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Proceedings of NORTHCON '94最新文献

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Development of a portable data acquisition and analysis system for industrial gas turbines 便携式工业燃气轮机数据采集与分析系统的研制
Proceedings of NORTHCON '94 Pub Date : 1994-10-11 DOI: 10.1109/NORTHC.1994.643320
S.G. Gemmell
{"title":"Development of a portable data acquisition and analysis system for industrial gas turbines","authors":"S.G. Gemmell","doi":"10.1109/NORTHC.1994.643320","DOIUrl":"https://doi.org/10.1109/NORTHC.1994.643320","url":null,"abstract":"This portable computerized data acquisition system was developed to assist those maintaining industrial gas turbines. The original system was designed to easily interface with a single type of control system. As the benefits accruing to users of the portable system became apparent, modifications were made to allow easy connection to other control systems. An integral component of the PortaScan system was the portable computer. When slotless laptops became ubiquitous, the data acquisition hardware was redesigned to fit into a single suitcase and be controlled through the laptop's printer port. At the same time, the new system was redesigned to reduce manufacturing costs and increase its marketability by incorporating previous modifications for interfacing with any control or instrumentation system. This portable data acquisition and analysis system is proving its worth as a cost-effective tool in operating and maintaining industrial gas turbines. Users throughout the world report substantial savings from using PortaScan.","PeriodicalId":218454,"journal":{"name":"Proceedings of NORTHCON '94","volume":null,"pages":null},"PeriodicalIF":0.0,"publicationDate":"1994-10-11","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"131097429","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Implementing ISO 9000 as a key business issue 将iso9000作为关键的业务问题来实施
Proceedings of NORTHCON '94 Pub Date : 1994-10-11 DOI: 10.1109/NORTHC.1994.638962
D.N. Middleton
{"title":"Implementing ISO 9000 as a key business issue","authors":"D.N. Middleton","doi":"10.1109/NORTHC.1994.638962","DOIUrl":"https://doi.org/10.1109/NORTHC.1994.638962","url":null,"abstract":"This paper will address some of the key business issues in an organization, identify the need for effective Quality Management Systems, and the way in which ISO 9000 may help address those needs. ISO 9000 provides a basic criteria and a well-developed set of requirements and, used correctly, can help support and provide the tools to meet business objectives. However, the business comes first, the quality system supports the business - both issues need to be integrated to provide management with the means to develop and keep satisfied customers.","PeriodicalId":218454,"journal":{"name":"Proceedings of NORTHCON '94","volume":null,"pages":null},"PeriodicalIF":0.0,"publicationDate":"1994-10-11","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"130999769","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Reliable error-free industrial communications using advanced carrier modulation techniques 可靠的无差错工业通信采用先进的载波调制技术
Proceedings of NORTHCON '94 Pub Date : 1994-10-11 DOI: 10.1109/NORTHC.1994.638954
M. Maes, J.R. Steffey
{"title":"Reliable error-free industrial communications using advanced carrier modulation techniques","authors":"M. Maes, J.R. Steffey","doi":"10.1109/NORTHC.1994.638954","DOIUrl":"https://doi.org/10.1109/NORTHC.1994.638954","url":null,"abstract":"Advanced carrier modulation (CM) technology can be applied to conditions requiring the utmost reliability and \"user friendly\" ease of installation, operation and reconfiguration, often at significantly lower cost. The technology supports data transmission for a wide variety of applications, such as process control, data acquisition, monitoring, energy management, access control, etc. Modular, portable units may be used for point-to-point, multi-drop, polling/addressing, multiplexing or full LAN applications transmitting discrete, analog (4-20 mA, 0-5 volt, etc.), pulse or digital (RS232, 422, 485) data.","PeriodicalId":218454,"journal":{"name":"Proceedings of NORTHCON '94","volume":null,"pages":null},"PeriodicalIF":0.0,"publicationDate":"1994-10-11","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"125501229","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
System design verification leading to unprecedented quality 系统设计验证带来前所未有的质量
Proceedings of NORTHCON '94 Pub Date : 1994-10-11 DOI: 10.1109/NORTHC.1994.643343
W. Lattin
