使用压降进行额定功率时的材料考虑

R. Malucci, F. Ruffino
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引用次数: 7

摘要

在评定镀金电源触点的性能时,要考虑电压降和老化后电压降的变化。在这种情况下,样品暴露在高电流循环中,电流水平产生非常高的温升。这就造成了由于热老化和可能的电迁移而导致降解的条件。结果表明,金的破坏准则与锡相似,但不相等。基于这些结果,得出了金属接触损失是影响锡金性能的共同因素。此外,电流密度和接触电压作为提供老化和失效准则的基本物理参数进行了讨论。目的是开发一种使用各种触点材料的压降来量化触点额定功率的方法,以便在现场可靠使用。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Materials Considerations in using Voltage Drop for Power Rating
Voltage drop, and change in voltage drop after aging, are considered in rating the performance of gold plated power contacts. In this case, samples are exposed to high current cycling at current levels that produce very high temperature rises. This created conditions that caused degradation due to thermal aging and possibly electro- migration. It is shown that the failure criterion for gold is similar, but not equal, to tin. Based on these results, it's concluded that loss of metallic contact regardless of plating type is the common factor in the tin and gold performance. Moreover, current density and contact voltage are discussed as basic physical parameters that provide links to aging and failure criteria. The aim is to develop a method using voltage drop for various contact materials to quantify power rating of contacts for reliable use in the field.
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