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Section VI 第六节
2018 19th International Conference of Young Specialists on Micro/Nanotechnologies and Electron Devices (EDM) Pub Date : 2018-06-01 DOI: 10.1017/cbo9781107360419.006
G. Policy
{"title":"Section VI","authors":"G. Policy","doi":"10.1017/cbo9781107360419.006","DOIUrl":"https://doi.org/10.1017/cbo9781107360419.006","url":null,"abstract":"The absence of a Board of Trustees audit committee poses challenges that the university may want to address in the context of the national movement toward greater board accountability for resources and the integrity of management processes. See audit recommendation in Section 6.3.6, below. An appropriately charged audit committee ought to provide oversight for the internal audit function; charge and respond to the university’s external auditors; address corporate responsibility issues in systematic, effective ways; and provide an appropriate mechanism by which the Board can exercise its fiduciary obligations.","PeriodicalId":120405,"journal":{"name":"2018 19th International Conference of Young Specialists on Micro/Nanotechnologies and Electron Devices (EDM)","volume":"1 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2018-06-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"123143155","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 25
The Non-Linear Differentiating Circuits of Correction of Transient Process in Differential Operational Amplifiers 差分运算放大器暂态过程校正的非线性微分电路
2018 19th International Conference of Young Specialists on Micro/Nanotechnologies and Electron Devices (EDM) Pub Date : 2018-06-01 DOI: 10.1109/EDM.2018.8434959
N. Prokopenko, A. Bugakova, A. I. Serebryakov
{"title":"The Non-Linear Differentiating Circuits of Correction of Transient Process in Differential Operational Amplifiers","authors":"N. Prokopenko, A. Bugakova, A. I. Serebryakov","doi":"10.1109/EDM.2018.8434959","DOIUrl":"https://doi.org/10.1109/EDM.2018.8434959","url":null,"abstract":"The nonlinear equivalent circuits for small and large signals of the input circuits of the classical BJT operational amplifier (Op-Amp), which relates to the basic functional nodes of analog-digital interfaces of modern automatic control systems and it has a significant effect on some of their dynamic parameters, are discussed. This enabled us to formulate a circuit method for connecting a differentiating correction circuit (DCC) of the transient to the standard Op-Amp. Such solution reduces significantly the recharging time of the Op-Amp integrating capacitor (Cc1), which forms the given phase margin and the unity gain frequency. It is shown that, on a small signal, the additional differentiating capacitor Cc2has practically no effect on the Op-Amp operation; however, it increases the maximum slew rate (SR) at the dynamic overload of the main Op-Amp input stage. The estimates of the SR limiting values are given with regard to the lag effect of the main Op-Amp functional nodes. The proposed method of connecting a differentiating correction circuit effectively works both in the Op-Amps and in other electronic devices of automation and robotics (continuous voltage stabilizers with differential stages, comparators, etc., implemented by modern technological processes - BJT, BiJFet, SiGe, CMOS, SOI, SOS, etc.).","PeriodicalId":120405,"journal":{"name":"2018 19th International Conference of Young Specialists on Micro/Nanotechnologies and Electron Devices (EDM)","volume":"19 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2018-06-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"115279330","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Optimization of Vibratory Source Electromagnetic Drive Operating Process 振动源电磁驱动工作过程优化
2018 19th International Conference of Young Specialists on Micro/Nanotechnologies and Electron Devices (EDM) Pub Date : 2018-06-01 DOI: 10.1109/EDM.2018.8434996
B. F. Simonov, V. Neyman, A. O. Kordubailo
{"title":"Optimization of Vibratory Source Electromagnetic Drive Operating Process","authors":"B. F. Simonov, V. Neyman, A. O. Kordubailo","doi":"10.1109/EDM.2018.8434996","DOIUrl":"https://doi.org/10.1109/EDM.2018.8434996","url":null,"abstract":"The linear electromagnetic machines, which are designed for operating as impact drives in well impulse vibratory sources applied for the impact on oil layers at great depth, have been comprehensively investigated. The lab results of the model operating processes are presented. The demands on the operating processes construction have been formulated with respect to the casing internal diameter limitation in a deep well. In the paper the results of experimental investigation seek to optimize operating mode are presented.","PeriodicalId":120405,"journal":{"name":"2018 19th International Conference of Young Specialists on Micro/Nanotechnologies and Electron Devices (EDM)","volume":"143 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2018-06-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"115812956","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 2
Mild Fluorination of Carbon Nanocages to Enhance the Supercapacitor Performance 碳纳米笼轻度氟化以提高超级电容器性能
