W. Kleinert
{"title":"使用无损超声检测缺陷尺寸:应用带宽相关DAC和DGS曲线","authors":"W. Kleinert","doi":"10.1007/978-3-319-32836-2","DOIUrl":null,"url":null,"abstract":"","PeriodicalId":109380,"journal":{"name":"Defect Sizing Using Non-destructive Ultrasonic Testing","volume":"229 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2016-05-06","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"10","resultStr":"{\"title\":\"Defect Sizing Using Non-destructive Ultrasonic Testing: Applying Bandwidth-Dependent DAC and DGS Curves\",\"authors\":\"W. Kleinert\",\"doi\":\"10.1007/978-3-319-32836-2\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"\",\"PeriodicalId\":109380,\"journal\":{\"name\":\"Defect Sizing Using Non-destructive Ultrasonic Testing\",\"volume\":\"229 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2016-05-06\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"10\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Defect Sizing Using Non-destructive Ultrasonic Testing\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1007/978-3-319-32836-2\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Defect Sizing Using Non-destructive Ultrasonic Testing","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1007/978-3-319-32836-2","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 10