Proceedings of the International Conference on Electromagnetic Interference and Compatibility (IEEE Cat. No.02TH8620)最新文献_第6页

Induced voltage on control cables in a GIS due to the transient EM fields generated during switching events 开关事件产生的瞬态电磁场对GIS控制电缆产生的感应电压

Proceedings of the International Conference on Electromagnetic Interference and Compatibility (IEEE Cat. No.02TH8620) Pub Date : 2002-08-07 DOI: 10.1109/ICEMIC.2002.1006467

M. Mohana Rao, M. Thomas, B.P. Singh

{"title":"Induced voltage on control cables in a GIS due to the transient EM fields generated during switching events","authors":"M. Mohana Rao, M. Thomas, B.P. Singh","doi":"10.1109/ICEMIC.2002.1006467","DOIUrl":"https://doi.org/10.1109/ICEMIC.2002.1006467","url":null,"abstract":"Very fast transient overvoltages (VFTO) generated due to switching operations in a gas insulated substation (GIS) may propagate out into external environment through discontinuities like SF/sub 6/ to air bushing, SF/sub 6/ to cable termination, nonmetallic viewing ports and flanges, etc. For the reliable operation of substation controls, it is essential that the transient electromagnetic (EM) fields radiated due to VFTO be within permissible levels. Since these transient fields have frequency components up to 200 MHz, they may induce currents on the metallic sheath of the shielded control cables. This in turn may induce undesired voltages on the central conductor of the cable depending on the transfer impedance of the cable. In the present paper, the influence of transient EM fields, type of grounding (single end grounding or both end grounding), contribution of vertical and horizontal components of transient fields, length of the cable and height of cable above ground on induced currents and voltages have been studied. Finally, the role of transfer impedance of the cable on the induced voltages for different types of groundings is analysed and reported.","PeriodicalId":148043,"journal":{"name":"Proceedings of the International Conference on Electromagnetic Interference and Compatibility (IEEE Cat. No.02TH8620)","volume":"36 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2002-08-07","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"129413206","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

引用次数: 0

Electrical integration of a high performance fighter aircraft-certain interesting experiences 一种高性能战斗机的电气集成——某些有趣的经历

Proceedings of the International Conference on Electromagnetic Interference and Compatibility (IEEE Cat. No.02TH8620) Pub Date : 2002-08-07 DOI: 10.1109/ICEMIC.2002.1006490

S. Krishnakumar, H. Prasad, N. Balasubramanian

引用次数: 0

Test instruments for radiation hazard monitoring 辐射危害监测用试验仪器

Proceedings of the International Conference on Electromagnetic Interference and Compatibility (IEEE Cat. No.02TH8620) Pub Date : 2002-08-07 DOI: 10.1109/ICEMIC.2002.1006544

S. Sathyamurthy

引用次数: 2

Analysis of a random survey on health-hazards due to electromagnetic radiation 电磁辐射对健康危害的随机调查分析

Proceedings of the International Conference on Electromagnetic Interference and Compatibility (IEEE Cat. No.02TH8620) Pub Date : 1900-01-01 DOI: 10.1109/ICEMIC.2002.1006541

A. Chowdhuri, S. K. Ray, S. K. Singh, Subhamoy Banerjee, K. Goswami, T. K. Dey

引用次数: 0

A generalized design of shields for the protection of bio-objects 一种用于保护生物物体的护盾的通用设计

Proceedings of the International Conference on Electromagnetic Interference and Compatibility (IEEE Cat. No.02TH8620) Pub Date : 1900-01-01 DOI: 10.1109/ICEMIC.2002.1006542

S. K. Singh, S. K. Ray, Subhamoy Banerjee, K. Goswami, T. K. Dey

引用次数: 0

EMI case history of a ventilating system for combat tank application 用于作战坦克通风系统的电磁干扰案例历史

Proceedings of the International Conference on Electromagnetic Interference and Compatibility (IEEE Cat. No.02TH8620) Pub Date : 1900-01-01 DOI: 10.1109/ICEMIC.2002.1006491

