ECS Electrochemistry Letters最新文献

{"title":"Minimally Invasive Insertion of Reference Electrodes into Commercial Lithium-Ion Pouch Cells","authors":"Euan McTurk, C. Birkl, M. Roberts, D. Howey, P. Bruce","doi":"10.1149/2.0081512EEL","DOIUrl":"https://doi.org/10.1149/2.0081512EEL","url":null,"abstract":"The authors gratefully acknowledge the financial support of EPSRC UK and Jaguar Land Rover Ltd for this work.","PeriodicalId":11470,"journal":{"name":"ECS Electrochemistry Letters","volume":"4 1","pages":""},"PeriodicalIF":0.0,"publicationDate":"2015-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://sci-hub-pdf.com/10.1149/2.0081512EEL","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"64333150","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

{"title":"In Situ Monitoring of Stress Developments and Mechanical Integrity during Galvanostatic Cycling of LiCoO2 Thin Films","authors":"Vineet Malav, M. Jangid, Indranil Hait, A. Mukhopadhyay","doi":"10.1149/2.0101512EEL","DOIUrl":"https://doi.org/10.1149/2.0101512EEL","url":null,"abstract":"","PeriodicalId":11470,"journal":{"name":"ECS Electrochemistry Letters","volume":"4 1","pages":""},"PeriodicalIF":0.0,"publicationDate":"2015-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://sci-hub-pdf.com/10.1149/2.0101512EEL","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"64340726","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

{"title":"Microvia Filling with Nickel-Tungsten Alloy to Decrease the Coefficient of Thermal Expansion of Electronic Circuit Interconnections","authors":"Yu-Tien Lin, Hsin-Man Huang, Hsin-Wei Wang, W. Dow, Jing-Yuan Lin, Ping-He Chang, Horn-Chin Lee","doi":"10.1149/2.0031509EEL","DOIUrl":"https://doi.org/10.1149/2.0031509EEL","url":null,"abstract":"A nickel-tungsten alloy plating formula was developed to electrochemically fill the microvias of printed circuit boards and the through-silicon vias (TSVs) of wafers. The plating solution was composed of Ni(SO3NH2)2, citric acid, sodium citrate, Na2WO4, chloride ions, and 2-mercapto-5-benzimidazolesulfonic acid. A void-free Ni-W superfilling of a microvia and a TSV were achieved. The tungsten content in the filled alloy varied from 1.5 atom% to 5.5 atom%, depending on the plating temperature. The coefficient of thermal expansion of the filled Ni-W was theoretically calculated according the tungsten content, which was lower than that of copper. © The Author(s) 2015. Published by ECS. This is an open access article distributed under the terms of the Creative Commons Attribution 4.0 License (CC BY, http://creativecommons.org/licenses/by/4.0/), which permits unrestricted reuse of the work in any","PeriodicalId":11470,"journal":{"name":"ECS Electrochemistry Letters","volume":"4 1","pages":""},"PeriodicalIF":0.0,"publicationDate":"2015-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://sci-hub-pdf.com/10.1149/2.0031509EEL","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"64312530","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

{"title":"Effect of sp3/sp2 Ratio on Boron Doped Diamond Films for Producing Persulfate","authors":"J. Barreto, K. C. Araújo, D. M. Araújo, C. Martínez-Huitle","doi":"10.1149/2.0061512EEL","DOIUrl":"https://doi.org/10.1149/2.0061512EEL","url":null,"abstract":"","PeriodicalId":11470,"journal":{"name":"ECS Electrochemistry Letters","volume":"4 1","pages":""},"PeriodicalIF":0.0,"publicationDate":"2015-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://sci-hub-pdf.com/10.1149/2.0061512EEL","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"64324213","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

