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Proceedings of the 20th IEEE Instrumentation Technology Conference (Cat. No.03CH37412)最新文献

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Detecting impedance and data aquisition for conventional partial discharge measuring systems 传统局部放电测量系统的阻抗检测与数据采集
Proceedings of the 20th IEEE Instrumentation Technology Conference (Cat. No.03CH37412) Pub Date : 2003-05-20 DOI: 10.1109/IMTC.2003.1208184
M.A.A. Medeiros, E. G. Costa, R. Freire, M. Neri, R.N.C. Alves
{"title":"Detecting impedance and data aquisition for conventional partial discharge measuring systems","authors":"M.A.A. Medeiros, E. G. Costa, R. Freire, M. Neri, R.N.C. Alves","doi":"10.1109/IMTC.2003.1208184","DOIUrl":"https://doi.org/10.1109/IMTC.2003.1208184","url":null,"abstract":"1 Abstract: The development of a wideband partial discharge detector has been described The bandwidth of the detector's amplifier is 50 MHz and the lower cutofl frequency is 2.7s MHz The detector's ourput signal is processed digitally using the discrefe wavelet transform Threshold de-noising has been used to aaenaate the background noise. The detector is able to distinctly Characterize corona andpartial discharge pulses.","PeriodicalId":135321,"journal":{"name":"Proceedings of the 20th IEEE Instrumentation Technology Conference (Cat. No.03CH37412)","volume":"9 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2003-05-20","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"134534463","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 3
Closed loop control trough Internet using the IDAC-1 [trough read through] 通过Internet使用IDAC-1进行闭环控制
Proceedings of the 20th IEEE Instrumentation Technology Conference (Cat. No.03CH37412) Pub Date : 2003-05-20 DOI: 10.1109/IMTC.2003.1207908
K. Tarchanidis, J. Lygouras, C. Chatziandreoglou
{"title":"Closed loop control trough Internet using the IDAC-1 [trough read through]","authors":"K. Tarchanidis, J. Lygouras, C. Chatziandreoglou","doi":"10.1109/IMTC.2003.1207908","DOIUrl":"https://doi.org/10.1109/IMTC.2003.1207908","url":null,"abstract":"This project uses an IDAC-1 board to sample the water level of a plexiglas column and to control its level. The level is measured by a pressure sensor and the control is performed by ON-OFF valves. Data are passed to a main computer and Internet is the transport media. The protocol used in this project is UDP/IP. The water pressure is sampled as potential difference on an A/D converter integrated on the IDAC-1. The controlling computer through the Internet acting as client asks for the pressure (water level) and IDAC-1 responds as server with the 10-bit resolution. To control the water level the IDAC-1 digital outputs through the two relays operate on the inlet and outlet valves. So, the water level can be controlled from anywhere in the World Wide Web (www).","PeriodicalId":135321,"journal":{"name":"Proceedings of the 20th IEEE Instrumentation Technology Conference (Cat. No.03CH37412)","volume":"81 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2003-05-20","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"133803110","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Soft-test/repair of ccd-based digital x-ray instrumentation 基于ccd的数字x射线仪器的软测试/维修
Proceedings of the 20th IEEE Instrumentation Technology Conference (Cat. No.03CH37412) Pub Date : 2003-05-20 DOI: 10.1109/IMTC.2003.1208173
B. Jin, N. Park, K. M. George, M. Choi, M. Yeary, Y. Kim
{"title":"Soft-test/repair of ccd-based digital x-ray instrumentation","authors":"B. Jin, N. Park, K. M. George, M. Choi, M. Yeary, Y. Kim","doi":"10.1109/IMTC.2003.1208173","DOIUrl":"https://doi.org/10.1109/IMTC.2003.1208173","url":null,"abstract":"Absfrncl Modern x-ray imaging systems evolve toward digifindim for reduced eost, foster time-todiagnosis ondimproved diagnostic eonfurmer. For the digitalx-ray systems, CCD (Charge Coupled Device) technology is eommanly used lo ddect and digitize optical x-ray i m g r This p p e r presents n novel sofr-lesUrepoir approach to overcome the defective pirelproblem in CCD (Charge Coupled Device)-based digital x-ray system through theoretical modeling and analysis of the testhepair process. There w e hw possible solulions lo cope with the defectivs pixel problem in CCD; one is the hard-repair approach mdanother is the proposed soJi-lesUrepoir oppronch. Hard-repair approach employs a high-yield, expensive reparable CCD lo minimize the impact of hard-defects on the CCD, which occur in the form of noise propagated through A/D converler lo LheJlome memory. Therefore, less work is neededlofilter andcorrect the image at the end-user level while if maybe exceedingly expensive lo proclice. On the other hand, theproposed sof-tesUrepoir approach is la detect ondtnlerote defective pixels a1 the digitized image level; thereby it is inexpensive lapmetice andon-line repair can be done for nom-interrupted service. I t tests the imnges to detect the deteclive pireis andfilter noire at the frame memory bve< and caches them in B flash memory in the conlroller for fulure repair, The controller cache keeps neeumubting all the nobe coordinates, and preprocesses the incoming image &la from the AID converter by repairing them. The proposed softlesffmpair approach *. pnrlierlarly devired to facilitate hnrdwore level implementalion uUimotdy for real-time telediagnosir. Porometrie simulation results demonslrale lhe speed and vinual yield enhancement by using lhe proposed opprooeh; thereby highly reliable, yet inexpensive sof-tesUmpoir of CCD-baseddigitalx-roy syrlems can be uUimotely realized.","PeriodicalId":135321,"journal":{"name":"Proceedings of the 20th IEEE Instrumentation Technology Conference (Cat. No.03CH37412)","volume":"15 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2003-05-20","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"127706150","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 2
