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Speed control of DC machine using adaptive neural IMC controller based on recurrent neural network 使用基于递归神经网络的自适应神经 IMC 控制器控制直流电机速度
2016 5th International Conference on Systems and Control (ICSC) Pub Date : 2016-05-25 DOI: 10.1109/ICOSC.2016.7507069
Z. Benmabrouk, A. Abid, M. Hamed, L. Sbita
{"title":"Speed control of DC machine using adaptive neural IMC controller based on recurrent neural network","authors":"Z. Benmabrouk, A. Abid, M. Hamed, L. Sbita","doi":"10.1109/ICOSC.2016.7507069","DOIUrl":"https://doi.org/10.1109/ICOSC.2016.7507069","url":null,"abstract":"This paper is a comparative study of classic IMC controller and a new adaptive IMC recurrent neural controller. The two controllers are implemented to control the DC machine speed. The IMC neural controller is based on two neural networks, the first is a recurrent neural network that replaces the DC machine model and the second is a neural network that replaces the internal model controller. The recurrent neural algorithm is developed and applied to estimate and control the DC machine speed under various types of disturbances in order to approve the controller robustness. Simulation results are provided to show the effectiveness of the proposed controller.","PeriodicalId":149249,"journal":{"name":"2016 5th International Conference on Systems and Control (ICSC)","volume":"78 3 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2016-05-25","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"131106719","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 5
Fault tolerant control for switching discrete-time systems with external disturbances 具有外部干扰的开关离散系统的容错控制
2016 5th International Conference on Systems and Control (ICSC) Pub Date : 2016-05-25 DOI: 10.1109/ICOSC.2016.7507024
A. Benzaouia, Youssef Eddoukali, O. Akhrif, L. Saydy
{"title":"Fault tolerant control for switching discrete-time systems with external disturbances","authors":"A. Benzaouia, Youssef Eddoukali, O. Akhrif, L. Saydy","doi":"10.1109/ICOSC.2016.7507024","DOIUrl":"https://doi.org/10.1109/ICOSC.2016.7507024","url":null,"abstract":"This paper investigates the problem of fault tolerant control for discrete-time switching systems under an arbitrary switching signal. Sufficient conditions for designing an observer are obtained using multiple Lyapunov function and H∞ techniques. A Sufficient condition for the solvability of this problem is established in terms of linear matrix inequalities (LMIs). The obtained results are applied on a numerical example showing fault detection, localization of fault and reconfiguration of the control to maintain asymptotic stability, even in the presence of a permanent sensor fault.","PeriodicalId":149249,"journal":{"name":"2016 5th International Conference on Systems and Control (ICSC)","volume":"14 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2016-05-25","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"132090011","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 2
Regularized regression models to predict the product quality in multistep manufacturing 多步制造过程中产品质量预测的正则回归模型
2016 5th International Conference on Systems and Control (ICSC) Pub Date : 2016-05-25 DOI: 10.1109/ICOSC.2016.7507067
M. Melhem, B. Ananou, M. Ouladsine, J. Pinaton
{"title":"Regularized regression models to predict the product quality in multistep manufacturing","authors":"M. Melhem, B. Ananou, M. Ouladsine, J. Pinaton","doi":"10.1109/ICOSC.2016.7507067","DOIUrl":"https://doi.org/10.1109/ICOSC.2016.7507067","url":null,"abstract":"Nowadays, the semiconductor manufacturing process is becoming very complex, consisting of hundreds of steps before obtaining the final product. Continuous Yield improvement is required to meet the current competitive market needs. High yield can be achieved by monitoring the wafer quality in real time throughout the auto-correlated multivariate process. However, the missing quality measurements make the product quality control very difficult. In this paper, we present an approach to predict product quality by using both the available on-line measurements of the production equipment data and the information about correlations between product quality measurements across the different steps. For this purpose, a regularized regression technique is used to represent statistical relationships between the correlated product quality measurements and the high-dimensional sensor data.","PeriodicalId":149249,"journal":{"name":"2016 5th International Conference on Systems and Control (ICSC)","volume":"7 8","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2016-05-25","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"120855006","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 3
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