{"title":"Proceedings of the IEEE: Stay Informed. Become Inspired.","authors":"","doi":"10.1109/JPROC.2024.3492483","DOIUrl":"10.1109/JPROC.2024.3492483","url":null,"abstract":"","PeriodicalId":20556,"journal":{"name":"Proceedings of the IEEE","volume":"112 9","pages":"C4-C4"},"PeriodicalIF":23.2,"publicationDate":"2024-12-11","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=10783093","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"142804898","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":1,"RegionCategory":"计算机科学","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"OA","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"IEEE Connects You to a Universe of Information!","authors":"","doi":"10.1109/JPROC.2024.3509073","DOIUrl":"10.1109/JPROC.2024.3509073","url":null,"abstract":"","PeriodicalId":20556,"journal":{"name":"Proceedings of the IEEE","volume":"112 9","pages":"1568-1568"},"PeriodicalIF":23.2,"publicationDate":"2024-12-11","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=10783098","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"142804911","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":1,"RegionCategory":"计算机科学","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"OA","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"Proceedings of the IEEE Publication Information","authors":"","doi":"10.1109/JPROC.2024.3492475","DOIUrl":"10.1109/JPROC.2024.3492475","url":null,"abstract":"","PeriodicalId":20556,"journal":{"name":"Proceedings of the IEEE","volume":"112 9","pages":"C2-C2"},"PeriodicalIF":23.2,"publicationDate":"2024-12-11","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=10783095","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"142805235","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":1,"RegionCategory":"计算机科学","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"OA","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"TechRxiv","authors":"","doi":"10.1109/JPROC.2024.3500693","DOIUrl":"10.1109/JPROC.2024.3500693","url":null,"abstract":"","PeriodicalId":20556,"journal":{"name":"Proceedings of the IEEE","volume":"112 9","pages":"1567-1567"},"PeriodicalIF":23.2,"publicationDate":"2024-12-11","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=10783100","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"142804899","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":1,"RegionCategory":"计算机科学","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"OA","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"IEEE Membership","authors":"","doi":"10.1109/JPROC.2024.3492481","DOIUrl":"10.1109/JPROC.2024.3492481","url":null,"abstract":"","PeriodicalId":20556,"journal":{"name":"Proceedings of the IEEE","volume":"112 9","pages":"C3-C3"},"PeriodicalIF":23.2,"publicationDate":"2024-12-11","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=10783099","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"142804912","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":1,"RegionCategory":"计算机科学","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"OA","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"Future Special Issues/Special Sections of the Proceedings","authors":"","doi":"10.1109/JPROC.2024.3492479","DOIUrl":"10.1109/JPROC.2024.3492479","url":null,"abstract":"","PeriodicalId":20556,"journal":{"name":"Proceedings of the IEEE","volume":"112 9","pages":"1566-1566"},"PeriodicalIF":23.2,"publicationDate":"2024-12-11","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=10783018","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"142805236","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":1,"RegionCategory":"计算机科学","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"OA","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
D. Kannadassan, K. Sivasankaran, S. Kumaravel, Chun-Hu Cheng, Maryam Shojaei Baghini, P. S. Mallick
{"title":"High-$k$ Metal–Insulator–Metal Capacitors for RF and Mixed-Signal VLSI Circuits: Challenges and Opportunities","authors":"D. Kannadassan, K. Sivasankaran, S. Kumaravel, Chun-Hu Cheng, Maryam Shojaei Baghini, P. S. Mallick","doi":"10.1109/jproc.2024.3506996","DOIUrl":"https://doi.org/10.1109/jproc.2024.3506996","url":null,"abstract":"","PeriodicalId":20556,"journal":{"name":"Proceedings of the IEEE","volume":"21 1","pages":""},"PeriodicalIF":20.6,"publicationDate":"2024-12-09","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"142797463","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":1,"RegionCategory":"计算机科学","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Jee Seok Yoon, Kwanseok Oh, Yooseung Shin, Maciej A. Mazurowski, Heung-Il Suk
{"title":"Domain Generalization for Medical Image Analysis: A Review","authors":"Jee Seok Yoon, Kwanseok Oh, Yooseung Shin, Maciej A. Mazurowski, Heung-Il Suk","doi":"10.1109/jproc.2024.3507831","DOIUrl":"https://doi.org/10.1109/jproc.2024.3507831","url":null,"abstract":"","PeriodicalId":20556,"journal":{"name":"Proceedings of the IEEE","volume":"236 1","pages":""},"PeriodicalIF":20.6,"publicationDate":"2024-12-05","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"142782597","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":1,"RegionCategory":"计算机科学","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}