2018 IEEE 3rd International Verification and Security Workshop (IVSW)最新文献_第2页

Pre-silicon Embedded System Evaluation as New EDA Tool for Security Verification 预硅嵌入式系统评估作为新的EDA安全验证工具

2018 IEEE 3rd International Verification and Security Workshop (IVSW) Pub Date : 2018-07-01 DOI: 10.1109/IVSW.2018.8494881

Sofiane Takarabt, K. Chibani, A. Facon, S. Guilley, Y. Mathieu, L. Sauvage, Youssef Souissi

{"title":"Pre-silicon Embedded System Evaluation as New EDA Tool for Security Verification","authors":"Sofiane Takarabt, K. Chibani, A. Facon, S. Guilley, Y. Mathieu, L. Sauvage, Youssef Souissi","doi":"10.1109/IVSW.2018.8494881","DOIUrl":"https://doi.org/10.1109/IVSW.2018.8494881","url":null,"abstract":"The security evaluation of embedded systems becomes clear and mandatory. Up today, the evaluation process is limited to certification labs that conduct the analysis on real target devices. This requires appropriate measurement platforms and equipment in addition to real chip analysis skills. In this paper, we put forward a pre-silicon evaluation methodology and tools that allow the security verification at an early stage (virtual target) and running it hands in hands with the functional verification. As of today, such approach can be used as new Electronic Design Automation (EDA) tool to properly satisfy the basics of Design for Security (DFS) concept. From a practical viewpoint, we show a study case to illustrate and provide a better understanding of that approach. Moreover, we propose new evaluation metrics based on Signal to Noise Ratio (SNR) computation, and verified on virtual and real targets respectively based on a comparative study. Likewise, the tool identifies vulnerabilites (thereby anticipating complete families of otherwise numerous, complex and many undiscovered attacks), and returns accurate feedack to the user on the precise line of code (LoC) where the vulnerability lays along with its characterization, including an identification of its severity. This allows the design to input source code to the tool, and to get back in return annotated source code with a collection of LoCs which deserve careful analysis and/or subsequent modification aiming at patching vulnerabilities.","PeriodicalId":125301,"journal":{"name":"2018 IEEE 3rd International Verification and Security Workshop (IVSW)","volume":"102 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2018-07-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"115288578","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

引用次数: 6

Hardware Trojan Detection and Functionality Determination for Soft IPs 软ip硬件木马检测与功能判定

2018 IEEE 3rd International Verification and Security Workshop (IVSW) Pub Date : 2018-07-01 DOI: 10.1109/IVSW.2018.8494891

Thao Le, Lucas Weaver, J. Di, Shaojie Zhang, Yier Jin

引用次数: 3

Authentication of Microcontroller Board Using Non-Invasive EM Emission Technique 基于非侵入性电磁发射技术的微控制器板认证

2018 IEEE 3rd International Verification and Security Workshop (IVSW) Pub Date : 2018-07-01 DOI: 10.1109/IVSW.2018.8494883

Mosabbah Mushir Ahmed, D. Hély, E. Perret, N. Barbot, R. Siragusa, M. Bernier, F. Garet

{"title":"Authentication of Microcontroller Board Using Non-Invasive EM Emission Technique","authors":"Mosabbah Mushir Ahmed, D. Hély, E. Perret, N. Barbot, R. Siragusa, M. Bernier, F. Garet","doi":"10.1109/IVSW.2018.8494883","DOIUrl":"https://doi.org/10.1109/IVSW.2018.8494883","url":null,"abstract":"Counterfeiting of integrated circuits (IC) has become a serious concern for electronics manufacturers, system integrators, and end users. It is necessary to find a robust solution which is both efficient and low cost in terms of implementation in order to detect and avoid the counterfeiting of ICs. To combat the counterfeiting of ICs in this paper we have extended our previous work on utilizing radiated EM emission for authentication of IC on microcontroller boards. Our proposed scheme exploits manufacturing based process variation (PV), which continues to dominate in the nanoscale technologies. We have focused our work on authentication of microcontrollers which are one of the main targets of counterfeiting. The proposed work emphasizes on being non-intrusive and does not require any internal modification of the system on chip, it can be used on already deployed ICs. Generated EM response is treated to different encoding metrics to quantize it as a fingerprint for the IC. To validate our proposed scheme, measurements are carried out over several microcontroller boards.","PeriodicalId":125301,"journal":{"name":"2018 IEEE 3rd International Verification and Security Workshop (IVSW)","volume":"79 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2018-07-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"114872275","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

