2008 IEEE International Conference on Electro/Information Technology最新文献

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Defending selective forwarding attacks in WMNs 防范wmn选择性转发攻击
2008 IEEE International Conference on Electro/Information Technology Pub Date : 2008-05-18 DOI: 10.1109/EIT.2008.4554274
D. Shila, T. Anjali
{"title":"Defending selective forwarding attacks in WMNs","authors":"D. Shila, T. Anjali","doi":"10.1109/EIT.2008.4554274","DOIUrl":"https://doi.org/10.1109/EIT.2008.4554274","url":null,"abstract":"Wireless Mesh Networks (WMNs) have emerged recently as a promising technology for next-generation wireless networking to provide wide variety of applications that cannot be supported directly by other wireless networks. In WMNs, security is turning out to be a major concern and little attention has been paid to this topic by the research community. In this paper, we investigate a serious security threat known as the selective forwarding attack (gray hole attack). In a selective forwarding attack, a malicious node refuses to forward all or a subset of the packets it receives. Such selective dropping is challenging to defend against. In this paper, we present an algorithm to defend against selective forwarding attacks based on AODV routing protocol. The first phase of the algorithm is Counter-Threshold Based and uses the detection threshold and packet counter to identify the attacks and the second phase is Query-Based and uses acknowledgment from the intermediate nodes to localize the attacker. We also present simulation results to illustrate the efficiency of the proposed algorithm. To the best of our knowledge, this is the first paper to present an algorithm for defending selective forwarding attacks in WMN.","PeriodicalId":215400,"journal":{"name":"2008 IEEE International Conference on Electro/Information Technology","volume":"22 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2008-05-18","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"133788975","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 64
Architecture of an ATCS network simulator ATCS网络模拟器的体系结构
2008 IEEE International Conference on Electro/Information Technology Pub Date : 2008-05-18 DOI: 10.1109/EIT.2008.4554320
P. Craven
{"title":"Architecture of an ATCS network simulator","authors":"P. Craven","doi":"10.1109/EIT.2008.4554320","DOIUrl":"https://doi.org/10.1109/EIT.2008.4554320","url":null,"abstract":"This paper discusses the architecture of a new system created to simulate a networking protocol called advanced train control system (ATCS). ATCS is a popular protocol used by railways to control track switches, relay sensor readings, and help improve safety. The new simulation environment plugs into the Network Simulator-2 (NS-2) framework, allowing the user to model railroad data networks. This simulator can be used to validate networks, predict how a network will act at load limits, test security vulnerabilities, and find what will happen when nodes fail.","PeriodicalId":215400,"journal":{"name":"2008 IEEE International Conference on Electro/Information Technology","volume":"206 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2008-05-18","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"132726811","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 2
Hierarchical plug-and-play self-diagnosable intelligent sensor networks for process control 用于过程控制的分层即插即用自诊断智能传感器网络
2008 IEEE International Conference on Electro/Information Technology Pub Date : 2008-05-18 DOI: 10.1109/EIT.2008.4554306
B. Joshi, T. Vincent, Jinran Chen, Arun Kumar Somani, N. Gomez, Reshmi Mitra
{"title":"Hierarchical plug-and-play self-diagnosable intelligent sensor networks for process control","authors":"B. Joshi, T. Vincent, Jinran Chen, Arun Kumar Somani, N. Gomez, Reshmi Mitra","doi":"10.1109/EIT.2008.4554306","DOIUrl":"https://doi.org/10.1109/EIT.2008.4554306","url":null,"abstract":"The focus of this research was to design a framework to create highly autonomous fault-tolerant distributed sensor networks with plug-and-play capabilities. This would enable diagnosis of faulty sensors and reconfiguration of the network in real time to ensure that the control of the manufacturing process can continue with accurate information in presence of sensor and processing element faults. The strategy is based on the recently approved IEEE 1451 family of standards. The innovative feature of the proposed effort is the IEEE 1451-based plug-and-play architecture that could lead to the development of a new member in the IEEE 1451 family of standards that will address reliability issues of the sensor networks.","PeriodicalId":215400,"journal":{"name":"2008 IEEE International Conference on Electro/Information Technology","volume":"454 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2008-05-18","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"134520354","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 5
Conception of an ultrasonic system for assistance to the diagnosis of the osteoporosis 超声辅助骨质疏松症诊断系统的构想
2008 IEEE International Conference on Electro/Information Technology Pub Date : 2008-05-18 DOI: 10.1109/EIT.2008.4554319
K. Saidi, Y. Remram, M. Attari
