ECS Electrochemistry Letters最新文献

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Aqueous Ion Battery Systems Using Sodium Vanadium Phosphate Stabilized by Titanium Substitution 钛取代稳定磷酸钒钠的水离子电池系统
ECS Electrochemistry Letters Pub Date : 2015-01-01 DOI: 10.1149/2.0011508EEL
C. Mason, Felix Lange
{"title":"Aqueous Ion Battery Systems Using Sodium Vanadium Phosphate Stabilized by Titanium Substitution","authors":"C. Mason, Felix Lange","doi":"10.1149/2.0011508EEL","DOIUrl":"https://doi.org/10.1149/2.0011508EEL","url":null,"abstract":"","PeriodicalId":11470,"journal":{"name":"ECS Electrochemistry Letters","volume":"4 1","pages":""},"PeriodicalIF":0.0,"publicationDate":"2015-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://sci-hub-pdf.com/10.1149/2.0011508EEL","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"64303600","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 45
Microvia Filling with Nickel-Tungsten Alloy to Decrease the Coefficient of Thermal Expansion of Electronic Circuit Interconnections 用镍钨合金填充微孔降低电子电路互连的热膨胀系数
ECS Electrochemistry Letters Pub Date : 2015-01-01 DOI: 10.1149/2.0031509EEL
Yu-Tien Lin, Hsin-Man Huang, Hsin-Wei Wang, W. Dow, Jing-Yuan Lin, Ping-He Chang, Horn-Chin Lee
{"title":"Microvia Filling with Nickel-Tungsten Alloy to Decrease the Coefficient of Thermal Expansion of Electronic Circuit Interconnections","authors":"Yu-Tien Lin, Hsin-Man Huang, Hsin-Wei Wang, W. Dow, Jing-Yuan Lin, Ping-He Chang, Horn-Chin Lee","doi":"10.1149/2.0031509EEL","DOIUrl":"https://doi.org/10.1149/2.0031509EEL","url":null,"abstract":"A nickel-tungsten alloy plating formula was developed to electrochemically fill the microvias of printed circuit boards and the through-silicon vias (TSVs) of wafers. The plating solution was composed of Ni(SO3NH2)2, citric acid, sodium citrate, Na2WO4, chloride ions, and 2-mercapto-5-benzimidazolesulfonic acid. A void-free Ni-W superfilling of a microvia and a TSV were achieved. The tungsten content in the filled alloy varied from 1.5 atom% to 5.5 atom%, depending on the plating temperature. The coefficient of thermal expansion of the filled Ni-W was theoretically calculated according the tungsten content, which was lower than that of copper. © The Author(s) 2015. Published by ECS. This is an open access article distributed under the terms of the Creative Commons Attribution 4.0 License (CC BY, http://creativecommons.org/licenses/by/4.0/), which permits unrestricted reuse of the work in any","PeriodicalId":11470,"journal":{"name":"ECS Electrochemistry Letters","volume":"4 1","pages":""},"PeriodicalIF":0.0,"publicationDate":"2015-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://sci-hub-pdf.com/10.1149/2.0031509EEL","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"64312530","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 9
Effect of sp3/sp2 Ratio on Boron Doped Diamond Films for Producing Persulfate sp3/sp2配比对硼掺杂金刚石膜制备过硫酸盐的影响
ECS Electrochemistry Letters Pub Date : 2015-01-01 DOI: 10.1149/2.0061512EEL
J. Barreto, K. C. Araújo, D. M. Araújo, C. Martínez-Huitle
{"title":"Effect of sp3/sp2 Ratio on Boron Doped Diamond Films for Producing Persulfate","authors":"J. Barreto, K. C. Araújo, D. M. Araújo, C. Martínez-Huitle","doi":"10.1149/2.0061512EEL","DOIUrl":"https://doi.org/10.1149/2.0061512EEL","url":null,"abstract":"","PeriodicalId":11470,"journal":{"name":"ECS Electrochemistry Letters","volume":"4 1","pages":""},"PeriodicalIF":0.0,"publicationDate":"2015-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://sci-hub-pdf.com/10.1149/2.0061512EEL","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"64324213","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 45
Organosilicon-Based Ionic Liquids with Iodide Anions as Iodide Sources for Dye-Sensitized Solar Cells 含碘阴离子的有机硅基离子液体作为染料敏化太阳能电池的碘化物源
ECS Electrochemistry Letters Pub Date : 2015-01-01 DOI: 10.1149/2.0071510EEL
Xiaodan Yan, Hao Luo, Jinglun Wang, Jianwen Yang, Lingzhi Zhang
