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28.4cc ultra-density 65W type-C adaptor with current mirror integration method 28.4cc超高密度65W c型适配器，采用电流镜像集成方法
IEICE Electron. Express Pub Date : 2022-01-01 DOI: 10.1587/elex.19.20220460
X. Lyu, Chenge Wang, Hua Chen, Faxin Yu
{"title":"28.4cc ultra-density 65W type-C adaptor with current mirror integration method","authors":"X. Lyu, Chenge Wang, Hua Chen, Faxin Yu","doi":"10.1587/elex.19.20220460","DOIUrl":"https://doi.org/10.1587/elex.19.20220460","url":null,"abstract":"","PeriodicalId":13437,"journal":{"name":"IEICE Electron. Express","volume":"24 1","pages":"20220460"},"PeriodicalIF":0.0,"publicationDate":"2022-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"81202008","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Characteristic analysis and diagnosis of short-circuit fault in armature winding of four-phase variable flux reluctance machine 四相变磁阻电机电枢绕组短路故障特征分析与诊断
IEICE Electron. Express Pub Date : 2022-01-01 DOI: 10.1587/elex.19.20220345
Yao Zhao, Zhibo Zhao, Dongdong Li, Shunfu Lin
{"title":"Characteristic analysis and diagnosis of short-circuit fault in armature winding of four-phase variable flux reluctance machine","authors":"Yao Zhao, Zhibo Zhao, Dongdong Li, Shunfu Lin","doi":"10.1587/elex.19.20220345","DOIUrl":"https://doi.org/10.1587/elex.19.20220345","url":null,"abstract":"","PeriodicalId":13437,"journal":{"name":"IEICE Electron. Express","volume":"7 1","pages":"20220345"},"PeriodicalIF":0.0,"publicationDate":"2022-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"89288100","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
A system-on-chip for series arc fault acquisition in smart grid based on two configurable sampling rate SAR ADCs 基于两个可配置采样率SAR adc的智能电网串联电弧故障采集系统
IEICE Electron. Express Pub Date : 2022-01-01 DOI: 10.1587/elex.19.20220163
Peiyong Zhang, Yuquan Su, Yike Li, Kaitian Huang
{"title":"A system-on-chip for series arc fault acquisition in smart grid based on two configurable sampling rate SAR ADCs","authors":"Peiyong Zhang, Yuquan Su, Yike Li, Kaitian Huang","doi":"10.1587/elex.19.20220163","DOIUrl":"https://doi.org/10.1587/elex.19.20220163","url":null,"abstract":"Arc faults in power systems may cause significant damage to equipment and even lead to electrical fires and hazard for personnel if they are not detected and isolated promptly. The series arc fault in a distribution system can be more dangerous compared to the parallel arc fault, because its low fault current will hinder the circuit breakers from responding in a timely manner. Therefore, it is necessary to properly detect the series arc fault. In this paper, a system-on-chip (SoC) for series AC arc fault acquisition is presented, which is based on two channels of configurable sampling rate successive approximation register (SAR) analog-to-digital-converters (ADCs). As the arc faults with different loads have different characteristics and may need a higher sampling rate under some circumstances, the adjustable sampling rate can meet varying needs. The system is implemented using a 55 nm CMOS process with a die area of 4.683 mm 2 and power dissipation of 75.9 mW. The proposed SAR ADC design can achieve a good Schreier figure-of-merit (FoM) of 161 dB at 1 MS/s sampling rate. With this ADC design, the SoC can complete arc faults acquisition with high precision and configurable sampling rate at a low cost. Meanwhile, the system can sample voltage and current signals from the smart grid respectively to initially locate the arc fault. words:","PeriodicalId":13437,"journal":{"name":"IEICE Electron. Express","volume":"294 1","pages":"20220163"},"PeriodicalIF":0.0,"publicationDate":"2022-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"79545257","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Model predictive current control for dual three-phase PMSM with hybrid voltage vector 基于混合电压矢量的双三相PMSM模型预测电流控制
IEICE Electron. Express Pub Date : 2022-01-01 DOI: 10.1587/elex.19.20220340
Fenghuang Cai, Fuyang Yang, Qinqin Chai, Jiahui Jiang