{"title":"System design verification leading to unprecedented quality","authors":"W. Lattin","doi":"10.1109/NORTHC.1994.643343","DOIUrl":"https://doi.org/10.1109/NORTHC.1994.643343","url":null,"abstract":"The author focuses on systems design verification leading to unprecedented quality of ICs, ASICs, printed circuit boards and modules in systems. The Logic Modeling Group of Synopsys, Inc. provides simulation models so that customers get the ASICs right the first time in a systems environment. In addition to ASIC verification, Logic Modeling makes it possible for unprecedented quality of printed circuit board designs by getting the first or second revision of a board ready for manufacturing. Many of today's electronics companies spin boards three to five times and often change PLD or FPGA programs as many as seven to ten times. The only way to achieve real quality in the design process is to radically change the design verification methodology. Design verification needs to happen in the early stages of the design process before board prototyping or before ASIC fab.","PeriodicalId":218454,"journal":{"name":"Proceedings of NORTHCON '94","volume":null,"pages":null},"PeriodicalIF":0.0,"publicationDate":"1994-10-11","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"133692657","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Modeling magnetic devices using the gyrator re-cap core model 利用旋转器重盖磁芯模型对磁性器件进行建模
Proceedings of NORTHCON '94 Pub Date : 1994-10-11 DOI: 10.1109/NORTHC.1994.638970
M. Eaton
{"title":"Modeling magnetic devices using the gyrator re-cap core model","authors":"M. Eaton","doi":"10.1109/NORTHC.1994.638970","DOIUrl":"https://doi.org/10.1109/NORTHC.1994.638970","url":null,"abstract":"This paper is an extension of the gyrator-capacitor more model introduced by D.C. Hamill (1994). This core model is simple, efficient and handles both linear and nonlinear cores. The only item lacking is an efficient core loss element for determining circuit Q and efficiency. The gyrator re-cap core model contains a core loss element that takes into account both eddy current and core hysteresis losses. This paper describes the model and then demonstrates how to use it to accurately model the following magnetic devices: inductor; transformer; flyback transformer; ferroresonant regulator; and flux gate magnetometer.","PeriodicalId":218454,"journal":{"name":"Proceedings of NORTHCON '94","volume":null,"pages":null},"PeriodicalIF":0.0,"publicationDate":"1994-10-11","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"125069726","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 19
Adding built-in self test to a non-intrusive trailer light system 在非侵入式拖车灯系统中增加内置自检
Proceedings of NORTHCON '94 Pub Date : 1994-10-11 DOI: 10.1109/NORTHC.1994.643328
D. Howe, F. Wang
{"title":"Adding built-in self test to a non-intrusive trailer light system","authors":"D. Howe, F. Wang","doi":"10.1109/NORTHC.1994.643328","DOIUrl":"https://doi.org/10.1109/NORTHC.1994.643328","url":null,"abstract":"This paper describes a design for testability feature using Built-in Self-Test (BIST) for a Non-Intrusive Trailer Light System (NITLS) prototype senior design project at Cogswell College North. NITLS substitutes an optical connection for the traditional electrical connection between towing vehicle and trailer. The addition of BIST, while accounting for a 95% growth in the silicon die size, was justified due to the fixed fabrication costs, the limited access to adequate test equipment, and the need for reliability due to the hostile operating environment. The Built-in Logic Block Observer (BILBO) BIST module was suitable for addition through a silicon compiler using logic synthesis.","PeriodicalId":218454,"journal":{"name":"Proceedings of NORTHCON '94","volume":null,"pages":null},"PeriodicalIF":0.0,"publicationDate":"1994-10-11","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"114043820","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 1
Metrics of effectiveness for micro and macro decision analysis applications 微观和宏观决策分析应用程序的有效性度量
Proceedings of NORTHCON '94 Pub Date : 1994-10-11 DOI: 10.1109/NORTHC.1994.643350
P. Murphy
{"title":"Metrics of effectiveness for micro and macro decision analysis applications","authors":"P. Murphy","doi":"10.1109/NORTHC.1994.643350","DOIUrl":"https://doi.org/10.1109/NORTHC.1994.643350","url":null,"abstract":"By macro decision analysis applications we refer to systems supporting decisions that directly involve human agents whose decisions may have major impact on the agent's organization. By micro decision analysis applications we mean systems where large numbers of decisions are made by automated decision systems, but the effect of each individual decision is not significant. In the former, few trials are available for statistical evaluation, but diverse meaningful metrics may be established which taken together offer reasonable evidence that a given application is cost effective. In the latter, metrics to demonstrate