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Transactions on Electrical and Electronic Materials最新文献

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Synthesis and Measurement of Optical Light Characterization for Modern Cost-fewer Polyvinyl Chloride Nanocomposites Thin Films 现代低成本聚氯乙烯纳米复合材料薄膜光学光表征的合成与测量
Transactions on Electrical and Electronic Materials Pub Date : 2023-11-10 DOI: 10.1007/s42341-023-00489-x
Ahmed Thabet, Fahad A.Al Mufadi, A. A. Ebnalwaled
{"title":"Synthesis and Measurement of Optical Light Characterization for Modern Cost-fewer Polyvinyl Chloride Nanocomposites Thin Films","authors":"Ahmed Thabet, Fahad A.Al Mufadi, A. A. Ebnalwaled","doi":"10.1007/s42341-023-00489-x","DOIUrl":"https://doi.org/10.1007/s42341-023-00489-x","url":null,"abstract":"","PeriodicalId":23222,"journal":{"name":"Transactions on Electrical and Electronic Materials","volume":"89 7","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2023-11-10","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"135091583","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Analysis of High-Temperature Effects on $$InAs/In_{0.3}Al_{0.7}As/InSb/In_{0.3}Al_{0.7}As$$ pHEMTs on Accessing RF/Analog performance: A Machine Learning Predictive Modeling 高温对$$InAs/In_{0.3}Al_{0.7}As/InSb/In_{0.3}Al_{0.7}As$$ pHEMTs访问射频/模拟性能的影响分析:机器学习预测建模
Transactions on Electrical and Electronic Materials Pub Date : 2023-11-09 DOI: 10.1007/s42341-023-00487-z
G. Lakshmi Vara Prasad, Venkatagurunatham Naidu Kollu, M. Sailaja, S. Radhakrishnan, K. Jagan Mohan, A. Kishore Reddy, G. Rajesh Chandra
{"title":"Analysis of High-Temperature Effects on $$InAs/In_{0.3}Al_{0.7}As/InSb/In_{0.3}Al_{0.7}As$$ pHEMTs on Accessing RF/Analog performance: A Machine Learning Predictive Modeling","authors":"G. Lakshmi Vara Prasad, Venkatagurunatham Naidu Kollu, M. Sailaja, S. Radhakrishnan, K. Jagan Mohan, A. Kishore Reddy, G. Rajesh Chandra","doi":"10.1007/s42341-023-00487-z","DOIUrl":"https://doi.org/10.1007/s42341-023-00487-z","url":null,"abstract":"","PeriodicalId":23222,"journal":{"name":"Transactions on Electrical and Electronic Materials","volume":" 7","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2023-11-09","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"135285866","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Performance Evaluation and Analysis of Hybrid Bilayer Dielectrics Based OTFTs for Temperature Sensing Application 基于混合双层介质的OTFTs温度传感性能评价与分析
Transactions on Electrical and Electronic Materials Pub Date : 2023-11-08 DOI: 10.1007/s42341-023-00488-y
Sushil Kumar Jain, Amit Mahesh Joshi
{"title":"Performance Evaluation and Analysis of Hybrid Bilayer Dielectrics Based OTFTs for Temperature Sensing Application","authors":"Sushil Kumar Jain, Amit Mahesh Joshi","doi":"10.1007/s42341-023-00488-y","DOIUrl":"https://doi.org/10.1007/s42341-023-00488-y","url":null,"abstract":"","PeriodicalId":23222,"journal":{"name":"Transactions on Electrical and Electronic Materials","volume":"29 18","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2023-11-08","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"135392171","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Structural and Dielectric Parameters of PVA/CMC Blend Reinforced with SiO2/SnO2 Nanoparticles for Nanoelectronics Applications SiO2/SnO2纳米粒子增强PVA/CMC共混物的结构和介电参数
Transactions on Electrical and Electronic Materials Pub Date : 2023-11-04 DOI: 10.1007/s42341-023-00486-0
Rehab Shather Abdul Hamza, Majeed Ali Habeeb
{"title":"Structural and Dielectric Parameters of PVA/CMC Blend Reinforced with SiO2/SnO2 Nanoparticles for Nanoelectronics Applications","authors":"Rehab Shather Abdul Hamza, Majeed Ali Habeeb","doi":"10.1007/s42341-023-00486-0","DOIUrl":"https://doi.org/10.1007/s42341-023-00486-0","url":null,"abstract":"","PeriodicalId":23222,"journal":{"name":"Transactions on Electrical and Electronic Materials","volume":"85 4","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2023-11-04","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"135774100","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Design and Numerical Investigation of CsSn0.5Ge0.5I3 Perovskite Photodetector with Optimized Performances 性能优化的CsSn0.5Ge0.5I3钙钛矿光电探测器设计与数值研究
Transactions on Electrical and Electronic Materials Pub Date : 2023-11-01 DOI: 10.1007/s42341-023-00484-2
Kamal Mishra, R. K. Chauhan, Rajan Mishra, Vaibhava Srivastava
