SPIE Laser Damage最新文献_第5页

Delay dependency of two-pulse femtosecond laser damage 双脉冲飞秒激光损伤的延迟依赖性

SPIE Laser Damage Pub Date : 2015-11-23 DOI: 10.1117/12.2194778

M. Gyamfi, P. Jürgens, L. Jensen, D. Ristau

{"title":"Delay dependency of two-pulse femtosecond laser damage","authors":"M. Gyamfi, P. Jürgens, L. Jensen, D. Ristau","doi":"10.1117/12.2194778","DOIUrl":"https://doi.org/10.1117/12.2194778","url":null,"abstract":"In the femtosecond regime laser damage thresholds are determined by the electric field distribution within the optical components. Especially, for radiation sources with integrated frequency conversion the simultaneous presence of photons with different frequencies introduces additional ionization channels in optical materials by cross excitation and other effects. In this work we report on the pulse delay dependency of the LIDT of HR390/780nm mirrors under simultaneous exposure to fundamental and second harmonic femtosecond radiation. We perform Son1-tests according to ISO 21254 with the addition of a second harmonic pulse at different fixed pulse energies. To determine the influence of the cross excitation between fundamental and second harmonic radiation, these tests are repeated for different time delays between the two pulses. For the 1on1, single wavelength femtosecond LIDT testing, the Keldysh theory in combination with the Drude Model has been proven to reasonably describe the time dependent electron density in the conduction band, and hence the LIDT. We extend these approaches to the determination of the LIDT for the case of simultaneous interactions of photons of two separate wavelengths.","PeriodicalId":204978,"journal":{"name":"SPIE Laser Damage","volume":"13 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2015-11-23","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"126811645","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

引用次数: 2

First principles simulation of laser-induced periodic surface structure using the particle-in-cell method 激光诱导周期性表面结构的第一性原理模拟

SPIE Laser Damage Pub Date : 2015-11-23 DOI: 10.1117/12.2195006

Robert A. Mitchell, D. Schumacher, E. Chowdhury

引用次数: 2

Self-consistent modeling of photoionization and the Kerr effect in bulk solids 大块固体中光电离和克尔效应的自洽模型

SPIE Laser Damage Pub Date : 2015-11-01 DOI: 10.1117/12.2195293

J. Gulley, T. Lanier

{"title":"Self-consistent modeling of photoionization and the Kerr effect in bulk solids","authors":"J. Gulley, T. Lanier","doi":"10.1117/12.2195293","DOIUrl":"https://doi.org/10.1117/12.2195293","url":null,"abstract":"In calculations of ultrafast laser-induced ionization the treatment of fundamental mechanisms such as photoionization and the Kerr effect are treated in isolation using monochromatic perturbative approaches. Such approaches are often questionable for pulses of ultrashort duration and multi-chromatic spectra. In this work we address this issue by solving the quantum optical Bloch equations in a 3D quasi-momentum space and show how to couple this model to ultrashort pulse propagation in dielectrics. This approach self-consistently couples a quantum calculation of the photoionization yield, the photoionization current, and the current from free-carriers with the traditional Kerr effect (self-focusing and self phase modulation) without resort to a perturbative treatment. The material band structure is taken in the tight binding limit and is periodic in the crystal momentum space. As this model makes no assumption about the pulse spectrum, we examine the laser-material interaction of strongly chirped pulses and multi-color multi-pulse schemes of laser-induced material modification. These results are compared to those predicted by standard treatments, such as the Keldysh model of photoionization, for pulses of ultrashort duration.","PeriodicalId":204978,"journal":{"name":"SPIE Laser Damage","volume":"1 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2015-11-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"131806018","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

引用次数: 2

The role of film interfaces in near-ultraviolet absorption and pulsed-laser damage in ion-beam-sputtered coatings based on HfO2/SiO2 thin-film pairs 基于HfO2/SiO2薄膜对的离子束溅射涂层中膜界面在近紫外吸收和脉冲激光损伤中的作用