{"title":"Conception of an ultrasonic system for assistance to the diagnosis of the osteoporosis","authors":"K. Saidi, Y. Remram, M. Attari","doi":"10.1109/EIT.2008.4554319","DOIUrl":"https://doi.org/10.1109/EIT.2008.4554319","url":null,"abstract":"Existing ultrasound devices for assessing the human tibia are based on detecting the first arriving signal, corresponding to a wave propagating at, or close to, the bulk longitudinal velocity in bone. However, human long bones are effectively irregular hollow tubes and should theoretically support the propagation of more complex guided modes similar to Lamb waves in plates. The present work is dedicated to a preliminary survey in order to have an approach on the interaction of the ultrasonic waves generated by focusing sensors to bone environment. In this context an ultrasonic system based on a pair of transducers (transmitter and receiver) vibrating at 100 kHz was set up to measure the wave velocity with great precision in a sample materials for the purpose of calibration before the measurement in bones. The constructed system includes a digital calliper for distance measurement with great precision and an electronic system including an emitter and a receiver circuit controlled by a programmable FPGA circuit. This latter was incorporated in the system in order to measure a shorts time flight between the two transducers. The measurement of these two parameters with a good precision will give the ultrasonic velocity between the two transducers that establish a link to mechanical parameters of the sample materials such as its thickness, density and Young modulus.","PeriodicalId":215400,"journal":{"name":"2008 IEEE International Conference on Electro/Information Technology","volume":"119 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2008-05-18","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"127595981","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 1
English-Malayalam Cross-Lingual Information Retrieval — an experience 英语-马拉雅拉姆语跨语言信息检索-一种体验
2008 IEEE International Conference on Electro/Information Technology Pub Date : 2008-05-18 DOI: 10.1109/EIT.2008.4554312
P. Nikesh, S. M. Idicula, S. DavidPeter
{"title":"English-Malayalam Cross-Lingual Information Retrieval — an experience","authors":"P. Nikesh, S. M. Idicula, S. DavidPeter","doi":"10.1109/EIT.2008.4554312","DOIUrl":"https://doi.org/10.1109/EIT.2008.4554312","url":null,"abstract":"This paper describes about an English-Malayalam cross-lingual information retrieval system. The system retrieves Malayalam documents in response to query given in English or Malayalam. Thus monolingual information retrieval is also supported in this system. Malayalam is one of the most prominent regional languages of Indian subcontinent. It is spoken by more than 37 million people and is the native language of Kerala state in India. Since we neither had any full-fledged online bilingual dictionary nor any parallel corpora to build the statistical lexicon, we used a bilingual dictionary developed in house for translation. Other language specific resources like Malayalam stemmer, Malayalam morphological root analyzer etc developed in house were used in this work.","PeriodicalId":215400,"journal":{"name":"2008 IEEE International Conference on Electro/Information Technology","volume":"40 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2008-05-18","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"131258402","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 7
Scalable multimedia-content integrity verification with robust hashing 具有健壮散列的可伸缩多媒体内容完整性验证
2008 IEEE International Conference on Electro/Information Technology Pub Date : 2008-05-18 DOI: 10.1109/EIT.2008.4554310
S. Ababneh, R. Ansari, A. Khokhar
{"title":"Scalable multimedia-content integrity verification with robust hashing","authors":"S. Ababneh, R. Ansari, A. Khokhar","doi":"10.1109/EIT.2008.4554310","DOIUrl":"https://doi.org/10.1109/EIT.2008.4554310","url":null,"abstract":"We propose a scalable, robust and recovery-driven multimedia content authentication system which exploits content-based robust hashing and watermark embedding to provide effective integrity verification of multimedia content. In addition, we propose providing content recovery by exploiting the collaborative decentralized nature of P2P networks. In this paper, we focus on the issues pertaining to the competing requirements of authentication robustness and tamper-detection accuracy. To this end, we describe a hierarchal hashing scheme that combines both fragile and robust features to generate a versatile watermark. We implement a representative image hashing that is robust to JPEG2000 compression and embedding distortion while being sensitive to tampering. Experimental results are presented to show the schemepsilas effectiveness.","PeriodicalId":215400,"journal":{"name":"2008 IEEE International Conference on Electro/Information Technology","volume":"1 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2008-05-18","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"122950940","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 3
A unified backward approach to the code book design problem 统一后向方法解决码本设计问题
2008 IEEE International Conference on Electro/Information Technology Pub Date : 2008-05-18 DOI: 10.1109/EIT.2008.4554340
Taisir Eldos, R. Omari
{"title":"A unified backward approach to the code book design problem","authors":"Taisir Eldos, R. Omari","doi":"10.1109/EIT.2008.4554340","DOIUrl":"https://doi.org/10.1109/EIT.2008.4554340","url":null,"abstract":"This paper presents a fast and robust approach for the code book design problem. Unlike the classical forward approach (CFA), which carries out the design process in two independent stages and in a forward direction; quantization then index assignment, the proposed unified backward approach (UBA) employs a statistics based mapping to generate the initial code vectors from the indices. This association faces a challenge due to the cardinally inequality, and this leads to utilizing the discrete cosine transform for compaction and dimension scaling. This mapping generates code vectors with two qualities; implicit tendency towards the constellation centroids and indices distance relationships analogy. Tests have shown that the UBA outperforms the CFA in more than 90% in terms of source distortion, while consistently having significant reduction in the channel distortion. Moreover, the improved initialization has caused some reduction in run time for higher bit rates designs.","PeriodicalId":215400,"journal":{"name":"2008 IEEE International Conference on Electro/Information Technology","volume":"61 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2008-05-18","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"123942968","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Simulation of a new maximum power point tracking technique for multiple photovoltaic arrays 一种新的光伏阵列最大功率点跟踪技术仿真
