{"title":"Total quality management in US DoD electronics acquisition","authors":"W. D. Yates, R. Johnson","doi":"10.1109/ARMS.1991.154500","DOIUrl":"https://doi.org/10.1109/ARMS.1991.154500","url":null,"abstract":"A study effort being performed by the reliability engineering department of McDonnell Aircraft Co. and the quality directorate of Hughes Aircraft-Radar Systems Group is described. The final product of this 24-month project will be a handbook that provides guidelines in all phases of the acquisition process to enable significant and continuous improvement in the reliability of US Department of Defense electronic systems. The guidelines will address the application of total quality management (TQM) tools and techniques and the use of those new and old design and manufacturing processes that directly contribute to obtaining high reliability. How to tailor current specifications to implement the guidelines will be included.<<ETX>>","PeriodicalId":145883,"journal":{"name":"Annual Reliability and Maintainability Symposium. 1991 Proceedings","volume":"9 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1991-01-29","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"123564198","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"Analyzing the effect of installing diagnostic equipment in a manufacturing cell","authors":"A. Lahoti, W. J. Kennedy","doi":"10.1109/ARMS.1991.154407","DOIUrl":"https://doi.org/10.1109/ARMS.1991.154407","url":null,"abstract":"An approach to determine whether diagnostic equipment should be incorporated in an FMS (flexible manufacturing system) is presented. The effect of installing diagnostics on the number of machines required and on material flow in a cell is studied. An attempt has been made to model the cost and benefits associated with the installation of diagnostic equipment. The approach uses Markovian modeling techniques to estimate the number of machines required with and without diagnostics. The methodology developed can be used by the designers of machines in an FMS to plan for providing diagnostic equipment for a level of production rate that represents maximum cost-effectiveness for the overall system.<<ETX>>","PeriodicalId":145883,"journal":{"name":"Annual Reliability and Maintainability Symposium. 1991 Proceedings","volume":"11 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1991-01-29","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"114584450","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"A new methodology for performance instrumentation vis-a-vis warranty requirements","authors":"J. K. Story","doi":"10.1109/ARMS.1991.154396","DOIUrl":"https://doi.org/10.1109/ARMS.1991.154396","url":null,"abstract":"The application of semiconductor technology to elapsed time indicators and event counters that can travel with a piece of military equipment from its initial testing to the end of its useful life is described. The monitoring devices and their applications are described in detail. In application, the devices' nonvolatile memory yields accurate readings whether the monitored equipment is operating or turned off, after the equipment fails, and even if a failure in the equipment causes a short circuit across the inputs of the device. Readings from the solid-state devices can be taken repeatedly in bench checks for warranty validation and for vendor analysis for improvement studies. No errors are generated by multiple readings.<<ETX>>","PeriodicalId":145883,"journal":{"name":"Annual Reliability and Maintainability Symposium. 1991 Proceedings","volume":"115 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1991-01-29","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"124572060","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"Reliability allocation with partial redundancy","authors":"D. Nowicki","doi":"10.1109/ARMS.1991.154469","DOIUrl":"https://doi.org/10.1109/ARMS.1991.154469","url":null,"abstract":"Concentration on the modeling of failure rates has produced a body of results only tangentially useful in the logistics modeling applications. The rate of occurrence of failures (ROCOF) is a more pertinent measure for such problems. This useful measure has been largely overlooked as a result of the relative rarity of redundancy. Increasingly complex systems and stringent operational demands have increased the degree of redundancy recently, however, and the utilisation of the ROCOF concept has increased. The author develops a generalized ROCOF solution for k-of-n systems, carefully distinguishing between the frequency of system failure and an allied concept, the rate at which demands are placed on the support infrastructure. He concludes with a discussion of reliability allocation in the presence of redundancy.<<ETX>>","PeriodicalId":145883,"journal":{"name":"Annual Reliability and Maintainability Symposium. 1991 Proceedings","volume":"119 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1991-01-29","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"126811113","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"A simulation model for risk assessment of turbine wheels","authors":"F. Safie, R. Hage","doi":"10.1109/ARMS.1991.154423","DOIUrl":"https://doi.org/10.1109/ARMS.1991.154423","url":null,"abstract":"A simulation model has been developed to evaluate the risk of the Space Shuttle auxiliary power unit (APU) turbine wheels for a specific inspection policy. It is an effective tool for risk/reliability evaluation and allows the analyst to study the tradeoffs between wheel reliability, wheel life, inspection interval, and rejection crack size. In the APU application, sensitivity analysis results showed that the wheel life limit has the least effect on wheel reliability when compared to the effect of the inspection interval and the rejection crack size. The simulation model developed represents a flexible tool to predict turbine wheel reliability and study the risk under different inspection policies.