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Journal of The Korean Institute of Electrical and Electronic Material Engineers最新文献

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Development of NCS-Based Technical Education Program for Analog Signal Processing 基于ncs的模拟信号处理技术教育方案的开发
Journal of The Korean Institute of Electrical and Electronic Material Engineers Pub Date : 2020-01-01 DOI: 10.4313/JKEM.2020.33.6.510
C. Cho
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引用次数: 0
Angle Ring Press Board Characteristic in Accordance with Temperature and Humidity for High Voltage Transformer 高压变压器角环压板随温湿度变化特性研究
Journal of The Korean Institute of Electrical and Electronic Material Engineers Pub Date : 2020-01-01 DOI: 10.4313/JKEM.2020.33.1.60
Suh Wang Byuck
{"title":"Angle Ring Press Board Characteristic in Accordance with Temperature and Humidity for High Voltage Transformer","authors":"Suh Wang Byuck","doi":"10.4313/JKEM.2020.33.1.60","DOIUrl":"https://doi.org/10.4313/JKEM.2020.33.1.60","url":null,"abstract":"In this study, to develop angle ring pressboards for high voltage transformers, the radius and thickness are modified under the conditions of temperature and humidity. In particular, a pressboard with a thickness of 6 mm and a radius at the angled part were investigated based on the simulation of the principal stress from the angled optimization profile shape. As a result, by the appropriate application of a higher temperature, the solid insulation can be improved to reduce the moisture content for an optimized profile angle of a high voltage transformer. This also results in the improvement of the safety factor by 25%. It is determined that the electrical insulation properties of pressboards in high voltage transformers can be enhanced by improving their properties.","PeriodicalId":17325,"journal":{"name":"Journal of The Korean Institute of Electrical and Electronic Material Engineers","volume":null,"pages":null},"PeriodicalIF":0.0,"publicationDate":"2020-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"74052472","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
EMI Debugging Technique of LED Lighting Module LED照明模块的电磁干扰调试技术
Journal of The Korean Institute of Electrical and Electronic Material Engineers Pub Date : 2020-01-01 DOI: 10.4313/JKEM.2020.33.2.151
Kim Jin-Sa
{"title":"EMI Debugging Technique of LED Lighting Module","authors":"Kim Jin-Sa","doi":"10.4313/JKEM.2020.33.2.151","DOIUrl":"https://doi.org/10.4313/JKEM.2020.33.2.151","url":null,"abstract":"","PeriodicalId":17325,"journal":{"name":"Journal of The Korean Institute of Electrical and Electronic Material Engineers","volume":null,"pages":null},"PeriodicalIF":0.0,"publicationDate":"2020-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"87400437","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Electrical Characteristics of 1,200 V Reverse Conducting-IGBT 1200v反导- igbt的电特性
Journal of The Korean Institute of Electrical and Electronic Material Engineers Pub Date : 2020-01-01 DOI: 10.4313/JKEM.2020.33.3.177
Kim Se Young, B. Ahn, yigu Kang
{"title":"Electrical Characteristics of 1,200 V Reverse Conducting-IGBT","authors":"Kim Se Young, B. Ahn, yigu Kang","doi":"10.4313/JKEM.2020.33.3.177","DOIUrl":"https://doi.org/10.4313/JKEM.2020.33.3.177","url":null,"abstract":"","PeriodicalId":17325,"journal":{"name":"Journal of The Korean Institute of Electrical and Electronic Material Engineers","volume":null,"pages":null},"PeriodicalIF":0.0,"publicationDate":"2020-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"87479558","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Effect of Native Oxide Layer on the Water Contact Angle to Determine the Surface Polarity of SiC Single Crystals 天然氧化层对水接触角测定SiC单晶表面极性的影响
Journal of The Korean Institute of Electrical and Electronic Material Engineers Pub Date : 2020-01-01 DOI: 10.4313/JKEM.2020.33.3.245
J. Y. Park, Jung Gon Kim, Kim Dae Sung, W. Yoo, L. Jae
{"title":"Effect of Native Oxide Layer on the Water Contact Angle to Determine the Surface Polarity of SiC Single Crystals","authors":"J. Y. Park, Jung Gon Kim, Kim Dae Sung, W. Yoo, L. Jae","doi":"10.4313/JKEM.2020.33.3.245","DOIUrl":"https://doi.org/10.4313/JKEM.2020.33.3.245","url":null,"abstract":"","PeriodicalId":17325,"journal":{"name":"Journal of The Korean Institute of Electrical and Electronic Material Engineers","volume":null,"pages":null},"PeriodicalIF":0.0,"publicationDate":"2020-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"79071475","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