Accuracy evaluation of a new broad-band vector digital spectrum analyzer 一种新型宽带矢量数字频谱分析仪的精度评价
Proceedings of the 20th IEEE Instrumentation Technology Conference (Cat. No.03CH37412) Pub Date : 2003-05-20 DOI: 10.1109/IMTC.2003.1208202
D. Mirri, G. Iuculano, F. Filicori, G. Pasini, P. Traverso
{"title":"Accuracy evaluation of a new broad-band vector digital spectrum analyzer","authors":"D. Mirri, G. Iuculano, F. Filicori, G. Pasini, P. Traverso","doi":"10.1109/IMTC.2003.1208202","DOIUrl":"https://doi.org/10.1109/IMTC.2003.1208202","url":null,"abstract":"der to obtain a measurement result independent of the meas- urement occasion, the ratio between each spectral component and the fundamental one is introduced. It has been shown that the mean value of this new parameter is independent from the measurement occasion if the number of samples is suffi- ciently large and","PeriodicalId":135321,"journal":{"name":"Proceedings of the 20th IEEE Instrumentation Technology Conference (Cat. No.03CH37412)","volume":"1 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2003-05-20","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"127711255","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 7
A mixed-mode circuit for interface control and gas sensor resistance measurement 一种用于接口控制和气体传感器电阻测量的混合模式电路
Proceedings of the 20th IEEE Instrumentation Technology Conference (Cat. No.03CH37412) Pub Date : 2003-05-20 DOI: 10.1109/IMTC.2003.1208271
J. Merino, R. Casanova, Á. Diéguez, S. Bota, C. Cané, J. Samitier
{"title":"A mixed-mode circuit for interface control and gas sensor resistance measurement","authors":"J. Merino, R. Casanova, Á. Diéguez, S. Bota, C. Cané, J. Samitier","doi":"10.1109/IMTC.2003.1208271","DOIUrl":"https://doi.org/10.1109/IMTC.2003.1208271","url":null,"abstract":"3- AM - A mired-mode interface circuit for monolithically integrated gas sensor arrays has been developed Circuiity includes interface electronics for inspection of up to four sensors array and interface logic for sman control. Because of its characteristics (IS robustness. small, size, low price and future capabilities with the adequate signal processing the system composed by the sensor and the application specific integrated circuit would be able to cover most of today markets considered for gas sensors.","PeriodicalId":135321,"journal":{"name":"Proceedings of the 20th IEEE Instrumentation Technology Conference (Cat. No.03CH37412)","volume":"26 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2003-05-20","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"121180323","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 5
High order modulation stripping for use by synchronization algorithms in communication systems 通信系统中同步算法使用的高阶调制剥离
Proceedings of the 20th IEEE Instrumentation Technology Conference (Cat. No.03CH37412) Pub Date : 2003-05-20 DOI: 10.1109/IMTC.2003.1207937
M. Rezki, L. Sabel, I. Kale
{"title":"High order modulation stripping for use by synchronization algorithms in communication systems","authors":"M. Rezki, L. Sabel, I. Kale","doi":"10.1109/IMTC.2003.1207937","DOIUrl":"https://doi.org/10.1109/IMTC.2003.1207937","url":null,"abstract":"In communication systems, the detection of the synchronization parameters such as phase offset and frequency offset is of a paramount importance to the decoding process of received signals. Signal modulation while it provides efficient use of the available bandwidth does dictate the use of data aided detection algorithms. Blind algorithms in the presence of modulation, although have the potential of providing a significant saving on bandwidth, usually fail to perform or produce suboptimum results in comparison with the data-aided methods. In this paper, we propose a new method to strip off high order modulation in order to be able to use to a certain extent the efficient blind detection algorithms.","PeriodicalId":135321,"journal":{"name":"Proceedings of the 20th IEEE Instrumentation Technology Conference (Cat. No.03CH37412)","volume":"16 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2003-05-20","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"121280410","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 3
Design of a high-performance optical system for angular position measurement: optical and electronic strategies for uncertainty reduction 一种用于角位置测量的高性能光学系统的设计:减少不确定度的光学和电子策略
Proceedings of the 20th IEEE Instrumentation Technology Conference (Cat. No.03CH37412) Pub Date : 2003-05-20 DOI: 10.1109/IMTC.2003.1207939
L. Rovati
{"title":"Design of a high-performance optical system for angular position measurement: optical and electronic strategies for uncertainty reduction","authors":"L. Rovati","doi":"10.1109/IMTC.2003.1207939","DOIUrl":"https://doi.org/10.1109/IMTC.2003.1207939","url":null,"abstract":"A high performance optical system to reduce measuring errors and uncertainty in angular encoders is presented. We propose a novel reading optical head, which exploits a lens system to improve the speed of the beam crossing the photodetector and a quadrant photodiode to perform a zero-crossover acquisition of the timing information.","PeriodicalId":135321,"journal":{"name":"Proceedings of the 20th IEEE Instrumentation Technology Conference (Cat. No.03CH37412)","volume":"30 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2003-05-20","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"128963627","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 5
