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Transactions on Electrical and Electronic Materials最新文献

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Liquid Phase Exfoliation and Characterization of Few Layer MoS_2 and WS_2 Nanosheets as Channel Material in Field Effect Transistor 场效应晶体管沟道材料MoS_ 2和WS_
IF 1.9
Transactions on Electrical and Electronic Materials Pub Date : 2023-01-12 DOI: 10.1007/s42341-023-00429-9
Rohit Sharma, Ashish Kumar, A. Dawar, S. Ojha, Ambuj Mishra, A. Goyal, Radhapiyari Laishram, V. Sathe, R. Srivastava, O. P. Sinha
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引用次数: 1
Aging Mechanism of p-Type Dopingless JLFET: NBTI and Channel-Hot-Carrier Stress p型无掺杂JLFET的老化机理:NBTI和通道热载流子应力
IF 1.9
Transactions on Electrical and Electronic Materials Pub Date : 2022-12-31 DOI: 10.1007/s42341-022-00428-2
Meena Panchore, Chithraja Rajan
{"title":"Aging Mechanism of p-Type Dopingless JLFET: NBTI and Channel-Hot-Carrier Stress","authors":"Meena Panchore, Chithraja Rajan","doi":"10.1007/s42341-022-00428-2","DOIUrl":"https://doi.org/10.1007/s42341-022-00428-2","url":null,"abstract":"","PeriodicalId":23222,"journal":{"name":"Transactions on Electrical and Electronic Materials","volume":"24 1","pages":"154-158"},"PeriodicalIF":1.9,"publicationDate":"2022-12-31","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"46959970","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 1
Dielectric Spectroscopy of A-Site and B-Site Modified K_0.5Na_0.5NbO_3–Bi_0.5Na_0.5TiO_3 Based Material K_0.5Na_0.5NbO_ 3–Bi_0.5Na_0.5TiO_
IF 1.9
Transactions on Electrical and Electronic Materials Pub Date : 2022-12-26 DOI: 10.1007/s42341-022-00425-5
Parbati Naik, A. Nayak, S. Patri
{"title":"Dielectric Spectroscopy of A-Site and B-Site Modified K_0.5Na_0.5NbO_3–Bi_0.5Na_0.5TiO_3 Based Material","authors":"Parbati Naik, A. Nayak, S. Patri","doi":"10.1007/s42341-022-00425-5","DOIUrl":"https://doi.org/10.1007/s42341-022-00425-5","url":null,"abstract":"","PeriodicalId":23222,"journal":{"name":"Transactions on Electrical and Electronic Materials","volume":"24 1","pages":"149-153"},"PeriodicalIF":1.9,"publicationDate":"2022-12-26","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"49641772","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Impact of Back Gate Bias on Analog Performance of Dopingless Transistor 背栅偏置对无掺杂晶体管模拟性能的影响
IF 1.9
Transactions on Electrical and Electronic Materials Pub Date : 2022-12-08 DOI: 10.1007/s42341-022-00426-4
Rakesh Kumar, Meena Panchore
{"title":"Impact of Back Gate Bias on Analog Performance of Dopingless Transistor","authors":"Rakesh Kumar, Meena Panchore","doi":"10.1007/s42341-022-00426-4","DOIUrl":"https://doi.org/10.1007/s42341-022-00426-4","url":null,"abstract":"","PeriodicalId":23222,"journal":{"name":"Transactions on Electrical and Electronic Materials","volume":"24 1","pages":"115-121"},"PeriodicalIF":1.9,"publicationDate":"2022-12-08","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"49429914","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 1
Wear-Induced Attenuation on Transmission Lines and Their Causes 输电线路的磨损衰减及其原因
IF 1.9
Transactions on Electrical and Electronic Materials Pub Date : 2022-11-15 DOI: 10.1007/s42341-022-00423-7
Philipp Lenz, Philipp Baron, Armin Wittmann, G. Fischer
{"title":"Wear-Induced Attenuation on Transmission Lines and Their Causes","authors":"Philipp Lenz, Philipp Baron, Armin Wittmann, G. Fischer","doi":"10.1007/s42341-022-00423-7","DOIUrl":"https://doi.org/10.1007/s42341-022-00423-7","url":null,"abstract":"","PeriodicalId":23222,"journal":{"name":"Transactions on Electrical and Electronic Materials","volume":"24 1","pages":"102-114"},"PeriodicalIF":1.9,"publicationDate":"2022-11-15","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"42715302","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 1
A Novel Memristor Model for the Nonlinear Memristor Devices 一种用于非线性忆阻器器件的新型忆阻器模型
IF 1.9
Transactions on Electrical and Electronic Materials Pub Date : 2022-11-12 DOI: 10.1007/s42341-022-00424-6
