发布求助
文献互助 智能选刊 最新文献

2020 21st International Conference of Young Specialists on Micro/Nanotechnologies and Electron Devices (EDM)最新文献

筛选
英文 中文
The Main Principles of Development of an Intelligent Multi-Channel Radiation Thermometer 智能多通道辐射测温仪的研制原理
2020 21st International Conference of Young Specialists on Micro/Nanotechnologies and Electron Devices (EDM) Pub Date : 2020-06-01 DOI: 10.1109/EDM49804.2020.9153495
N. Chernysheva, A. Ionov, B. Ionov
{"title":"The Main Principles of Development of an Intelligent Multi-Channel Radiation Thermometer","authors":"N. Chernysheva, A. Ionov, B. Ionov","doi":"10.1109/EDM49804.2020.9153495","DOIUrl":"https://doi.org/10.1109/EDM49804.2020.9153495","url":null,"abstract":"The article is devoted to the range of problems concerning the adoption of the concept of intelligent measuring instruments for construction of new-generation radiation thermometers. It is shown that the main problem of current non-contact temperature measurement methods and instruments is the absence of any real mechanism to quality control of their results. This often leads to underestimation of measurement uncertainty. The possibility of designing and manufacturing intelligent radiation thermometers, which monitor the influence of external and internal destabilizing factors on the measurement process, is considered to be a solution. Special attention is paid to the problems of constructing a radiation thermometry system, whose function is to measure relatively low temperatures (200…800°C) in difficult manufacturing conditions.","PeriodicalId":147681,"journal":{"name":"2020 21st International Conference of Young Specialists on Micro/Nanotechnologies and Electron Devices (EDM)","volume":"4 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2020-06-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"115823195","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 1
The Detection of Voltage Extreme Points of the Shielded Power Supply Bus under the Ultrashort Pulse Excitation 超短脉冲激励下屏蔽供电母线电压极值点的检测
2020 21st International Conference of Young Specialists on Micro/Nanotechnologies and Electron Devices (EDM) Pub Date : 2020-06-01 DOI: 10.1109/EDM49804.2020.9153536
R. R. Gazizov, R. Gazizov, T. T. Gazizov
{"title":"The Detection of Voltage Extreme Points of the Shielded Power Supply Bus under the Ultrashort Pulse Excitation","authors":"R. R. Gazizov, R. Gazizov, T. T. Gazizov","doi":"10.1109/EDM49804.2020.9153536","DOIUrl":"https://doi.org/10.1109/EDM49804.2020.9153536","url":null,"abstract":"The paper investigates the propagation of the ultrashort pulse along the conductors of the power supply (PS) bus with improved design. The common-mode and differential-mode excitations of the 100 V ultrashort pulse were used. Eight propagation ways were considered. The voltage maximum of 13.569 V was obtained with a common-mode excitation, and the voltage minimum (minus 16.683 V) was obtained with differential-mode excitation for 50 Ohm terminations.","PeriodicalId":147681,"journal":{"name":"2020 21st International Conference of Young Specialists on Micro/Nanotechnologies and Electron Devices (EDM)","volume":"45 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2020-06-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"115961933","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 1
EDM 2020 Copyright Page EDM 2020版权页面
2020 21st International Conference of Young Specialists on Micro/Nanotechnologies and Electron Devices (EDM) Pub Date : 2020-06-01 DOI: 10.1109/edm49804.2020.9153338
{"title":"EDM 2020 Copyright Page","authors":"","doi":"10.1109/edm49804.2020.9153338","DOIUrl":"https://doi.org/10.1109/edm49804.2020.9153338","url":null,"abstract":"","PeriodicalId":147681,"journal":{"name":"2020 21st International Conference of Young Specialists on Micro/Nanotechnologies and Electron Devices (EDM)","volume":"205 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2020-06-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"114292399","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Possibility of Aircraft Electrical Equipment Diagnostics by the Local Load Control Units 本地负荷控制单元诊断飞机电气设备的可能性
2020 21st International Conference of Young Specialists on Micro/Nanotechnologies and Electron Devices (EDM) Pub Date : 2020-06-01 DOI: 10.1109/EDM49804.2020.9153496
Nikolay A. Simankov, A. A. Savelov, S. Khalyutin, A. Davidov
