2020 Workshop on Fault Detection and Tolerance in Cryptography (FDTC)最新文献

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2020 Workshop on Fault Detection and Tolerance in Cryptography (FDTC) Pub Date : 2020-09-01 DOI: 10.1109/fdtc51366.2020.00008

Katrina Jessoe, E. Spang

引用次数: 0

An End-to-End Approach for Multi-Fault Attack Vulnerability Assessment 多故障攻击脆弱性评估的端到端方法

2020 Workshop on Fault Detection and Tolerance in Cryptography (FDTC) Pub Date : 2020-09-01 DOI: 10.1109/FDTC51366.2020.00009

Vincent Werner, Laurent Maingault, Marie-Laure Potet

引用次数: 8

SiliconToaster: A Cheap and Programmable EM Injector for Extracting Secrets 硅烤面包机:用于提取秘密的廉价可编程电磁注入器

2020 Workshop on Fault Detection and Tolerance in Cryptography (FDTC) Pub Date : 2020-09-01 DOI: 10.1109/FDTC51366.2020.00012

K. M. Abdellatif, Olivier Hériveaux

引用次数: 12

Countermeasures Optimization in Multiple Fault-Injection Context 多故障注入环境下的对策优化

2020 Workshop on Fault Detection and Tolerance in Cryptography (FDTC) Pub Date : 2020-09-01 DOI: 10.1109/FDTC51366.2020.00011

Etienne Boespflug, Cristian Ene, L. Mounier, Marie-Laure Potet

引用次数: 2

Title Page I 第一页

2020 Workshop on Fault Detection and Tolerance in Cryptography (FDTC) Pub Date : 2020-09-01 DOI: 10.1109/fdtc51366.2020.00001

引用次数: 0

Single-bit Laser Fault Model in NOR Flash Memories: Analysis and Exploitation NOR闪存中单比特激光故障模型的分析与开发

2020 Workshop on Fault Detection and Tolerance in Cryptography (FDTC) Pub Date : 2020-09-01 DOI: 10.1109/FDTC51366.2020.00013

A. Menu, J. Dutertre, J. Rigaud, Brice Colombier, Pierre-Alain Moëllic, J. Danger

{"title":"Single-bit Laser Fault Model in NOR Flash Memories: Analysis and Exploitation","authors":"A. Menu, J. Dutertre, J. Rigaud, Brice Colombier, Pierre-Alain Moëllic, J. Danger","doi":"10.1109/FDTC51366.2020.00013","DOIUrl":"https://doi.org/10.1109/FDTC51366.2020.00013","url":null,"abstract":"Laser injection is a powerful fault injection technique with a high spatial accuracy which allows an adversary to efficiently extract the secret information from an electronic device. The control and the repeatability of faults requires the attacker to understand the relation of the fault model to the setup (notably the laser spot size) and the process node of the target device. Most studies on laser fault injection report fault models resulting from a photo-electric current in CMOS transistors. This study provides a black-box analysis of the effect of a photo-electric current in floating-gate transistors of two embedded NOR Flash memories from two different manufacturers. Experimental results demonstrate that single-bit bit-set faults can be injected in code and data without corrupting the Flash memory, even with a laser spot of more than 20 µm in diameter, which is several orders of magnitude larger than the process node of the floating-gate transistors in the experiments. This article also presents the specifics of performing a \"safe-error\" attack on AES, leveraging the previously detailed single-bit bit-set fault model.","PeriodicalId":168420,"journal":{"name":"2020 Workshop on Fault Detection and Tolerance in Cryptography (FDTC)","volume":"100 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2020-09-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"124402375","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

引用次数: 10

Acknowledgments 致谢

2020 Workshop on Fault Detection and Tolerance in Cryptography (FDTC) Pub Date : 2020-09-01 DOI: 10.1109/fdtc51366.2020.00007

引用次数: 0

Copyright 版权

2020 Workshop on Fault Detection and Tolerance in Cryptography (FDTC) Pub Date : 2020-09-01 DOI: 10.1109/fdtc51366.2020.00003

引用次数: 0

Title Page III 第三页

2020 Workshop on Fault Detection and Tolerance in Cryptography (FDTC) Pub Date : 2020-09-01 DOI: 10.1109/fdtc51366.2020.00002

引用次数: 0

Attacking Hardware Random Number Generators in a Multi-Tenant Scenario 攻击多租户场景下的硬件随机数生成器

2020 Workshop on Fault Detection and Tolerance in Cryptography (FDTC) Pub Date : 2020-09-01 DOI: 10.1109/FDTC51366.2020.00010

Yrjo Koyen, Adriaan Peetermans, Vladimir Rožić, I. Verbauwhede

{"title":"Attacking Hardware Random Number Generators in a Multi-Tenant Scenario","authors":"Yrjo Koyen, Adriaan Peetermans, Vladimir Rožić, I. Verbauwhede","doi":"10.1109/FDTC51366.2020.00010","DOIUrl":"https://doi.org/10.1109/FDTC51366.2020.00010","url":null,"abstract":"True random number generators are important building blocks for cryptographic systems and can be the target of adversaries that want to break cryptographic protocols by reducing the unpredictability of the used random numbers. This paper examines the viability of three different types of potential attacks on these generators when they are implemented on field programmable gate arrays, namely the voltage manipulation attack, the ring-oscillator locking attack and the replica observation attack. The proposed attacks only make use of the available programmable logic of the device and as such do not require physical access to it. They can technically be mounted remotely in a multi-tenant scenario by adversaries that only have bitstream write access to a part of the programmable logic. The attacks try to exploit interactions that can exist between an attack circuit and the targeted circuit because they reside on the same chip. The paper presents two case studies: an elementary ring oscillator design and a transition effect ring oscillator design. For the first case study, all three scenarios were tested and for the second case study, only the voltage manipulation attack scenario is examined. Our results show that this voltage manipulation attack is the most effective of the three proposed attacks.","PeriodicalId":168420,"journal":{"name":"2020 Workshop on Fault Detection and Tolerance in Cryptography (FDTC)","volume":"157 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2020-09-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"121047851","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

引用次数: 3