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Proceedings of 1996 IEEE International Frequency Control Symposium最新文献

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Temperature compensation of thickness shear mode resonators formed on artificial twinned quartz plates 人工孪晶石英板厚度剪切模谐振腔的温度补偿
Proceedings of 1996 IEEE International Frequency Control Symposium Pub Date : 1996-06-05 DOI: 10.1109/FREQ.1996.559921
T. Uno
{"title":"Temperature compensation of thickness shear mode resonators formed on artificial twinned quartz plates","authors":"T. Uno","doi":"10.1109/FREQ.1996.559921","DOIUrl":"https://doi.org/10.1109/FREQ.1996.559921","url":null,"abstract":"This paper presents a temperature compensation technique for a thickness shear mode resonator formed on an artificial twin quartz plate. The author reports on a technique to form X-axis inverted areas on a quartz plate. Because the X-axis inverted area can be formed with an arbitrary pattern, many applications are possible. Temperature compensation for AT-cut resonators proposed here is one promising application of the artificial twin quartz formation technique. The X-axis inverted areas are formed near a trapped energy mode AT-cut resonator. Energy of the vibration leaked into the X-axis inverted areas affects the frequency temperature characteristics of the resonator. Theoretical analysis of temperature compensation based on the trapped energy mode theory is presented. Experimental results suggest the possibility of improving the frequency temperature characteristics.","PeriodicalId":140391,"journal":{"name":"Proceedings of 1996 IEEE International Frequency Control Symposium","volume":"57 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1996-06-05","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"114287541","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 4
ZnO thin film resonator lattice filters ZnO薄膜谐振器晶格滤波器
Proceedings of 1996 IEEE International Frequency Control Symposium Pub Date : 1996-06-05 DOI: 10.1109/FREQ.1996.559880
L. Mang, F. Hickernell
{"title":"ZnO thin film resonator lattice filters","authors":"L. Mang, F. Hickernell","doi":"10.1109/FREQ.1996.559880","DOIUrl":"https://doi.org/10.1109/FREQ.1996.559880","url":null,"abstract":"ZnO thin film resonator lattice filter results at GHz frequencies are reported. These filters are very compact, measuring 1 mm by 1 mm, have balanced input and output, and have insertion loss of approximately 1.5 dB at 1.5 GHz, while selectivity is over 30 dB. The performance of these lattice filters compares very favorably with ladder filters processed on the same silicon wafer with identical figure of merit, Q/r, having approximately double the bandwidth of the ladder filters. These filters are best used with ICs with differential I/O which are becoming commercially available from semiconductor companies.","PeriodicalId":140391,"journal":{"name":"Proceedings of 1996 IEEE International Frequency Control Symposium","volume":"32 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1996-06-05","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"114457487","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 7
Vibration sensitivity of AQP SAW oscillators AQP SAW振荡器的振动灵敏度
Proceedings of 1996 IEEE International Frequency Control Symposium Pub Date : 1996-06-05 DOI: 10.1109/FREQ.1996.559894
D. Andres, G. K. Montress, J. Greer, T. Parker
{"title":"Vibration sensitivity of AQP SAW oscillators","authors":"D. Andres, G. K. Montress, J. Greer, T. Parker","doi":"10.1109/FREQ.1996.559894","DOIUrl":"https://doi.org/10.1109/FREQ.1996.559894","url":null,"abstract":"All Quartz Package (AQP) SAW oscillators with low vibration sensitivity are achievable by minimizing the external stresses that might otherwise be transferred to the AQP SAW device. If these external stresses are at their lowest possible level, then frit geometry becomes a factor in establishing just how low the vibration sensitivity may be. Optimizing the frit geometry often involves trade-offs with the overall AQP SAW device's size requirements. Through the use of finite element modeling, it was determined that the AQP's cover and substrate thicknesses also could be used to improve vibration sensitivity. The model predicted a decrease in vibration sensitivity, with increasing cover thickness, for the vibration sensitivity component, /spl gamma//sub 1/, in a direction normal to the SAW substrate. The model also predicted a degradation in vibration sensitivity with increasing substrate thickness. These results were confirmed experimentally. The other benefit of increased cover thickness was a sizable reduction in the variation of performance among the devices tested. The increased cover thickness decreases the sensitivity of the AQP SAW to variations in the mounting material. The influence of AQP cover thickness on an insufficiently stiffened oscillator was examined. The result was similar, except that the variation in cover thickness had a more dramatic affect than in the sufficiently stiffened case.","PeriodicalId":140391,"journal":{"name":"Proceedings of 1996 IEEE International Frequency Control Symposium","volume":"62 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1996-06-05","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"114499962","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 6
Technical trends and future evolution of surface acoustic wave devices 表面声波器件的技术趋势和未来发展
Proceedings of 1996 IEEE International Frequency Control Symposium Pub Date : 1996-06-05 DOI: 10.1109/FREQ.1996.559841
J. Yamada