引用次数: 6

Software-only Reverse Engineering of Physical DRAM Mappings for Rowhammer Attacks 针对Rowhammer攻击的物理DRAM映射的纯软件逆向工程

2018 IEEE 3rd International Verification and Security Workshop (IVSW) Pub Date : 2018-07-01 DOI: 10.1109/IVSW.2018.8494868

Alessandro Barenghi, L. Breveglieri, Niccolò Izzo, Gerardo Pelosi

引用次数: 22

Hardware Security Evaluation Platform for MCU-Based Connected Devices: Application to Healthcare IoT 基于mcu的连接设备硬件安全评估平台:在医疗物联网中的应用

2018 IEEE 3rd International Verification and Security Workshop (IVSW) Pub Date : 2018-07-01 DOI: 10.1109/IVSW.2018.8494843

Z. Kazemi, Athanasios Papadimitriou, D. Hély, M. Fazeli, V. Beroulle

引用次数: 16

Keynotes: Towards Self-Explaining Digital Systems: A Design Methodology for the Next Generation 主题演讲:走向自我解释的数字系统:下一代的设计方法论

2018 IEEE 3rd International Verification and Security Workshop (IVSW) Pub Date : 2018-07-01 DOI: 10.1109/IVSW.2018.8494895

R. Drechsler

引用次数: 0

A Machine Learning Attacks Resistant Two Stage Physical Unclonable Functions Design 一种抗机器学习攻击的两阶段物理不可克隆函数设计

2018 IEEE 3rd International Verification and Security Workshop (IVSW) Pub Date : 2018-07-01 DOI: 10.1109/IVSW.2018.8494839

Haibo Su, Mark Zwolinski, Basel Halak

引用次数: 10

Physical Inspection & Attacks: New Frontier in Hardware Security 物理检测与攻击:硬件安全的新前沿

2018 IEEE 3rd International Verification and Security Workshop (IVSW) Pub Date : 2018-07-01 DOI: 10.1109/IVSW.2018.8494856

Mir Tanjidur Rahman, Qihang Shi, Shahin Tajik, Haoting Shen, D. Woodard, M. Tehranipoor, N. Asadizanjani

{"title":"Physical Inspection & Attacks: New Frontier in Hardware Security","authors":"Mir Tanjidur Rahman, Qihang Shi, Shahin Tajik, Haoting Shen, D. Woodard, M. Tehranipoor, N. Asadizanjani","doi":"10.1109/IVSW.2018.8494856","DOIUrl":"https://doi.org/10.1109/IVSW.2018.8494856","url":null,"abstract":"Due to globalization, the semiconductor industry is becoming more susceptible to trust and security issues. Hardware Trojans, i.e., malicious modification to integrated circuits (ICs), can violate the root of trust when the devices are fabricated in untrusted facilities. Literature shows as the microscopy and failure analysis tools excel in the resolution and capability, physical inspection methods like reverse engineering and photonic emission become attractive in helping verify such trust issues. On the contrary, such physical inspection methods are opening new capabilities for an adversary to extract sensitive information like secret keys, memory content or intellectual property (IP) from the chip compromising confidentiality and integrity. Different countermeasures have been proposed, however, there are still many unanswered questions. In this paper, we discuss physical inspection/attack methods using failure analysis tools and analyze the existing countermeasures and security/trust issues related to them. Next, we will introduce challenges related to the development of new countermeasures and trust verification. Finally, we present research roadmap for this emerging field.","PeriodicalId":125301,"journal":{"name":"2018 IEEE 3rd International Verification and Security Workshop (IVSW)","volume":"42 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2018-07-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"125255518","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

引用次数: 33

Detecting Cache-Timing Vulnerabilities in Post-Quantum Cryptography Algorithms 后量子加密算法中的缓存定时漏洞检测

2018 IEEE 3rd International Verification and Security Workshop (IVSW) Pub Date : 2018-07-01 DOI: 10.1109/IVSW.2018.8494855

A. Facon, S. Guilley, Matthieu Lec'Hvien, Alexander Schaub, Youssef Souissi

引用次数: 16

Towards Self-Explaining Digital Systems: A Design Methodology for the Next Generation 迈向自我解释的数字系统:下一代的设计方法论

2018 IEEE 3rd International Verification and Security Workshop (IVSW) Pub Date : 2018-07-01 DOI: 10.1109/IVSW.2018.8494900

R. Drechsler, Christoph Lüth, G. Fey, T. Güneysu

引用次数: 8