A new methodology for performance instrumentation vis-a-vis warranty requirements

Abstract

The application of semiconductor technology to elapsed time indicators and event counters that can travel with a piece of military equipment from its initial testing to the end of its useful life is described. The monitoring devices and their applications are described in detail. In application, the devices' nonvolatile memory yields accurate readings whether the monitored equipment is operating or turned off, after the equipment fails, and even if a failure in the equipment causes a short circuit across the inputs of the device. Readings from the solid-state devices can be taken repeatedly in bench checks for warranty validation and for vendor analysis for improvement studies. No errors are generated by multiple readings.<>