{"title":"Model predictive current control for dual three-phase PMSM with hybrid voltage vector","authors":"Fenghuang Cai, Fuyang Yang, Qinqin Chai, Jiahui Jiang","doi":"10.1587/elex.19.20220340","DOIUrl":"https://doi.org/10.1587/elex.19.20220340","url":null,"abstract":"To improve the steady-state performance of the dual three-phase permanent magnet synchronous motor with high torque ripple and high harmonic current, this paper proposes a hybrid voltage vector model predictive current control algorithm (MPCC). Firstly, based on the virtual voltage vectors synthesized using the vector characteristics of the fundamental and harmonic subspaces, hybrid voltage vectors are synthesized from the virtual voltage vectors and the zero vector to increase the voltage vector amplitude range to reduce torque ripple and to suppress harmonic currents. Then a vector selection method is proposed to reduce the number of alternative vectors and the calculation burden of the MPCC. Finally, the realization of corresponding PWM modulation is given. The simulation results show that the method effectively suppresses harmonic currents and torque ripple and increases the steady-state performance of the motor.","PeriodicalId":13437,"journal":{"name":"IEICE Electron. Express","volume":"20 1","pages":"20220340"},"PeriodicalIF":0.0,"publicationDate":"2022-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"89540589","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 2
Data-driven condition monitoring of stator winding terminal insulation for inverter-fed machine using enhanced switching oscillation signals 基于增强开关振荡信号的逆变电机定子绕组端子绝缘数据驱动状态监测
IEICE Electron. Express Pub Date : 2022-01-01 DOI: 10.1587/elex.19.20220435
Junjie Yu, Hao Li, Ruijunjie Cheng, Jingyu Liu, Yao Li
{"title":"Data-driven condition monitoring of stator winding terminal insulation for inverter-fed machine using enhanced switching oscillation signals","authors":"Junjie Yu, Hao Li, Ruijunjie Cheng, Jingyu Liu, Yao Li","doi":"10.1587/elex.19.20220435","DOIUrl":"https://doi.org/10.1587/elex.19.20220435","url":null,"abstract":"","PeriodicalId":13437,"journal":{"name":"IEICE Electron. Express","volume":"59 1","pages":"20220435"},"PeriodicalIF":0.0,"publicationDate":"2022-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"89696939","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
A 240μW 17bit ENOB ΔΣ modulator using 2nd-order noise-shaped integrating quantizer 采用二阶噪声形积分量化器的240μW 17bit ENOB ΔΣ调制器
IEICE Electron. Express Pub Date : 2022-01-01 DOI: 10.1587/elex.19.20220038
Kunyu Wang, Wenjing Xu, Chengbin Zhang, M. Law, Li Zhou, Ming Chen, Jie Chen
{"title":"A 240μW 17bit ENOB ΔΣ modulator using 2nd-order noise-shaped integrating quantizer","authors":"Kunyu Wang, Wenjing Xu, Chengbin Zhang, M. Law, Li Zhou, Ming Chen, Jie Chen","doi":"10.1587/elex.19.20220038","DOIUrl":"https://doi.org/10.1587/elex.19.20220038","url":null,"abstract":"","PeriodicalId":13437,"journal":{"name":"IEICE Electron. Express","volume":"86 1","pages":"20220038"},"PeriodicalIF":0.0,"publicationDate":"2022-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"90312059","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
A two-segment LSTM based data center temperature prediction model 基于两段LSTM的数据中心温度预测模型
IEICE Electron. Express Pub Date : 2022-01-01 DOI: 10.1587/elex.19.20220291
Yifei Kang, Chunping Ma, Simin Wang, Weiguo Wu, Kangning Zhao
{"title":"A two-segment LSTM based data center temperature prediction model","authors":"Yifei Kang, Chunping Ma, Simin Wang, Weiguo Wu, Kangning Zhao","doi":"10.1587/elex.19.20220291","DOIUrl":"https://doi.org/10.1587/elex.19.20220291","url":null,"abstract":"Nowadays , data centers are critical infrastructure for the information industry. Thermal security is one of the most concerning problems of the data center efficiently providing service. The temperature prediction method is an effective way, which overcomes the lagging of the feedback control and rewards a high prediction accuracy. While the current LSTM based prediction methods are limited in accuracy and restricted in scalability due to the lack of knowledge of physical properties and consideration of time constant differences of features. To address this, we propose a data center temperature prediction model with two-segment LSTM for prediction separately for IT equipment load and other heat-related variables with different time constants. The model takes into account the physical properties of the equipment and achieves higher prediction accuracy. The experimental results show that the prediction accuracy of our method is 27.27% higher than the state-of-art single segment LSTM method.","PeriodicalId":13437,"journal":{"name":"IEICE Electron. Express","volume":"30 1","pages":"20220291"},"PeriodicalIF":0.0,"publicationDate":"2022-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"76687350","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 1
