24th ISDEIV 2010最新文献

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Fiber-controlled vacuum interrupter module used for fault current interruption 光纤控制真空断流模块,用于故障电流中断
24th ISDEIV 2010 Pub Date : 2010-11-09 DOI: 10.1109/DEIV.2010.5625845
X. Duan, M. Liao, J. Zou, Zhihui Huang
{"title":"Fiber-controlled vacuum interrupter module used for fault current interruption","authors":"X. Duan, M. Liao, J. Zou, Zhihui Huang","doi":"10.1109/DEIV.2010.5625845","DOIUrl":"https://doi.org/10.1109/DEIV.2010.5625845","url":null,"abstract":"A novel fiber-controlled vacuum interrupter module (FCVIM) is proposed in this paper, which can be used for controlled interruption of short circuit currents by means of point-on-wave control. In the FCVIM, the permanent magnetic actuator operates at high potential terminal with the vacuum interrupter, the operation commands come from low potential terminal by optical fiber, which realizes a simple insulation structure between high and low potential terminals. The operation power supply is from bus by a special designed CT coil, and a storage battery is used when the bus current is abnormal. The FCVIM can compose large capability and high voltage vacuum circuit breakers with series and parallel combination. Experimental tests show that electrical and mechanical parameters of the FCVIM are excellent. Operating time dispersion of the FCVIM is less than 0.5ms, which accords with the requirements of controlled switching by means of point-on-wave control and the high vacuum circuit breaker based on multiple vacuum interrupters.","PeriodicalId":209149,"journal":{"name":"24th ISDEIV 2010","volume":"15 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2010-11-09","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"115278818","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 7
PIC simulation of discharge in vacuum and influencing factors 真空放电的PIC模拟及其影响因素
24th ISDEIV 2010 Pub Date : 2010-11-09 DOI: 10.1109/DEIV.2010.5625760
Yundong Cao, Jing Li, Xiaoming Liu, Chunguang Hou, Peng Sun
{"title":"PIC simulation of discharge in vacuum and influencing factors","authors":"Yundong Cao, Jing Li, Xiaoming Liu, Chunguang Hou, Peng Sun","doi":"10.1109/DEIV.2010.5625760","DOIUrl":"https://doi.org/10.1109/DEIV.2010.5625760","url":null,"abstract":"There are great differences between vacuum discharge and common gas discharge. For short gap gas breakdown, the main reason can be explained as followings: electrons from the cathode emission are accelerated by the electric field and impact the anode which will release a lot of metal vapor. The ions produced by the collisions between metal vapor gas molecule and electron impact the cathode and secondary electrons emission will come into being. Based on the field emission theory in vacuum, particle in cell simulation method is used in our paper to trace the motion of electrons produced by cathode emission and ion produced by collision in time and space dimensions. Mont Carlo method is used here to cope with the collisions between electrons and neutral molecules. The cross sections of the collision which relate with the energy are all from the experiments. The secondary electron emission, exciting, elastic and ionizing collisions between electrons and metallic vapor molecules have been considered in our paper. The state parameters of charged particles at any position and time are recorded and the effect of vacuum degree on discharge voltage are simulated which can explain the mechanism of vacuum discharge from microscopic view.","PeriodicalId":209149,"journal":{"name":"24th ISDEIV 2010","volume":"96 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2010-11-09","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"123125413","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 1
Netshape manufacturing of CuCr medium voltage circuit breakers Netshape制造CuCr中压断路器
24th ISDEIV 2010 Pub Date : 2010-11-09 DOI: 10.1109/DEIV.2010.5625814
C. Kowanda, A. Plankensteiner, C. Grohs, A. Schwaiger, M. Hochstrasser, F. Muller
