65th ARFTG Conference Digest, 2005. Spring 2005最新文献

{"title":"Analysis of results in complex-valued intercomparisons","authors":"M. Rodriguez","doi":"10.1109/CPEM.2008.4574731","DOIUrl":"https://doi.org/10.1109/CPEM.2008.4574731","url":null,"abstract":"In the analysis of complex-valued intercomparisons (i.e. comparisons in which the participants provide complex quantities, together with an associated uncertainty region) the visualisation of results plays a determinant role. In a general case the region of uncertainty is an ellipse, which is defined by two standard deviations in both axes, together with the correlation factor between x and y. Besides, the problem arises regarding the assignment of a given figure of merit to each participant, which may help analysing the individual results. Traditional approaches rely on the definition of the so-called spatial median among the participants, as well as the median of absolute deviation (MAD). This allows us to define a circle encompassing all non-outliers, the definition of an outlier thus being to lie outside the circle of 3.75-MAD from the spatial median. However, both the spatial median and the MAD rely only on the measured values as obtained from each participant, and the whole approach provides no information, either visual or analytical, about the associated region of uncertainty estimated by each laboratory. Our first goal in this paper is to graphically represent the measured values, together with their uncertainty, against the computed \"3.75-MAD-circle\". Second objective is to define a figure of merit for each participant, from which an impartial observer can deduce the level of agreement between the individual laboratories and the reference value of the intercomparison. This figure of merit will be based on probabilities or levels of confidence, making use of the Monte Carlo method for simulation of the assumed probability density function of results. Previous approaches are based on the graphical representation of complex-valued quantities in the traditional magnitude and phase plots. This has the advantage of presenting the results in a similar way to the one-dimensional problem, as well as minor disadvantages such as the existence of asymmetric uncertainty budgets. Our feeling, however, is that we should be moving onto the full two-dimensional approach if we eventually want to get rid of old pre-conceived ideas from the one-dimensional world, e.g. the truncation of magnitude distributions as a result of the magnitude being non-negative. With this in mind, we will be presenting some theoretical examples of intercomparison results which show basically the same dispersion between participants, but different regions of uncertainty for each measured value. Our goal is to evaluate the change in the proposed figure of merit: (1) as the measured value changes; (2) as the uncertainty region is increased or reduced; and (3) as the uncertainty region is rotated. Finally, a similar approach as the one here presented can be applied to the computation of a generalised \"normalised error\" between any two complex-valued quantities and their associated regions of uncertainty. This can be of some help in topics like the assessment of measurement results ","PeriodicalId":148659,"journal":{"name":"65th ARFTG Conference Digest, 2005. Spring 2005","volume":"15 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2008-06-08","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"130510739","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

{"title":"Pulsed-IV pulsed-RF measurements using a large signal network analyzer","authors":"S. Doo, P. Roblin, Sunyoung Lee, D. Chaillot, M. vanden Bossche","doi":"10.1109/ARFTGS.2005.1500570","DOIUrl":"https://doi.org/10.1109/ARFTGS.2005.1500570","url":null,"abstract":"A new pulsed-IV pulsed-RF measurement system using a large signal network analyzer (LSNA) is proposed to address the problem of desensitization afflicting conventional pulsed-RF measurement systems. Several extraction methods using the entire spectrum measured by the system are presented to extract non-desensitized pulsed-RF S-parameters of a transistor. The comparison of the calculated S-parameters using the least-square fitting in time domain with those using only the fundamental tone reveals the significant increase in dynamic range achieved by the proposed measurement scheme.","PeriodicalId":148659,"journal":{"name":"65th ARFTG Conference Digest, 2005. Spring 2005","volume":"1 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2005-06-17","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"130207614","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

