2016 Argentine Conference of Micro-Nanoelectronics, Technology and Applications (CAMTA)最新文献

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Measurement of the read-out noise of fully depleted thick CCDs 全耗尽厚ccd读出噪声的测量
M. S. Haro, G. Cancelo, G. Fernández Moroni, X. Bertou, J. Tiffenberg, E. Paolini, J. Estrada
{"title":"Measurement of the read-out noise of fully depleted thick CCDs","authors":"M. S. Haro, G. Cancelo, G. Fernández Moroni, X. Bertou, J. Tiffenberg, E. Paolini, J. Estrada","doi":"10.1109/CAMTA.2016.7574083","DOIUrl":"https://doi.org/10.1109/CAMTA.2016.7574083","url":null,"abstract":"Fully depleted thick CCDs have been designed for infrared astronomy, but their low read-out noise of the order of ≈2e- and their considerable mass of ≈5.2 gr, allows novel uses for them in low energy threshold particle detection applications, such as the CONNIE and DAMIC experiments. For both experiments, a reduction of the CCD read-out noise is vital. In this work we present a method to measure the read-out noise coming from electronic and non-electronic sources. The impact of the external electronics on the noise is discussed and its full characterization is presented.","PeriodicalId":108317,"journal":{"name":"2016 Argentine Conference of Micro-Nanoelectronics, Technology and Applications (CAMTA)","volume":"20 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2016-08-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"116755319","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 10
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