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Characterization of On-Wafer Diode Noise Sources 片上二极管噪声源的表征
51st ARFTG Conference Digest Pub Date : 1998-06-01 DOI: 10.1109/ARFTG.1998.327277
J. Randa, D. Walker, L. Dunleavy, R. Billinger, J. Rice
{"title":"Characterization of On-Wafer Diode Noise Sources","authors":"J. Randa, D. Walker, L. Dunleavy, R. Billinger, J. Rice","doi":"10.1109/ARFTG.1998.327277","DOIUrl":"https://doi.org/10.1109/ARFTG.1998.327277","url":null,"abstract":"A set of wafer probeable diode noise source transfer standards are characterized using on-wafer noise temperature methods developed recently at the National Institute of Standards and Technology (NIST). This paper reviews the methods for accurate on-wafer measurements of noise temperature and details the preliminary design and construction of the transfer standards. Measurements are presented of their noise temperatures at frequencies from 8 to 12 GHz. Such transfer standards could be used in interlaboratory comparisons or as a verification tool for checking on-wafer noise calibration accuracy.","PeriodicalId":208002,"journal":{"name":"51st ARFTG Conference Digest","volume":"23 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1998-06-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"114650632","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 2
Vector Corrected Power Sensor Calibration System 矢量校正功率传感器校准系统
51st ARFTG Conference Digest Pub Date : 1998-06-01 DOI: 10.1109/ARFTG.1998.327286
J. Fenton
{"title":"Vector Corrected Power Sensor Calibration System","authors":"J. Fenton","doi":"10.1109/ARFTG.1998.327286","DOIUrl":"https://doi.org/10.1109/ARFTG.1998.327286","url":null,"abstract":"A new power sensor calibration system incorporating a vector network analyzer has been developed. The vector based system is able to account for the various impedance mismatches at the calibration test port, thus mathematically eliminating the mismatch uncertainty component of the power calibration. With scalar based systems, this component is a major contributor to the overall calibration uncertainty. With the new vector based system, the overall calibration uncertainty is significantly reduced. This paper will discuss the new system in detail, and show measurement data and associated uncertainties.","PeriodicalId":208002,"journal":{"name":"51st ARFTG Conference Digest","volume":"1 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1998-06-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"114754945","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 2
Close-In Phase Noise Measurements of Injection Locked Oscillators 注入锁相振荡器的闭合相位噪声测量
51st ARFTG Conference Digest Pub Date : 1998-06-01 DOI: 10.1109/ARFTG.1998.327289
Alberto Rodriguez, L. Dunleavy, T. Weller
{"title":"Close-In Phase Noise Measurements of Injection Locked Oscillators","authors":"Alberto Rodriguez, L. Dunleavy, T. Weller","doi":"10.1109/ARFTG.1998.327289","DOIUrl":"https://doi.org/10.1109/ARFTG.1998.327289","url":null,"abstract":"Independent implementation and verification is described for a published injection locking approach to close-in phase noise measurements. Experimentation was conducted to study the sensitivity of the measured results to various parameters within the system, including oscillator-under-test power level, and the need for an isolator in the test system. The results show that the phase noise measurement is relatively robust to power level variations within the system, and that the isolator, although bandwidth limiting, does perform a necessary role for the measurement. A pair of 1.4GHz free running oscillators are used as test cases in this study. Measurements from the injection locking technique are compared to those made using the more traditional detector and discriminator methods.","PeriodicalId":208002,"journal":{"name":"51st ARFTG Conference Digest","volume":"29 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1998-06-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"122037324","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Wideband Frequency-Domain Measurement of Multipath Effects in 2.4 GHz Wireless Channels 2.4 GHz无线信道中多径效应的宽带频域测量
51st ARFTG Conference Digest Pub Date : 1900-01-01 DOI: 10.1109/ARFTG.1998.327271
A. Kuppusamy, P. Flikkema, T. Weller