{"title":"Technical trends and future evolution of surface acoustic wave devices","authors":"J. Yamada","doi":"10.1109/FREQ.1996.559841","DOIUrl":"https://doi.org/10.1109/FREQ.1996.559841","url":null,"abstract":"The pulse compression system for military use adopted a surface acoustic wave device as a dispersive delay line. The devices have been confirmed as essential electrical components after great success in TV-IF filters. Many applications, such as various filters and resonators for CB radios, FM radios, mobile radios, satellite broadcasting equipment in consumer electronics and telecommunications, have been widely developed for practical use. Multimedia, supported globally by fusion of computers, consumer electronics and telecommunication technology, is just beginning at present. The importance of surface acoustic wave devices is increasing as the components meet the needs of high-frequency, high-performance, more functional and down-sized equipment. This paper describes the progress schedule and the details of the FPLMTS (Future Public Land Mobile Telecommunication Systems) in Japan, and reviews the technical trends of the low-loss and the high-frequency surface acoustic wave devices, and then clarifies the demands in the systems for the devices.","PeriodicalId":140391,"journal":{"name":"Proceedings of 1996 IEEE International Frequency Control Symposium","volume":"15 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1996-06-05","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"124288734","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 3
Similarities and differences in the analytical descriptions of the acceleration sensitivities of acoustic bulk and surface wave resonators 声体与表面波谐振器加速度灵敏度解析描述的异同
Proceedings of 1996 IEEE International Frequency Control Symposium Pub Date : 1996-06-05 DOI: 10.1109/FREQ.1996.559892
H. Tiersten
{"title":"Similarities and differences in the analytical descriptions of the acceleration sensitivities of acoustic bulk and surface wave resonators","authors":"H. Tiersten","doi":"10.1109/FREQ.1996.559892","DOIUrl":"https://doi.org/10.1109/FREQ.1996.559892","url":null,"abstract":"The importance and advantages of the use of finite deformation theory in the analytical description of the influence of biasing states in general and acceleration in particular on the accurate prediction of the behavior of precision resonant devices is noted. The unknown intermediate biasing state is defined and the electroelastic equations are presented referred to the known reference coordinates. The useful equation for the perturbation in eigenfrequency was obtained from these equations. The detailed mode shapes of both surface wave and contoured resonators are presented, as are the equations of the extension and flexure of thin plates for the determination of the biasing states. Some results on acceleration sensitivity for both surface wave and contoured resonators are presented and contrasted.","PeriodicalId":140391,"journal":{"name":"Proceedings of 1996 IEEE International Frequency Control Symposium","volume":"34 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1996-06-05","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"115614568","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 3
A measurement of the period stability of a free pendulum in vacuum 真空中自由摆周期稳定性的测量
Proceedings of 1996 IEEE International Frequency Control Symposium Pub Date : 1996-06-05 DOI: 10.1109/FREQ.1996.559949
A. De Marchi, M. Ortolano, F. Periale, E. Rubiola
{"title":"A measurement of the period stability of a free pendulum in vacuum","authors":"A. De Marchi, M. Ortolano, F. Periale, E. Rubiola","doi":"10.1109/FREQ.1996.559949","DOIUrl":"https://doi.org/10.1109/FREQ.1996.559949","url":null,"abstract":"High period stabilities can be expected of a fiber suspended light pendulum swinging freely in vacuum, mainly because of the extremely high Q factors (>10/sup 5/) obtainable in this almost frictionless mechanical oscillator. In this paper, the modelization and the projected stability limitations of such a system are discussed. Both the physical arrangements and the electronic data collection solutions adopted in the experimental realization of a prototype pendulum apparatus are described, and sample series of period measurements are reported, analyzed and discussed. Mechanical instrumental noise (no isolation against vibrations was provided) appears to limit the Allan deviation of post modelization residuals with a white noise of a few /spl mu/s per period, which masks all projected period measurement stability limitations. It is argued that this observed noise is generated by instability in the position of the period detector, and possible solutions to this problem are proposed.","PeriodicalId":140391,"journal":{"name":"Proceedings of 1996 IEEE International Frequency Control Symposium","volume":"1 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1996-06-05","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"125067295","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 3
Study of S- and /spl xi/-bar synthetic quartz by X-ray topography S-和/spl - xi/-bar合成石英的x射线形貌研究
Proceedings of 1996 IEEE International Frequency Control Symposium Pub Date : 1996-06-05 DOI: 10.1109/FREQ.1996.559821
A. H. Shinohara, C. Suzuki