{"title":"Possibility of Aircraft Electrical Equipment Diagnostics by the Local Load Control Units","authors":"Nikolay A. Simankov, A. A. Savelov, S. Khalyutin, A. Davidov","doi":"10.1109/EDM49804.2020.9153496","DOIUrl":"https://doi.org/10.1109/EDM49804.2020.9153496","url":null,"abstract":"This article describes the practical experience of using local load control units for diagnostics and monitoring condition of airborne electrical power consumers in an unpowered status. Considering that integrated power supply circuits contain aging components, preventive testing of these circuits may prevent malfunction of power consumers. Diagnostics described in this article are based on analysis of frequency response of loads and definition of special diagnostic points of the frequency response.","PeriodicalId":147681,"journal":{"name":"2020 21st International Conference of Young Specialists on Micro/Nanotechnologies and Electron Devices (EDM)","volume":"12 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2020-06-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"126141759","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 3
Spectral Characteristics of Spatiotemporal Signals and Interference on a Linear Antenna Array 线性天线阵列上时空信号的频谱特性及干扰
2020 21st International Conference of Young Specialists on Micro/Nanotechnologies and Electron Devices (EDM) Pub Date : 2020-06-01 DOI: 10.1109/EDM49804.2020.9153519
D. Zima, A. Spector, D. Sokolova
{"title":"Spectral Characteristics of Spatiotemporal Signals and Interference on a Linear Antenna Array","authors":"D. Zima, A. Spector, D. Sokolova","doi":"10.1109/EDM49804.2020.9153519","DOIUrl":"https://doi.org/10.1109/EDM49804.2020.9153519","url":null,"abstract":"The paper considers an approach to the description of a mathematical model of signals arriving at spatially distributed antenna elements of a digital antenna array in radar systems. The spectral and correlation characteristics of the formed spatiotemporal processes are studied and one of the possible signal processing methods based on these properties is proposed.","PeriodicalId":147681,"journal":{"name":"2020 21st International Conference of Young Specialists on Micro/Nanotechnologies and Electron Devices (EDM)","volume":"19 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2020-06-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"129945292","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 2
Fabrication of 2D Crystals by Intercalation of a Bulk ZnWO4 Single Crystals 块状ZnWO4单晶插层制备二维晶体
2020 21st International Conference of Young Specialists on Micro/Nanotechnologies and Electron Devices (EDM) Pub Date : 2020-06-01 DOI: 10.1109/EDM49804.2020.9153532
A. I. Komonov, R. Soots, V. Shlegel, V. Prinz
{"title":"Fabrication of 2D Crystals by Intercalation of a Bulk ZnWO4 Single Crystals","authors":"A. I. Komonov, R. Soots, V. Shlegel, V. Prinz","doi":"10.1109/EDM49804.2020.9153532","DOIUrl":"https://doi.org/10.1109/EDM49804.2020.9153532","url":null,"abstract":"In the present paper, we describe a method for obtaining two-dimensional dielectric crystal from bulk ZnWO4 single crystals. The method includes a combination of intercalation and an ultrasonic treatment of a suspension of ZnWO4 single crystals. For the first time, ZnWO4 crystals down to 1.5 nm thick were obtained. The intercalation is shown to proceed predominantly through vertical defects in the crystal. The shape of the microcrystals obtained exhibits a pronounced faceting typical of single-crystal ZnWO4 fragments. The technique proposed makes it possible to exfoliate monolayer crystals. The results of the present study can prove useful for creation of new free-standing two-dimensional film heterostructures. The obtained suspension of dielectric two-dimensional crystals is promising in two-dimensional printing for flexible electronics.","PeriodicalId":147681,"journal":{"name":"2020 21st International Conference of Young Specialists on Micro/Nanotechnologies and Electron Devices (EDM)","volume":"35 6 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2020-06-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"133645104","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 1
Performance Analysis of UWB Communication Receiver in Multipath Environment Based on RAKE Receiver 基于RAKE接收机的多径环境下UWB通信接收机性能分析
2020 21st International Conference of Young Specialists on Micro/Nanotechnologies and Electron Devices (EDM) Pub Date : 2020-06-01 DOI: 10.1109/EDM49804.2020.9153501
V. A. Karbolin, V. I. Nosov, Vyacheslav O. Kalinin
{"title":"Performance Analysis of UWB Communication Receiver in Multipath Environment Based on RAKE Receiver","authors":"V. A. Karbolin, V. I. Nosov, Vyacheslav O. Kalinin","doi":"10.1109/EDM49804.2020.9153501","DOIUrl":"https://doi.org/10.1109/EDM49804.2020.9153501","url":null,"abstract":"The paper contains the results of bit error rate (BER) performance research of the Rake receiver in multipath channel. The BER performance comparison with the non-Rake correlation receiver is presented, the method of estimation of BER performance of multipath components for the choice of optimal UWB wireless system parameters such as data rate, modulation scheme, duty cycle, pulse shape and multipath components assigned to Rake receiver fingers is proposed. Binary Pulse Position Modulation is employed as a modulation scheme.","PeriodicalId":147681,"journal":{"name":"2020 21st International Conference of Young Specialists on Micro/Nanotechnologies and Electron Devices (EDM)","volume":"16 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2020-06-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"114749384","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 1