{"title":"Organosilicon-Based Ionic Liquids with Iodide Anions as Iodide Sources for Dye-Sensitized Solar Cells","authors":"Xiaodan Yan, Hao Luo, Jinglun Wang, Jianwen Yang, Lingzhi Zhang","doi":"10.1149/2.0071510EEL","DOIUrl":"https://doi.org/10.1149/2.0071510EEL","url":null,"abstract":"Four novel organosilicon-based iodides, trimethylsilylmethoxy ethoxytrimethylammonium iodide (TMSC1EN1I), (2-trimethylsilylmethoxy) ethoxytrimethylammonium iodide (TMSC1EN1I), (2-(2-(2-trimethylsilylmethoxy)ethoxy)ethoxy) ethoxytrimethylammonium iodide (TMSC1EN3I) and trimethylsilylmethy diethylmethylammonium iodide (TMSPCI), were designed and synthesized. H-1 NMR and C-13 NMR spectra were recorded to confirm the synthesis of pure products. The organosilicon-based ionic liquids were investigated as the sole iodide sources for electrolytes in dye-sensitized solar cells (DSSCs). The best solar cell efficiency of 3.70% was achieved with TMSC1EN1I (bearing one ethylene oxide segment between silicon and ammonium cation) as the sole iodide source in MPN-based electrolyte at AM 1.5 full sunlight (100 mW/cm(2)). (C) 2015 The Electrochemical Society. All rights","PeriodicalId":11470,"journal":{"name":"ECS Electrochemistry Letters","volume":"4 1","pages":""},"PeriodicalIF":0.0,"publicationDate":"2015-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://sci-hub-pdf.com/10.1149/2.0071510EEL","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"64328837","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Nuclear Microprobe Analysis for Determination of Element Enrichment Following Magnesium Dissolution 核探针法测定镁溶解后元素富集
ECS Electrochemistry Letters Pub Date : 2015-01-01 DOI: 10.1149/2.0081510EEL
N. Birbilis, T. Cain, J. Laird, X. Xia, J. Scully, A. Hughes
{"title":"Nuclear Microprobe Analysis for Determination of Element Enrichment Following Magnesium Dissolution","authors":"N. Birbilis, T. Cain, J. Laird, X. Xia, J. Scully, A. Hughes","doi":"10.1149/2.0081510EEL","DOIUrl":"https://doi.org/10.1149/2.0081510EEL","url":null,"abstract":"With significant increases in the production and utility of magnesium (Mg) in the past decade, Mg-alloys remain an attractive material for weight reduction in several industries, 1 in addition to substantial exploration as electrode materials in primary and secondary batteries. 2‐3 In such cases, the unambiguous determination of factors that play a role in corrosion/electrochemistry of Mg are of critical importance. The influence of impurities on the corrosion of Mg has been well documented since the early 20 th century, 4 with tolerance limits for a number of elements in Mg proposed. 5 In particular, the influence of deliberate alloying additions of low levels of transition metals (iron, manganeseandzirconium)oncorrosionofMghavebeendocumented by systematic studies. 6 Furthermore, the comparison of the electrochemistry of pure Mg specimens with low (at commercial levels of ∼40 ppmw) and ultra low levels (≤ 1 ppmw) of Fe were also recently presented. 7 Such studies add to the evidence that impurity elements, nominally of low solubility, 8‐10 influence the corrosion electrochemistry of Mg. In spite of this, at least two key aspects with respect to the in-service performance of Mg remain under researched. The first of these includes the detection and analysis of impurity elements on the Mg surface, and the study of possible enrichment of impurity elements on Mg during dissolution; both aspects are worthy of elaboration. Regarding the analysis of impurity elements on Mg surfaces, this is a particularly challenging task for the common methods nominally used in corrosion related works. Nominally, impurity concentrations are in the parts per million range. For example, commercial purity Mg will nominally contain < 100 ppmw Fe, which is below < 0.01% on the basis of weight %, and even lower on the basis of atom %. The analysis of such low levels of Fe with accuracy is not readily possible by methods such as X-ray photoelectron spectroscopy or Auger electron spectroscopy, which require concentrations approaching 