Materials Transactions Jim最新文献_第5页

Electronic structure of delafossite-type metallic oxide PdCoO2 : Special Issue on Structure and Electronic Properties in the Pseudogap Systems delafoite型金属氧化物PdCoO2的电子结构:赝隙体系结构与电子性能特刊

Materials Transactions Jim Pub Date : 2001-06-20 DOI: 10.2320/MATERTRANS.42.961

M. Hasegawa, T. Higuchi, Masayuki Tanaka, T. Tsukamoto, Shik Shin, H. Takei

引用次数: 12

Thermoelectric properties of (Ca, Sr, Bi)2Co2O5 whiskers : Special Issue on Structure and Electronic Properties in the Pseudogap Systems (Ca, Sr, Bi)2Co2O5晶须的热电性能:赝隙体系结构和电子性能特刊

Materials Transactions Jim Pub Date : 2001-06-20 DOI: 10.2320/MATERTRANS.42.956

R. Funahashi, I. Matsubara, H. Ikuta, T. Takeuchi, U. Mizutani

{"title":"Thermoelectric properties of (Ca, Sr, Bi)2Co2O5 whiskers : Special Issue on Structure and Electronic Properties in the Pseudogap Systems","authors":"R. Funahashi, I. Matsubara, H. Ikuta, T. Takeuchi, U. Mizutani","doi":"10.2320/MATERTRANS.42.956","DOIUrl":"https://doi.org/10.2320/MATERTRANS.42.956","url":null,"abstract":"Thermoelectric properties of (Ca, Sr, Bi) 2 Co 2 O 5 (Co-225) single crystalline whiskers with a layered structure were measured over a wide temperature range 100-973 K. Both Seebeck coefficient and electrical resistivity exhibited fairly complex temperature dependences in this temperature range. The whole temperature range studied is divided into four distinct regions (I) to (IV), depending on observed characteristic temperature dependences of both Seebeck coefficient and electrical resistivity. From more or less linearly temperature dependent Seebeck coefficient in region (I) in combination with unique temperature dependences of both resistivity and Hall coefficient, we conclude the presence of a small pseudogap with a width of a few meV across the Fermi level. Complex magnetic properties are observed: the antiferromagnetic transition at 22 K but the hysteresis in the M-H curve remains up to room temperature. This is taken as evidence for the existence of Co atoms situated in different magnetic environments. The possession of large Seebeck coefficients exceeding 100 μV K -1 in this system is attributed to the presence of the pseudogap at the Fermi level.","PeriodicalId":18264,"journal":{"name":"Materials Transactions Jim","volume":"4 1","pages":"956-960"},"PeriodicalIF":0.0,"publicationDate":"2001-06-20","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"79271612","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

引用次数: 19

A study on the fluxless soldering of Si-wafer/glass substrate using Sn-3.5 mass%Ag and Sn-37 mass%Pb solder : Special issue on basic science and advanced technology of lead-free electronics packaging Sn-3.5质量%Ag和Sn-37质量%Pb焊料对硅晶片/玻璃基板无钎焊的研究&无铅电子封装基础科学与先进技术专刊

Materials Transactions Jim Pub Date : 2001-05-20 DOI: 10.2320/MATERTRANS.42.820

Chang-Bae Park, Soon-Min Hong, J. Jung, C. Kang, Yong-Eui Shin

{"title":"A study on the fluxless soldering of Si-wafer/glass substrate using Sn-3.5 mass%Ag and Sn-37 mass%Pb solder : Special issue on basic science and advanced technology of lead-free electronics packaging","authors":"Chang-Bae Park, Soon-Min Hong, J. Jung, C. Kang, Yong-Eui Shin","doi":"10.2320/MATERTRANS.42.820","DOIUrl":"https://doi.org/10.2320/MATERTRANS.42.820","url":null,"abstract":"UBM-coated Si-wafer was fluxlessly soldered with glass substrate in N 2 atmosphere using plasma cleaning method. The bulk Sn-37 mass%Pb and Sn-3.5 mass%Ag solders were rolled to the sheet of 100 μm thickness in order to achieve bonding to Si-wafer by fluxless 1st reflow process. The oxide layer on the solder surface was analyzed by AES (Auger Electron Spectroscopy). After 1st reflow the Si-wafer with a solder disk was plasma-cleaned, and soldered to glass by 2nd reflow soldering process without flux in N 2 atmosphere. The thickness of oxide layer decreased with increasing plasma power and cleaning time. The optimum plasma treatment condition in this study was 500 W for 12 min and at this condition, 100% bonding ratio for Sn-3.5 Ag and over 80% bonding ratio for Sn-37Pb solder were achieved. The intermetallic compound of continuous Cu 6 Sn 5 was observed along the Si-wafer/solder interface but discrete Cu 6 Sn 5 along the glass/solder interface and the different shapes of Cu 6 Sn 5 were caused by different thickness of Cu as a pad. The fracture of the tensile test specimen occurred at not only solder/UBM and solder/TSM interface but also in Si-wafer and glass substrate.","PeriodicalId":18264,"journal":{"name":"Materials Transactions Jim","volume":"8 1","pages":"820-824"},"PeriodicalIF":0.0,"publicationDate":"2001-05-20","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"91331880","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

引用次数: 16

Application of a fractal method to quantitatively describe some typical fracture surfaces : Special issue on recent progress in understanding of materials fracture 应用分形方法定量描述一些典型断裂面:材料断裂理解的最新进展特刊