{"title":"Wideband Frequency-Domain Measurement of Multipath Effects in 2.4 GHz Wireless Channels","authors":"A. Kuppusamy, P. Flikkema, T. Weller","doi":"10.1109/ARFTG.1998.327271","DOIUrl":"https://doi.org/10.1109/ARFTG.1998.327271","url":null,"abstract":"The frequency selectivity and time variation of wireless channels will strongly influence signal waveform and receiver design for broadband wireless systems such as wireless local area networks. This paper describes the development and deployment of instrumentation to determine the frequency response of 2.4 GHz indoor wireless channels. The instrumentation is developed around a HP 87146 vector network analyzer and includes the required amplification for measurement of responses at a transmit-receive separation of up to 33 meters. While designed primarily to gather data for development of accurate small-scale multipath models, the setup is calibrated to also provide the absolute signal levels necessary for shadowing and path loss characterization. The system design and link power budget are presented along with the criteria for selecting the individual components. In addition, the methodology for correction of magnitude and phase responses of the components is detailed. Finally, the measurement campaign is described, and sample results are presented that exhibit the frequency- and time-selectivity of these channels.","PeriodicalId":208002,"journal":{"name":"51st ARFTG Conference Digest","volume":"8 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1900-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"124071611","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Procedure for Measurements and Statistical Processing of Upstream Channel Noise in HFC-Networks hfc网络上游信道噪声的测量和统计处理程序
51st ARFTG Conference Digest Pub Date : 1900-01-01 DOI: 10.1109/mwsym.1998.700591
K. Haelvoet, J. Vandenbruaene, Elke Claus, K. de Kesel, L. Martens
{"title":"Procedure for Measurements and Statistical Processing of Upstream Channel Noise in HFC-Networks","authors":"K. Haelvoet, J. Vandenbruaene, Elke Claus, K. de Kesel, L. Martens","doi":"10.1109/mwsym.1998.700591","DOIUrl":"https://doi.org/10.1109/mwsym.1998.700591","url":null,"abstract":"A promising candidate for the growing bandwidth requirements of interactive multimedia services are hybrid fiber-coax CATV networks. They are however very susceptible to noise-funneling. We present a measurement method and statistical postprocessing for both ingress and impulse noise that is independent of the modulation and access technique used. The impact of ingress noise is evaluated for a TDMA/FDMA and CDMA access technique to illustrate this.","PeriodicalId":208002,"journal":{"name":"51st ARFTG Conference Digest","volume":"259 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1900-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"115662648","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 1
A Test Board for Multiport Immittance Measurement and Characterization of RF-IC Packages RF-IC封装多端口阻抗测量与特性测试板
51st ARFTG Conference Digest Pub Date : 1900-01-01 DOI: 10.1109/mwsym.1998.700957
A. Tripathi, R. Lutz, V. Tripathi, H. H. Wu, Jeff Meyer, B. Hutchison
{"title":"A Test Board for Multiport Immittance Measurement and Characterization of RF-IC Packages","authors":"A. Tripathi, R. Lutz, V. Tripathi, H. H. Wu, Jeff Meyer, B. Hutchison","doi":"10.1109/mwsym.1998.700957","DOIUrl":"https://doi.org/10.1109/mwsym.1998.700957","url":null,"abstract":"An experimental technique based on the measurement of two port scattering parameters for the characterization of electrically small RF-IC package is presented. The procedure is based on a novel test board design to facilitate extraction of n-port admittance and impedance matrix parameters using two port network analyzer scattering parameter measurements. An optimization routine is used to extract the SPICE based equivalent circuit model that includes the mutual coupling effects present in the RF-IC package pins.","PeriodicalId":208002,"journal":{"name":"51st ARFTG Conference Digest","volume":"29 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1900-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"130532496","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Analysis of Microvia Interconnects 微孔互连分析
51st ARFTG Conference Digest Pub Date : 1900-01-01 DOI: 10.1109/mwsym.1998.700959
R. Abhari, T. van Deventer
{"title":"Analysis of Microvia Interconnects","authors":"R. Abhari, T. van Deventer","doi":"10.1109/mwsym.1998.700959","DOIUrl":"https://doi.org/10.1109/mwsym.1998.700959","url":null,"abstract":"The development of high density circuitry has promoted the introduction of the microvia technology which relies on organic dielectrics and vertical interconnects of reduced dimensions. In this paper, microvia interconnects are evaluated both through simulation using an FDTD model and experimental measurements, and have shown good electrical performance.","PeriodicalId":208002,"journal":{"name":"51st ARFTG Conference Digest","volume":"3 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1900-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"132290384","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
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