2021 International Seminar on Electron Devices Design and Production (SED)最新文献_第4页

Method for Transmitting Information under Conditions of Excess of Interference Level over Useful Narrowband Signal 有效窄带信号干扰水平超过干扰水平条件下的信息传输方法

2021 International Seminar on Electron Devices Design and Production (SED) Pub Date : 2021-04-27 DOI: 10.1109/SED51197.2021.9444536

D. Artamonov, N. Grachev

{"title":"Method for Transmitting Information under Conditions of Excess of Interference Level over Useful Narrowband Signal","authors":"D. Artamonov, N. Grachev","doi":"10.1109/SED51197.2021.9444536","DOIUrl":"https://doi.org/10.1109/SED51197.2021.9444536","url":null,"abstract":"There are various methods for suppressing radio interference in communications. In particular, interference exceeding the useful signal level. However, these methods in most cases are based on the parameters of the interference in the spectrums' range, the occurrence's time, the action's direction, polarization, etc. It is known that radio systems with a single receiver do not have effective suppressions' means of powerful broadband interference. In addition, there are fundamental limitations of single-channel information transmission systems formulated in the Shannon-Hartley theorem. We have developed a digital signal processing algorithm. It suppresses radio interference and selects a narrowband useful signal. This algorithm is based on the method of spatially spaced two-channel synchronous reception. The research results show high efficiency. The theoretical model allows error-free transmission of information with a signal-to-noise ratio up to minus 26.5dB. This method will significantly improve information transmission systems for their key parameters. These include the frequency range used and noise immunity.","PeriodicalId":215744,"journal":{"name":"2021 International Seminar on Electron Devices Design and Production (SED)","volume":"25 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2021-04-27","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"123250237","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

引用次数: 1

AC/DC Converter Integrated into the Aircraft Generator AC/DC变换器集成到飞机发电机

2021 International Seminar on Electron Devices Design and Production (SED) Pub Date : 2021-04-27 DOI: 10.1109/SED51197.2021.9444501

Ismagilov Flur Rashitovich, Yamalov Ilnar Ildarovich, Urazbakhtin Ruslan Rustemovich, Levchenko Lev Igorevich, Sultanov Azat Maratovich

引用次数: 0

Fast Emotion Recognition Neural Network for IoT Devices 面向物联网设备的快速情感识别神经网络

2021 International Seminar on Electron Devices Design and Production (SED) Pub Date : 2021-04-27 DOI: 10.1109/SED51197.2021.9444517

S. Mikhaylevskiy, V. Chernyavskiy, V. Pavlishen, I. Romanova, R. Solovyev

{"title":"Fast Emotion Recognition Neural Network for IoT Devices","authors":"S. Mikhaylevskiy, V. Chernyavskiy, V. Pavlishen, I. Romanova, R. Solovyev","doi":"10.1109/SED51197.2021.9444517","DOIUrl":"https://doi.org/10.1109/SED51197.2021.9444517","url":null,"abstract":"The last decades have witnessed rapid IoT technologies development, which provided ubiquitous human-computer interactions. Building intelligent systems of various types, among which emotion recognition systems, is important challenge nowadays. Especially pressing problem is to build a real-time portable system which can be embedded in low performance hardware. We propose a high accuracy emotion recognition system, which can be deployed on a single board Raspberry Pi computer to perform real-time recognition of 4 facial expressions: neutral, angry, surprised, and happy. Recognition pipeline is divided into two main stages: human face detection and facial expression classification. Both stages are performed by deep neural networks with simple yet effective design. Several optimization techniques, such as weights quantization and model tracing, were applied after model training, to gain extra execution time reduction. The introduced system is lightweight and fast, is executed locally on a cost-effective single board computer, and requires minimum resources to make and transmit predictions, what makes proposed system an effective IoT device.","PeriodicalId":215744,"journal":{"name":"2021 International Seminar on Electron Devices Design and Production (SED)","volume":"23 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2021-04-27","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"134302476","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

引用次数: 4

Understanding join strategies in distributed systems 理解分布式系统中的连接策略

2021 International Seminar on Electron Devices Design and Production (SED) Pub Date : 2021-04-27 DOI: 10.1109/SED51197.2021.9444489

Yevgeniya Tyryshkina

引用次数: 0

Experimental Studies of Temperature-Controlled Discharge Characteristics and Calculation of the Heat Generation Rate of NMC Type Battery Cells NMC型电池温控放电特性实验研究及产热率计算

2021 International Seminar on Electron Devices Design and Production (SED) Pub Date : 2021-04-27 DOI: 10.1109/SED51197.2021.9444497

A. Varyukhin, V. Zakharchenko, A. A. Osika, G. Ivanov, D. Zhuravlev, I. Kiselev, A. V. Geliev, A. N. Kim

引用次数: 0

Methodology for Choosing a Method and Instruments of Measuring Technological Modes and Parameters of Synthesized Coatings According to Technical and Economic Indicators 根据技术经济指标选择合成涂料工艺模式和工艺参数测量方法和仪器的方法学

2021 International Seminar on Electron Devices Design and Production (SED) Pub Date : 2021-04-27 DOI: 10.1109/SED51197.2021.9444495