SPIE Laser Damage Pub Date : 2015-11-01 DOI: 10.1117/12.2196654

S. Papernov, A. Kozlov, J. Oliver, C. Smith, L. Jensen, D. Ristau, S. Günster, H. Mädebach

{"title":"The role of film interfaces in near-ultraviolet absorption and pulsed-laser damage in ion-beam-sputtered coatings based on HfO2/SiO2 thin-film pairs","authors":"S. Papernov, A. Kozlov, J. Oliver, C. Smith, L. Jensen, D. Ristau, S. Günster, H. Mädebach","doi":"10.1117/12.2196654","DOIUrl":"https://doi.org/10.1117/12.2196654","url":null,"abstract":"The role of thin-film interfaces in the near-ultraviolet absorption and pulsed-laser–induced damage was studied for ion-beam–sputtered coatings comprised of HfO2 and SiO2 thin-film pairs. To separate contributions from the bulk of the film and from interfacial areas, absorption and damage threshold were measured for a one-wave (355-nm)–thick HfO2 single-layer film and for a film containing seven narrow HfO2 layers separated by SiO2 layers. The seven-layer film was designed to have a total optical thickness of HfO2 layers equal to one wave at 355 nm and an E-field peak and average intensity similar to a single-layer HfO2 film. Absorption in both types of films was measured using laser calorimetry and photothermal heterodyne imaging. The results showed a small contribution to total absorption from thinfilm interfaces, as compared to HfO2 film material. The relevance of obtained absorption data to coating near-ultraviolet, nanosecond-pulse laser damage was verified by measuring the damage threshold and characterizing damage morphology. The results of this study revealed a higher damage resistance in the seven-layer coating as compared to the single-layer HfO2 film, in agreement with data recently reported for similarly designed electron-beam–deposited coatings. The results are explained through the similarity of interfacial film structure and structure formed during the co-deposition of HfO2 and SiO2 materials.","PeriodicalId":204978,"journal":{"name":"SPIE Laser Damage","volume":"4 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2015-11-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"115208600","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

引用次数: 1

Mixed oxide coatings for advanced fs-laser applications 先进光纤激光器应用的混合氧化物涂层

SPIE Laser Damage Pub Date : 2007-12-20 DOI: 10.1117/12.753730

M. Jupé, M. Lappschies, L. Jensen, K. Starke, D. Ristau, A. Melninkaitis, V. Sirutkaitis, I. Cravetchi, W. Rudolph

引用次数: 24

The relationship between laser fluence profile and the cumulative probability of damage curve 激光能量流剖面与损伤曲线累积概率的关系

SPIE Laser Damage Pub Date : 2007-12-20 DOI: 10.1117/12.753054

J. Arenberg

引用次数: 4

Studies on thin films as short pulse laser debris shields 薄膜作为短脉冲激光碎片屏蔽的研究

SPIE Laser Damage Pub Date : 2007-12-20 DOI: 10.1117/12.752605

J. Schwarz, P. Rambo, M. Geissel, D. Headley, M. Ramsey, B. Atherton

引用次数: 5

Analysis of output surface damage resulting from single 351 nm, 3 ns pulses on sub-nanosecond laser conditioned KD2PO4 crystals 亚纳秒激光条件下单次351nm, 3ns脉冲对KD2PO4晶体输出表面损伤分析

SPIE Laser Damage Pub Date : 2007-12-20 DOI: 10.1117/12.752957

J. Jarboe, J. Adams, R. Hackel

引用次数: 3

Laser damage investigation in KTiOPO4 (KTP) and RbTiOPO4 (RTP) crystals: threshold anisotropy and the influence of SHG KTiOPO4 (KTP)和RbTiOPO4 (RTP)晶体的激光损伤研究:阈值各向异性和SHG的影响

SPIE Laser Damage Pub Date : 2007-12-20 DOI: 10.1117/12.752895

F. Wagner, A. Hildenbrand, J. Natoli, M. Commandré, F. Théodore, H. Albrecht

{"title":"Laser damage investigation in KTiOPO4 (KTP) and RbTiOPO4 (RTP) crystals: threshold anisotropy and the influence of SHG","authors":"F. Wagner, A. Hildenbrand, J. Natoli, M. Commandré, F. Théodore, H. Albrecht","doi":"10.1117/12.752895","DOIUrl":"https://doi.org/10.1117/12.752895","url":null,"abstract":"The laser damage probability of nonlinear optical crystals depends on many different factors. In addition to the fabrication process (crystal growth, cutting, polishing, coating) the damage threshold of non-linear crystals is influenced by the usage of the crystal. The anisotropy of material properties like the complex refractive index, the mechanical yield strength and the polarizability may cause anisotropy of the Laser Induced Damage Threshold (LIDT). The LIDT may depend on the propagation direction or the polarization of the light. Anisotropy in the LIDT has in fact been observed in different crystals. The dependency of the KDP-LIDT on the propagation direction and its independence on the polarization direction reported by Burnham et al. is an example that is not yet fully understood. For KTP it has been evidenced by Hu et al. that the grey-tracking threshold is polarization dependent. In this contribution we discuss the bulk laser damage resistance of two isomorphous non-linear crystals: KTiOPO4 (KTP) and RbTiOPO4 (RTP). All tests are performed using a nanosecond laser at 1064nm wavelength. For both crystals all polarization and propagation directions parallel to the principal axes have been tested. In addition we investigated two typical devices: two types of Pockels cells in RTP and a SHG-cut crystal in KTP. The results are analyzed on the basis of an anisotropic sensitivity of the crystal to the electric field and the efficiency of second harmonic generation.","PeriodicalId":204978,"journal":{"name":"SPIE Laser Damage","volume":"7 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2007-12-20","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"133618695","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

引用次数: 7

248 nm high fluence irradiation of CaF2 crystals 248nm高通量辐照CaF2晶体

SPIE Laser Damage Pub Date : 2007-12-20 DOI: 10.1117/12.752813

A. Burkert, D. Keutel, U. Natura

引用次数: 5