1% (which is ∼100 times larger than the typical Fe impurity content) for accurate detection. Similarly, the signal to noise ratio, and large interaction volume, from energy dispersive X-ray spectroscopy are also prohibitive. In fact, even imaging of, and evidence of, impurity Fe (which is known to be present from ICP analysis of chemically dissolved metals) using Field Emission Gun-Scanning Electron Microscopy (FEG-SEM) is elusive. Site-specific Transmission Elec","PeriodicalId":11470,"journal":{"name":"ECS Electrochemistry Letters","volume":"4 1","pages":"34-37"},"PeriodicalIF":0.0,"publicationDate":"2015-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://sci-hub-pdf.com/10.1149/2.0081510EEL","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"64332653","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 44
Minimally Invasive Insertion of Reference Electrodes into Commercial Lithium-Ion Pouch Cells 参考电极在商用锂离子袋电池中的微创插入
ECS Electrochemistry Letters Pub Date : 2015-01-01 DOI: 10.1149/2.0081512EEL
Euan McTurk, C. Birkl, M. Roberts, D. Howey, P. Bruce
{"title":"Minimally Invasive Insertion of Reference Electrodes into Commercial Lithium-Ion Pouch Cells","authors":"Euan McTurk, C. Birkl, M. Roberts, D. Howey, P. Bruce","doi":"10.1149/2.0081512EEL","DOIUrl":"https://doi.org/10.1149/2.0081512EEL","url":null,"abstract":"The authors gratefully acknowledge the financial support of EPSRC UK and Jaguar Land Rover Ltd for this work.","PeriodicalId":11470,"journal":{"name":"ECS Electrochemistry Letters","volume":"4 1","pages":""},"PeriodicalIF":0.0,"publicationDate":"2015-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://sci-hub-pdf.com/10.1149/2.0081512EEL","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"64333150","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 37
In Situ Monitoring of Stress Developments and Mechanical Integrity during Galvanostatic Cycling of LiCoO2 Thin Films LiCoO2薄膜恒流循环过程中应力发展和机械完整性的原位监测
ECS Electrochemistry Letters Pub Date : 2015-01-01 DOI: 10.1149/2.0101512EEL
Vineet Malav, M. Jangid, Indranil Hait, A. Mukhopadhyay
{"title":"In Situ Monitoring of Stress Developments and Mechanical Integrity during Galvanostatic Cycling of LiCoO2 Thin Films","authors":"Vineet Malav, M. Jangid, Indranil Hait, A. Mukhopadhyay","doi":"10.1149/2.0101512EEL","DOIUrl":"https://doi.org/10.1149/2.0101512EEL","url":null,"abstract":"","PeriodicalId":11470,"journal":{"name":"ECS Electrochemistry Letters","volume":"4 1","pages":""},"PeriodicalIF":0.0,"publicationDate":"2015-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://sci-hub-pdf.com/10.1149/2.0101512EEL","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"64340726","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 13
Effect of Mass Transfer Conditions on Double-Loop EPR Sensitization Testing of Austenitic Stainless Steel 传质条件对奥氏体不锈钢双环EPR敏化试验的影响
ECS Electrochemistry Letters Pub Date : 2015-01-01 DOI: 10.1149/2.0101508EEL
Chen-xiao Zhao, P. Pistorius
{"title":"Effect of Mass Transfer Conditions on Double-Loop EPR Sensitization Testing of Austenitic Stainless Steel","authors":"Chen-xiao Zhao, P. Pistorius","doi":"10.1149/2.0101508EEL","DOIUrl":"https://doi.org/10.1149/2.0101508EEL","url":null,"abstract":"Previous work showed that mass transfer conditions affect the critical current density during potentiodynamic polarization measurements on Type 304 stainless steel in dilute sulfuric acid containing thiocyanate. This work used rotating disk electrodes of sensitized Type 304 stainless steel to test whether the mass transfer conditions would also affect double-loop electrochemical potentiodynamic reactivation sensitization tests. The critical current density during the forward scan was found to increase slightly with increased rotation rate, but there was no effect on the critical current density during the reactivation scan. © The Author(s) 2015. Published by ECS. This is an open access article distributed under the terms of the Creative Commons Attribution Non-Commercial No