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Transactions on Electrical and Electronic Materials最新文献

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Research on Characterizing and Detecting Voltage Disturbance Due to the Incipient Fault of MV Power Cables 中压电力电缆初期故障电压扰动的表征与检测研究
IF 1.9
Transactions on Electrical and Electronic Materials Pub Date : 2023-06-05 DOI: 10.1007/s42341-023-00452-w
Junping Cao, Jinsuo Li, Guangzhen Ren, Naiyi Li, Yunhe Wang, Xilan Xie, Xiaojing Wang, Jing Yong
{"title":"Research on Characterizing and Detecting Voltage Disturbance Due to the Incipient Fault of MV Power Cables","authors":"Junping Cao, Jinsuo Li, Guangzhen Ren, Naiyi Li, Yunhe Wang, Xilan Xie, Xiaojing Wang, Jing Yong","doi":"10.1007/s42341-023-00452-w","DOIUrl":"https://doi.org/10.1007/s42341-023-00452-w","url":null,"abstract":"","PeriodicalId":23222,"journal":{"name":"Transactions on Electrical and Electronic Materials","volume":"24 1","pages":"336 - 345"},"PeriodicalIF":1.9,"publicationDate":"2023-06-05","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"45977113","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Ferroelectricity Based Memory Devices: New-Generation of Materials and Applications 基于铁电的存储器件:新一代材料和应用
IF 1.9
Transactions on Electrical and Electronic Materials Pub Date : 2023-06-05 DOI: 10.1007/s42341-023-00445-9
Yifan Hu, Matheus Rabelo, Taeyong Kim, Jaewoong Cho, Jiwon Choi, Xinyi Fan, J. Yi
{"title":"Ferroelectricity Based Memory Devices: New-Generation of Materials and Applications","authors":"Yifan Hu, Matheus Rabelo, Taeyong Kim, Jaewoong Cho, Jiwon Choi, Xinyi Fan, J. Yi","doi":"10.1007/s42341-023-00445-9","DOIUrl":"https://doi.org/10.1007/s42341-023-00445-9","url":null,"abstract":"","PeriodicalId":23222,"journal":{"name":"Transactions on Electrical and Electronic Materials","volume":"24 1","pages":"271 - 278"},"PeriodicalIF":1.9,"publicationDate":"2023-06-05","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"49163583","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 3
Visible Light Driven Photoluminescence Activity of ZnFe2O4 –Ag Doped Nanomaterials for Photostability: Green Synthesis Approach ZnFe2O4–Ag掺杂纳米材料光稳定性的可见光驱动发光活性：绿色合成方法
IF 1.9
Transactions on Electrical and Electronic Materials Pub Date : 2023-05-25 DOI: 10.1007/s42341-023-00446-8
S. Saha, K. L. Routray, D. Behera
{"title":"Visible Light Driven Photoluminescence Activity of ZnFe2O4 –Ag Doped Nanomaterials for Photostability: Green Synthesis Approach","authors":"S. Saha, K. L. Routray, D. Behera","doi":"10.1007/s42341-023-00446-8","DOIUrl":"https://doi.org/10.1007/s42341-023-00446-8","url":null,"abstract":"","PeriodicalId":23222,"journal":{"name":"Transactions on Electrical and Electronic Materials","volume":"24 1","pages":"295 - 302"},"PeriodicalIF":1.9,"publicationDate":"2023-05-25","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"42040637","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Investigating the Effects of Channel Length and High-K Dielectric Materials on the Performance of Double-Gate MOSFETs 通道长度和高k介电材料对双栅mosfet性能影响的研究
IF 1.9
Transactions on Electrical and Electronic Materials Pub Date : 2023-05-23 DOI: 10.1007/s42341-023-00444-w
Umamaheshwar Soma
{"title":"Investigating the Effects of Channel Length and High-K Dielectric Materials on the Performance of Double-Gate MOSFETs","authors":"Umamaheshwar Soma","doi":"10.1007/s42341-023-00444-w","DOIUrl":"https://doi.org/10.1007/s42341-023-00444-w","url":null,"abstract":"","PeriodicalId":23222,"journal":{"name":"Transactions on Electrical and Electronic Materials","volume":"24 1","pages":"285 - 294"},"PeriodicalIF":1.9,"publicationDate":"2023-05-23","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"48106825","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Improving Stability and Low Leakage Current of ZnO Varistors Ceramics 提高ZnO压敏陶瓷的稳定性和低漏电流
IF 1.9
Transactions on Electrical and Electronic Materials Pub Date : 2023-05-22 DOI: 10.1007/s42341-023-00447-7
Guanyue Sun, Hongfeng Zhao
{"title":"Improving Stability and Low Leakage Current of ZnO Varistors Ceramics","authors":"Guanyue Sun, Hongfeng Zhao","doi":"10.1007/s42341-023-00447-7","DOIUrl":"https://doi.org/10.1007/s42341-023-00447-7","url":null,"abstract":"","PeriodicalId":23222,"journal":{"name":"Transactions on Electrical and Electronic Materials","volume":"24 1","pages":"267 - 270"},"PeriodicalIF":1.9,"publicationDate":"2023-05-22","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"43219369","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Micro Cylindrical Ultrasonic Motor with Improvised Power and Efficiency 改进功率和效率的微型圆柱超声电机
