D. Mirri, G. Iuculano, F. Filicori, G. Pasini, P. Traverso
{"title":"一种新型宽带矢量数字频谱分析仪的精度评价","authors":"D. Mirri, G. Iuculano, F. Filicori, G. Pasini, P. Traverso","doi":"10.1109/IMTC.2003.1208202","DOIUrl":null,"url":null,"abstract":"der to obtain a measurement result independent of the meas- urement occasion, the ratio between each spectral component and the fundamental one is introduced. It has been shown that the mean value of this new parameter is independent from the measurement occasion if the number of samples is suffi- ciently large and","PeriodicalId":135321,"journal":{"name":"Proceedings of the 20th IEEE Instrumentation Technology Conference (Cat. No.03CH37412)","volume":"1 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2003-05-20","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"7","resultStr":"{\"title\":\"Accuracy evaluation of a new broad-band vector digital spectrum analyzer\",\"authors\":\"D. Mirri, G. Iuculano, F. Filicori, G. Pasini, P. Traverso\",\"doi\":\"10.1109/IMTC.2003.1208202\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"der to obtain a measurement result independent of the meas- urement occasion, the ratio between each spectral component and the fundamental one is introduced. It has been shown that the mean value of this new parameter is independent from the measurement occasion if the number of samples is suffi- ciently large and\",\"PeriodicalId\":135321,\"journal\":{\"name\":\"Proceedings of the 20th IEEE Instrumentation Technology Conference (Cat. No.03CH37412)\",\"volume\":\"1 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2003-05-20\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"7\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Proceedings of the 20th IEEE Instrumentation Technology Conference (Cat. No.03CH37412)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/IMTC.2003.1208202\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Proceedings of the 20th IEEE Instrumentation Technology Conference (Cat. No.03CH37412)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/IMTC.2003.1208202","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Accuracy evaluation of a new broad-band vector digital spectrum analyzer
der to obtain a measurement result independent of the meas- urement occasion, the ratio between each spectral component and the fundamental one is introduced. It has been shown that the mean value of this new parameter is independent from the measurement occasion if the number of samples is suffi- ciently large and