An intelligent active brace system for the treatment of scoliosis 一种用于治疗脊柱侧凸的智能主动支撑系统
Proceedings of the 20th IEEE Instrumentation Technology Conference (Cat. No.03CH37412) Pub Date : 2003-05-20 DOI: 10.1109/IMTC.2003.1208168
E. Lou, D. Hill, J. Raso, A. Donauer
{"title":"An intelligent active brace system for the treatment of scoliosis","authors":"E. Lou, D. Hill, J. Raso, A. Donauer","doi":"10.1109/IMTC.2003.1208168","DOIUrl":"https://doi.org/10.1109/IMTC.2003.1208168","url":null,"abstract":"Efficiency of brace treatment for adolescent idiopathic scoliosis is correlated to how the brace has been worn. The more often the patients wear their braces to the prescribed tightness as well as to the prescribed length of time each day, the better the treatment outcomes. This paper describes an active intelligent brace system designed to maintain the interface pressure between the brace and body within the prescribed range during daily activity. The intelligent system consists of a microcomputer, a force transducer and a force feedback component. A subject who has no scoliosis volunteered to test the system for a few hours. Preliminary trials indicate that wearing the system increases the amount of time which a subject wears his brace in the prescribed range of tightness. The test subject wore the brace without feedback within the prescribed range of tightness for 28% of the time, whereas when the air bladder feedback system was activated, the subject wore the brace effectively for 47% of the time.","PeriodicalId":135321,"journal":{"name":"Proceedings of the 20th IEEE Instrumentation Technology Conference (Cat. No.03CH37412)","volume":"155 2 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2003-05-20","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"128680941","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 3
A/D converters with midpoint correction 带中点校正的A/D转换器
Proceedings of the 20th IEEE Instrumentation Technology Conference (Cat. No.03CH37412) Pub Date : 2003-05-20 DOI: 10.1109/IMTC.2003.1207943
Y. Jenq
{"title":"A/D converters with midpoint correction","authors":"Y. Jenq","doi":"10.1109/IMTC.2003.1207943","DOIUrl":"https://doi.org/10.1109/IMTC.2003.1207943","url":null,"abstract":"The analog to digital converter (ADC) has been widely used in modern electronic systems and instruments. Characterizing and improving the performances of ADCs has been an active research area for years based on IEEE Standard 1241 (2001), B.E. Peetz et al. (1982), J. Doernberg et al. (1984), G. Chiorboli et al. (1996) and N. Giaquinto et al. (1996). In this paper, we introduce a simple algorithm, namely, the midpoint correction algorithm, to improve the signal to noise ratio (SNR) performance of an ADC with nonlinearity errors. The residual mean square error (MSE) after the application of the midpoint correction algorithm is obtained in closed form. An approximate equation governing the relationship between the residual mean square error of an ADC and the normalized mean square error (MSE/sub DNL/) of the residual differential nonlinearity (DNL) is also derived. It can be shown that MSE /spl cong/ (q/sup 2//12)*(1+3*MSE/sub DNL/), where q is the quantization step-size of an ideal ADC. Computer simulation results are also presented to validate the theoretical results.","PeriodicalId":135321,"journal":{"name":"Proceedings of the 20th IEEE Instrumentation Technology Conference (Cat. No.03CH37412)","volume":"8 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2003-05-20","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"129384378","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 2
A revised statistical deduction approach to pipeline leak detection 一种改进的管道泄漏检测统计推导方法
Proceedings of the 20th IEEE Instrumentation Technology Conference (Cat. No.03CH37412) Pub Date : 2003-05-20 DOI: 10.1109/IMTC.2003.1208027
Yaqing Tu, Dongqiang Qiu, Du Zhang
{"title":"A revised statistical deduction approach to pipeline leak detection","authors":"Yaqing Tu, Dongqiang Qiu, Du Zhang","doi":"10.1109/IMTC.2003.1208027","DOIUrl":"https://doi.org/10.1109/IMTC.2003.1208027","url":null,"abstract":"A statistical deduction approach has been proposed to the pipeline leak detection problem. Central to the approach is an equation for locating leaks. In this paper, we analyze the inadequacy of the existing leak location equation and propose a revised equation for improved leak location accuracy. Simulation experiments have been conducted with regard to the original and the revised equations, respectively. Results indicate that the revised equation indeed improves the accuracy of locating leaks in the statistical deduction approach.","PeriodicalId":135321,"journal":{"name":"Proceedings of the 20th IEEE Instrumentation Technology Conference (Cat. No.03CH37412)","volume":"67 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2003-05-20","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"115846334","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 5
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