{"title":"Study of S- and /spl xi/-bar synthetic quartz by X-ray topography","authors":"A. H. Shinohara, C. Suzuki","doi":"10.1109/FREQ.1996.559821","DOIUrl":"https://doi.org/10.1109/FREQ.1996.559821","url":null,"abstract":"Synthetic quartz crystals were grown on S- and /spl xi/-bar seeds and characterized by X-ray topography. For comparison, synthetic quartz crystals grown on intermediary cutting between S- and /spl xi/-planes (/spl phi/=24-42/spl deg/) seeds were also investigated. As a result, several new growth regions usually not present in the Y-cut of Y- and Z-bars synthetic quartz crystals have been observed, in a number of four in the /spl xi/-bar and two in the S-bar. For convenience, these new growth regions were called /spl xi/-regions. The texture of /spl xi/-regions of /spl xi/- and S-bars synthetic quartz crystals are quite similar, with strong distortions in the crystal lattice structure due to a high segregation of impurities. This fact was also verified by the degree of darkness after a /spl gamma/-ray irradiation. The impurity analysis by atomic absorption spectroscopy revealed high content of Al in the /spl xi/-regions with a concentration of about 30 ppm. Furthermore, the growth velocities of /spl xi/-regions are higher in comparison with other regions. In the present research the occurrence of the new regions is directly related to the orientation of seed, which can induce an aggregation of high concentration of Al impurity.","PeriodicalId":140391,"journal":{"name":"Proceedings of 1996 IEEE International Frequency Control Symposium","volume":"1 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1996-06-05","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"129617745","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 6
Frequency-temperature relations of thickness-shear and flexural vibrations of contoured quartz resonators 异形石英谐振器厚度-剪切和弯曲振动的频率-温度关系
Proceedings of 1996 IEEE International Frequency Control Symposium Pub Date : 1996-06-05 DOI: 10.1109/FREQ.1996.559944
Pcy Lee, Jue Wang
{"title":"Frequency-temperature relations of thickness-shear and flexural vibrations of contoured quartz resonators","authors":"Pcy Lee, Jue Wang","doi":"10.1109/FREQ.1996.559944","DOIUrl":"https://doi.org/10.1109/FREQ.1996.559944","url":null,"abstract":"The two-dimensional first-order equations of incremental vibrations superposed on the steady and homogeneous thermal deformations of crystal plates by Lee and Yong are reduced to a set of four coupled equations for frequencies up to and including those of the fundamental x/sub 1/x/sub 2/ (or slow) thickness-shear mode. These equations are employed to study the frequency-temperature relations of the thickness-shear and flexural vibrations of beveled plates of AT-cut of quartz. Closed form solutions for the uniform portion and analytical solutions in terms of infinite power series for the contoured portions are obtained. By requiring these solutions to satisfy the continuity conditions and traction-fret edge conditions, the frequency equation is obtained. Effects of the contouring and the orientation angle of the plate are examined systematically by computing the frequency changes as a function of temperature increment for various values of geometric parameters and the orientation angle of the plate. Similar results for the uniform and finite plates are also computed and presented for comparison.","PeriodicalId":140391,"journal":{"name":"Proceedings of 1996 IEEE International Frequency Control Symposium","volume":"1 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1996-06-05","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"128929629","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 6
The electrical behavior of crystal unit resonating at the fundamental frequency 150 MHz 在基频150mhz处谐振的晶体单元的电学行为
Proceedings of 1996 IEEE International Frequency Control Symposium Pub Date : 1996-06-05 DOI: 10.1109/FREQ.1996.559875
M. Tanaka, T. Ugajin, N. Araki, Y. Oomura
{"title":"The electrical behavior of crystal unit resonating at the fundamental frequency 150 MHz","authors":"M. Tanaka, T. Ugajin, N. Araki, Y. Oomura","doi":"10.1109/FREQ.1996.559875","DOIUrl":"https://doi.org/10.1109/FREQ.1996.559875","url":null,"abstract":"In this paper, the 150 MHz rectangular AT-cut quartz crystal units were prepared by photolithography technique. The crystal units were measured precisely by the center line method. In addition, the oscillators equipped with the 150 MHz crystal unit were constructed on trial, and experimental results are shown.","PeriodicalId":140391,"journal":{"name":"Proceedings of 1996 IEEE International Frequency Control Symposium","volume":"2 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1996-06-05","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"127552472","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 3
Influence of static electric field, mechanical pressure and temperature on the propagation of acoustic waves in La/sub 3/Ga/sub 5/SiO/sub 14/ piezoelectric single crystals 静电场、机械压力和温度对La/sub 3/Ga/sub 5/SiO/sub 14/压电单晶中声波传播的影响
Proceedings of 1996 IEEE International Frequency Control Symposium Pub Date : 1996-06-05 DOI: 10.1109/FREQ.1996.559838
B. Sorokin, P. P. Turchin, S. I. Burkov, D. Glushkov, K. S. Aleksandrov
{"title":"Influence of static electric field, mechanical pressure and temperature on the propagation of acoustic waves in La/sub 3/Ga/sub 5/SiO/sub 14/ piezoelectric single crystals","authors":"B. Sorokin, P. P. Turchin, S. I. Burkov, D. Glushkov, K. S. Aleksandrov","doi":"10.1109/FREQ.1996.559838","DOIUrl":"https://doi.org/10.1109/FREQ.1996.559838","url":null,"abstract":"On the fundamental of our original experimental results the full set of tensorial components of linear and nonlinear electromechanical properties and temperature coefficients of material properties for La/sub 3/Ga/sub 5/SiO/sub 14/ piezoelectric crystals have been obtained. These data were used for the analysis of influence of static electrical field and of uniaxial homogeneous mechanical pressure on the propagation anisotropy of acoustic waves superposed by the temperature variations.","PeriodicalId":140391,"journal":{"name":"Proceedings of 1996 IEEE International Frequency Control Symposium","volume":"392 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1996-06-05","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"127592622","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 61
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