an increase in decision performance may be demonstrated statistically, but an analyst often has little insight into the decision process. An application involving the acquisition of a super computer is used to illustrate a macro-decision application, while a neural-net based application elucidates the micro case. It is then argued that the ultimate acceptance of decision analysis technologies depends on the provision of both process and performance metrics.","PeriodicalId":218454,"journal":{"name":"Proceedings of NORTHCON '94","volume":null,"pages":null},"PeriodicalIF":0.0,"publicationDate":"1994-10-11","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"115103132","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Technology assessment of decision-analysis methodologies 决策分析方法的技术评估
Proceedings of NORTHCON '94 Pub Date : 1994-10-11 DOI: 10.1109/NORTHC.1994.643348
S. Iverson
{"title":"Technology assessment of decision-analysis methodologies","authors":"S. Iverson","doi":"10.1109/NORTHC.1994.643348","DOIUrl":"https://doi.org/10.1109/NORTHC.1994.643348","url":null,"abstract":"For the development of a set of metrics to assess the effectiveness of tools, techniques, and procedures to aid in group decision-making, a technology assessment methodology is outlined. This paper addresses a set of considerations and criteria to generate the advantages and limitations inherent to the technologies involved with the purpose of avoiding some of the pitfalls and negative secondary repercussions that can stem from their use. Software tools that are intended to facilitate group decision-making include a set of techniques for the internal processing of information. They call for data and information given a particular world view which may or may not fit the organizational structure.","PeriodicalId":218454,"journal":{"name":"Proceedings of NORTHCON '94","volume":null,"pages":null},"PeriodicalIF":0.0,"publicationDate":"1994-10-11","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"122778258","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Electric vehicle developments in Europe and Japan 欧洲和日本的电动汽车发展
Proceedings of NORTHCON '94 Pub Date : 1994-10-11 DOI: 10.1109/NORTHC.1994.643351
J. Yerkes
{"title":"Electric vehicle developments in Europe and Japan","authors":"J. Yerkes","doi":"10.1109/NORTHC.1994.643351","DOIUrl":"https://doi.org/10.1109/NORTHC.1994.643351","url":null,"abstract":"Volkswagen, Mercedes, and the big three Japanese companies, Nissan, Toyota and Honda may develop for the 1998 model year good basic electric cars. VW's Concept 1 will be offered with gasoline, diesel/electric, and full electric drive trains. From a cost stand point most of the cars will be offered with improved lead-acid batteries such as the Horizon with NiCd or some form of advanced battery as an upgrade or high performance option. General Motors will sell the Impact with lead-acid batteries. The position of Ford and Chrysler is unknown at this point, but both are fielding electric versions of vans already in production. At least one of these efforts may pay off and after 2000 the electric car could improve rapidly.","PeriodicalId":218454,"journal":{"name":"Proceedings of NORTHCON '94","volume":null,"pages":null},"PeriodicalIF":0.0,"publicationDate":"1994-10-11","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"130487623","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 3
A systematic technique to modeling of power semiconductor devices for power electronic simulation 一种用于电力电子仿真的功率半导体器件的系统建模技术
Proceedings of NORTHCON '94 Pub Date : 1994-10-11 DOI: 10.1109/NORTHC.1994.638968
C.L. Ma, P. Lauritzen
{"title":"A systematic technique to modeling of power semiconductor devices for power electronic simulation","authors":"C.L. Ma, P. Lauritzen","doi":"10.1109/NORTHC.1994.638968","DOIUrl":"https://doi.org/10.1109/NORTHC.1994.638968","url":null,"abstract":"Accurate power semiconductor device models are needed to predict large overshoot voltages and currents, switching power losses, conducted EMI etc. in the design of high performance, reliable power converters. A new systematic modeling technique, the lumped-charge modeling technique, is used to construct high power device models for power electronic circuit simulation. The lumped-charge models are composed of simple and continuous device equations and are valid over a wide range of operation. They represent a new generation of accurate power semiconductor device models.","PeriodicalId":218454,"journal":{"name":"Proceedings of NORTHCON '94","volume":null,"pages":null},"PeriodicalIF":0.0,"publicationDate":"1994-10-11","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"133243250","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 6
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