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2001 31st European Microwave Conference最新文献

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Phase Stability Tests with a Millimeter Wave Network Analyzer 用毫米波网络分析仪进行相位稳定性测试
2001 31st European Microwave Conference Pub Date : 2001-10-01 DOI: 10.1109/EUMA.2001.338941
P. Eskelinen, J. Saily
{"title":"Phase Stability Tests with a Millimeter Wave Network Analyzer","authors":"P. Eskelinen, J. Saily","doi":"10.1109/EUMA.2001.338941","DOIUrl":"https://doi.org/10.1109/EUMA.2001.338941","url":null,"abstract":"Short-term phase uncertainties in certain commercial millimeter wave vector network analyzers seem to be partly related to errors in their internal reference oscillators despite the selected operating principle. Sudden phase jumps up to 0.5 degrees and lasting for 5 - 20 seconds have been observed and correlated results of 0.05 degrees at 100 GHz are demonstrated together with a phase drift lasting several hours from start-up. The poor frequency stability of internal references and the lack of any locking capability further reduce the possibility for long-term comparisons against known external sources.","PeriodicalId":207696,"journal":{"name":"2001 31st European Microwave Conference","volume":" 10","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2001-10-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"120829709","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 4
Measurement and Modelling of MIC Components Using Conductive Lithographic Films 使用导电光刻薄膜的MIC元件的测量和建模
2001 31st European Microwave Conference Pub Date : 2001-10-01 DOI: 10.1109/EUMA.2001.339160
P. Shepherd, C. Taylor, P. Evans, D. Harrison
{"title":"Measurement and Modelling of MIC Components Using Conductive Lithographic Films","authors":"P. Shepherd, C. Taylor, P. Evans, D. Harrison","doi":"10.1109/EUMA.2001.339160","DOIUrl":"https://doi.org/10.1109/EUMA.2001.339160","url":null,"abstract":"Conductive Lithographic Films (CLFs) have previously demonstrated useful properties in printed microwave circuits, combining low cost with high speed of manufacture. In this paper we examine the formation of various passive components via the CLF process, which enables further integration of printed microwave integrated circuits. The printed components include vias, resistors and overlay capacitors, and offer viable alternatives to traditional manufacturing processes for Microwave Integrated Circuits (MICs). Manufacturing data, measurements on test structures and equivalent circuit modelling for a range of CLF circuit structures are presented.","PeriodicalId":207696,"journal":{"name":"2001 31st European Microwave Conference","volume":"63 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2001-10-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"116281578","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 6
Calibration of E-Field Probe for SAR Measurement in Lossy Liquid 有耗液体中SAR测量电磁场探头的标定
2001 31st European Microwave Conference Pub Date : 2001-10-01 DOI: 10.1109/EUMA.2001.339196
R. Dlouhy, Z. Škvor
{"title":"Calibration of E-Field Probe for SAR Measurement in Lossy Liquid","authors":"R. Dlouhy, Z. Škvor","doi":"10.1109/EUMA.2001.339196","DOIUrl":"https://doi.org/10.1109/EUMA.2001.339196","url":null,"abstract":"A new technique for probe calibration has been developed. It enables for accurate characterisation of the probe, and therefore gives the opportunity for precise measurements of SAR distribution. The technique has been used for measurement of SAR caused by mobile phones in a model of human head.","PeriodicalId":207696,"journal":{"name":"2001 31st European Microwave Conference","volume":"1 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2001-10-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"116815640","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Spectral Characteristics of Anisotropic Dielectric Disk Resonator with Imperfect Conducting End Walls 端壁不完全导电的各向异性介质圆盘谐振腔的频谱特性
2001 31st European Microwave Conference Pub Date : 2001-10-01 DOI: 10.1109/EUMA.2001.339171
Y. Prokopenko, Y. Filippov
