W. Kleinert
{"title":"Defect Sizing Using Non-destructive Ultrasonic Testing: Applying Bandwidth-Dependent DAC and DGS Curves","authors":"W. Kleinert","doi":"10.1007/978-3-319-32836-2","DOIUrl":"https://doi.org/10.1007/978-3-319-32836-2","url":null,"abstract":"","PeriodicalId":109380,"journal":{"name":"Defect Sizing Using Non-destructive Ultrasonic Testing","volume":"229 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2016-05-06","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"114417426","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 10