T. A. Anusudha
{"title":"A Novel Memristor Model for the Nonlinear Memristor Devices","authors":"T. A. Anusudha","doi":"10.1007/s42341-022-00424-6","DOIUrl":"https://doi.org/10.1007/s42341-022-00424-6","url":null,"abstract":"","PeriodicalId":23222,"journal":{"name":"Transactions on Electrical and Electronic Materials","volume":"24 1","pages":"91-101"},"PeriodicalIF":1.9,"publicationDate":"2022-11-12","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"48349130","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Microsensor for Cancer Detection and MEMS Actuator for Cancer Therapy 用于癌症检测的微传感器和用于癌症治疗的MEMS致动器
IF 1.9
Transactions on Electrical and Electronic Materials Pub Date : 2022-11-07 DOI: 10.1007/s42341-022-00421-9
A. Kalaiarasi, Gautam Aishwarya
{"title":"Microsensor for Cancer Detection and MEMS Actuator for Cancer Therapy","authors":"A. Kalaiarasi, Gautam Aishwarya","doi":"10.1007/s42341-022-00421-9","DOIUrl":"https://doi.org/10.1007/s42341-022-00421-9","url":null,"abstract":"","PeriodicalId":23222,"journal":{"name":"Transactions on Electrical and Electronic Materials","volume":"24 1","pages":"82-90"},"PeriodicalIF":1.9,"publicationDate":"2022-11-07","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"42725992","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 1
Improvement of Device Reliability and Variability Using High Pressure Deuterium Annealing 利用高压氘退火提高器件的可靠性和可变性
IF 1.9
Transactions on Electrical and Electronic Materials Pub Date : 2022-11-04 DOI: 10.1007/s42341-022-00422-8
Dae-Han Jung, S. Yoon, Ja-Yun Ku, Donglin Wang, Khwang-Sun Lee, Jun-Young Park
{"title":"Improvement of Device Reliability and Variability Using High Pressure Deuterium Annealing","authors":"Dae-Han Jung, S. Yoon, Ja-Yun Ku, Donglin Wang, Khwang-Sun Lee, Jun-Young Park","doi":"10.1007/s42341-022-00422-8","DOIUrl":"https://doi.org/10.1007/s42341-022-00422-8","url":null,"abstract":"","PeriodicalId":23222,"journal":{"name":"Transactions on Electrical and Electronic Materials","volume":"24 1","pages":"1-4"},"PeriodicalIF":1.9,"publicationDate":"2022-11-04","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"44938118","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Investigation of Structural, Photoluminescence and Thermoluminescence Properties of Scheelite-Type CaWO_4 Phosphor Scheelite型CaWO_4荧光粉的结构、光致发光和热致发光性能研究
IF 1.9
Transactions on Electrical and Electronic Materials Pub Date : 2022-11-04 DOI: 10.1007/s42341-022-00420-w
R. Paikaray, T. Badapanda, H. Mohapatra, T. Richhariya
{"title":"Investigation of Structural, Photoluminescence and Thermoluminescence Properties of Scheelite-Type CaWO_4 Phosphor","authors":"R. Paikaray, T. Badapanda, H. Mohapatra, T. Richhariya","doi":"10.1007/s42341-022-00420-w","DOIUrl":"https://doi.org/10.1007/s42341-022-00420-w","url":null,"abstract":"","PeriodicalId":23222,"journal":{"name":"Transactions on Electrical and Electronic Materials","volume":"24 1","pages":"73-81"},"PeriodicalIF":1.9,"publicationDate":"2022-11-04","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"47239532","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 2
High Power PV Array Emulator Based on State Feedback Controller Under Uniform and Non-Uniform Insolation 均匀和非均匀条件下基于状态反馈控制器的大功率光伏阵列模拟器
IF 1.9
Transactions on Electrical and Electronic Materials Pub Date : 2022-11-01 DOI: 10.1007/s42341-022-00418-4
Mustapha ALAOUI, H. Maker, A. Mouhsen, H. Hihi
{"title":"High Power PV Array Emulator Based on State Feedback Controller Under Uniform and Non-Uniform Insolation","authors":"Mustapha ALAOUI, H. Maker, A. Mouhsen, H. Hihi","doi":"10.1007/s42341-022-00418-4","DOIUrl":"https://doi.org/10.1007/s42341-022-00418-4","url":null,"abstract":"","PeriodicalId":23222,"journal":{"name":"Transactions on Electrical and Electronic Materials","volume":"24 1","pages":"54-64"},"PeriodicalIF":1.9,"publicationDate":"2022-11-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"48698532","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
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