{"title":"Spectral Characteristics of Anisotropic Dielectric Disk Resonator with Imperfect Conducting End Walls","authors":"Y. Prokopenko, Y. Filippov","doi":"10.1109/EUMA.2001.339171","DOIUrl":"https://doi.org/10.1109/EUMA.2001.339171","url":null,"abstract":"The electrodynamic analysis of a dielectric disk resonator with imperfect conducting end walls is carried out at excitation of \"whispering gallery\" oscillations. The possibility of solving the inverse problem is considered: it consists in the determination of permittivity tensor components of anisotropic uniaxial crystal. The spectral characteristics of teflon disk resonator with copper end surfaces are studied in the 8 mm wave band.","PeriodicalId":207696,"journal":{"name":"2001 31st European Microwave Conference","volume":"27 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2001-10-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"125861470","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 1
Verification of THEA Tile Calibration and Beamforming Results using a Near Field Scanner 使用近场扫描仪验证THEA瓷砖校准和波束形成结果
2001 31st European Microwave Conference Pub Date : 2001-10-01 DOI: 10.1109/EUMA.2001.339050
G. Hampson, J. D. de Vaate
{"title":"Verification of THEA Tile Calibration and Beamforming Results using a Near Field Scanner","authors":"G. Hampson, J. D. de Vaate","doi":"10.1109/EUMA.2001.339050","DOIUrl":"https://doi.org/10.1109/EUMA.2001.339050","url":null,"abstract":"ASTRON is in the process of realizing phased array technology for the Square Kilometer Array (SKA). A demonstrator known as the THousand Element Array (THEA) is currently under construction to develop such technology. One of the 16 phased array tiles from which THEA is built, is reported in this paper. Each tile can be calibrated using a Phase Toggling Technique developed previously. The only verification of such a processes were possible by measuring beam patterns. This paper illustrates the use of a recently installed Planar Near Field Scanner to perform the verification using holography measurements. Additionally the scanner provides far field beam patterns, which are also presented. An important part of SKA technology is the ability to reject RFI signals, which is demonstrated using deterministic nulling techniques. These results are also illustrated.","PeriodicalId":207696,"journal":{"name":"2001 31st European Microwave Conference","volume":"1 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2001-10-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"129824938","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 8
Two-surface Lens Correcting Amlitude Distribution and Phase Error 两面透镜校正高度分布和相位误差
2001 31st European Microwave Conference Pub Date : 2001-10-01 DOI: 10.1109/EUMA.2001.339095
M. Chyba
{"title":"Two-surface Lens Correcting Amlitude Distribution and Phase Error","authors":"M. Chyba","doi":"10.1109/EUMA.2001.339095","DOIUrl":"https://doi.org/10.1109/EUMA.2001.339095","url":null,"abstract":"The article describes design of a microwave dielectric lens correcting cosinus amplitude distribution to Taylor and also corrects pahase aperture error. Presented technical parameters obtained by a prototype development piece indicate that this solution in many cases could be a suitable alternative to a corrugated horn or to a horn with dielectric core when low sidelobes are required. Design and performance of an efficient matching layer between dielectric environment and free space enable utilization of such lens in frequency band about 10 %.","PeriodicalId":207696,"journal":{"name":"2001 31st European Microwave Conference","volume":"28 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2001-10-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"127530175","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Application of a Hybrid Method to Model the Interaction Between an Electromagnetic Illumination and an Active Microwave Component 混合方法在电磁照明与有源微波元件相互作用建模中的应用
2001 31st European Microwave Conference Pub Date : 2001-10-01 DOI: 10.1109/EUMA.2001.338924
J. Bras, E. Larique, D. Baillargeat, M. Aubourg, S. Verdeyme
{"title":"Application of a Hybrid Method to Model the Interaction Between an Electromagnetic Illumination and an Active Microwave Component","authors":"J. Bras, E. Larique, D. Baillargeat, M. Aubourg, S. Verdeyme","doi":"10.1109/EUMA.2001.338924","DOIUrl":"https://doi.org/10.1109/EUMA.2001.338924","url":null,"abstract":"This paper presents an analysis of the interaction between an electromagnetic illumination and a microwave transistor applying a hybrid method. This method combines a 3D electromagnetic simulation, which employs a Finite Element Method in the frequency domain, and a classical circuit one. This approach will be firstly applied to predict the effect of an electromagnetic illumination on the FET electrodes, and secondly to predict its effect on the FET input microstrip lines.","PeriodicalId":207696,"journal":{"name":"2001 31st European Microwave Conference","volume":"18 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2001-10-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"132416463","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Bulk Silicon Micro-Machined MEM Switches For Millimeter-Wave Applications 用于毫米波应用的大块硅微加工MEM开关