<<ETX>>","PeriodicalId":145883,"journal":{"name":"Annual Reliability and Maintainability Symposium. 1991 Proceedings","volume":"19 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1991-01-29","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"127785353","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"An alternative method for preparing FMECA's","authors":"R. Sexton","doi":"10.1109/ARMS.1991.154439","DOIUrl":"https://doi.org/10.1109/ARMS.1991.154439","url":null,"abstract":"Some of the practical problems associated with the application of formal, MIL-STD-1629, failure modes and effects analyses (FMEAs) are addressed, and an alternative cost-saving methodology is proposed. The technique is fast in application and allows engineers to influence design decisions, using FMEA studies, as the design progresses. The technique follows the spirit of the standard, rather than its letter, and overcomes what is considered one of the major shortcomings of the standard, since a single failure can effectively only disrupt one system function. It is noted that the methods described have already rapidly gained acceptance and wide application in the United Kingdom.<<ETX>>","PeriodicalId":145883,"journal":{"name":"Annual Reliability and Maintainability Symposium. 1991 Proceedings","volume":"41 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1991-01-29","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"131730181","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"Progress in international standardization of verification and evaluation procedures","authors":"J. Rise","doi":"10.1109/ARMS.1991.154482","DOIUrl":"https://doi.org/10.1109/ARMS.1991.154482","url":null,"abstract":"Procedures for estimation, compliance, and comparison of reliability characteristics are presented. Repaired and nonrepaired items are treated separately. For nonrepaired items, the procedures addresse the Weibull, normal, lognormal, and exponential (constant failure rate) distributions including goodness-of-fit tests. For repaired items, the procedures cover tests for trends (constant failure intensity) and trend analysis modeling based on the power law model. Related to the procedures, an overview of existing international standards and those in progress is given. A number of IEC publications being revised to cover both failure rate (nonrepaired items) and failure intensity (repaired items).<<ETX>>","PeriodicalId":145883,"journal":{"name":"Annual Reliability and Maintainability Symposium. 1991 Proceedings","volume":"5 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1991-01-29","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"131029283","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
T. Sharma, A. Aitken, R.L. Bonis, B.C. Latter, L. J. Mancini
{"title":"The impact of product reliability on return on investment (ROI)","authors":"T. Sharma, A. Aitken, R.L. Bonis, B.C. Latter, L. J. Mancini","doi":"10.1109/ARMS.1991.154446","DOIUrl":"https://doi.org/10.1109/ARMS.1991.154446","url":null,"abstract":"This panel session addresses the following topics: built-in product reliability; cost benefits of auxiliary power unit reliability improvements; product dependability for commercial transport airplanes; improving aircraft availability through technical information automation.<<ETX>>","PeriodicalId":145883,"journal":{"name":"Annual Reliability and Maintainability Symposium. 1991 Proceedings","volume":"22 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1991-01-29","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"133666250","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"Weapon system reliability and maintainability: increasing their visibility with decision makers","authors":"R. W. Price","doi":"10.1109/ARMS.1991.154418","DOIUrl":"https://doi.org/10.1109/ARMS.1991.154418","url":null,"abstract":"The enhancement of the visibility of system R&M (reliability and maintainability) characteristics with senior executives at the top of the decision-making process is examined. It is shown that possible conflict with other documents used by decision makers poses a drawback. Cost and operational effectiveness analyses (COEAs) are one example, since they are the official, validated cost reference for US Army weapon systems. Further investigation is needed to refine approaches for communicating R&M information.<<ETX>>","PeriodicalId":145883,"journal":{"name":"Annual Reliability and Maintainability Symposium. 1991 Proceedings","volume":"34 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1991-01-29","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"128873832","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"Dependability modeling for computer systems","authors":"D. I. Heimann, Nitin Mittal, Kishor S. Trivedi","doi":"10.1109/ARMS.1991.154425","DOIUrl":"https://doi.org/10.1109/ARMS.1991.154425","url":null,"abstract":"A computer system dependability analysis that ties together concepts such as reliability, maintainability and availability is discussed. Three classes of dependability measures are described: system availability, system reliability, and task completion. Using an illustrative example, measures within each class are defined, evaluated, and compared. Four types of dependability analyses are discussed: evaluation, sensitivity analysis, specification determination, and trade-off analysis. The determination of the parameters, such as failure rates, coverage probabilities, repair rates, and reward rates is discussed.<<ETX>>","PeriodicalId":145883,"journal":{"name":"Annual Reliability and Maintainability Symposium. 1991 Proceedings","volume":"4 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1991-01-29","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"131275700","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}