Materials Transactions Jim Pub Date : 2001-01-20 DOI: 10.2320/MATERTRANS.42.128

X. Li, J. Tian, S. Li, Zhongguang Wang

{"title":"Application of a fractal method to quantitatively describe some typical fracture surfaces : Special issue on recent progress in understanding of materials fracture","authors":"X. Li, J. Tian, S. Li, Zhongguang Wang","doi":"10.2320/MATERTRANS.42.128","DOIUrl":"https://doi.org/10.2320/MATERTRANS.42.128","url":null,"abstract":"By using a vertical sectioning method (VSM) or secondary electron line scanning method (SELSM), the fractal dimension D S for surface, D L for scanning profile were measured quantitatively on some typical fracture surfaces, namely cleavage fractures, dimple fractures and fatigue fractures of composite materials. It was shown that the measured value of D S relates differently to the impact energy values of materials for cleavage or dimple fractures. The microstructure of materials should be considered comprehensively when relating D S to the mechanical properties of materials. It is found that the correlation between the fractal dimension and the impact energy obtained by SELSM and VSM methods appears to be quite similar. Moreover, the quantitative measurements on the fatigue fracture surfaces of SiC/AI composite materials showed that SiC volume fraction has a strong effect on fractal dimension D S , and that there is an obvious difference in the D S values for fatigue fractures which are due to different fracture mechanisms. These results show that it is possible to reflect the fracture mechanism using D S and relate it to the fracture properties of materials.","PeriodicalId":18264,"journal":{"name":"Materials Transactions Jim","volume":"43 1","pages":"128-131"},"PeriodicalIF":0.0,"publicationDate":"2001-01-20","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"84406224","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

引用次数: 12

Roles of quasiperiodicity and local environment in the electronic transport of the icosahedral quasicrystals in Al-Pd-TM (TM=Fe, Ru, Os) systems : Special Issue on Structure and Electronic Properties in the Pseudogap Systems 准周期性和局部环境在Al-Pd-TM (TM=Fe, Ru, Os)体系中二十面体准晶体电子输运中的作用:赝隙体系的结构和电子性质特刊

Materials Transactions Jim Pub Date : 2001-01-01 DOI: 10.2320/MATERTRANS.42.928

R. Tamura, T. Asao, And Shin Takeuchi

{"title":"Roles of quasiperiodicity and local environment in the electronic transport of the icosahedral quasicrystals in Al-Pd-TM (TM=Fe, Ru, Os) systems : Special Issue on Structure and Electronic Properties in the Pseudogap Systems","authors":"R. Tamura, T. Asao, And Shin Takeuchi","doi":"10.2320/MATERTRANS.42.928","DOIUrl":"https://doi.org/10.2320/MATERTRANS.42.928","url":null,"abstract":"In order to gain an insight into the roles of the local atomic environment and the long-range quasiperiodicity in the electronic transport of the icosahedral quasicrystal, a direct comparison of the electrical resistivity of icosahedral quasicrystals, (1/0, 1/0, 1/0) and (2/1, 2/1, 2/1) crystalline approximants in the Al-Pd-TM (TM=Fe, Ru, Os) ternary systems has been made on the basis of the same alloy system. The trend of the resistivity of 1/0-cubic approximants, which are the lowest order crystalline analogues to the icosahedral phase, already possesses a nonmetallic character, while the 2/1-cubic approximants exhibit quite similar behavior to that of the corresponding quasicrystals. The present result strongly suggests that the effect of the long-range quasiperiodicity beyond the lattice periodicity of 2/1-cubic approximant phase on the electronic transport is of less significance and the electronic transport of approximants and quasicrystals is mainly determined by the local atomic environment of a scale less than 2.0 nm.","PeriodicalId":18264,"journal":{"name":"Materials Transactions Jim","volume":"38 1","pages":"928-932"},"PeriodicalIF":0.0,"publicationDate":"2001-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"88523370","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

引用次数: 10

Application of Energy Dispersive Grazing Incidence X-ray Reflectometry Method to Structural Analysis of Liquid/Liquid and Liquid/Solid Interfaces 能量色散掠入射x射线反射法在液/液和液/固界面结构分析中的应用

Materials Transactions Jim Pub Date : 2000-12-01 DOI: 10.2320/MATERTRANS1989.41.1651

S. Sato, T. Imanaga, E. Matsubara, M. Saito, Y. Waseda

引用次数: 4

Non-Metallic Inclusions and Acicular Ferrite in Low Carbon Steel 低碳钢中的非金属夹杂物和针状铁素体

Materials Transactions Jim Pub Date : 2000-12-01 DOI: 10.2320/MATERTRANS1989.41.1663

Young-Joo Oh, Sang-Yoon Lee, Jung-Soo Byun, J. Shim, Y. Cho

引用次数: 24

Applicability of Platinum and Molybdenum Coatings for Measuring Thermal Diffusivity of Transparent Glass Specimens by the Laser Flash Method at High Temperatures 铂和钼涂层在高温下激光闪光法测量透明玻璃试样热扩散率的适用性

Materials Transactions Jim Pub Date : 2000-12-01 DOI: 10.2320/MATERTRANS1989.41.1616

H. Shibata, H. Ohta, Atsushi Suzuki, Y. Waseda

引用次数: 15

Effect of Cu on the corrosion resistance of a NiMo2B2-Dispersed Ni-based alloy Cu对nimo2b2分散镍基合金耐蚀性的影响

Materials Transactions Jim Pub Date : 2000-12-01 DOI: 10.2320/MATERTRANS1989.41.1593

Guofeng Zhang, M. Morishita, M. Inada, K. Kôyama

引用次数: 4

Mechanical Properties of Mo–Nb–TiC In-situ Composites Synthesized by Hot-Pressing 热压原位合成Mo-Nb-TiC复合材料的力学性能

Materials Transactions Jim Pub Date : 2000-12-01 DOI: 10.2320/MATERTRANS1989.41.1599

N. Nomura, K. Yoshimi, S. Hanada

引用次数: 15