volume":null,"pages":null},"PeriodicalIF":1.2,"publicationDate":"2024-04-04","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"140602930","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":4,"RegionCategory":"物理与天体物理","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

{"title":"Application research of monochromatic micro x‐ray fluorescence in glass physical evidence traceability","authors":"Xingyi Wang, Yude Li, Chenmeng Wang, Shaobo Huang, Fengzi Zhou, Xiaoyan Lin","doi":"10.1002/xrs.3423","DOIUrl":"https://doi.org/10.1002/xrs.3423","url":null,"abstract":"Micro‐x‐ray fluorescence (μ‐XRF) is a commonly used elemental analysis technique for glass physical evidence in forensic cases, which can detect major and trace elements in samples and potentially identify glass fragments according to the differences in elemental composition. However, when a sample is irradiated with polychromatic x‐rays, bremsstrahlung scattering from the source radiation provides noise in the fluorescence spectrum and affects the detection results. To improve the signal‐to‐noise ratio of the fluorescence spectrum, a Mμ‐XRF spectrometer constructed under the low‐power Mo target x‐ray tube condition was used to analyze ten kinds of common glass fragments. The application of laboratory Mμ‐XRF analysis in single‐point detection of tiny glass materials was studied. Experimental results show that the detection limit of Sr element was 51 μg/L, and the spectrometer can distinguish different types of small glass fragments according to the fluorescence spectrum information.","PeriodicalId":23867,"journal":{"name":"X-Ray Spectrometry","volume":null,"pages":null},"PeriodicalIF":1.2,"publicationDate":"2024-04-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"140602969","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":4,"RegionCategory":"物理与天体物理","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}