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Transactions on Electrical and Electronic Materials最新文献

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Strong Depression of Ferroelectricity in a Classical Ferroelectric Metal–Organic Framework of [(CH3)2NH2][Al(H2O)6](SO4)2 Under the Influence of Nanodispersed Silicon Dioxide at Low Temperatures 低温下纳米分散二氧化硅对[(CH3)2NH2][Al(H2O)6](SO4)2经典铁电金属-有机骨架中铁电性的强抑制
IF 1.9
Transactions on Electrical and Electronic Materials Pub Date : 2023-08-19 DOI: 10.1007/s42341-023-00471-7
H. Nguyen
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引用次数: 0
Planar Monopole Antenna Based on Surface Roughness and Stub Loaded with Notch Controlling Characteristics 基于表面粗糙度和缺口控制特性的平面单极天线
IF 1.9
Transactions on Electrical and Electronic Materials Pub Date : 2023-08-19 DOI: 10.1007/s42341-023-00469-1
Y. V. Lakshmaiah, B. Roy
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引用次数: 0
Enhancing GaN/AlGaN MQW Micro LED Optical and Electrical Performance with a Non-uniform LQB 非均匀LQB增强GaN/AlGaN MQW微型LED光电性能
IF 1.9
Transactions on Electrical and Electronic Materials Pub Date : 2023-08-10 DOI: 10.1007/s42341-023-00467-3
H. Mohamed, N. Sengouga, A. Meftah
{"title":"Enhancing GaN/AlGaN MQW Micro LED Optical and Electrical Performance with a Non-uniform LQB","authors":"H. Mohamed, N. Sengouga, A. Meftah","doi":"10.1007/s42341-023-00467-3","DOIUrl":"https://doi.org/10.1007/s42341-023-00467-3","url":null,"abstract":"","PeriodicalId":23222,"journal":{"name":"Transactions on Electrical and Electronic Materials","volume":"24 1","pages":"469 - 478"},"PeriodicalIF":1.9,"publicationDate":"2023-08-10","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"44962374","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Studies of Structural, Microstructure, Dielectric and Optical Properties of Bismuth-Based Complex Perovskite Modified Bismuth Ferrite: BiFeO3–(Bi0.5Na0.25K0.25)(Ti0.5Mn0.5)O3 Ceramics 铋基复合钙钛矿改性铋铁氧体:BiFeO3 - (Bi0.5Na0.25K0.25)(Ti0.5Mn0.5)O3陶瓷的结构、微观结构、介电和光学性能研究
IF 1.9
Transactions on Electrical and Electronic Materials Pub Date : 2023-08-05 DOI: 10.1007/s42341-023-00462-8
S. Sourav, Sunena Parida, R. Choudhary, Umakant Prasad
{"title":"Studies of Structural, Microstructure, Dielectric and Optical Properties of Bismuth-Based Complex Perovskite Modified Bismuth Ferrite: BiFeO3–(Bi0.5Na0.25K0.25)(Ti0.5Mn0.5)O3 Ceramics","authors":"S. Sourav, Sunena Parida, R. Choudhary, Umakant Prasad","doi":"10.1007/s42341-023-00462-8","DOIUrl":"https://doi.org/10.1007/s42341-023-00462-8","url":null,"abstract":"","PeriodicalId":23222,"journal":{"name":"Transactions on Electrical and Electronic Materials","volume":"24 1","pages":"434 - 446"},"PeriodicalIF":1.9,"publicationDate":"2023-08-05","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"43292124","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Jacobian Based Nonlinear Algorithms for Prediction of Optimized RF MEMS Switch Dimensions 基于雅可比矩阵的射频MEMS开关尺寸优化预测非线性算法
IF 1.9
Transactions on Electrical and Electronic Materials Pub Date : 2023-08-03 DOI: 10.1007/s42341-023-00463-7
L. Thalluri, ·. M. A. Kumar, Mohamed Sultan, Mohamed Sultan Mohamed Ali, N. Britto, Martin Paul, ·. K. S. Rao, K. Guha, S. Kiran, Lakshmi, Narayana Thalluri
{"title":"Jacobian Based Nonlinear Algorithms for Prediction of Optimized RF MEMS Switch Dimensions","authors":"L. Thalluri, ·. M. A. Kumar, Mohamed Sultan, Mohamed Sultan Mohamed Ali, N. Britto, Martin Paul, ·. K. S. Rao, K. Guha, S. Kiran, Lakshmi, Narayana Thalluri","doi":"10.1007/s42341-023-00463-7","DOIUrl":"https://doi.org/10.1007/s42341-023-00463-7","url":null,"abstract":"","PeriodicalId":23222,"journal":{"name":"Transactions on Electrical and Electronic Materials","volume":"24 1","pages":"447 - 458"},"PeriodicalIF":1.9,"publicationDate":"2023-08-03","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"48740607","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
A Comprehensive Performance Investigation on Junction-Less TFET (JL-TFET) Based Biosensor: Device Structure and Sensitivity 基于无结TFET（JL-TFET）的生物传感器的综合性能研究：器件结构和灵敏度
IF 1.9
Transactions on Electrical and Electronic Materials Pub Date : 2023-08-01 DOI: 10.1007/s42341-023-00465-5
Jayalakshmi Bitra, Gurumurthy Komanapalli
