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Journal of Advanced Microscopy Research最新文献

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High Performance of Green Quantum Dots Light-Emitting Diodes Based on NiO Electron Blocking Layer 基于NiO电子阻挡层的高性能绿色量子点发光二极管
Journal of Advanced Microscopy Research Pub Date : 2017-12-01 DOI: 10.1166/JAMR.2017.1342
Zhiwei Li
{"title":"High Performance of Green Quantum Dots Light-Emitting Diodes Based on NiO Electron Blocking Layer","authors":"Zhiwei Li","doi":"10.1166/JAMR.2017.1342","DOIUrl":"https://doi.org/10.1166/JAMR.2017.1342","url":null,"abstract":"","PeriodicalId":14913,"journal":{"name":"Journal of Advanced Microscopy Research","volume":"27 1","pages":"198-202"},"PeriodicalIF":0.0,"publicationDate":"2017-12-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"89698698","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
The Blood Brain Barrier Breakdown in Severe Traumatic Brain Injuries in Aging Patients. An Electron Microscopic Study 老年重型颅脑损伤患者血脑屏障的破坏。电子显微镜研究
Journal of Advanced Microscopy Research Pub Date : 2017-12-01 DOI: 10.1166/JAMR.2017.1349
O. Castejón
{"title":"The Blood Brain Barrier Breakdown in Severe Traumatic Brain Injuries in Aging Patients. An Electron Microscopic Study","authors":"O. Castejón","doi":"10.1166/JAMR.2017.1349","DOIUrl":"https://doi.org/10.1166/JAMR.2017.1349","url":null,"abstract":"","PeriodicalId":14913,"journal":{"name":"Journal of Advanced Microscopy Research","volume":"94 1","pages":"236-240"},"PeriodicalIF":0.0,"publicationDate":"2017-12-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"77469635","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 1
Solution-Processed Quantum Dots Light-Emitting Diodes Based on Novel Ag Dendrites Electrode 基于新型银枝电极的溶液处理量子点发光二极管
Journal of Advanced Microscopy Research Pub Date : 2017-12-01 DOI: 10.1166/jamr.2017.1345
Zhiwei Li
{"title":"Solution-Processed Quantum Dots Light-Emitting Diodes Based on Novel Ag Dendrites Electrode","authors":"Zhiwei Li","doi":"10.1166/jamr.2017.1345","DOIUrl":"https://doi.org/10.1166/jamr.2017.1345","url":null,"abstract":"","PeriodicalId":14913,"journal":{"name":"Journal of Advanced Microscopy Research","volume":"25 1","pages":"213-217"},"PeriodicalIF":0.0,"publicationDate":"2017-12-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"81877591","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Effect of Laser Hardfacing Process Parameters on Microstructural Characteristics and Microhardness of Ni–Cr–B–Si–C Deposit on Austenitic Stainless Steel Substrate 激光堆焊工艺参数对奥氏体不锈钢基体Ni-Cr-B-Si-C镀层显微组织特征和显微硬度的影响
Journal of Advanced Microscopy Research Pub Date : 2017-12-01 DOI: 10.1166/jamr.2017.1339
S. Gnanasekaran, G. Padmanaban, V. Balasubramanian
{"title":"Effect of Laser Hardfacing Process Parameters on Microstructural Characteristics and Microhardness of Ni–Cr–B–Si–C Deposit on Austenitic Stainless Steel Substrate","authors":"S. Gnanasekaran, G. Padmanaban, V. Balasubramanian","doi":"10.1166/jamr.2017.1339","DOIUrl":"https://doi.org/10.1166/jamr.2017.1339","url":null,"abstract":"","PeriodicalId":14913,"journal":{"name":"Journal of Advanced Microscopy Research","volume":"152 1","pages":"173-181"},"PeriodicalIF":0.0,"publicationDate":"2017-12-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"73645672","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 4
Spectrophotometric Evaluation of Reflection Coefficient of Thin Ti and TiN Coatings Depending on Deposition Method 基于沉积方法的薄Ti和TiN涂层反射系数的分光光度评价
Journal of Advanced Microscopy Research Pub Date : 2017-12-01 DOI: 10.1166/JAMR.2017.1343
V. Taran, R. M. Muratov, A. Taran
{"title":"Spectrophotometric Evaluation of Reflection Coefficient of Thin Ti and TiN Coatings Depending on Deposition Method","authors":"V. Taran, R. M. Muratov, A. Taran","doi":"10.1166/JAMR.2017.1343","DOIUrl":"https://doi.org/10.1166/JAMR.2017.1343","url":null,"abstract":"","PeriodicalId":14913,"journal":{"name":"Journal of Advanced Microscopy Research","volume":"37 1","pages":"203-206"},"PeriodicalIF":0.0,"publicationDate":"2017-12-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"74454489","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 3
