2010 IEEE Long Island Systems, Applications and Technology Conference最新文献

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North Atlantic Right Whale acoustic signal processing: Part I. comparison of machine learning recognition algorithms 北大西洋露脊鲸声学信号处理:第一部分:机器学习识别算法的比较
2010 IEEE Long Island Systems, Applications and Technology Conference Pub Date : 2010-05-07 DOI: 10.1109/LISAT.2010.5478268
Peter J. Dugan, A. Rice, I. Urazghildiiev, C. Clark
{"title":"North Atlantic Right Whale acoustic signal processing: Part I. comparison of machine learning recognition algorithms","authors":"Peter J. Dugan, A. Rice, I. Urazghildiiev, C. Clark","doi":"10.1109/LISAT.2010.5478268","DOIUrl":"https://doi.org/10.1109/LISAT.2010.5478268","url":null,"abstract":"This paper compares three different approaches currently used in recognizing contact calls made from the North Atlantic Right Whale (NRW), Eubalaena glacialis. We present two new approaches consisting of machine learning algorithms based on artificial neural networks (NET) and the classification and regression tree classifiers (CART), and compare their performance with earlier work that employs multi-Stage feature vector testing (FVT) approach. A combined total of over 100,000 noise and NRW up-call events were used in the study. Calls were primarily recorded from two areas, Cape Cod Bay and Great South Channel. Of the three classifiers, the CART had the highest assignment rates, overall 86.45% with highest false positive rates (≪100 per hour). The FVT Method had exceptionally low false positive rates, with ≪50 per hour. However, it had an overall assignment rate less than the NET. The CART had statistically the same false positive rate as the NET with the highest assignment rates, 2.2% higher than the NET and 11.75% greater than the FVT Method. Details of the results are shown and extensions to the research are discussed.","PeriodicalId":220573,"journal":{"name":"2010 IEEE Long Island Systems, Applications and Technology Conference","volume":"4 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2010-05-07","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"127917605","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 36
RFID design using EM analysis 利用EM分析进行RFID设计
2010 IEEE Long Island Systems, Applications and Technology Conference Pub Date : 2009-11-03 DOI: 10.1109/LISAT.2010.5478272
J. Rautio
{"title":"RFID design using EM analysis","authors":"J. Rautio","doi":"10.1109/LISAT.2010.5478272","DOIUrl":"https://doi.org/10.1109/LISAT.2010.5478272","url":null,"abstract":"RFID (Radio Frequency IDentification) is a very widely used technology and is still rapidly developing. RFID uses include tracking equipment, goods, animals, etc. Tracking helps a business optimize their processes thus reducing operating cost. As a result, there is an increased need for accurate and fast design of the RF portion of RFID systems. In this tutorial overview we show how easily it can be to design the key RF portions of an RFID system by using EM analysis. This paper starts with a brief overview of antenna design and performance criteria and different kinds of EM (electromagnetic) analyses appropriate for RFID design. Two design examples will be illustrated. Due to paper length limitations, descriptions are necessarily brief.","PeriodicalId":220573,"journal":{"name":"2010 IEEE Long Island Systems, Applications and Technology Conference","volume":"2 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2009-11-03","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"126722324","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 8
Photoluminescence modification in self-assembled fluorescent 3D photonic crystals 自组装荧光三维光子晶体的光致发光修饰
2010 IEEE Long Island Systems, Applications and Technology Conference Pub Date : 2009-10-14 DOI: 10.1109/LISAT.2010.5478276
H. Krishnamoorthy, J. H. Song, I. Kretzschmar, V. Menon
{"title":"Photoluminescence modification in self-assembled fluorescent 3D photonic crystals","authors":"H. Krishnamoorthy, J. H. Song, I. Kretzschmar, V. Menon","doi":"10.1109/LISAT.2010.5478276","DOIUrl":"https://doi.org/10.1109/LISAT.2010.5478276","url":null,"abstract":"We report modification of photoluminescence by a 3D photonic crystal fabricated using fluorescent polystyrene microspheres by the process of self-assembly. We demonstrate the photoluminescence (PL) modification from self-assembled 3D photonic crystals fabricated using fluorescent polystyrene (PS) spheres. The refractive index contrast in this system is ∼ 0.57, which is quite small. The modification is observed in the first order photonic bandgap that occurs in these systems. The simulated band structure of the photonic crystal shows a bandgap between the first and second bands in the LU direction. This first order bandgap lies in the red region of the visible spectrum. Experimentally, the bandstucture is studied by performing angle dependent reflectivity. We found good agreement between the simulated band structure and the one obtained from reflectivity. The dye infiltrated into the PS microspheres emits into the bandgap of the photonic crystal. As a result of the reduced number density of states within the bandgap, the radiative decay rate is slowed down. This modification in the radiative decay rate was studied using both steady state and time resolved PL measurements. The steady state photoluminescence spectrum of the dye overlaps with the first order band gap of the photonic crystal. Using time resolved photoluminescence measurements, we report a 10% increase in the spontaneous emission lifetime.","PeriodicalId":220573,"journal":{"name":"2010 IEEE Long Island Systems, Applications and Technology Conference","volume":"84 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2009-10-14","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"123838464","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 1
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