Annual Reliability and Maintainability Symposium 1995 Proceedings最新文献

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Understanding and solving the real reliability assurance problems 了解和解决实际的可靠性保证问题
Annual Reliability and Maintainability Symposium 1995 Proceedings Pub Date : 1995-01-16 DOI: 10.1109/RAMS.1995.513240
M. Pecht, F.R. Nash, J.H. Lory
{"title":"Understanding and solving the real reliability assurance problems","authors":"M. Pecht, F.R. Nash, J.H. Lory","doi":"10.1109/RAMS.1995.513240","DOIUrl":"https://doi.org/10.1109/RAMS.1995.513240","url":null,"abstract":"To be competitive, manufacturers need to know how things fail, as well as how things work. The combination of physics-of-failure and best practices is an approach to the development of cost-effective reliable products that focuses on how things can fail through an understanding of the root causes of failure. The goal is to answer the following questions: (1) how can the supplier measure how well he is doing?; (2) what kind of reliability assurances can a supplier give to a customer?; (3) how can a customer determine that the supplier knows what he is doing, and that he is likely to deliver what is desired?; and (4) how can both the supplier and customer assess and minimize the risks? These questions are important because the supplier of a product that fails in the field experiences a loss of customer confidence and subsequently a loss of business. Similarly, the customer of a product that fails will experience a loss of functionality which could result in decreased business, safety and customer satisfaction.","PeriodicalId":143102,"journal":{"name":"Annual Reliability and Maintainability Symposium 1995 Proceedings","volume":null,"pages":null},"PeriodicalIF":0.0,"publicationDate":"1995-01-16","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"115029249","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 6
A fault-list generation algorithm for the evaluation of system coverage 一种用于系统覆盖率评估的故障列表生成算法
Annual Reliability and Maintainability Symposium 1995 Proceedings Pub Date : 1995-01-16 DOI: 10.1109/RAMS.1995.513279
D.T. Smith, B.W. Johnson, J. Profeta, D. Bozzolo
{"title":"A fault-list generation algorithm for the evaluation of system coverage","authors":"D.T. Smith, B.W. Johnson, J. Profeta, D. Bozzolo","doi":"10.1109/RAMS.1995.513279","DOIUrl":"https://doi.org/10.1109/RAMS.1995.513279","url":null,"abstract":"The expanding size and complexity of dependable computing systems has increased their cost and at the same time complicated the process of estimating dependability attributes such as fault coverage and detection latency. One approach to estimating such parameters is to employ fault injection, however algorithms are needed to generate a list of faults to inject. Unlike randomly selected faults, a fault list is needed which guarantees to cause either system failure or the activation of mechanisms which cover the injected fault. This research effort has developed an automated technique for selecting faults to use during fault injection experiments. The technique is general in nature and can be applied to any computing platform. The primary objective of this research effort was the development and implementation of the algorithms to generate a fault set which exercises the fault detection and fault processing aspects of the system. The end result is a completely automated method for evaluating complex dependable computing systems by estimating fault coverage and fault detection latency.","PeriodicalId":143102,"journal":{"name":"Annual Reliability and Maintainability Symposium 1995 Proceedings","volume":null,"pages":null},"PeriodicalIF":0.0,"publicationDate":"1995-01-16","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"126353484","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 13
A risk-effect model for waterway transport of dangerous goods 水路危险货物运输的风险效应模型
Annual Reliability and Maintainability Symposium 1995 Proceedings Pub Date : 1995-01-16 DOI: 10.1109/RAMS.1995.513268
J. Donk, W.G. de Rijke