IGZO TFT Stability Improvement Based on Various Passivation Materials 基于不同钝化材料的IGZO TFT稳定性改善
Journal of The Korean Institute of Electrical and Electronic Material Engineers Pub Date : 2020-01-01 DOI: 10.4313/JKEM.2020.33.1.6
Jaemin Kim, Park Jin Soo, Geonju Yoon, Jaehyun Cho, Sangwoo Bae, Jinseok Kim, Kwon, Kee-Won, Youn-jung Lee, J. Yi
{"title":"IGZO TFT Stability Improvement Based on Various Passivation Materials","authors":"Jaemin Kim, Park Jin Soo, Geonju Yoon, Jaehyun Cho, Sangwoo Bae, Jinseok Kim, Kwon, Kee-Won, Youn-jung Lee, J. Yi","doi":"10.4313/JKEM.2020.33.1.6","DOIUrl":"https://doi.org/10.4313/JKEM.2020.33.1.6","url":null,"abstract":"","PeriodicalId":17325,"journal":{"name":"Journal of The Korean Institute of Electrical and Electronic Material Engineers","volume":null,"pages":null},"PeriodicalIF":0.0,"publicationDate":"2020-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"88281975","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Evaluation of Electrical Properties of IZO Thin-Film with UV Post-Annealing Treatment Time 紫外后退火时间对IZO薄膜电性能的影响
Journal of The Korean Institute of Electrical and Electronic Material Engineers Pub Date : 2020-01-01 DOI: 10.4313/JKEM.2020.33.2.93
Jae-Yun Lee, Han-Sang Kim, Sung‐Jin Kim
{"title":"Evaluation of Electrical Properties of IZO Thin-Film with UV Post-Annealing Treatment Time","authors":"Jae-Yun Lee, Han-Sang Kim, Sung‐Jin Kim","doi":"10.4313/JKEM.2020.33.2.93","DOIUrl":"https://doi.org/10.4313/JKEM.2020.33.2.93","url":null,"abstract":"","PeriodicalId":17325,"journal":{"name":"Journal of The Korean Institute of Electrical and Electronic Material Engineers","volume":null,"pages":null},"PeriodicalIF":0.0,"publicationDate":"2020-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"75104717","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Enhancement of Hydrophobicity by a Heat Treatment of Zinc Aluminate Thin Film Deposited on Glass Substrate 玻璃基板铝酸锌薄膜热处理增强疏水性
Journal of The Korean Institute of Electrical and Electronic Material Engineers Pub Date : 2020-01-01 DOI: 10.4313/JKEM.2020.33.4.249
S. Seo, Soon-Gil Yoon
{"title":"Enhancement of Hydrophobicity by a Heat Treatment of Zinc Aluminate Thin Film Deposited on Glass Substrate","authors":"S. Seo, Soon-Gil Yoon","doi":"10.4313/JKEM.2020.33.4.249","DOIUrl":"https://doi.org/10.4313/JKEM.2020.33.4.249","url":null,"abstract":"","PeriodicalId":17325,"journal":{"name":"Journal of The Korean Institute of Electrical and Electronic Material Engineers","volume":null,"pages":null},"PeriodicalIF":0.0,"publicationDate":"2020-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"78785285","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Properties of ZnO:Ga Thin Films Deposited by RF Magnetron Sputtering with Ar Gas Flows 氩气流下射频磁控溅射制备ZnO:Ga薄膜的性能
Journal of The Korean Institute of Electrical and Electronic Material Engineers Pub Date : 2020-01-01 DOI: 10.4313/JKEM.2020.33.6.450
Deok-Kyu Kim
{"title":"Properties of ZnO:Ga Thin Films Deposited by RF Magnetron Sputtering with Ar Gas Flows","authors":"Deok-Kyu Kim","doi":"10.4313/JKEM.2020.33.6.450","DOIUrl":"https://doi.org/10.4313/JKEM.2020.33.6.450","url":null,"abstract":"","PeriodicalId":17325,"journal":{"name":"Journal of The Korean Institute of Electrical and Electronic Material Engineers","volume":null,"pages":null},"PeriodicalIF":0.0,"publicationDate":"2020-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"81051262","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Design and Fabrication of a Surge Generator with Coupling/Decoupling Networks 带耦合/解耦网络的浪涌发生器的设计与制造
Journal of The Korean Institute of Electrical and Electronic Material Engineers Pub Date : 2020-01-01 DOI: 10.4313/JKEM.2020.33.2.130
N. Kim, T. Kang, H. Shin, G. Kil
{"title":"Design and Fabrication of a Surge Generator with Coupling/Decoupling Networks","authors":"N. Kim, T. Kang, H. Shin, G. Kil","doi":"10.4313/JKEM.2020.33.2.130","DOIUrl":"https://doi.org/10.4313/JKEM.2020.33.2.130","url":null,"abstract":"","PeriodicalId":17325,"journal":{"name":"Journal of The Korean Institute of Electrical and Electronic Material Engineers","volume":null,"pages":null},"PeriodicalIF":0.0,"publicationDate":"2020-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"88586234","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
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