2018 19th International Conference of Young Specialists on Micro/Nanotechnologies and Electron Devices (EDM) Pub Date : 2018-06-01 DOI: 10.1109/EDM.2018.8435053
A. Sosunov, V. Henner, G. Sumanasekera
{"title":"Mild Fluorination of Carbon Nanocages to Enhance the Supercapacitor Performance","authors":"A. Sosunov, V. Henner, G. Sumanasekera","doi":"10.1109/EDM.2018.8435053","DOIUrl":"https://doi.org/10.1109/EDM.2018.8435053","url":null,"abstract":"Fluorination process was carried out on carbon nanocages in the CFx range at 0<x≤0.3 in fluorine plasma. The evolution of the structural changes was determined by the x-ray photoelectron spectroscopy. It is shown that soft fluorination at x~0.05 leads to an increase in the capacitance (more than 20%) and stability of the operation of supercapacitors due to pseudocapacity. Increase the processing time leads to blocking the specific surface of carbon nanocages and rapid decrease in the capacitance of supercapacitors.","PeriodicalId":120405,"journal":{"name":"2018 19th International Conference of Young Specialists on Micro/Nanotechnologies and Electron Devices (EDM)","volume":"20 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2018-06-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"131461951","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Testing Microcontroller Based Physical Systems Using Finite Transition Models 使用有限过渡模型测试基于微控制器的物理系统
2018 19th International Conference of Young Specialists on Micro/Nanotechnologies and Electron Devices (EDM) Pub Date : 2018-06-01 DOI: 10.1109/EDM.2018.8435029
A. Laputenko, T. D. Petukhov, N. Vasnev
{"title":"Testing Microcontroller Based Physical Systems Using Finite Transition Models","authors":"A. Laputenko, T. D. Petukhov, N. Vasnev","doi":"10.1109/EDM.2018.8435029","DOIUrl":"https://doi.org/10.1109/EDM.2018.8435029","url":null,"abstract":"Many devices of controlling parts of physical systems are implemented on the basis of microcontrollers. Such critical systems are needed to be tested thoroughly. This paper contains experimental results on testing controlling parts of laser based physical systems. We consider generators of synchronizing pulses for controlling important parts of the laser system. Test derivation is performed using the model of a timed transition system with finite number of states. We then generate a number of mutants for a microcontroller part and the performed experiments clearly show that timed Finite State Machine based test suites have a good quality as they allow to detect most frequently occurring faults in considered systems.","PeriodicalId":120405,"journal":{"name":"2018 19th International Conference of Young Specialists on Micro/Nanotechnologies and Electron Devices (EDM)","volume":"19 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2018-06-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"126846645","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 3
Traction Network Current Rate Changing Analysis 牵引网络电流变化分析
2018 19th International Conference of Young Specialists on Micro/Nanotechnologies and Electron Devices (EDM) Pub Date : 2018-06-01 DOI: 10.1109/EDM.2018.8435061
A. V. Kulekina, E. G. Langeman, S. M. Kuznetsov, B. Malozyomov, K. Akberov
{"title":"Traction Network Current Rate Changing Analysis","authors":"A. V. Kulekina, E. G. Langeman, S. M. Kuznetsov, B. Malozyomov, K. Akberov","doi":"10.1109/EDM.2018.8435061","DOIUrl":"https://doi.org/10.1109/EDM.2018.8435061","url":null,"abstract":"The parameters of transition processes characteristics could be defined on oscillogram data obtained by means of remote monitors access received from a power section. Also this data helps to analyze protection operation and adjust setpoints. The article is focused on current rate changing analysis at different traction network operation modes.","PeriodicalId":120405,"journal":{"name":"2018 19th International Conference of Young Specialists on Micro/Nanotechnologies and Electron Devices (EDM)","volume":"21 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2018-06-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"125354055","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Processing of Signals with Orthogonal Frequency Multiplexing and Spread Spectrum at Low Signal-to-Noise Ratios 低信噪比下正交频复用扩频信号的处理
2018 19th International Conference of Young Specialists on Micro/Nanotechnologies and Electron Devices (EDM) Pub Date : 2018-06-01 DOI: 10.1109/EDM.2018.8434977
E. Rogozhnikov, Y. Kryukov, D. Pokamestov