S. Sathyamurthy, A. Ravichandran, D. Sekhar

引用次数: 0

EMC value propositions for telecom products 电信产品的EMC价值主张

Proceedings of the International Conference on Electromagnetic Interference and Compatibility (IEEE Cat. No.02TH8620) Pub Date : 1900-01-01 DOI: 10.1109/ICEMIC.2002.1006472

T.S. Raghavan, S. Sadasivam, R. Madhusoodhanan

{"title":"EMC value propositions for telecom products","authors":"T.S. Raghavan, S. Sadasivam, R. Madhusoodhanan","doi":"10.1109/ICEMIC.2002.1006472","DOIUrl":"https://doi.org/10.1109/ICEMIC.2002.1006472","url":null,"abstract":"Telecommunication plays a vital role in the social fabric of mankind encompassing residential, commercial and public utility environment. Harmonious co-existence of IT/telecom products in society is of paramount importance. Telecom equipment shall not malfunction in a hostile electrical environment. For ensuring that, international standard organisations like the ETSI, IEC, CISPR and national standard bodies like ISI, TEC have laid down EMC specifications, guidelines and procedures depending upon the application. This paper elucidates the design considerations from EMC perspective for the optimum performance of telecom products that would meet the EMC requirements of regulatory authorities. A case study of a telecom product, viz, corDECT WLL (wireless local loop) used in access networks for voice telephony and Internet connectivity is taken up for elucidating EMI potential problems encountered and the measures taken to mitigate the same. Emission and susceptibility requirements from standard institutes to meet the regulatory authorities are outlined. In addition, the measures taken to meet the overvoltage and overcurrent specifications as per ITU Recommendations K20 & k.21 are narrated.","PeriodicalId":148043,"journal":{"name":"Proceedings of the International Conference on Electromagnetic Interference and Compatibility (IEEE Cat. No.02TH8620)","volume":"324 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1900-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"122323498","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

引用次数: 0

A critique on traceability of EMC measurements 对电磁兼容测量可追溯性的批判

Proceedings of the International Conference on Electromagnetic Interference and Compatibility (IEEE Cat. No.02TH8620) Pub Date : 1900-01-01 DOI: 10.1109/ICEMIC.2002.1006524

A. Sathyanarayanan, A. Sanyal

{"title":"A critique on traceability of EMC measurements","authors":"A. Sathyanarayanan, A. Sanyal","doi":"10.1109/ICEMIC.2002.1006524","DOIUrl":"https://doi.org/10.1109/ICEMIC.2002.1006524","url":null,"abstract":"In a competitive global market, product quality assurance by an accredited laboratory assumes great importance for overall acceptance of the product. For electrical and electronic products, the European market has stipulated mandatory quality certification like 'CE' marking which calls for regulatory EMC testing and certification carried out at empowered laboratories. Acceptance of EMC test data from various laboratories warrants traceability of EMC measurements between various test environments. For test laboratories dealing with electrical and electronic products, ISO/IEC17025 standard provides the guidelines for accreditation, similar to ISO 9000 standards for manufacturing and service sectors. One of the most important criteria for getting accreditation for the test laboratories as per the ISO guidelines is the traceability of the test equipment which would ensure minimum inaccuracy and the required confidence level of the measured data. In this paper the authors intended to address the traceability issue related to estimated uncertainty in EMI measurements and calibration of EMC test equipment.","PeriodicalId":148043,"journal":{"name":"Proceedings of the International Conference on Electromagnetic Interference and Compatibility (IEEE Cat. No.02TH8620)","volume":"86 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1900-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"128957653","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

引用次数: 0

Proceedings of the International Conference on Electromagnetic Interference and Compatibility (IEEE Cat. No.02TH8620) 国际电磁干扰与兼容会议论文集(IEEE Cat)。No.02TH8620)

Proceedings of the International Conference on Electromagnetic Interference and Compatibility (IEEE Cat. No.02TH8620) Pub Date : 1900-01-01 DOI: 10.1109/ICEMIC.2002.1006450

引用次数: 0

CE marking and EMC Directive CE标志和EMC指令

Proceedings of the International Conference on Electromagnetic Interference and Compatibility (IEEE Cat. No.02TH8620) Pub Date : 1900-01-01 DOI: 10.1109/ICEMIC.2002.1006464

M.G. Sathyendra, B. Aggarwal

引用次数: 0