Derivatives 4.0 License (CC BY-NC-ND, http://creativecommons.org/licenses/by-nc-nd/4.0/), which permits non-commercial reuse, distribution, and reproduction in any medium, provided the original work is not changed in any way and is properly cited. For permission for commercial reuse, please email: oa@electrochem.org. [DOI: 10.1149/2.0101508eel] All rights reserved.","PeriodicalId":11470,"journal":{"name":"ECS Electrochemistry Letters","volume":"4 1","pages":""},"PeriodicalIF":0.0,"publicationDate":"2015-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://sci-hub-pdf.com/10.1149/2.0101508EEL","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"64340760","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 2
Fault Current Measurements during Crush Testing of Electrically Parallel Lithium-Ion Battery Modules 电并联锂离子电池模块挤压试验中的故障电流测量
ECS Electrochemistry Letters Pub Date : 2015-01-01 DOI: 10.1149/2.0011509EEL
James Marcicki, X. Yang, Phil Rairigh
{"title":"Fault Current Measurements during Crush Testing of Electrically Parallel Lithium-Ion Battery Modules","authors":"James Marcicki, X. Yang, Phil Rairigh","doi":"10.1149/2.0011509EEL","DOIUrl":"https://doi.org/10.1149/2.0011509EEL","url":null,"abstract":"Experimental data is presented from crush testing of 1S4P battery modules that quantifies the fault currents experienced by each cell after the onset of an internal short circuit. Combined with voltage and temperature measurements, the newly proposed method for measuring fault currents provides a more complete picture of the module failure during abusive crush. Short circuit resistance trends versus time are calculated from the current measurements, indicating approximately 20 milliohms resistance values prior to thermal runaway and resistive heat generation on the order of hundreds of watts. Language: en","PeriodicalId":11470,"journal":{"name":"ECS Electrochemistry Letters","volume":"4 1","pages":""},"PeriodicalIF":0.0,"publicationDate":"2015-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://sci-hub-pdf.com/10.1149/2.0011509EEL","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"64303718","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 5
Symmetric Supercapacitor Based on Reduced Graphene Oxide in Non-Aqueous Electrolyte 非水电解质中基于还原氧化石墨烯的对称超级电容器
ECS Electrochemistry Letters Pub Date : 2015-01-01 DOI: 10.1149/2.0031508EEL
S. Shivakumara, Brij Kishore, T. Penki, N. Munichandraiah
{"title":"Symmetric Supercapacitor Based on Reduced Graphene Oxide in Non-Aqueous Electrolyte","authors":"S. Shivakumara, Brij Kishore, T. Penki, N. Munichandraiah","doi":"10.1149/2.0031508EEL","DOIUrl":"https://doi.org/10.1149/2.0031508EEL","url":null,"abstract":"Reduced graphene oxide (RGO) is prepared by thermal exfoliation of graphite oxide in air. Symmetric RGO/RGO supercapacitors are constructed in a non-aqueous electrolyte and characterized. The values of energy density are 44 Wh kg−1 and 15 Wh kg−1, respectively at 0.15 and 8.0 kW kg−1. The symmetric supercapacitor exhibits stable charge/discharge cycling tested up to 3000 cycles. The low-temperature thermal exfoliation approach is convenient for mass production of RGO at low cost and it can be used as electrode material for energy storage applications. © The Author(s) 2015. Published by ECS. This is an open access article distributed under the terms of the Creative Commons Attribution 4.0 License (CC BY, http://creativecommons.org/licenses/by/4.0/), which permits unrestricted reuse of the work in any medium, provided the original work is properly cited. [DOI: 10.1149/2.0031508eel] All rights reserved.","PeriodicalId":11470,"journal":{"name":"ECS Electrochemistry Letters","volume":"4 1","pages":""},"PeriodicalIF":0.0,"publicationDate":"2015-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://sci-hub-pdf.com/10.1149/2.0031508EEL","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"64312904","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 14
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