IF 1.9
Transactions on Electrical and Electronic Materials Pub Date : 2023-05-17 DOI: 10.1007/s42341-023-00441-z
G. Sahoo, Baruna Kumar Turuk, Basudeba Behera
{"title":"Micro Cylindrical Ultrasonic Motor with Improvised Power and Efficiency","authors":"G. Sahoo, Baruna Kumar Turuk, Basudeba Behera","doi":"10.1007/s42341-023-00441-z","DOIUrl":"https://doi.org/10.1007/s42341-023-00441-z","url":null,"abstract":"","PeriodicalId":23222,"journal":{"name":"Transactions on Electrical and Electronic Materials","volume":"24 1","pages":"242 - 249"},"PeriodicalIF":1.9,"publicationDate":"2023-05-17","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"42647917","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Performance Analysis of the Gate All Around Nanowire FET with Group III–V Compound Channel Materials and High-k Gate Oxides III-V族复合沟道材料和高-k栅氧化物栅极全绕线纳米线FET的性能分析
IF 1.9
Transactions on Electrical and Electronic Materials Pub Date : 2023-05-12 DOI: 10.1007/s42341-023-00438-8
Shashank Shandilya, C. Madhu, Vijay Kumar
{"title":"Performance Analysis of the Gate All Around Nanowire FET with Group III–V Compound Channel Materials and High-k Gate Oxides","authors":"Shashank Shandilya, C. Madhu, Vijay Kumar","doi":"10.1007/s42341-023-00438-8","DOIUrl":"https://doi.org/10.1007/s42341-023-00438-8","url":null,"abstract":"","PeriodicalId":23222,"journal":{"name":"Transactions on Electrical and Electronic Materials","volume":" ","pages":"1-7"},"PeriodicalIF":1.9,"publicationDate":"2023-05-12","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"48096424","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Integration of Particle Swarm Optimization (PSO) and Machine Learning to Improve Classification Accuracy During Antenna Design 粒子群优化算法与机器学习相结合提高天线设计中的分类精度
IF 1.9
Transactions on Electrical and Electronic Materials Pub Date : 2023-05-11 DOI: 10.1007/s42341-023-00443-x
Susheel Kumar Singh, Mukesh Kumar, Jeetendra Singh
{"title":"Integration of Particle Swarm Optimization (PSO) and Machine Learning to Improve Classification Accuracy During Antenna Design","authors":"Susheel Kumar Singh, Mukesh Kumar, Jeetendra Singh","doi":"10.1007/s42341-023-00443-x","DOIUrl":"https://doi.org/10.1007/s42341-023-00443-x","url":null,"abstract":"","PeriodicalId":23222,"journal":{"name":"Transactions on Electrical and Electronic Materials","volume":" ","pages":"1-9"},"PeriodicalIF":1.9,"publicationDate":"2023-05-11","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"47299644","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Evaluation of Strong Microwave Absorption Property of PVB-PEDOT:PSS-Ti_3C_2T_x MXene Nanocomposite With Materials Data-Driven Discovery 用材料数据驱动的发现评价PVB-PEDOT:PSS-Ti_3C_2T_x MXene纳米复合材料的强微波吸收性能
IF 1.9
Transactions on Electrical and Electronic Materials Pub Date : 2023-05-08 DOI: 10.1007/s42341-023-00439-7
M. Praveen Kumar, Sarika Raga, S. Chetana, K. Avinash, A. Dey, D. Rangappa
{"title":"Evaluation of Strong Microwave Absorption Property of PVB-PEDOT:PSS-Ti_3C_2T_x MXene Nanocomposite With Materials Data-Driven Discovery","authors":"M. Praveen Kumar, Sarika Raga, S. Chetana, K. Avinash, A. Dey, D. Rangappa","doi":"10.1007/s42341-023-00439-7","DOIUrl":"https://doi.org/10.1007/s42341-023-00439-7","url":null,"abstract":"","PeriodicalId":23222,"journal":{"name":"Transactions on Electrical and Electronic Materials","volume":"1 1","pages":"1-7"},"PeriodicalIF":1.9,"publicationDate":"2023-05-08","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"42808386","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 1
Dimensional Effect on Analog/RF Performance of Dual Material Gate Junctionless FinFET at 7 nm Technology Node 7nm工艺节点双材料栅极无结FinFET模拟/射频性能的尺寸效应
IF 1.9
Transactions on Electrical and Electronic Materials Pub Date : 2023-05-08 DOI: 10.1007/s42341-023-00440-0
Rambabu Kusuma, V. Talari
{"title":"Dimensional Effect on Analog/RF Performance of Dual Material Gate Junctionless FinFET at 7 nm Technology Node","authors":"Rambabu Kusuma, V. Talari","doi":"10.1007/s42341-023-00440-0","DOIUrl":"https://doi.org/10.1007/s42341-023-00440-0","url":null,"abstract":"","PeriodicalId":23222,"journal":{"name":"Transactions on Electrical and Electronic Materials","volume":"1 1","pages":"1-10"},"PeriodicalIF":1.9,"publicationDate":"2023-05-08","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"42207616","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
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