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Post-Silicon Validation and Debug最新文献

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The Future of Post-Silicon Debug 后硅调试的未来
Post-Silicon Validation and Debug Pub Date : 2018-09-02 DOI: 10.1007/978-3-319-98116-1_19
Farimah Farahmandi, P. Mishra
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引用次数: 0
Structural Signal Selection for Post-Silicon Validation 后硅验证的结构信号选择
Post-Silicon Validation and Debug Pub Date : 2018-09-02 DOI: 10.1007/978-3-319-98116-1_3
K. Basu
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引用次数: 1
Test Generation and Lightweight Checking for Multi-core Memory Consistency 多核内存一致性的测试生成和轻量级检查
Post-Silicon Validation and Debug Pub Date : 2018-09-02 DOI: 10.1007/978-3-319-98116-1_9
Doowon Lee, V. Bertacco
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引用次数: 0
Coverage Evaluation and Analysis of Post-Silicon Tests with Virtual Prototypes 基于虚拟样机的后硅测试覆盖率评估与分析
Post-Silicon Validation and Debug Pub Date : 2018-09-02 DOI: 10.1007/978-3-319-98116-1_14
Kai Cong, Fei Xie
{"title":"Coverage Evaluation and Analysis of Post-Silicon Tests with Virtual Prototypes","authors":"Kai Cong, Fei Xie","doi":"10.1007/978-3-319-98116-1_14","DOIUrl":"https://doi.org/10.1007/978-3-319-98116-1_14","url":null,"abstract":"","PeriodicalId":227242,"journal":{"name":"Post-Silicon Validation and Debug","volume":"5 3","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2018-09-02","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"120861349","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Network-on-Chip Validation and Debug 片上网络验证和调试
Post-Silicon Validation and Debug Pub Date : 2018-09-02 DOI: 10.1007/978-3-319-98116-1_16
Subodha Charles, P. Mishra
{"title":"Network-on-Chip Validation and Debug","authors":"Subodha Charles, P. Mishra","doi":"10.1007/978-3-319-98116-1_16","DOIUrl":"https://doi.org/10.1007/978-3-319-98116-1_16","url":null,"abstract":"","PeriodicalId":227242,"journal":{"name":"Post-Silicon Validation and Debug","volume":"14 3","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2018-09-02","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"121004669","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
High-Level Debugging of Post-Silicon Failures 后硅故障的高级调试
Post-Silicon Validation and Debug Pub Date : 2018-09-02 DOI: 10.1007/978-3-319-98116-1_12
M. Fujita, Qinhao Wang, Yusuke Kimura
{"title":"High-Level Debugging of Post-Silicon Failures","authors":"M. Fujita, Qinhao Wang, Yusuke Kimura","doi":"10.1007/978-3-319-98116-1_12","DOIUrl":"https://doi.org/10.1007/978-3-319-98116-1_12","url":null,"abstract":"","PeriodicalId":227242,"journal":{"name":"Post-Silicon Validation and Debug","volume":"33 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2018-09-02","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"125224874","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Post-Silicon Signal Selection Using Machine Learning 后硅信号选择使用机器学习
Post-Silicon Validation and Debug Pub Date : 2018-09-02 DOI: 10.1007/978-3-319-98116-1_6
Alif Ahmed, Kamran Rahmani, P. Mishra
{"title":"Post-Silicon Signal Selection Using Machine Learning","authors":"Alif Ahmed, Kamran Rahmani, P. Mishra","doi":"10.1007/978-3-319-98116-1_6","DOIUrl":"https://doi.org/10.1007/978-3-319-98116-1_6","url":null,"abstract":"","PeriodicalId":227242,"journal":{"name":"Post-Silicon Validation and Debug","volume":"41 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2018-09-02","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"123341970","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
On-Chip Constrained-Random Stimuli Generation 片上约束随机刺激生成
Post-Silicon Validation and Debug Pub Date : 2018-09-02 DOI: 10.1007/978-3-319-98116-1_8
Xiaobing Shi, N. Nicolici
{"title":"On-Chip Constrained-Random Stimuli Generation","authors":"Xiaobing Shi, N. Nicolici","doi":"10.1007/978-3-319-98116-1_8","DOIUrl":"https://doi.org/10.1007/978-3-319-98116-1_8","url":null,"abstract":"","PeriodicalId":227242,"journal":{"name":"Post-Silicon Validation and Debug","volume":"51 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2018-09-02","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"122960995","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 1
Observability-Aware Post-Silicon Test Generation 可观察性感知后硅测试一代
Post-Silicon Validation and Debug Pub Date : 2018-09-02 DOI: 10.1007/978-3-319-98116-1_7
Farimah Farahmandi, P. Mishra
{"title":"Observability-Aware Post-Silicon Test Generation","authors":"Farimah Farahmandi, P. Mishra","doi":"10.1007/978-3-319-98116-1_7","DOIUrl":"https://doi.org/10.1007/978-3-319-98116-1_7","url":null,"abstract":"","PeriodicalId":227242,"journal":{"name":"Post-Silicon Validation and Debug","volume":"57 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2018-09-02","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"126560902","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 1
SoC Security Versus Post-Silicon Debug Conflict SoC安全性与后硅调试冲突
Post-Silicon Validation and Debug Pub Date : 2018-09-02 DOI: 10.1007/978-3-319-98116-1_18
Yangdi Lyu, Yuanwen Huang, P. Mishra
{"title":"SoC Security Versus Post-Silicon Debug Conflict","authors":"Yangdi Lyu, Yuanwen Huang, P. Mishra","doi":"10.1007/978-3-319-98116-1_18","DOIUrl":"https://doi.org/10.1007/978-3-319-98116-1_18","url":null,"abstract":"","PeriodicalId":227242,"journal":{"name":"Post-Silicon Validation and Debug","volume":"120 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2018-09-02","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"129028852","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
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