{"title":"Netshape manufacturing of CuCr medium voltage circuit breakers","authors":"C. Kowanda, A. Plankensteiner, C. Grohs, A. Schwaiger, M. Hochstrasser, F. Muller","doi":"10.1109/DEIV.2010.5625814","DOIUrl":"https://doi.org/10.1109/DEIV.2010.5625814","url":null,"abstract":"Continuum mechanics based modelling and finite element based simulation methods are commonly proved to represent cost efficient and timesaving tools for optimization of filling body geometries and tool designs. In case of adequate material descriptions they also allow to reduce the risk of flaws such as formation of cracks and low-density areas, respectively. By linking the simulation tools for compaction and sintering further enhancements are achievable such as minimized sintering distortions this way forming the basis for an advanced design tool of netshape (NS) manufacturing routes. The technical applicability and economic relevance of the proposed approach is demonstrated on the example of NS manufactured CuCr contacts for medium voltage circuit breakers as they are used in electric power distribution. The approach comprises modelling of powder compaction and sintering in an integrative manner via Drucker-Prager/Cap plasticity modelling and non-linear visco-elastic transversally isotropic sintering modelling, respectively. In particular, the careful calibration procedure for the material models used for the compaction and sintering regime with respect to the experimental findings of several types of mechanical green body tests as well as sintering experiments is described in detail. This way the presented approach claims and focusses on the first-in-class show case of a CuCr circuit breaker component being netshape manufactured.","PeriodicalId":209149,"journal":{"name":"24th ISDEIV 2010","volume":"452 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2010-11-09","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"116637295","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 1
Temporal and spatial behaviour of the single cathode spot ignition in vacuum 真空中单阴极点燃的时空行为
24th ISDEIV 2010 Pub Date : 2010-11-09 DOI: 10.1109/DEIV.2010.5625868
A. Batrakov, S. Popov, R. Methling, D. Uhrlandt, K. Weltmann
{"title":"Temporal and spatial behaviour of the single cathode spot ignition in vacuum","authors":"A. Batrakov, S. Popov, R. Methling, D. Uhrlandt, K. Weltmann","doi":"10.1109/DEIV.2010.5625868","DOIUrl":"https://doi.org/10.1109/DEIV.2010.5625868","url":null,"abstract":"Optical emission of a single cathode spot was studied to improve understanding of cathode spot initiation and dynamics. A single cathode spot was generated with high reproducibility in a gap under UHV conditions at a liquid Ga-In-alloy cathode. Discharges were initiated by rectangular voltage pulses of 100 ns length produced by a cable generator. The spot radiation was recorded in time with a high temporal and spectral resolution by a spectrograph coupled with a streak camera and a CCD camera. Cathode spot light radiation was found to be as weak in the discharge beginning as the equipment set records nothing. Cathode spot radiation becomes bright when cathode spot plasma approaches closely to the anode. Unlike spot initiation in a pure vacuum gap, a cathode spot starts as a bright flash when the gap is filled with plasma.","PeriodicalId":209149,"journal":{"name":"24th ISDEIV 2010","volume":"91 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2010-11-09","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"116768343","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Effect of component tolerances on withstand strength of vacuum interrupters 元件公差对真空灭流器耐压强度的影响
24th ISDEIV 2010 Pub Date : 2010-11-09 DOI: 10.1109/DEIV.2010.5625793
P. Stoving, R. Kaluzny
{"title":"Effect of component tolerances on withstand strength of vacuum interrupters","authors":"P. Stoving, R. Kaluzny","doi":"10.1109/DEIV.2010.5625793","DOIUrl":"https://doi.org/10.1109/DEIV.2010.5625793","url":null,"abstract":"Computer modeling has been used for some time in the design of vacuum switching and fault interrupter devices. While generally useful for tweaking of existing designs, this modeling has not always been as useful as it could be in predicting the performance of newer designs, and thus tends to become more of a qualitative, rather than a quantitative study. One area of potential error in the calculation of the electric field of a vacuum interrupter is the role of the tolerance stack-up of each piece, and the potential mislocation of parts and surfaces from their ideal position as a result of this stack-up. Monte-Carlo statistical methods are used to simulate the potential effect of the component tolerances on the electric field in a vacuum interrupter, and the potential effects of this on the withstand performance of the design.","PeriodicalId":209149,"journal":{"name":"24th ISDEIV 2010","volume":"37 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2010-11-09","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"121131488","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Photoelectron emission from a polymer surface irradiated by oxygen ions 由氧离子照射的聚合物表面的光电子发射
