{"title":"Overview of noise measurement strategies for the characterization of active devices at microwave frequencies","authors":"A. Caddemi, M. Sannino","doi":"10.1109/EDMO.1999.821475","DOIUrl":"https://doi.org/10.1109/EDMO.1999.821475","url":null,"abstract":"The microwave noise parameters of a device can be: (a) extracted from noise figure measurements and appropriate data processing techniques, (b) obtained by a direct search of the minimum noise condition, (c) computed by a noisy circuit model determined on the basis of scattering parameter measurements and a single noise figure measure. In the present paper we review the topical aspects of these different noise characterization techniques and evaluate them comparatively from the viewpoint of the device type under test (either bipolar or field-effect transistor) on the basis of the experimental results obtained in our lab.","PeriodicalId":114744,"journal":{"name":"1999 Symposium on High Performance Electron Devices for Microwave and Optoelectronic Applications. EDMO (Cat. No.99TH8401)","volume":"37 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1999-11-22","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"132249830","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"Dynamics of vertical-cavity surface-emitting laser with two transverse modes","authors":"Igor Scherbatko, Stavros Iezekiel, L. Zei","doi":"10.1109/EDMO.1999.821470","DOIUrl":"https://doi.org/10.1109/EDMO.1999.821470","url":null,"abstract":"A theoretical and experimental investigation of the dynamics and steady-state regime of a two-mode vertical cavity surface emitting laser (VCSEL) is presented. A simple theoretical model was formulated which confirmed and explained experimental observations. The phenomenological model takes into account the variation of confinement factor, and it has been validated by measurements. Results from this model demonstrate the importance of carrier distribution dynamics in establishing stable operation and prediction of turn-on and turn-off regimes.","PeriodicalId":114744,"journal":{"name":"1999 Symposium on High Performance Electron Devices for Microwave and Optoelectronic Applications. EDMO (Cat. No.99TH8401)","volume":"27 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1999-11-22","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"127906210","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}