{"title":"Effect of Mass Transfer Conditions on Double-Loop EPR Sensitization Testing of Austenitic Stainless Steel","authors":"Chen-xiao Zhao, P. Pistorius","doi":"10.1149/2.0101508EEL","DOIUrl":"https://doi.org/10.1149/2.0101508EEL","url":null,"abstract":"Previous work showed that mass transfer conditions affect the critical current density during potentiodynamic polarization measurements on Type 304 stainless steel in dilute sulfuric acid containing thiocyanate. This work used rotating disk electrodes of sensitized Type 304 stainless steel to test whether the mass transfer conditions would also affect double-loop electrochemical potentiodynamic reactivation sensitization tests. The critical current density during the forward scan was found to increase slightly with increased rotation rate, but there was no effect on the critical current density during the reactivation scan. © The Author(s) 2015. Published by ECS. This is an open access article distributed under the terms of the Creative Commons Attribution Non-Commercial No Derivatives 4.0 License (CC BY-NC-ND, http://creativecommons.org/licenses/by-nc-nd/4.0/), which permits non-commercial reuse, distribution, and reproduction in any medium, provided the original work is not changed in any way and is properly cited. For permission for commercial reuse, please email: oa@electrochem.org. [DOI: 10.1149/2.0101508eel] All rights reserved.","PeriodicalId":11470,"journal":{"name":"ECS Electrochemistry Letters","volume":"4 1","pages":""},"PeriodicalIF":0.0,"publicationDate":"2015-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://sci-hub-pdf.com/10.1149/2.0101508EEL","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"64340760","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

{"title":"Organosilicon-Based Ionic Liquids with Iodide Anions as Iodide Sources for Dye-Sensitized Solar Cells","authors":"Xiaodan Yan, Hao Luo, Jinglun Wang, Jianwen Yang, Lingzhi Zhang","doi":"10.1149/2.0071510EEL","DOIUrl":"https://doi.org/10.1149/2.0071510EEL","url":null,"abstract":"Four novel organosilicon-based iodides, trimethylsilylmethoxy ethoxytrimethylammonium iodide (TMSC1EN1I), (2-trimethylsilylmethoxy) ethoxytrimethylammonium iodide (TMSC1EN1I), (2-(2-(2-trimethylsilylmethoxy)ethoxy)ethoxy) ethoxytrimethylammonium iodide (TMSC1EN3I) and trimethylsilylmethy diethylmethylammonium iodide (TMSPCI), were designed and synthesized. H-1 NMR and C-13 NMR spectra were recorded to confirm the synthesis of pure products. The organosilicon-based ionic liquids were investigated as the sole iodide sources for electrolytes in dye-sensitized solar cells (DSSCs). The best solar cell efficiency of 3.70% was achieved with TMSC1EN1I (bearing one ethylene oxide segment between silicon and ammonium cation) as the sole iodide source in MPN-based electrolyte at AM 1.5 full sunlight (100 mW/cm(2)). (C) 2015 The Electrochemical Society. All rights","PeriodicalId":11470,"journal":{"name":"ECS Electrochemistry Letters","volume":"4 1","pages":""},"PeriodicalIF":0.0,"publicationDate":"2015-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://sci-hub-pdf.com/10.1149/2.0071510EEL","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"64328837","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

{"title":"Nuclear Microprobe Analysis for Determination of Element Enrichment Following Magnesium Dissolution","authors":"N. Birbilis, T. Cain, J. Laird, X. Xia, J. Scully, A. Hughes","doi":"10.1149/2.0081510EEL","DOIUrl":"https://doi.org/10.1149/2.0081510EEL","url":null,"abstract":"With significant increases in the production and utility of magnesium (Mg) in the past decade, Mg-alloys remain an attractive material for weight reduction in several industries, 1 in addition to substantial exploration as electrode materials in primary and secondary batteries. 2‐3 In such cases, the unambiguous determination of factors that play a role in corrosion/electrochemistry of Mg are of critical importance. The influence of impurities on the corrosion of Mg has been well documented since the early 20 th century, 4 with tolerance limits for a number of elements in Mg proposed. 5 In particular, the influence of deliberate alloying additions of low levels of transition metals (iron, manganeseandzirconium)oncorrosionofMghavebeendocumented by systematic studies. 6 Furthermore, the comparison of the electrochemistry of pure Mg specimens with low (at commercial levels of ∼40 ppmw) and ultra low levels (≤ 1 ppmw) of Fe were also recently presented. 7 Such studies add to the evidence that impurity elements, nominally of low solubility, 8‐10 influence the corrosion electrochemistry of Mg. In spite of this, at least two key aspects with respect to the in-service performance of Mg remain under researched. The first of these includes the detection and analysis of impurity elements on the Mg surface, and the study of possible enrichment of impurity elements on Mg during dissolution; both aspects are worthy of elaboration. Regarding the analysis of impurity elements on Mg surfaces, this is a particularly challenging task for the common methods nominally used in corrosion related works. Nominally, impurity concentrations are in the parts per million range. For example, commercial purity Mg will nominally contain < 100 ppmw Fe, which is below < 0.01% on the basis of weight %, and even lower on the basis of atom %. The analysis of such low levels of Fe with accuracy is not readily possible by methods such as X-ray photoelectron spectroscopy or Auger electron spectroscopy, which require concentrations approaching 1% (which is ∼100 times larger than the typical Fe impurity content) for accurate detection. Similarly, the signal to noise ratio, and large interaction volume, from energy dispersive X-ray spectroscopy are also prohibitive. In fact, even imaging of, and evidence of, impurity Fe (which is known to be present from ICP analysis of chemically dissolved metals) using Field Emission Gun-Scanning Electron Microscopy (FEG-SEM) is elusive. Site-specific Transmission Elec","PeriodicalId":11470,"journal":{"name":"ECS Electrochemistry Letters","volume":"4 1","pages":"34-37"},"PeriodicalIF":0.0,"publicationDate":"2015-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://sci-hub-pdf.com/10.1149/2.0081510EEL","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"64332653","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