{"title":"Improved Y factor noise measurement using the second stage contribution to advantage","authors":"A. Victor, M. Steer","doi":"10.1109/ARFTGS.2005.1500574","DOIUrl":"https://doi.org/10.1109/ARFTGS.2005.1500574","url":null,"abstract":"The ultimate limitation to characterizing noise in microwave amplifiers derives from the noise inserted by the front-end of the measurement set. Typically a high-gain low noise preamplifier is used in the measurement set to improve accuracy. Even then there is a limit to the minimum noise factor that can be measured. In this paper an extended Y-factor noise measurement technique is presented that utilizes an amplifier stage identical and in addition to the amplifier under test to enhance measurement accuracy. Utilizing a calibrated noise source, the output noise power of first a forward cascade of the two amplifiers is measured and then that when the amplifiers are arranged in reverse cascade. The use of a spectrum analyzer or power meter with a readily measured change in noise power reading is required as well as a calibrated noise source.","PeriodicalId":148659,"journal":{"name":"65th ARFTG Conference Digest, 2005. Spring 2005","volume":"35 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2005-06-17","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"133564205","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

{"title":"An automated IPX characterization system","authors":"J.-F.J. Nowakowski","doi":"10.1109/ARFTGS.2005.1500582","DOIUrl":"https://doi.org/10.1109/ARFTGS.2005.1500582","url":null,"abstract":"In the highly competitive market of RFICs, components test plays a key role. In order to reduce the critical factor time to market, the main objective is to test the most products possible in the least amount of time, for the lowest cost and with the highest accuracy. Automated tests help reaching this goal, for example for intermodulation measurements, which are ones of the most important parameters when characterizing mixers and LNAs. A fully automated modular test system in industrial R&D laboratory environment has been developed for RF and I/O products. This paper presents a part of this global test system and focuses on intermodulation measurements capabilities. Automatic calibration and report generation, traceability, large modularity, enhanced accuracy, multiple instruments choice, friendly interface, reuse strategy are ones of the main features of this system. Using this validated solution, the reduction of characterization time is a factor of 5. In the future, this system will be extended not only to all kind of RF measurements but also to complete tests of PLL/VCO, mixed products. A closed loop will allow comparing, in a direct flow, simulation and tests results. The perspectives of this system are thus wide opened.","PeriodicalId":148659,"journal":{"name":"65th ARFTG Conference Digest, 2005. Spring 2005","volume":"281 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2005-06-17","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"122945143","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

{"title":"Measuring the on wafer noise figure of a W-band LNA - an application","authors":"J. Burns, H. Fudem, M. R. Murphy","doi":"10.1109/ARFTGS.2005.1500566","DOIUrl":"https://doi.org/10.1109/ARFTGS.2005.1500566","url":null,"abstract":"A method to measure the noise figure of a three stage W-band low noise amplifier (LNA) is described. Measurement results of noise figure and s-parameter gains are compared.","PeriodicalId":148659,"journal":{"name":"65th ARFTG Conference Digest, 2005. Spring 2005","volume":"47 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2005-06-17","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"132869434","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

{"title":"Automated calibration of noise figure measurement path of a low noise RF receiver","authors":"G. Ibrahim","doi":"10.1109/ARFTGS.2005.1500590","DOIUrl":"https://doi.org/10.1109/ARFTGS.2005.1500590","url":null,"abstract":"In an automated production test system, to achieve high precision NF measurement of low noise RF receiver with high production rate, the test fixture NF measurement path has to be calibrated repetitively with high accuracy and speed between measurements. The calibration path was designed within the fixture utilizing a noise figure analyzer and a noise source, such that switching between measurement path and calibration path can be controlled through software automatically or at discretion of the operator. The condition for precise measurements required that the measurement path contribution to the DUT noise figure must be continuously calibrated out at the NFA. This requires that the noise figure calibration path must have equivalent characteristics to the measurement path so that to ensure equal path loss compensation to the measurement path, as well as equal thermal noise. The designed system was implemented with a 5% repetitive precision.","PeriodicalId":148659,"journal":{"name":"65th ARFTG Conference Digest, 2005. Spring 2005","volume":"6 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2005-06-17","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"121286314","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

