{"title":"Time Domain Measurements, Characterization and Modeling of Interconnects","authors":"J. Jong, L. Hayden, V. Tripathi","doi":"10.1109/ARFTG.1992.327005","DOIUrl":"https://doi.org/10.1109/ARFTG.1992.327005","url":null,"abstract":"Single and coupled uniform and nonuniform interconnects associated with high speed electronic packages are characterized by calibrated time domain reflection and transmission (TDR/measurements. One- and two-port calibration techniques have been developed in time domain and are used to construct lumped, distributed as well as hybrid circuit models for interconnects and associated packages by using basic dynamic deconvolution techniques. Methods for calibration, de-embedding and general distributed model extraction are presented together with the measured data and equivalent circuit models for several test structures. These include uniform and nonuniform isolated and coupled interconnects, discontinuities and a Triquint multilayered ceramic package. The accuracy of the circuit models is ascertained by comparing the simulated time domain response with the measured data.","PeriodicalId":130939,"journal":{"name":"40th ARFTG Conference Digest","volume":"5 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1992-12-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"134428397","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"Microwave Characterization of Microshield Lines","authors":"R. F. Drayton, L. Katehi","doi":"10.1109/ARFTG.1992.327011","DOIUrl":"https://doi.org/10.1109/ARFTG.1992.327011","url":null,"abstract":"An experimental characterization of a new type of monolithic planar transmission line, the microshield, is presented. Theoretically, it is shown to have the tendency to radiate less than the conventional coplanar waveguide (CPW). To characterize the line, experimental measurement of a scattering parameters of the microwave model is essential. This paper presents characterization through the design, fabrication and measurement of the line and a discontinuity such as the two coupled open-end line. The frequency dependence of the effective dielectric constant is measured and compared to the computed values. Although proposed for applications at lower sub-mm-wave frequencies, fabrication in a hybrid fashion allows for use at microwave frequencies. Present applications of microshield technology are seen in Microtech Cascade probes and feed throughs for package connections in CPW interconnects. In addition, it is possible to use the microshield to connect MMIC's by designing the shield width to accommodate an MMIC. Therefore characterization of the microshield line and discontinuities is necessary.","PeriodicalId":130939,"journal":{"name":"40th ARFTG Conference Digest","volume":"62 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1992-12-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"132847225","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}