24th ISDEIV 2010 Pub Date : 2010-11-09 DOI: 10.1109/DEIV.2010.5625784
M. Yumoto, S. Okamura, K. Nitta
{"title":"Photoelectron emission from a polymer surface irradiated by oxygen ions","authors":"M. Yumoto, S. Okamura, K. Nitta","doi":"10.1109/DEIV.2010.5625784","DOIUrl":"https://doi.org/10.1109/DEIV.2010.5625784","url":null,"abstract":"A satellite is required to have a long life and high reliability. However, a lot of atomic oxygen (AO), an erosive agent, is present at an altitude of several 100 km. Accordingly, it is necessary to monitor the degradation degree of the materials used on the satellite surface. In this study, to characterize the surface properties, photoelectron emission characteristics of several polymers were measured using a deuterium lamp and the band path filters. In addition, PE (Polyethylene) irradiated by oxygen ions was measured. From the measurement, the threshold energy for electron emission and its quantum efficiency were evaluated. As a result, the threshold energy of polymers was about 6 eV. The magnitude of PE irradiated by oxygen ions was not remarkably changed, but irradiation did increase its quantum efficiency. To clarify the mechanism of the phenomenon, an XPS (X-ray Photoelectron Spectroscope) and an AFM (Atomic Force Microscope) were used to analyze chemical bonds at the surface introduced by ion irradiation and surface roughness. The result shows that chemical bonds including oxygen atoms play an important role.","PeriodicalId":209149,"journal":{"name":"24th ISDEIV 2010","volume":"89 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2010-11-09","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"127261928","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
High-current vacuum arc: The relationship between anode phenomena and the average opening velocity of vacuum interrupter 大电流真空电弧:阳极现象与真空灭弧器平均开断速度的关系
24th ISDEIV 2010 Pub Date : 2010-11-09 DOI: 10.1109/DEIV.2010.5625830
Guowei Kong, Zhiyuan Liu, Dong Wang, M. Rong
{"title":"High-current vacuum arc: The relationship between anode phenomena and the average opening velocity of vacuum interrupter","authors":"Guowei Kong, Zhiyuan Liu, Dong Wang, M. Rong","doi":"10.1109/DEIV.2010.5625830","DOIUrl":"https://doi.org/10.1109/DEIV.2010.5625830","url":null,"abstract":"In order to understand the influence of the average opening velocity on the high-current vacuum arc anode phenomena, a high-speed photography was used to observe anode phenomena of vacuum arc discharge in vacuum interrupters. The contact diameters used in the vacuum interrupters were 12 mm and 25 mm, respectively. The contact materials included Cu, CuCr25, and CuCr50. The arc current frequency was 50 Hz and the arcing time was controlled at about 9 ms. A permanent magnet mechanism with a contact spring was used to adjust the average opening velocity from 1.3 m/s to 1.8 m/s. The experimental results showed that with the arc current increasing, there was a threshold current I1st (peak value) with which a high-current anode mode first appeared. And the first high-current anode mode was a footpoint at the velocity of 1.8 m/s. While at the velocity of 1.3 m/s, it was most probably an anode spot and sometimes it was a footpoint. The result showed that at the velocity of 1.8 m/s, the threshold current I1st was lower than that of the 1.3 m/s. And the threshold current I1st followed the order of Cu > CuCr25 > CuCr50 at both the velocities of 1.3 m/s and 1.8 m/s. Meanwhile, at the higher average opening velocity of 1.8 m/s, the arc energy and arc voltage were higher than or close to that with 1.3 m/s.","PeriodicalId":209149,"journal":{"name":"24th ISDEIV 2010","volume":"52 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2010-11-09","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"124814571","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 2
Development mechanism of impulse surface flashover on alumina dielectrics in vacuum 真空中氧化铝电介质脉冲表面闪络的发展机理
