W. Kleinert
{"title":"Defect Sizing Using Non-destructive Ultrasonic Testing: Applying Bandwidth-Dependent DAC and DGS Curves","authors":"W. Kleinert","doi":"10.1007/978-3-319-32836-2","DOIUrl":null,"url":null,"abstract":"","PeriodicalId":109380,"journal":{"name":"Defect Sizing Using Non-destructive Ultrasonic Testing","volume":"229 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2016-05-06","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"10","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Defect Sizing Using Non-destructive Ultrasonic Testing","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1007/978-3-319-32836-2","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 10