{"title":"Aqueous Ion Battery Systems Using Sodium Vanadium Phosphate Stabilized by Titanium Substitution","authors":"C. Mason, Felix Lange","doi":"10.1149/2.0011508EEL","DOIUrl":"https://doi.org/10.1149/2.0011508EEL","url":null,"abstract":"","PeriodicalId":11470,"journal":{"name":"ECS Electrochemistry Letters","volume":"4 1","pages":""},"PeriodicalIF":0.0,"publicationDate":"2015-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://sci-hub-pdf.com/10.1149/2.0011508EEL","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"64303600","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

{"title":"Galvanic Deposition of Silver on Silicon Surfaces from Fluoride Free Aqueous Solutions","authors":"S. Djokić, K. Cadien","doi":"10.1149/2.0051506EEL","DOIUrl":"https://doi.org/10.1149/2.0051506EEL","url":null,"abstract":"Direct deposition of silver from fluoride-free alkaline solutions containing Ag(I) ions at pH higher than 12 onto silicon surfaces at room or elevated temperatures has been demonstrated. This deposition does not require a reducing agent, i.e. process proceeds via galvanic displacement reactions. This new process that is based on strong alkaline and fluoride-free solutions was experimentally illustrated through XRD and SEM analyses. Theoretically, it was confirmed that this process is thermodynamically favorable at room temperature, however for the real industrial applications elevated temperatures (up to 100◦C) are recommended. © The Author(s) 2015. Published by ECS. This is an open access article distributed under the terms of the Creative Commons Attribution 4.0 License (CC BY, http://creativecommons.org/licenses/by/4.0/), which permits unrestricted reuse of the work in any medium, provided the original work is properly cited. [DOI: 10.1149/2.0051506eel] All rights reserved.","PeriodicalId":11470,"journal":{"name":"ECS Electrochemistry Letters","volume":"4 1","pages":""},"PeriodicalIF":0.0,"publicationDate":"2015-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://sci-hub-pdf.com/10.1149/2.0051506EEL","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"64320335","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

{"title":"Reactions and SEI Formation during Charging of Li-O2 Cells","authors":"Jonathan Højberg, Kristian B. Knudsen, J. Hjelm, T. Vegge","doi":"10.1149/2.0051507EEL","DOIUrl":"https://doi.org/10.1149/2.0051507EEL","url":null,"abstract":"Reactions and SEI Formation during Charging of Li-O2 Cells In this letter we combine detailed electrochemical impedance measurements with quantitative measurements of O2 evolution and Li2O2 oxidation to describe the charge mechanisms during charge of Li-O2 batteries with porous carbon electrodes. We identify Li2O2 oxidation at 3.05 V and an apparent chemical formation of a solid electrolyte interface (SEI) layer as the first monolayer of Li2O2 is oxidized, leading to a voltage increase. The first electrochemical degradation reaction is identified between 3.3 V and 3.5 V, and the chemical degradation is limited above 3.5 V, suggesting that a chemically stable SEI layer has been formed.","PeriodicalId":11470,"journal":{"name":"ECS Electrochemistry Letters","volume":"4 1","pages":""},"PeriodicalIF":0.0,"publicationDate":"2015-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://sci-hub-pdf.com/10.1149/2.0051507EEL","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"64320430","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}