Electrical Contacts - 2007 Proceedings of the 53rd IEEE Holm Conference on Electrical Contacts最新文献_第2页

Electro-mechanical modelling of multilayer contacts in electrical connectors 电连接器中多层触点的机电建模

Electrical Contacts - 2007 Proceedings of the 53rd IEEE Holm Conference on Electrical Contacts Pub Date : 2007-09-24 DOI: 10.1109/HOLM.2007.4318187

F. Ossart, S. Noel, D. Alamarguy, S. Correia, P. Gendre

引用次数: 19

An experimental study of the minimum arc current of silver contacts with different opening speeds 不同开启速度下银触点最小弧电流的实验研究

Electrical Contacts - 2007 Proceedings of the 53rd IEEE Holm Conference on Electrical Contacts Pub Date : 2007-09-24 DOI: 10.1109/HOLM.2007.4318233

M. Hasegawa

{"title":"An experimental study of the minimum arc current of silver contacts with different opening speeds","authors":"M. Hasegawa","doi":"10.1109/HOLM.2007.4318233","DOIUrl":"https://doi.org/10.1109/HOLM.2007.4318233","url":null,"abstract":"In order to study the influence of contact opening speed on occurrence rates of break arcs, Ag contacts were operated to break inductive DC load currents from 0.1 A to 0.6 A at 14 V with contact opening speeds of 0.5 mm/s to 10 mm/s in a switching mechanism employing a stepping motor. Occurrence rates of break arcs and their average durations were determined at each current level under the respective contact opening speeds. From the results, irrespective of the opening speed values, the arc occurrence rate was almost 100% at 0.4 A. For all of the contact opening speeds tested, the conventional minimum arc current level can be considered, not as the lower limit for arc ignition, but rather as the threshold level for arc discharges of certain duration to occur at the rate of almost 100%. Moreover, in the current range from 0.2 to 0.4 A, slight differences in the arc occurrence rates were seen with differences in the contact opening speeds. The average arc durations were around 50 mus at the conventional minimum arc current level of 0.4 A, and not influenced significantly by changes in the tested range of contact opening speeds.","PeriodicalId":11624,"journal":{"name":"Electrical Contacts - 2007 Proceedings of the 53rd IEEE Holm Conference on Electrical Contacts","volume":null,"pages":null},"PeriodicalIF":0.0,"publicationDate":"2007-09-24","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"88184635","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

引用次数: 11

Weibull Analysis of Switching Contact Resistance in Laboratory and Commercial Circuit Breakers 实验室和商用断路器开关接触电阻的威布尔分析

Electrical Contacts - 2007 Proceedings of the 53rd IEEE Holm Conference on Electrical Contacts Pub Date : 2007-09-24 DOI: 10.1109/HOLM.2007.4318195

C. Leung, E. Streicher, D. Fitzgerald

引用次数: 12

Materials Considerations in using Voltage Drop for Power Rating 使用压降进行额定功率时的材料考虑

Electrical Contacts - 2007 Proceedings of the 53rd IEEE Holm Conference on Electrical Contacts Pub Date : 2007-09-24 DOI: 10.1109/HOLM.2007.4318190

R. Malucci, F. Ruffino

引用次数: 7

A Study on Quenching Characteristics of YBaCuO Bulk Superconductor with Deposited Ag Layer 镀银YBaCuO块状超导体的淬火特性研究

Electrical Contacts - 2007 Proceedings of the 53rd IEEE Holm Conference on Electrical Contacts Pub Date : 2007-09-24 DOI: 10.1109/HOLM.2007.4318198

K. Fukuda, H. Fujita, K. Sawa, M. Tomita, M. Murakami, N. Sakai, I. Hirabayashi

{"title":"A Study on Quenching Characteristics of YBaCuO Bulk Superconductor with Deposited Ag Layer","authors":"K. Fukuda, H. Fujita, K. Sawa, M. Tomita, M. Murakami, N. Sakai, I. Hirabayashi","doi":"10.1109/HOLM.2007.4318198","DOIUrl":"https://doi.org/10.1109/HOLM.2007.4318198","url":null,"abstract":"A persistent current switch (PCS) is used for superconducting applications, such as superconducting magnetic energy storage (SMES) system. The authors have proposed a mechanical switch of Y-Ba-Cu-O (YBCO) bulk as a mechanical PCS. In previous reports, in order to investigate the contact characteristics of the switch, 50 A current test was performed and the contact resistance between two contacts was measured by four terminal method. As a result, it became clear that polishing and metal depositing on contact surfaces was effective methods to reduce the residual resistance, and the authors achieved to reduce this resistance to 0.64 muOmega, which was less than our target value of 1 muOmega. This paper focused on the greater current test (above 50 A) in order to perform more practical experiment as PCS used for SMES. In this experiment, the authors examined the characteristics to normal conductive state in the YBCO, which was not obtained by former 50 A current test. As a result, the transfer current is found to have a relationship with the layer thickness of deposited Ag on contact surfaces. The value of transfer current was rose by increasing the layer thickness of deposited silver, but saturated at around 0.60 mum.","PeriodicalId":11624,"journal":{"name":"Electrical Contacts - 2007 Proceedings of the 53rd IEEE Holm Conference on Electrical Contacts","volume":null,"pages":null},"PeriodicalIF":0.0,"publicationDate":"2007-09-24","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"79248477","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

引用次数: 0

Numerical Analysis of Low-Voltage Circuit-Breakers under Short-Circuit Conditions 短路条件下低压断路器的数值分析

Electrical Contacts - 2007 Proceedings of the 53rd IEEE Holm Conference on Electrical Contacts Pub Date : 2007-09-24 DOI: 10.1109/HOLM.2007.4318192

T. Mutzel, F. Berger, M. Anheuser

引用次数: 4

Dynamic Simulation of Operating Mechanism for Molded Case Circuit Breaker 塑壳断路器操动机构的动态仿真

Electrical Contacts - 2007 Proceedings of the 53rd IEEE Holm Conference on Electrical Contacts Pub Date : 2007-09-24 DOI: 10.1109/HOLM.2007.4318215

Degui Chen, Ruicheng Dai, Jingshu Zhang, W. Tong

引用次数: 12

The Effect of Initial Connector Insertions on Electrical Contact Resistance 初始连接器插入对电接触电阻的影响

Electrical Contacts - 2007 Proceedings of the 53rd IEEE Holm Conference on Electrical Contacts Pub Date : 2007-09-24 DOI: 10.1109/HOLM.2007.4318189

R. Jackson, W. Ashurst, G. Flowers, S. Angadi, S. Choe, M. Bozack

引用次数: 13

Effect of Dust Contamination on Electrical Contact Failure 粉尘污染对电触点失效的影响

Electrical Contacts - 2007 Proceedings of the 53rd IEEE Holm Conference on Electrical Contacts Pub Date : 2007-09-24 DOI: 10.1109/HOLM.2007.4318186

Ji Gao Zhang

引用次数: 37

{111} Si Etched Planar Electrical Contacts for Power MEMS-relays 用于功率mems继电器的硅蚀刻平面电触点

Electrical Contacts - 2007 Proceedings of the 53rd IEEE Holm Conference on Electrical Contacts Pub Date : 2007-09-24 DOI: 10.1109/HOLM.2007.4318210

A. Weber, J. Lang, A. Slocum

引用次数: 9