{"title":"A risk-effect model for waterway transport of dangerous goods","authors":"J. Donk, W.G. de Rijke","doi":"10.1109/RAMS.1995.513268","DOIUrl":"https://doi.org/10.1109/RAMS.1995.513268","url":null,"abstract":"Inland waterway transport of dangerous goods in the Netherlands is becoming increasingly important. When accidentally exposed, these goods can endanger the environment and inhabitants. The Dutch government is concerned with the safety of transport and has developed a risk management policy. To develop tools for risk management, a large research project \"Safety of Inland Water Transport\" was initiated. The aim of this project is to make an inventory of the most dangerous locations along the inland waterways and to develop a risk-effect model (REM), that can support decisions on safety improvement of waterways and harbours. The research project is divided into 3 phases. In January 1994 the first phase of the project was finished. In the final phase REM will enable precise calculation of safety risks, economical and environmental risks of waterway transport and will make it possible to get insight into the qualitative and quantitative effect of risk-reducing measures. In the paper an outline of the risk policy in the Netherlands is given. The paper then concentrates on the first phase version of REM. Some major future developments of REM are highlighted. The application of REM is then demonstrated with a case-study.","PeriodicalId":143102,"journal":{"name":"Annual Reliability and Maintainability Symposium 1995 Proceedings","volume":null,"pages":null},"PeriodicalIF":0.0,"publicationDate":"1995-01-16","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"132757454","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 1
Combining computational-simulations with probabilistic-risk-assessment techniques to analyze launch vehicles 将计算模拟与概率风险评估技术相结合,对运载火箭进行分析
Annual Reliability and Maintainability Symposium 1995 Proceedings Pub Date : 1995-01-16 DOI: 10.1109/RAMS.1995.513267
G. Maggio, J. Fragola
{"title":"Combining computational-simulations with probabilistic-risk-assessment techniques to analyze launch vehicles","authors":"G. Maggio, J. Fragola","doi":"10.1109/RAMS.1995.513267","DOIUrl":"https://doi.org/10.1109/RAMS.1995.513267","url":null,"abstract":"To assess the overall cost of a launch system the potential losses which may be incurred due to catastrophic failure should also be considered along with the manufacturing and operational costs. The potential for catastrophic failure may be determined by performing a probabilistic risk assessment. Launch vehicles operate under highly transient conditions. In addition, the complex nature of launch systems makes the task of determining the probability of failure responses and consequences, with any reasonable certainty, practically impossible. Launch vehicle dynamics may be studied by the use of computational methods, offering a solution for assessing failure responses. However, the deterministic nature of these methods makes their use incompatible with probabilistic risk assessment. This paper discusses a solution to this dilemma. A semi-deterministic methodology is proposed which combines these two technologies, computational simulation and probabilistic risk assessment, in a synergistic fashion. A matrix based interfacing mechanism was developed which allows information to be transferred from one analysis structure to the other. Although software may be developed to facilitate the transfer process, the methodology may be applied without having to modify any of the existing resources. As computer-based designing and testing becomes the rule and not the exception, this method may offer engineers the capability to integrate risk considerations directly into the design process. Assessing risk during the design phase has the potential of substantially reducing safety related maintenance costs.","PeriodicalId":143102,"journal":{"name":"Annual Reliability and Maintainability Symposium 1995 Proceedings","volume":null,"pages":null},"PeriodicalIF":0.0,"publicationDate":"1995-01-16","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"123000563","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 2
Using R&M analysis to calculate economic risk in the process industries 运用R&M分析方法计算过程工业的经济风险
Annual Reliability and Maintainability Symposium 1995 Proceedings Pub Date : 1995-01-16 DOI: 10.1109/RAMS.1995.513269
H. Tripp, J. Propst
{"title":"Using R&M analysis to calculate economic risk in the process industries","authors":"H. Tripp, J. Propst","doi":"10.1109/RAMS.1995.513269","DOIUrl":"https://doi.org/10.1109/RAMS.1995.513269","url":null,"abstract":"A systematic procedure for quantifying the financial risk of repetitive hardware failures is used to analyze the reliability of plant electrical systems and process units. The procedure uses component failure rates and the financial impact to calculate annual risk premiums, which approximate the insurance premiums required to compensate for financial losses caused by the component failures. Basic reliability calculations are then used to combine the component characteristics and to find the annual risk premium of the system. Typically the annual risk premiums for components follow a Pareto distribution; i.e., several component failures account for most of the production losses. Results of these calculations provide data for: ranking component failures on the basis of financial impact across discipline, system, and unit boundaries; developing realistic estimates of the future availability of units and systems; developing alternatives for upgrading systems to achieve desired availability; and developing maintenance strategies.","PeriodicalId":143102,"journal":{"name":"Annual Reliability and Maintainability Symposium 1995 Proceedings","volume":null,"pages":null},"PeriodicalIF":0.0,"publicationDate":"1995-01-16","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"123327641","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 3