{"title":"Processing of Signals with Orthogonal Frequency Multiplexing and Spread Spectrum at Low Signal-to-Noise Ratios","authors":"E. Rogozhnikov, Y. Kryukov, D. Pokamestov","doi":"10.1109/EDM.2018.8434977","DOIUrl":"https://doi.org/10.1109/EDM.2018.8434977","url":null,"abstract":"The article deals with the signals with orthogonal frequency multiplexing and spread spectrum at low signal to noise ratios formation and processing. Existing signals' forming and processing methods are considered. The article describes the main errors sources which lead to errors during demodulation. Signal processing method which makes it possible to reduce the error probability in comparison with the known method for processing such signals is proposed in the article. Reduction the bit error probability in the proposed method is achieved due to coherent accumulation and subsequent averaging of the estimates of the transfer functions used for equalization. The proposed signal processing method can be used in a complex interference environment and at low signal-to-noise ratios.","PeriodicalId":120405,"journal":{"name":"2018 19th International Conference of Young Specialists on Micro/Nanotechnologies and Electron Devices (EDM)","volume":"22 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2018-06-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"114369039","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
The Modeling of Ultrasonic Cavitation Depolymerization Causing Reducing of Polymer Viscosity 超声空化解聚导致聚合物粘度降低的模型研究
2018 19th International Conference of Young Specialists on Micro/Nanotechnologies and Electron Devices (EDM) Pub Date : 2018-06-01 DOI: 10.1109/EDM.2018.8435073
V. Khmelev, R. Golykh, Galina A. Bobrova, Vladislav A. Shakura, E. V. Ilchenko
{"title":"The Modeling of Ultrasonic Cavitation Depolymerization Causing Reducing of Polymer Viscosity","authors":"V. Khmelev, R. Golykh, Galina A. Bobrova, Vladislav A. Shakura, E. V. Ilchenko","doi":"10.1109/EDM.2018.8435073","DOIUrl":"https://doi.org/10.1109/EDM.2018.8435073","url":null,"abstract":"The paper presents the model of ultrasonic cavitation depolymerization which is destruction of polymer macromolecules under cavitation. The model is based on probability approach which is allow to reduce the task of cavitation depolymerization calculation to solve the system of self-similar equations for macromolecules with different weights concentration. The equations include probability of macromolecules destruction. The probability is determined by cross-section of collision of macromolecules pair and possibility of macromolecule destruction at contact with another molecule. The calculations have shown that the cavitation reduces the modal molecular weight up to 2 times. It causes reducing the polymer viscosity up to 10 times.","PeriodicalId":120405,"journal":{"name":"2018 19th International Conference of Young Specialists on Micro/Nanotechnologies and Electron Devices (EDM)","volume":"98 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2018-06-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"122602871","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Simulation Modeling of the Internal Combustion Engine Starting System Using a Supercapacitor Battery 使用超级电容电池的内燃机启动系统仿真建模
2018 19th International Conference of Young Specialists on Micro/Nanotechnologies and Electron Devices (EDM) Pub Date : 2018-06-01 DOI: 10.1109/EDM.2018.8434976
B. Malozyomov, A. V. Myatezh, M. A. Smirnov
{"title":"Simulation Modeling of the Internal Combustion Engine Starting System Using a Supercapacitor Battery","authors":"B. Malozyomov, A. V. Myatezh, M. A. Smirnov","doi":"10.1109/EDM.2018.8434976","DOIUrl":"https://doi.org/10.1109/EDM.2018.8434976","url":null,"abstract":"In this paper it was described various types of Supercapacitor technology, using for powering smartphones, tablets and electric transport systems. Parameters of energy storage devices were compared in terms of energy and cost efficient. The proposed battery technology is on the verge of carrying the revolution in road transport and energy storage of renewable energy.","PeriodicalId":120405,"journal":{"name":"2018 19th International Conference of Young Specialists on Micro/Nanotechnologies and Electron Devices (EDM)","volume":"83 4 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2018-06-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"123279293","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 7
An Interface Model of the Interconnection Between Integrated Circuit Chip Die and Printed Circuit Board 集成电路芯片与印刷电路板互连的接口模型
2018 19th International Conference of Young Specialists on Micro/Nanotechnologies and Electron Devices (EDM) Pub Date : 2018-06-01 DOI: 10.1109/EDM.2018.8434983
A. A. Antonov, Igor K. Surin
{"title":"An Interface Model of the Interconnection Between Integrated Circuit Chip Die and Printed Circuit Board","authors":"A. A. Antonov, Igor K. Surin","doi":"10.1109/EDM.2018.8434983","DOIUrl":"https://doi.org/10.1109/EDM.2018.8434983","url":null,"abstract":"This work represents results obtained during research of high frequency IC packaging. The interface between IC die and PCB is described and its inner structure is developed: contact pads on IC die, bondwires and chip outputs. As an example of method developed the interface effects into device development and characteristics are shown for the LNA module as a part of the GPS receiver test chip.","PeriodicalId":120405,"journal":{"name":"2018 19th International Conference of Young Specialists on Micro/Nanotechnologies and Electron Devices (EDM)","volume":"1 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2018-06-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"129069494","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 1
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