40th ARFTG Conference Digest最新文献

筛选
英文 中文
Time Domain Measurements, Characterization and Modeling of Interconnects 互连的时域测量、表征和建模
40th ARFTG Conference Digest Pub Date : 1992-12-01 DOI: 10.1109/ARFTG.1992.327005
J. Jong, L. Hayden, V. Tripathi
{"title":"Time Domain Measurements, Characterization and Modeling of Interconnects","authors":"J. Jong, L. Hayden, V. Tripathi","doi":"10.1109/ARFTG.1992.327005","DOIUrl":"https://doi.org/10.1109/ARFTG.1992.327005","url":null,"abstract":"Single and coupled uniform and nonuniform interconnects associated with high speed electronic packages are characterized by calibrated time domain reflection and transmission (TDR/measurements. One- and two-port calibration techniques have been developed in time domain and are used to construct lumped, distributed as well as hybrid circuit models for interconnects and associated packages by using basic dynamic deconvolution techniques. Methods for calibration, de-embedding and general distributed model extraction are presented together with the measured data and equivalent circuit models for several test structures. These include uniform and nonuniform isolated and coupled interconnects, discontinuities and a Triquint multilayered ceramic package. The accuracy of the circuit models is ascertained by comparing the simulated time domain response with the measured data.","PeriodicalId":130939,"journal":{"name":"40th ARFTG Conference Digest","volume":"5 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1992-12-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"134428397","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 1
Microwave Characterization of Microshield Lines 微屏蔽线的微波特性
40th ARFTG Conference Digest Pub Date : 1992-12-01 DOI: 10.1109/ARFTG.1992.327011
R. F. Drayton, L. Katehi
{"title":"Microwave Characterization of Microshield Lines","authors":"R. F. Drayton, L. Katehi","doi":"10.1109/ARFTG.1992.327011","DOIUrl":"https://doi.org/10.1109/ARFTG.1992.327011","url":null,"abstract":"An experimental characterization of a new type of monolithic planar transmission line, the microshield, is presented. Theoretically, it is shown to have the tendency to radiate less than the conventional coplanar waveguide (CPW). To characterize the line, experimental measurement of a scattering parameters of the microwave model is essential. This paper presents characterization through the design, fabrication and measurement of the line and a discontinuity such as the two coupled open-end line. The frequency dependence of the effective dielectric constant is measured and compared to the computed values. Although proposed for applications at lower sub-mm-wave frequencies, fabrication in a hybrid fashion allows for use at microwave frequencies. Present applications of microshield technology are seen in Microtech Cascade probes and feed throughs for package connections in CPW interconnects. In addition, it is possible to use the microshield to connect MMIC's by designing the shield width to accommodate an MMIC. Therefore characterization of the microshield line and discontinuities is necessary.","PeriodicalId":130939,"journal":{"name":"40th ARFTG Conference Digest","volume":"62 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1992-12-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"132847225","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 3
0
×
引用
GB/T 7714-2015
复制
MLA
复制
APA
复制
导出至
BibTeX EndNote RefMan NoteFirst NoteExpress
×
提示
您的信息不完整,为了账户安全,请先补充。
现在去补充
×
提示
您因"违规操作"
具体请查看互助需知
我知道了
×
提示
确定
请完成安全验证×
相关产品
×
本文献相关产品
联系我们:info@booksci.cn Book学术提供免费学术资源搜索服务,方便国内外学者检索中英文文献。致力于提供最便捷和优质的服务体验。 Copyright © 2023 布克学术 All rights reserved.
京ICP备2023020795号-1
ghs 京公网安备 11010802042870号
Book学术文献互助
Book学术文献互助群
群 号:481959085
Book学术官方微信