Reliability-based structural design 基于可靠性的结构设计
Annual Reliability and Maintainability Symposium 1995 Proceedings Pub Date : 1995-01-16 DOI: 10.1109/RAMS.1995.513247
D. Mukherjee, S. Mahadevan
{"title":"Reliability-based structural design","authors":"D. Mukherjee, S. Mahadevan","doi":"10.1109/RAMS.1995.513247","DOIUrl":"https://doi.org/10.1109/RAMS.1995.513247","url":null,"abstract":"This paper presents the use of state-of-the-art reliability techniques to develop efficient structural design guidelines for civil engineering structures in a manner that includes overall structural system effects. Probabilistic design is done by explicitly accounting for the uncertainties in the different variables and their influence on structural performance. This approach has been used to develop a set of load and resistance factors instead of just a single safety factor to address all the uncertainties. However, the reliabilities of the individual components, when placed in the overall configuration, may not remain the same as when the components are considered separately. Therefore, this paper proposes that the reliability of the structure be explicitly satisfied at the component level as well as at the system level during design. Two important considerations are addressed in this regard: (i) the influence of system effects on the element reliability, and (ii) formulation of component design to ensure overall system reliability. As a result, system factors are developed for inclusion in structural design.","PeriodicalId":143102,"journal":{"name":"Annual Reliability and Maintainability Symposium 1995 Proceedings","volume":null,"pages":null},"PeriodicalIF":0.0,"publicationDate":"1995-01-16","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"121574591","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 8
Design simulation tool to improve product reliability 设计仿真工具,提高产品可靠性
Annual Reliability and Maintainability Symposium 1995 Proceedings Pub Date : 1995-01-16 DOI: 10.1109/RAMS.1995.513245
W. D. Yates, D. M. Beaman
{"title":"Design simulation tool to improve product reliability","authors":"W. D. Yates, D. M. Beaman","doi":"10.1109/RAMS.1995.513245","DOIUrl":"https://doi.org/10.1109/RAMS.1995.513245","url":null,"abstract":"The design community has historically been challenged to design-in reliability and maintainability (R&M) during the front-end of the design process. This has been difficult due to the budget profiles on most programs: R&M activities have not traditionally been funded up-front, and the designers are usually just too busy trying to make their designs work to worry about R&M. This paper describes a McDonnell Douglas Aerospace (MDA) independent research and development (IRAD) supportability sponsored project entitled \"Integrated Crew Chiefs Associate\". This IRAD has developed a new design simulation software tool that permits designers to assess and optimize their design for reliability up-front, during the early conceptual design phases of product development. The result has been a tool that allows the designer to reduce cycle time in developing a new prototype hydromechanical subsystem and its associated onboard embedded control logic software, the ability to optimize the configuration and subsystem reliability very early-on, and the ability to capture early design information for use throughout the acquisition process for performing reliability, maintainability, testability, and advanced logistics analysis.","PeriodicalId":143102,"journal":{"name":"Annual Reliability and Maintainability Symposium 1995 Proceedings","volume":null,"pages":null},"PeriodicalIF":0.0,"publicationDate":"1995-01-16","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"121767678","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 12
Analysis techniques for real-time, fault-tolerant, VLSI processing arrays 实时、容错、超大规模集成电路处理阵列的分析技术
Annual Reliability and Maintainability Symposium 1995 Proceedings Pub Date : 1995-01-16 DOI: 10.1109/RAMS.1995.513237
