Post-Silicon Validation and Debug最新文献

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Hybrid Signal Selection 混合信号选择
Post-Silicon Validation and Debug Pub Date : 2018-09-02 DOI: 10.1007/978-3-319-98116-1_5
A. Davoodi
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引用次数: 0
Simulation-Based Signal Selection 基于仿真的信号选择
Post-Silicon Validation and Debug Pub Date : 2018-09-02 DOI: 10.1007/978-3-319-98116-1_4
Debapriya Chatterjee, V. Bertacco
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引用次数: 0
Selection of Post-Silicon Hardware Assertions 后硅硬件断言的选择
Post-Silicon Validation and Debug Pub Date : 2018-09-02 DOI: 10.1007/978-3-319-98116-1_10
Pouya Taatizadeh, N. Nicolici
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引用次数: 0
Debug Data Reduction Techniques 调试数据缩减技术
Post-Silicon Validation and Debug Pub Date : 2018-09-02 DOI: 10.1007/978-3-319-98116-1_11
Sandeep Chandran, P. Panda
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引用次数: 0
Post-Silicon SoC Validation Challenges 后硅SoC验证挑战
Post-Silicon Validation and Debug Pub Date : 2018-09-02 DOI: 10.1007/978-3-319-98116-1_1
Farimah Farahmandi, P. Mishra
{"title":"Post-Silicon SoC Validation Challenges","authors":"Farimah Farahmandi, P. Mishra","doi":"10.1007/978-3-319-98116-1_1","DOIUrl":"https://doi.org/10.1007/978-3-319-98116-1_1","url":null,"abstract":"","PeriodicalId":227242,"journal":{"name":"Post-Silicon Validation and Debug","volume":"1 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2018-09-02","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"129054941","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Utilization of Debug Infrastructure for Post-Silicon Coverage Analysis 对后硅覆盖分析的调试基础设施的利用
Post-Silicon Validation and Debug Pub Date : 2018-09-02 DOI: 10.1007/978-3-319-98116-1_15
Farimah Farahmandi, P. Mishra
{"title":"Utilization of Debug Infrastructure for Post-Silicon Coverage Analysis","authors":"Farimah Farahmandi, P. Mishra","doi":"10.1007/978-3-319-98116-1_15","DOIUrl":"https://doi.org/10.1007/978-3-319-98116-1_15","url":null,"abstract":"","PeriodicalId":227242,"journal":{"name":"Post-Silicon Validation and Debug","volume":"46 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2018-09-02","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"128521506","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 1
Post-Silicon Fault Localization with Satisfiability Solvers 基于可满足解算器的后硅故障定位
Post-Silicon Validation and Debug Pub Date : 2018-09-02 DOI: 10.1007/978-3-319-98116-1_13
Georg Weissenbacher, S. Malik
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引用次数: 1
SoC Instrumentations: Pre-Silicon Preparation for Post-Silicon Readiness SoC仪器:硅前制备后硅准备
Post-Silicon Validation and Debug Pub Date : 2018-09-02 DOI: 10.1007/978-3-319-98116-1_2
S. Ray
{"title":"SoC Instrumentations: Pre-Silicon Preparation for Post-Silicon Readiness","authors":"S. Ray","doi":"10.1007/978-3-319-98116-1_2","DOIUrl":"https://doi.org/10.1007/978-3-319-98116-1_2","url":null,"abstract":"","PeriodicalId":227242,"journal":{"name":"Post-Silicon Validation and Debug","volume":"7 2‐3","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2018-09-02","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"120833622","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 1
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