An all-digital CMOS temperature sensor with a wide supply voltage range 具有宽电源电压范围的全数字CMOS温度传感器
IEICE Electron. Express Pub Date : 2022-01-01 DOI: 10.1587/elex.19.20220280
Fuyue Qian, Ye Li, Xiaowei Zhang, Jianxiong Xi, Lenian He
{"title":"An all-digital CMOS temperature sensor with a wide supply voltage range","authors":"Fuyue Qian, Ye Li, Xiaowei Zhang, Jianxiong Xi, Lenian He","doi":"10.1587/elex.19.20220280","DOIUrl":"https://doi.org/10.1587/elex.19.20220280","url":null,"abstract":"","PeriodicalId":13437,"journal":{"name":"IEICE Electron. Express","volume":"40 1","pages":"20220280"},"PeriodicalIF":0.0,"publicationDate":"2022-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"76825547","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 1
A 2.2ppm/°C compensated bandgap voltage reference with a double-ended current trimming technique 2.2ppm/°C补偿带隙电压参考与双端电流修剪技术
IEICE Electron. Express Pub Date : 2022-01-01 DOI: 10.1587/elex.19.20220390
Wenxin Yu, Lenian He, Jianxiong Xi, Quan Sun, Changyou Men
{"title":"A 2.2ppm/°C compensated bandgap voltage reference with a double-ended current trimming technique","authors":"Wenxin Yu, Lenian He, Jianxiong Xi, Quan Sun, Changyou Men","doi":"10.1587/elex.19.20220390","DOIUrl":"https://doi.org/10.1587/elex.19.20220390","url":null,"abstract":"This paper presents a high-precision bandgap voltage reference (BGR) with a double-ended current trimming technique. A high-order curvature compensation method is adopted to compensate for the nonlinearity of V BE . The proposed trimming technique using the one-time programmable (OTP) programming cancels the errors caused by process variation and enables bulk production, which achieves a best TC of 2.2 ppm/℃ from -40 ℃ to 125 ℃. The proposed BGR is fabricated in a 0.18-um BCD process with an active area of 0.329 mm 2 . The line sensitivity is 0.18 %/V operating from 2.9 V to 3.6 V.","PeriodicalId":13437,"journal":{"name":"IEICE Electron. Express","volume":"9 1","pages":"20220390"},"PeriodicalIF":0.0,"publicationDate":"2022-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"73140373","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 1
Optimized fast data migration for hybrid DRAM/STT-MRAM main memory 优化了混合DRAM/STT-MRAM主存的快速数据迁移
IEICE Electron. Express Pub Date : 2022-01-01 DOI: 10.1587/elex.18.20210493
Chenji Liu, Lan Chen, Xiaoran Hao, Mao Ni
{"title":"Optimized fast data migration for hybrid DRAM/STT-MRAM main memory","authors":"Chenji Liu, Lan Chen, Xiaoran Hao, Mao Ni","doi":"10.1587/elex.18.20210493","DOIUrl":"https://doi.org/10.1587/elex.18.20210493","url":null,"abstract":"In order to reduce the main memory energy of the IoT terminal, STT-MRAM is used to replace DRAM to save refresh energy. However, the write performance of STT-MRAM cells is worse than that of DRAM. Our previous work proposed a hybrid DRAM/STT-MRAM main memory and fast data migration to reduce the adverse effects of poor write performance of STT-MRAM cells with negligible performance overhead. This article optimizes the migration algorithm and experiment scheme: 1. Reduce the storage overhead of the algorithm. 2. Realize the continuous work of the algorithm. 3. Consider the impact of system standby time on main memory energy. The results show that compared with our previous work, the storage overhead of the algorithm is reduced 99.8%. When the system standby time is zero, the energy of the hybrid main memory (including the energy of the algorithm) is reduced by 4% on average compared to DRAM. The longer the system standby time, the more energy saving.","PeriodicalId":13437,"journal":{"name":"IEICE Electron. Express","volume":"12 1","pages":"20210493"},"PeriodicalIF":0.0,"publicationDate":"2022-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"72722713","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
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