2001 31st European Microwave Conference Pub Date : 2001-10-01 DOI: 10.1109/EUMA.2001.339132
K. Grenier, P. Pons, R. Plana, J. Graffeuil
{"title":"Bulk Silicon Micro-Machined MEM Switches For Millimeter-Wave Applications","authors":"K. Grenier, P. Pons, R. Plana, J. Graffeuil","doi":"10.1109/EUMA.2001.339132","DOIUrl":"https://doi.org/10.1109/EUMA.2001.339132","url":null,"abstract":"This paper deals with the realization of micro-electro-mechanical (MEM) components dedicated to microwave and millimeter-wave applications and focuses on the advantage of using bulk silicon micro-machining. The silicon substrate etching benefits have been demonstrated through both electromagnetic simulations and measurements of a single MEM switch. Important improvements in term of insertion loss and isolation have been obtained. Further developments in term of distributed switches are addressed.","PeriodicalId":207696,"journal":{"name":"2001 31st European Microwave Conference","volume":"73 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2001-10-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"132862389","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 13
Magic Tee Junction Based on Hybrid Architecture of Microstrip Line and Non-Radiative Dielectric Waveguide 基于微带线与非辐射介质波导混合结构的魔三通结
2001 31st European Microwave Conference Pub Date : 2001-10-01 DOI: 10.1109/EUMA.2001.339025
Y. Cassivi, K. Wu
{"title":"Magic Tee Junction Based on Hybrid Architecture of Microstrip Line and Non-Radiative Dielectric Waveguide","authors":"Y. Cassivi, K. Wu","doi":"10.1109/EUMA.2001.339025","DOIUrl":"https://doi.org/10.1109/EUMA.2001.339025","url":null,"abstract":"A new magic tee junction based on hybrid planar/non-radiative dielectric (NRD) guide integrated circuit technology is presented. Two separate junctions are used to form this magic tee junction. The first is an NRD T-junction optimized for LSM10 mode to LSE10 mode conversion. This junction has the similar properties as an E-plane rectangular waveguide T-junction. The second is a microstrip line junction that feeds two microstrip-to-NRD LSE10 mode transitions in transferring the signal to the two output branches of the NRD T-junction. This hybrid geometry has the properties of a H-plane waveguide T-junction. Measured results show that an isolation of 20dB can easily be achieved between the sum and difference ports.","PeriodicalId":207696,"journal":{"name":"2001 31st European Microwave Conference","volume":"40 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2001-10-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"132959213","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 6
Novel Current Sharing Concept Improves Efficiency of Broadband Feedback Amplifiers 新的电流共享概念提高了宽带反馈放大器的效率
2001 31st European Microwave Conference Pub Date : 2001-10-01 DOI: 10.1109/EUMA.2001.338968
A. Virdee, B. Virdee
{"title":"Novel Current Sharing Concept Improves Efficiency of Broadband Feedback Amplifiers","authors":"A. Virdee, B. Virdee","doi":"10.1109/EUMA.2001.338968","DOIUrl":"https://doi.org/10.1109/EUMA.2001.338968","url":null,"abstract":"This paper describes the concept of current sharing in order to reduce the current consumption of hybrid MIC broadband amplifiers and improve the overall efficiency of the subsystems that employ the amplifiers. Current sharing technique was implemented on a 2-18 GHz cascaded two-stage feedback amplifier and a 2-4 GHz balanced amplifier. The experimental results presented demonstrated that the current sharing concept drastically reduces the current consumption by 50 percent without compromising the amplifier performance in any way. The consequence of this is a two-fold improvement in the power-added efficiency.","PeriodicalId":207696,"journal":{"name":"2001 31st European Microwave Conference","volume":"23 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2001-10-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"132079526","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 1
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