{"title":"A Comprehensive Performance Investigation on Junction-Less TFET (JL-TFET) Based Biosensor: Device Structure and Sensitivity","authors":"Jayalakshmi Bitra, Gurumurthy Komanapalli","doi":"10.1007/s42341-023-00465-5","DOIUrl":"https://doi.org/10.1007/s42341-023-00465-5","url":null,"abstract":"","PeriodicalId":23222,"journal":{"name":"Transactions on Electrical and Electronic Materials","volume":"24 1","pages":"365 - 372"},"PeriodicalIF":1.9,"publicationDate":"2023-08-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"45097153","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 1
Retraction Note: Floating and Grounded Meminductor Using VDTA and Neuromorphic Circuit Based on Amoeba Behaviour 注:基于变形虫行为的VDTA和神经形态电路的浮式和接地式记忆电感器
Transactions on Electrical and Electronic Materials Pub Date : 2023-08-01 DOI: 10.1007/s42341-023-00466-4
Vangala Indhrani, Ashok Kumar Srinivasan, P. Khobragade Vaishali
{"title":"Retraction Note: Floating and Grounded Meminductor Using VDTA and Neuromorphic Circuit Based on Amoeba Behaviour","authors":"Vangala Indhrani, Ashok Kumar Srinivasan, P. Khobragade Vaishali","doi":"10.1007/s42341-023-00466-4","DOIUrl":"https://doi.org/10.1007/s42341-023-00466-4","url":null,"abstract":"","PeriodicalId":23222,"journal":{"name":"Transactions on Electrical and Electronic Materials","volume":"56 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2023-08-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"135971764","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
DC and RF Performance Analysis of Extended Field Plated AlGaN/GaN/ β-Ga2O3 HEMT 扩展场镀AlGaN/GaN/ β-Ga2O3 HEMT直流和射频性能分析
IF 1.9
Transactions on Electrical and Electronic Materials Pub Date : 2023-08-01 DOI: 10.1007/s42341-023-00464-6
B. Balaji, R. Karpagam, ·. S. Leones, Sherwin Vimalraj, G. Sathishkumar, V. Megala, Y. Gowthami
{"title":"DC and RF Performance Analysis of Extended Field Plated AlGaN/GaN/ β-Ga2O3 HEMT","authors":"B. Balaji, R. Karpagam, ·. S. Leones, Sherwin Vimalraj, G. Sathishkumar, V. Megala, Y. Gowthami","doi":"10.1007/s42341-023-00464-6","DOIUrl":"https://doi.org/10.1007/s42341-023-00464-6","url":null,"abstract":"","PeriodicalId":23222,"journal":{"name":"Transactions on Electrical and Electronic Materials","volume":"24 1","pages":"459 - 468"},"PeriodicalIF":1.9,"publicationDate":"2023-08-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"43349220","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Development of arc and Deterioration Detection System for Fire Prevention Using UV and IR Sensors 利用紫外和红外传感器开发电弧和劣化火灾探测系统
IF 1.9
Transactions on Electrical and Electronic Materials Pub Date : 2023-07-25 DOI: 10.1007/s42341-023-00461-9
Han-Byeol Kim, Kyung-Jae Cho, M. Cheon
{"title":"Development of arc and Deterioration Detection System for Fire Prevention Using UV and IR Sensors","authors":"Han-Byeol Kim, Kyung-Jae Cho, M. Cheon","doi":"10.1007/s42341-023-00461-9","DOIUrl":"https://doi.org/10.1007/s42341-023-00461-9","url":null,"abstract":"","PeriodicalId":23222,"journal":{"name":"Transactions on Electrical and Electronic Materials","volume":"24 1","pages":"427 - 433"},"PeriodicalIF":1.9,"publicationDate":"2023-07-25","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"42828497","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Effect of Ni Doping on the Local Electronic Structure of ZnO Thin Films by Synchrotron X-ray Absorption Spectroscopy 同步辐射X射线吸收光谱法研究Ni掺杂对ZnO薄膜局域电子结构的影响
IF 1.9
Transactions on Electrical and Electronic Materials Pub Date : 2023-07-24 DOI: 10.1007/s42341-023-00460-w
P. Gupta, B. C. Joshi
{"title":"Effect of Ni Doping on the Local Electronic Structure of ZnO Thin Films by Synchrotron X-ray Absorption Spectroscopy","authors":"P. Gupta, B. C. Joshi","doi":"10.1007/s42341-023-00460-w","DOIUrl":"https://doi.org/10.1007/s42341-023-00460-w","url":null,"abstract":"","PeriodicalId":23222,"journal":{"name":"Transactions on Electrical and Electronic Materials","volume":"24 1","pages":"421 - 426"},"PeriodicalIF":1.9,"publicationDate":"2023-07-24","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"44141674","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 1
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