{"title":"Spectrophotometric Evaluation of Reflection Coefficient of Thin Ti and TiN Coatings Depending on Deposition Method","authors":"V. Taran, R. M. Muratov, A. Taran","doi":"10.1166/JAMR.2017.1343","DOIUrl":null,"url":null,"abstract":"","PeriodicalId":14913,"journal":{"name":"Journal of Advanced Microscopy Research","volume":"37 1","pages":"203-206"},"PeriodicalIF":0.0000,"publicationDate":"2017-12-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"3","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Journal of Advanced Microscopy Research","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1166/JAMR.2017.1343","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
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