Combined Effect of TiB2 Particle Addition and Heat Treatment on Mechanical Properties of Al6061/TiB2 In-Situ Formed MMCs TiB2颗粒添加与热处理对原位成形Al6061/TiB2复合材料力学性能的影响
Journal of Advanced Microscopy Research Pub Date : 2017-12-01 DOI: 10.1166/JAMR.2017.1348
B. Gobalakrishnan, P. Lakshminarayanan, R. Varahamoorthi
{"title":"Combined Effect of TiB2 Particle Addition and Heat Treatment on Mechanical Properties of Al6061/TiB2 In-Situ Formed MMCs","authors":"B. Gobalakrishnan, P. Lakshminarayanan, R. Varahamoorthi","doi":"10.1166/JAMR.2017.1348","DOIUrl":"https://doi.org/10.1166/JAMR.2017.1348","url":null,"abstract":"","PeriodicalId":14913,"journal":{"name":"Journal of Advanced Microscopy Research","volume":"4 1","pages":"230-235"},"PeriodicalIF":0.0,"publicationDate":"2017-12-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"79135009","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 5
Porosity Estimation of Nanostructured a-SiC Coating on Ti–6Al–4V by Topography Mapping with Hardness Enhancement Ti-6Al-4V表面纳米结构a-SiC涂层的孔隙率估算
Journal of Advanced Microscopy Research Pub Date : 2017-12-01 DOI: 10.1166/JAMR.2017.1341
K. Karthik, V. Srinivasan, B. Karthikeyan
{"title":"Porosity Estimation of Nanostructured a-SiC Coating on Ti–6Al–4V by Topography Mapping with Hardness Enhancement","authors":"K. Karthik, V. Srinivasan, B. Karthikeyan","doi":"10.1166/JAMR.2017.1341","DOIUrl":"https://doi.org/10.1166/JAMR.2017.1341","url":null,"abstract":"","PeriodicalId":14913,"journal":{"name":"Journal of Advanced Microscopy Research","volume":"34 1","pages":"190-197"},"PeriodicalIF":0.0,"publicationDate":"2017-12-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"87240019","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Use of Environmental Scanning Electron Microscope for Taxonomy of Fungi 环境扫描电镜在真菌分类中的应用
Journal of Advanced Microscopy Research Pub Date : 2017-12-01 DOI: 10.1166/JAMR.2017.1337
B. Naik, S. K. Goyal, A. Tripathi, Vijay Kumar
{"title":"Use of Environmental Scanning Electron Microscope for Taxonomy of Fungi","authors":"B. Naik, S. K. Goyal, A. Tripathi, Vijay Kumar","doi":"10.1166/JAMR.2017.1337","DOIUrl":"https://doi.org/10.1166/JAMR.2017.1337","url":null,"abstract":"","PeriodicalId":14913,"journal":{"name":"Journal of Advanced Microscopy Research","volume":"6 1","pages":"163-166"},"PeriodicalIF":0.0,"publicationDate":"2017-12-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"76445724","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 4
Establishing Empirical Relationship to Predict the Corrosion Rate of HVOF Sprayed Iron Based Amorphous Metallic Coating on 316 Stainless Steel 建立预测316不锈钢HVOF喷涂铁基非晶态金属涂层腐蚀速率的经验关系
Journal of Advanced Microscopy Research Pub Date : 2017-12-01 DOI: 10.1166/JAMR.2017.1340
S. Vignesh, K. Shanmugam, V. Balasubramanian, K. Sridhar, R. Jayaraj
{"title":"Establishing Empirical Relationship to Predict the Corrosion Rate of HVOF Sprayed Iron Based Amorphous Metallic Coating on 316 Stainless Steel","authors":"S. Vignesh, K. Shanmugam, V. Balasubramanian, K. Sridhar, R. Jayaraj","doi":"10.1166/JAMR.2017.1340","DOIUrl":"https://doi.org/10.1166/JAMR.2017.1340","url":null,"abstract":"","PeriodicalId":14913,"journal":{"name":"Journal of Advanced Microscopy Research","volume":"137 1","pages":"182-189"},"PeriodicalIF":0.0,"publicationDate":"2017-12-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"77614154","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Scanning Electron Microscopy and EDS Analysis of Compacted Powder of Al–Co Alloy System Al-Co合金体系压实粉末的扫描电镜和能谱分析
Journal of Advanced Microscopy Research Pub Date : 2017-12-01 DOI: 10.1166/jamr.2017.1346
I. Raheb, M. Debili
{"title":"Scanning Electron Microscopy and EDS Analysis of Compacted Powder of Al–Co Alloy System","authors":"I. Raheb, M. Debili","doi":"10.1166/jamr.2017.1346","DOIUrl":"https://doi.org/10.1166/jamr.2017.1346","url":null,"abstract":"","PeriodicalId":14913,"journal":{"name":"Journal of Advanced Microscopy Research","volume":"33 2 1","pages":"218-222"},"PeriodicalIF":0.0,"publicationDate":"2017-12-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"78074643","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
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