{"title":"Save The \"Thru\" in the A.N.A. Calibration","authors":"A. Ferrero, U. Pisani, F. Sanpietro","doi":"10.1109/ARFTG.1992.327007","DOIUrl":"https://doi.org/10.1109/ARFTG.1992.327007","url":null,"abstract":"The conventional network analyzer (NWA) two-port calibration procedures require a standard thru line to be connected between the ports. Unfortunately in many applications, for example when measuring MMIC or on-wafer devices with not aligned ports, a custom thru line must be used. The procedure here applied overcomes the difficulty due to the poor knowledge of this thru element since it is based on a generic reciprocal unknown two port structure, provided that its S21 phase shift is roughly known. Some experimental comparisons with other well sound calibration techniques will be here presented where different reciprocal two-port structures were used as unknown thru.","PeriodicalId":130939,"journal":{"name":"40th ARFTG Conference Digest","volume":"376 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1992-12-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"131209550","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"Microwave Characterization of Microshield Lines","authors":"R. F. Drayton, L. Katehi","doi":"10.1109/ARFTG.1992.327011","DOIUrl":"https://doi.org/10.1109/ARFTG.1992.327011","url":null,"abstract":"An experimental characterization of a new type of monolithic planar transmission line, the microshield, is presented. Theoretically, it is shown to have the tendency to radiate less than the conventional coplanar waveguide (CPW). To characterize the line, experimental measurement of a scattering parameters of the microwave model is essential. This paper presents characterization through the design, fabrication and measurement of the line and a discontinuity such as the two coupled open-end line. The frequency dependence of the effective dielectric constant is measured and compared to the computed values. Although proposed for applications at lower sub-mm-wave frequencies, fabrication in a hybrid fashion allows for use at microwave frequencies. Present applications of microshield technology are seen in Microtech Cascade probes and feed throughs for package connections in CPW interconnects. In addition, it is possible to use the microshield to connect MMIC's by designing the shield width to accommodate an MMIC. Therefore characterization of the microshield line and discontinuities is necessary.","PeriodicalId":130939,"journal":{"name":"40th ARFTG Conference Digest","volume":"62 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1992-12-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"132847225","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}