2008 IEEE International Conference on Electro/Information Technology Pub Date : 2008-05-18 DOI: 10.1109/EIT.2008.4554290
A. Bazzi, S. Karaki
{"title":"Simulation of a new maximum power point tracking technique for multiple photovoltaic arrays","authors":"A. Bazzi, S. Karaki","doi":"10.1109/EIT.2008.4554290","DOIUrl":"https://doi.org/10.1109/EIT.2008.4554290","url":null,"abstract":"This paper introduces a new two-stage maximum power point tracking (MPPT) technique for multiple photovoltaic arrays operating under different levels of irradiance and temperature. The variations in such conditions could cause several local maxima on the overall power-current (P-I) curve of the arrays. This technique aims to locate the global maximum power point (MPP) on the P-I curve of the interconnected arrays thus bypassing any local maximum that might trap available single-stage MPPT algorithms. The first stage of the proposed technique finds a point that bypasses local maxima and moves the operating point of the PV arrays near the global MPP. The second stage is a normal MPPT technique that finds the exact global maximum. A system of two series PV arrays, a battery load, and the proposed technique were simulated in Simulink. The operation of the proposed two-stage technique is verified with the second stage being either the ldquoperturb and observerdquo algorithm (P&O) or the ripple correlation control (RCC). The efficiency of the technique is around 95% and its convergence time is 11 ms under extreme changes in the operating conditions. Compared to single stage techniques and other two stage techniques, this technique is shown to be very competitive, accurate, and fast.","PeriodicalId":215400,"journal":{"name":"2008 IEEE International Conference on Electro/Information Technology","volume":"83 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2008-05-18","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"115485353","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 25
Charged based MOS transistor modeling in weak inversion 弱反转中基于电荷的MOS晶体管建模
2008 IEEE International Conference on Electro/Information Technology Pub Date : 2008-05-18 DOI: 10.1109/EIT.2008.4554317
T. M. Bhatti, F. Bhatti
{"title":"Charged based MOS transistor modeling in weak inversion","authors":"T. M. Bhatti, F. Bhatti","doi":"10.1109/EIT.2008.4554317","DOIUrl":"https://doi.org/10.1109/EIT.2008.4554317","url":null,"abstract":"This paper brings in three transistor models that may be used for weak inversion design: the EKV model, the ACM model and the BSIM3v3 model. The EKV model is used in modeling of weak inversion to offer an accurate prediction of low-voltage, low-current designs. The ACM model gives equations that avoid non-physical interpolating curves between weak inversion and strong inversion region, with the intensions of modeling moderate inversion more precisely. The model is an extension of EKV model and is useful at the limits of weak inversion, where circuit will benefit from drifting into moderate inversion. As a final point the BSIM3v3 model is compared with the EKV model and a good relationship is shown. Although EKV model is considerably less complex as compared to BSIM3v3 model it is sufficiently accurate to model transistors. To demonstrate the ability for circuit analysis a transconductor is used as an example.","PeriodicalId":215400,"journal":{"name":"2008 IEEE International Conference on Electro/Information Technology","volume":"40 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2008-05-18","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"129636470","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 3
Multistage stochastic hydrothermal scheduling 多阶段随机热液调度
2008 IEEE International Conference on Electro/Information Technology Pub Date : 2008-05-18 DOI: 10.1109/EIT.2008.4554269
T. Aouam, Zuwei Yu
{"title":"Multistage stochastic hydrothermal scheduling","authors":"T. Aouam, Zuwei Yu","doi":"10.1109/EIT.2008.4554269","DOIUrl":"https://doi.org/10.1109/EIT.2008.4554269","url":null,"abstract":"The paper addresses the stochastic long-term hydrothermal scheduling problem. This problem is usually modeled as a multistage stochastic program and solved using algorithms that are based on dynamic programming. One such algorithm is the stochastic dual dynamic programming (SDDP) algorithm, which is implemented for the hydrothermal power system of the Pacific Northwest in the U.S. The importance of the first period is emphasized. It is shown that the impact of the first period diminishes after four periods. This result can be exploited to make the stochastic dual dynamic programming (SDDP) algorithm converge very fast.","PeriodicalId":215400,"journal":{"name":"2008 IEEE International Conference on Electro/Information Technology","volume":"1 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2008-05-18","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"129249093","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 7
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