24th ISDEIV 2010 Pub Date : 2010-11-09 DOI: 10.1109/DEIV.2010.5625860
T. Ishida, H. Kojima, K. Tsuchiya, H. Okubo
{"title":"Development mechanism of impulse surface flashover on alumina dielectrics in vacuum","authors":"T. Ishida, H. Kojima, K. Tsuchiya, H. Okubo","doi":"10.1109/DEIV.2010.5625860","DOIUrl":"https://doi.org/10.1109/DEIV.2010.5625860","url":null,"abstract":"We investigated the development mechanism of impulse surface flashover on alumina ceramic insulator in vacuum. We measured the still image and framing image of fast developing surface flashover in synchronous with applied impulse voltage and current waveforms. The light emission transition in initiation of surface flashover was clarified. We found the dark area is formed around the cathode and conducting channel is formed from the anode in developing process of surface flashover in vacuum.","PeriodicalId":209149,"journal":{"name":"24th ISDEIV 2010","volume":"6 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2010-11-09","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"124986553","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 1
Investigation of spatial correlations of pre-breakdown emission sites and breakdowns of vacuum gaps under short-pulsed testing 短脉冲测试下真空间隙击穿与击穿的空间相关性研究
24th ISDEIV 2010 Pub Date : 2010-11-09 DOI: 10.1109/DEIV.2010.5625801
E. Nefyodtsev, S. Onischenko, A. Batrakov, D. Proskurovsky
{"title":"Investigation of spatial correlations of pre-breakdown emission sites and breakdowns of vacuum gaps under short-pulsed testing","authors":"E. Nefyodtsev, S. Onischenko, A. Batrakov, D. Proskurovsky","doi":"10.1109/DEIV.2010.5625801","DOIUrl":"https://doi.org/10.1109/DEIV.2010.5625801","url":null,"abstract":"Emission activity of the stainless steel surface under 200-kV, 100-ns dc voltage pulses was studied with the use of the 4-channel, 12-bit ICCD camera. The gap was formed by a bulk cathode and a thin-foil anode. Both the cathode and anode surfaces were cleaned and polished preliminary by means of electron-beam treatment in the mode of short-time melting in vacuum. Observations gave a ground to tell about pre-breakdown emission sites of two kinds that are stable emission sites (SES's) and unstable ones (UES's), which are different in behaviour and in ability to initiate breakdowns. SES's occurred on the cathode surface lead to breakdowns coinciding with SES's in location. Breakdown strength as high as 1 MV/cm and even higher is achieved only under condition of absence any SEC. Close to 1 MV/cm, UES's start to be recognized in images. An UES pattern is changed from shot to shot without breakdowns. As a rule, breakdowns occur in locations different from UES's, recorded in the previous frame just before the breakdown. The results obtained could be of interest in study of pre-breakdown phenomena at extremely high electric fields in vacuum.","PeriodicalId":209149,"journal":{"name":"24th ISDEIV 2010","volume":"44 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2010-11-09","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"125144245","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 1
Dielectric strength of vacuum interrupters influence of manufacturing process 制造工艺对真空灭流器介电强度的影响
24th ISDEIV 2010 Pub Date : 2010-11-09 DOI: 10.1109/DEIV.2010.5625836
H. Schellekens, Francois Chombart, Romain Mottin, F. Vianna
{"title":"Dielectric strength of vacuum interrupters influence of manufacturing process","authors":"H. Schellekens, Francois Chombart, Romain Mottin, F. Vianna","doi":"10.1109/DEIV.2010.5625836","DOIUrl":"https://doi.org/10.1109/DEIV.2010.5625836","url":null,"abstract":"A test method based on combined measurement of voltage breakdown value and position is used to measure the microscopic electric field enhancement factor on copper and stainless steel electrodes in vacuum. This method is then used to evaluate the effectiveness of an industrial cleaning process. Process parameters are identified that positively influence the dielectric strength. An improvement of 15% is obtained.","PeriodicalId":209149,"journal":{"name":"24th ISDEIV 2010","volume":"1 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2010-11-09","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"126858575","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 3
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