{"title":"Wide-bandwidth, vector-corrected measurement with high spurious-free dynamic range","authors":"P. Blockley, D. Gunyan, J.B. Scott","doi":"10.1109/ARFTGS.2005.1500589","DOIUrl":"https://doi.org/10.1109/ARFTGS.2005.1500589","url":null,"abstract":"Wide-bandwidth vector-signal measurements with high spurious-free dynamic range (SFDR), are difficult to make with traditional instruments. Equivalent-time sampling oscilloscopes offer wide-bandwidth, however lack dynamic range (/spl ap/60dB SFDR). Vector signal analyzers have high dynamic range (/spl ap/75dB SFDR), however have limited IF bandwidth (<100MHz). The Maury MT4463A large-signal network analyzer has an IF bandwidth less than 10MHz and dynamic range less than 60dB, however allows calibrated measurement of distortion at harmonics of the fundamental. This paper presents a vector-corrected measurement of a wide-bandwidth signal (>800MHz) plus its sidebands and harmonics with dynamic range in excess of 80dB SFDR.","PeriodicalId":148659,"journal":{"name":"65th ARFTG Conference Digest, 2005. Spring 2005","volume":"211 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2005-06-17","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"123265963","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

{"title":"Use of transfer switches in different configurations between custom switch relay boxes and VNA's","authors":"B. M. Narancic","doi":"10.1109/ARFTGS.2005.1500575","DOIUrl":"https://doi.org/10.1109/ARFTGS.2005.1500575","url":null,"abstract":"Transfer switches can be integrated in some custom solution to allow some special measurement. In practical problems, rarely you do need to measure all possible combinations, usually only some of them. Therefore, different instruments should sometimes be used in the measurements. Solution is to use transfer switches, because less switches may be used some simplified solution. Otherwise, every instrument should have own switch relay box for measurement. Also, transfer switches (or a group of them) can allow connection of VNA and DUT's SRB in order to measure several different types of parameters on different instruments. Possibilities to measure between the same ports, but with different paths are also considered in this paper. Controlling of switching, such as type of relays used in measurement is subject of consideration, also.","PeriodicalId":148659,"journal":{"name":"65th ARFTG Conference Digest, 2005. Spring 2005","volume":"34 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2005-06-17","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"127492384","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

{"title":"A preliminary study of different metrics for the validation of device and behavioral models","authors":"M. Pirazzini, G. Fernandez, A. Alabadelah, G. Vannini, M. Barciela, E. Sánchez, D. Schreurs","doi":"10.1109/ARFTGS.2005.1500571","DOIUrl":"https://doi.org/10.1109/ARFTGS.2005.1500571","url":null,"abstract":"In integrated circuit and/or system design using CAD tools, model accuracy has obviously a direct impact on the quality of the final performance prediction. One of the most common ways to evaluate the quality of a model has always been the visual inspection of the comparison between simulations and measurements; the highest quality is assigned to the model that returns the set of curves closer to the measured ones. Unfortunately a large number of variables (bias, frequency, power level, large signal regime, etc.) may be of concern and, in such a case, it can be quite hard to decide which is the best model for a targeted application. Therefore, the problem of accuracy evaluation can be addressed by defining suitable \"metrics\", i.e., numerical formulae which return, possibly, dimensionless quantity as performance indexes for a model in term of best fitting between simulations and measurements. In this work several metrics have been studied from the model validation point of view. In particular, different metrics for DC characteristics, scattering parameters as well as large signal performance have been tested for HBT and NMOS transistor models, and for WCDMA base station LDMOS power amplifier models. Dis/Advantages of the proposed metrics and possible solutions/improvements are discussed.","PeriodicalId":148659,"journal":{"name":"65th ARFTG Conference Digest, 2005. Spring 2005","volume":"25 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2005-06-17","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"127874795","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

{"title":"A simple calibration algorithm for partially leaky model multiport vector network analyzers","authors":"V. Teppati, A. Ferrero, D. Parena, U. Pisani","doi":"10.1109/ARFTGS.2005.1500560","DOIUrl":"https://doi.org/10.1109/ARFTGS.2005.1500560","url":null,"abstract":"Calibration of leaky multiport vector network analyzers can be a long and time consuming procedure, unless calibration model and number of standard connections are somehow optimized. In this paper we present an optimized solution for a practical set of multiport problems, where calibration model can be divided in two separate leaky halves, neglecting leakage between them. This problem is typical for multiport on-wafer measurements, where multi-signal probes (e.g. GSGSG) are implied. We show that with a proper choice of calibration standards, the optimized calibration procedure takes the same time of a classical two port LRM or TRL.","PeriodicalId":148659,"journal":{"name":"65th ARFTG Conference Digest, 2005. Spring 2005","volume":"90 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2005-06-17","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"126072419","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}