E. Pecherskaya, P. Golubkov, V. V. Antipenko, A. Volik, G. Kozlov, T. Zinchenko

{"title":"Methodology for Choosing a Method and Instruments of Measuring Technological Modes and Parameters of Synthesized Coatings According to Technical and Economic Indicators","authors":"E. Pecherskaya, P. Golubkov, V. V. Antipenko, A. Volik, G. Kozlov, T. Zinchenko","doi":"10.1109/SED51197.2021.9444495","DOIUrl":"https://doi.org/10.1109/SED51197.2021.9444495","url":null,"abstract":"It has been shown that in order to obtain oxide coatings with desired properties, in the process of their synthesis, it is necessary to measure and control the technological parameters and properties of the coatings. The authors proposed an automated system for the synthesis and study of coating parameters by the micro-arc oxidation method. An algorithm for the selection of methods and instruments for measuring technological modes and parameters of synthesized coatings according to technical and economic indicators and a method for choosing the optimal means for measuring technological parameters of the microarc oxidation process according to technical and economic indicators based on the average gain criterion have been developed. The analyzed technical indicators include metrological characteristics of measuring instruments. The technique was implemented in the selection of optimal measuring instruments for coating parameters in the process of micro-arc oxidation, which confirmed the relevance of the development of an automated system for the synthesis of coatings with specified properties, with a relative measurement error of the parameters not exceeding ±0.5 % by micro-arc oxidation.","PeriodicalId":215744,"journal":{"name":"2021 International Seminar on Electron Devices Design and Production (SED)","volume":"19 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2021-04-27","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"121242320","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

引用次数: 1

Construction and Calibration of Inclinometric Systems with Fluxgate and Accelerometric Sensors 带有磁通门和加速度传感器的倾角测量系统的构建和校准

2021 International Seminar on Electron Devices Design and Production (SED) Pub Date : 2021-04-27 DOI: 10.1109/SED51197.2021.9444505

D. Milovzorov, V. Yasoveev

引用次数: 0

Complex Method for Determining the Technical Condition of Electronic Devices Based on a Cognitive Model, Petri Nets and Artificial Neural Network 基于认知模型、Petri网和人工神经网络的电子设备技术状态复杂判定方法

2021 International Seminar on Electron Devices Design and Production (SED) Pub Date : 2021-04-27 DOI: 10.1109/SED51197.2021.9444531

A. Kolodenkova, S. Vereshchagina

{"title":"Complex Method for Determining the Technical Condition of Electronic Devices Based on a Cognitive Model, Petri Nets and Artificial Neural Network","authors":"A. Kolodenkova, S. Vereshchagina","doi":"10.1109/SED51197.2021.9444531","DOIUrl":"https://doi.org/10.1109/SED51197.2021.9444531","url":null,"abstract":"The paper proposes a complex method for determining the technical condition of electronic devices (TC of ED) based on building a heterogeneous cognitive model (HCM), a simulation network model and formation of an artificial neural network (ANN). The well-proven and established in modeling discrete processes Petri net acts here as a simulation network model. The novelty of the given method is the combination of the HCM and the Petri net to obtain additional information about TC of ED and to build on their basis the ANN for making diagnostic decisions under measuring and expert information. ANN is used to solve the classification problem that allows one to identify the state of the ED which are characterized by certain parameter values and range it to one of the several pairwise non-intersecting specified classes. The paper presents a table of flowchart conversion into HCM, Petri net, as well as algorithms for converting HCM and Petri net into ANN with some assumptions. This allows one to avoid the select problem of the ANN structure, which is carried out on the basis of the operational personnel experience and scores of attempts to conduct training. The method proposed is illustrated by the example of determining the TC of microcontrollers in control systems.","PeriodicalId":215744,"journal":{"name":"2021 International Seminar on Electron Devices Design and Production (SED)","volume":"255 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2021-04-27","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"115428939","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

引用次数: 2

The Method of Diagnostics of Radio-Electronic Means Based on the Analysis of Shock Effects by Means of Machine Learning Algorithms 基于机器学习算法的冲击效应分析的无线电电子仪器诊断方法

2021 International Seminar on Electron Devices Design and Production (SED) Pub Date : 2021-04-27 DOI: 10.1109/SED51197.2021.9444499

Daniel E. Kondrashov, K. Bushmeleva, S. Uvaysov, P. Bushmelev

{"title":"The Method of Diagnostics of Radio-Electronic Means Based on the Analysis of Shock Effects by Means of Machine Learning Algorithms","authors":"Daniel E. Kondrashov, K. Bushmeleva, S. Uvaysov, P. Bushmelev","doi":"10.1109/SED51197.2021.9444499","DOIUrl":"https://doi.org/10.1109/SED51197.2021.9444499","url":null,"abstract":"The content of the article focuses on the problem of insufficient effectiveness of existing methods of diagnostics of radio-electronic means, in particular, aimed at identifying structural defects. The defects of mechanical nature are not given sufficient attention, so the development of a diagnostic system aimed at identifying structural defects is an urgent task of practical significance. To solve this problem, it is proposed to use modern information technologies, including machine learning algorithms, which in turn will be implemented in the developed methodology for diagnosing radio-electronic means based on the analysis of impact impacts and which in turn will involve artificial neural networks based on the recognition of images of structural defects obtained after mechanical impacts. The paper describes in detail the specified diagnostic method, determines the configuration of the artificial neural network and calculates its accuracy, which in turn allows us to conclude that the chosen approach is promising. The paper presents a project of an automated system for diagnosing radio-electronic means based on the analysis of shock effects using neural networks, defines its architecture, designs the main modules, and determines the types of software.","PeriodicalId":215744,"journal":{"name":"2021 International Seminar on Electron Devices Design and Production (SED)","volume":"50 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2021-04-27","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"126763572","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

引用次数: 0

Development of the indoor climate control system 室内气候控制系统的开发

2021 International Seminar on Electron Devices Design and Production (SED) Pub Date : 2021-04-27 DOI: 10.1109/SED51197.2021.9444525

S. Polesskiy, Daniel Klyuvakov, Alexander Tonkov

引用次数: 0