A. J. Schwab, B.W. Johnson, J. Dugan
{"title":"Analysis techniques for real-time, fault-tolerant, VLSI processing arrays","authors":"A. J. Schwab, B.W. Johnson, J. Dugan","doi":"10.1109/RAMS.1995.513237","DOIUrl":"https://doi.org/10.1109/RAMS.1995.513237","url":null,"abstract":"Several techniques are described for the quantitative evaluation of the effectiveness of various reconfiguration strategies for real-time, VLSI processing arrays. The first technique illustrates the advantages of small, easily managed semi-Markov models for comparing important events in the fault/error process of a system. Since these events have the greatest impact on architecture selection in a real-time system, a methodology that quantifies system differences is necessary to properly design a real-time processing array. The second technique developed for this research expands the previous concept to include the events within a single time interval in a real-time system. The single interval model provides unique information on critical real-time design issues. It quantitatively describes the effects of time-outs on the failure probability of potential reconfiguration strategies. The interaction of sampling rate and failures due to time-outs is clarified with this model. The ability to recover from faults at different points within an interval is also estimated.","PeriodicalId":143102,"journal":{"name":"Annual Reliability and Maintainability Symposium 1995 Proceedings","volume":null,"pages":null},"PeriodicalIF":0.0,"publicationDate":"1995-01-16","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"125338911","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 2
Dependent-failures in spacecraft: root causes, coupling factors, defenses, and design implications 航天器中的依赖故障:根本原因、耦合因素、防御和设计含义
Annual Reliability and Maintainability Symposium 1995 Proceedings Pub Date : 1995-01-16 DOI: 10.1109/RAMS.1995.513266
P. Rutledge, A. Mosleh
{"title":"Dependent-failures in spacecraft: root causes, coupling factors, defenses, and design implications","authors":"P. Rutledge, A. Mosleh","doi":"10.1109/RAMS.1995.513266","DOIUrl":"https://doi.org/10.1109/RAMS.1995.513266","url":null,"abstract":"This paper provides: (1) the results of dependent failure analysis of Space Shuttle Orbiter in-flight anomaly (IFA) data; (2) revised and new classification systems for root causes, coupling factors, and defenses; (3) dependent failure design guidelines for the analysis of existing spacecraft systems and the design of new ones; (4) insights from the study; and (5) parameters for use in common cause failure models for spacecraft. The Space Shuttle served as the primary subject of this study because: (1) problem/failure data were abundant and readily available; (2) in-flight failures are thoroughly analyzed and relatively well documented upon the vehicle's return to Earth; and perhaps most importantly; and (3) the Space Shuttle is a valuable national resource.","PeriodicalId":143102,"journal":{"name":"Annual Reliability and Maintainability Symposium 1995 Proceedings","volume":null,"pages":null},"PeriodicalIF":0.0,"publicationDate":"1995-01-16","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"129196095","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 29
Application of test effectiveness in spacecraft testing 试验有效性在航天器试验中的应用
Annual Reliability and Maintainability Symposium 1995 Proceedings Pub Date : 1995-01-16 DOI: 10.1109/RAMS.1995.513289
P. Lang, Michael E. Card, Susie Saalwaechter, Todd Godkin
{"title":"Application of test effectiveness in spacecraft testing","authors":"P. Lang, Michael E. Card, Susie Saalwaechter, Todd Godkin","doi":"10.1109/RAMS.1995.513289","DOIUrl":"https://doi.org/10.1109/RAMS.1995.513289","url":null,"abstract":"This article summarizes test design practices of selected NASA Centers and prime contractors as they are used to evaluate the performance and reliability of space mission payloads. It also reports the use of previous relevant test experience to avoid risk in the design of future spacecraft and enhance test programs. Test effectiveness (TE) is defined as the ability of a test to accurately emulate the expected mission environment, and reliably detect failure causing defects before launch. These twin objectives determine the value of a test program relative to project funding.","PeriodicalId":143102,"journal":{"name":"Annual Reliability and Maintainability Symposium 1995 Proceedings","volume":null,"pages":null},"PeriodicalIF":0.0,"publicationDate":"1995-01-16","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"127515058","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 3
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