{"title":"Design and Numerical Investigation of CsSn0.5Ge0.5I3 Perovskite Photodetector with Optimized Performances","authors":"Kamal Mishra, R. K. Chauhan, Rajan Mishra, Vaibhava Srivastava","doi":"10.1007/s42341-023-00484-2","DOIUrl":"https://doi.org/10.1007/s42341-023-00484-2","url":null,"abstract":"","PeriodicalId":23222,"journal":{"name":"Transactions on Electrical and Electronic Materials","volume":"8 4","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2023-11-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"135326011","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Study of Variation in Optical Properties and Dispersion Parameters of Fe-Doped TiO2 Nanopowders 掺铁纳米TiO2粉体光学性质及色散参数变化研究
Transactions on Electrical and Electronic Materials Pub Date : 2023-11-01 DOI: 10.1007/s42341-023-00482-4
Debabandana Apta, Susanta Kumar Das, Maya Devi
{"title":"Study of Variation in Optical Properties and Dispersion Parameters of Fe-Doped TiO2 Nanopowders","authors":"Debabandana Apta, Susanta Kumar Das, Maya Devi","doi":"10.1007/s42341-023-00482-4","DOIUrl":"https://doi.org/10.1007/s42341-023-00482-4","url":null,"abstract":"","PeriodicalId":23222,"journal":{"name":"Transactions on Electrical and Electronic Materials","volume":"90 2","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2023-11-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"135320434","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Synthesis, Photophysical and Electrochemical Studies of 1,6/1,7-Diaminoperylene − 3,4,9,10-tetracarboxylic Acid Bisimides: Novel NIR Fluorescent Dyes 新型近红外荧光染料1,6/1,7-二氨基苝- 3,4,9,10-四羧酸双亚胺的合成、光物理和电化学研究
Transactions on Electrical and Electronic Materials Pub Date : 2023-10-28 DOI: 10.1007/s42341-023-00485-1
Maruti B. Yadav, Yeong Il Kim, Yeon Tae Jeong
{"title":"Synthesis, Photophysical and Electrochemical Studies of 1,6/1,7-Diaminoperylene − 3,4,9,10-tetracarboxylic Acid Bisimides: Novel NIR Fluorescent Dyes","authors":"Maruti B. Yadav, Yeong Il Kim, Yeon Tae Jeong","doi":"10.1007/s42341-023-00485-1","DOIUrl":"https://doi.org/10.1007/s42341-023-00485-1","url":null,"abstract":"","PeriodicalId":23222,"journal":{"name":"Transactions on Electrical and Electronic Materials","volume":"51 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2023-10-28","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"136233611","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Microstructure Evolution and Shear Strength Study of Sn–9Zn and Sn–8Zn–3Bi on Cu Substrate Cu基体上Sn-9Zn和Sn-8Zn-3Bi的组织演变及抗剪强度研究
Transactions on Electrical and Electronic Materials Pub Date : 2023-10-17 DOI: 10.1007/s42341-023-00481-5
Ramani Mayappan, Zainal Arifin Ahmad
{"title":"Microstructure Evolution and Shear Strength Study of Sn–9Zn and Sn–8Zn–3Bi on Cu Substrate","authors":"Ramani Mayappan, Zainal Arifin Ahmad","doi":"10.1007/s42341-023-00481-5","DOIUrl":"https://doi.org/10.1007/s42341-023-00481-5","url":null,"abstract":"","PeriodicalId":23222,"journal":{"name":"Transactions on Electrical and Electronic Materials","volume":"22 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2023-10-17","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"135992633","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Analysis of Device Parameter Variations in In1−xGaxAs Based Gate Stacked Double Metal Surrounding Gate Nanowire MOSFET In1−xGaxAs基栅堆叠双金属围栅纳米线MOSFET器件参数变化分析
Transactions on Electrical and Electronic Materials Pub Date : 2023-10-16 DOI: 10.1007/s42341-023-00478-0
Parveen Kumar, Sanjeev Kumar Sharma, Balwinder Raj
{"title":"Analysis of Device Parameter Variations in In1−xGaxAs Based Gate Stacked Double Metal Surrounding Gate Nanowire MOSFET","authors":"Parveen Kumar, Sanjeev Kumar Sharma, Balwinder Raj","doi":"10.1007/s42341-023-00478-0","DOIUrl":"https://doi.org/10.1007/s42341-023-00478-0","url":null,"abstract":"","PeriodicalId":23222,"journal":{"name":"Transactions on Electrical and Electronic Materials","volume":"33 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2023-10-16","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"136113517","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Deep Insight into Raised Buried Oxide SOI-Fe TFET and It’s Analog/RF and Linearity Performance Parameters 深埋氧化SOI-Fe TFET及其模拟/射频和线性性能参数研究
Transactions on Electrical and Electronic Materials Pub Date : 2023-10-13 DOI: 10.1007/s42341-023-00480-6
Sirisha Meriga, Brinda Bhowmick
{"title":"Deep Insight into Raised Buried Oxide SOI-Fe TFET and It’s Analog/RF and Linearity Performance Parameters","authors":"Sirisha Meriga, Brinda Bhowmick","doi":"10.1007/s42341-023-00480-6","DOIUrl":"https://doi.org/10.1007/s42341-023-00480-6","url":null,"abstract":"","PeriodicalId":23222,"journal":{"name":"Transactions on Electrical and Electronic Materials","volume":"28 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2023-10-13","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"135858133","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
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