Simulation of Electro-optical Device for Fire Detection on Basis of Spectral Pyrometry Method 基于光谱热分析法的光电火灾探测装置仿真
2020 21st International Conference of Young Specialists on Micro/Nanotechnologies and Electron Devices (EDM) Pub Date : 2020-06-01 DOI: 10.1109/EDM49804.2020.9153469
A. Sidorenko, S. Lisakov, Andrey I. Kin, E. Sypin
{"title":"Simulation of Electro-optical Device for Fire Detection on Basis of Spectral Pyrometry Method","authors":"A. Sidorenko, S. Lisakov, Andrey I. Kin, E. Sypin","doi":"10.1109/EDM49804.2020.9153469","DOIUrl":"https://doi.org/10.1109/EDM49804.2020.9153469","url":null,"abstract":"Simulation of a high-speed electro-optical device for fire detection based on a spectral pyrometry method was performed. Analytical dependencies for simulation of a high-speed electro-optical device for fire detection based on a spectral pyrometry method were formulated. The initial data for simulation about spectral characteristics of the test fires were taken from literature. Parameters of the photodetectors (PD-24-10 and PD-38) were taken from documentation on the photodetectors. The developed computer model allows simulating the operation of electro-optical device in wide spectral ranges of 1200--4800 nm with wavelength step of 10 nm for test fires with temperature from 800 to 1600 K. Spectral ranges for detection of fire radiation by the electro-optical device were studied. Six spectral ranges were determined during the study. The photodetectors of the electro-optical device was selected. The set of spectral ranges was determined: $1800pm 50nm;1900pm 50nm;2000pm 50nm; 3000 pm 50nm;3400pm 50nm;3550pm$ 50nm. The maximum error of temperature calculation using this set of spectral ranges was 10%. Infrared photodetectors PD-19sr, PD-21sr, PD-29, PD34, PD-38 (manufactured by IoffeLED) were selected for the implementation of the electro-optical device.","PeriodicalId":147681,"journal":{"name":"2020 21st International Conference of Young Specialists on Micro/Nanotechnologies and Electron Devices (EDM)","volume":"5 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2020-06-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"133589075","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
EDM 2020 Cover Page EDM 2020封面页
2020 21st International Conference of Young Specialists on Micro/Nanotechnologies and Electron Devices (EDM) Pub Date : 2020-06-01 DOI: 10.1109/edm49804.2020.9153518
{"title":"EDM 2020 Cover Page","authors":"","doi":"10.1109/edm49804.2020.9153518","DOIUrl":"https://doi.org/10.1109/edm49804.2020.9153518","url":null,"abstract":"","PeriodicalId":147681,"journal":{"name":"2020 21st International Conference of Young Specialists on Micro/Nanotechnologies and Electron Devices (EDM)","volume":"248 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2020-06-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"116118464","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
TEM cell for Testing Low-profile Integrated Circuits for EMC 用于测试低轮廓集成电路的电磁兼容性的TEM单元
2020 21st International Conference of Young Specialists on Micro/Nanotechnologies and Electron Devices (EDM) Pub Date : 2020-06-01 DOI: 10.1109/EDM49804.2020.9153508
A. V. Demakov, M. Komnatnov
{"title":"TEM cell for Testing Low-profile Integrated Circuits for EMC","authors":"A. V. Demakov, M. Komnatnov","doi":"10.1109/EDM49804.2020.9153508","DOIUrl":"https://doi.org/10.1109/EDM49804.2020.9153508","url":null,"abstract":"The paper presents the results of development of TEM cell with a working volume of $30times 30times 5 mm^{3}$ for measuring radiated immunity and electromagnetic emissions of low-profile integrated circuits. A solid model of the TEM cell was developed based on the analysis of various designs for matching transitions using analytical estimation and electrodynamic simulation. A research prototype of the cell was built and its S-parameters measurements were performed.","PeriodicalId":147681,"journal":{"name":"2020 21st International Conference of Young Specialists on Micro/Nanotechnologies and Electron Devices (EDM)","volume":"36 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2020-06-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"123518244","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 8
首页 上一页 下一页 尾页
0
×
引用
GB/T 7714-2015
复制
MLA
复制
APA
复制
导出至
BibTeX EndNote RefMan NoteFirst NoteExpress
×
提示
您的信息不完整，为了账户安全，请先补充。
现在去补充
×
提示
您因"违规操作"
具体请查看互助需知
我知道了
×
提示
现在去查看 取消
×
提示
确定
请完成安全验证×
相关产品
×
本文献相关产品
联系我们：info@booksci.cn Book学术提供免费学术资源搜索服务，方便国内外学者检索中英文文献。致力于提供最便捷和优质的服务体验。 Copyright © 2023 布克学术 All rights reserved.
京ICP备2023020795号-1
ghs 京公网安备 11010802042870号
Book学术文献互助
Book学术文献互助群
群 号：604180095
Book学术官方微信
小红书